SG11202004959VA - Electrical connection socket - Google Patents
Electrical connection socketInfo
- Publication number
- SG11202004959VA SG11202004959VA SG11202004959VA SG11202004959VA SG11202004959VA SG 11202004959V A SG11202004959V A SG 11202004959VA SG 11202004959V A SG11202004959V A SG 11202004959VA SG 11202004959V A SG11202004959V A SG 11202004959VA SG 11202004959V A SG11202004959V A SG 11202004959VA
- Authority
- SG
- Singapore
- Prior art keywords
- electrical connection
- connection socket
- socket
- electrical
- connection
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
- H01R12/70—Coupling devices
- H01R12/71—Coupling devices for rigid printing circuits or like structures
- H01R12/712—Coupling devices for rigid printing circuits or like structures co-operating with the surface of the printed circuit or with a coupling device exclusively provided on the surface of the printed circuit
- H01R12/716—Coupling device provided on the PCB
- H01R12/718—Contact members provided on the PCB without an insulating housing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0433—Sockets for IC's or transistors
- G01R1/0441—Details
- G01R1/045—Sockets or component fixtures for RF or HF testing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0433—Sockets for IC's or transistors
- G01R1/0441—Details
- G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2896—Testing of IC packages; Test features related to IC packages
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06716—Elastic
- G01R1/06722—Spring-loaded
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
- H01R12/50—Fixed connections
- H01R12/51—Fixed connections for rigid printed circuits or like structures
- H01R12/55—Fixed connections for rigid printed circuits or like structures characterised by the terminals
- H01R12/57—Fixed connections for rigid printed circuits or like structures characterised by the terminals surface mounting terminals
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/02—Contact members
- H01R13/193—Means for increasing contact pressure at the end of engagement of coupling part, e.g. zero insertion force or no friction
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Connecting Device With Holders (AREA)
- Details Of Connecting Devices For Male And Female Coupling (AREA)
- Coupling Device And Connection With Printed Circuit (AREA)
- Measuring Leads Or Probes (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201762592668P | 2017-11-30 | 2017-11-30 | |
US201762592670P | 2017-11-30 | 2017-11-30 | |
PCT/JP2018/024823 WO2019106871A1 (en) | 2017-11-30 | 2018-06-29 | Electrical connection socket |
Publications (1)
Publication Number | Publication Date |
---|---|
SG11202004959VA true SG11202004959VA (en) | 2020-06-29 |
Family
ID=66664045
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG11202004961XA SG11202004961XA (en) | 2017-11-30 | 2018-06-29 | Electrical connection socket |
SG11202004959VA SG11202004959VA (en) | 2017-11-30 | 2018-06-29 | Electrical connection socket |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG11202004961XA SG11202004961XA (en) | 2017-11-30 | 2018-06-29 | Electrical connection socket |
Country Status (5)
Country | Link |
---|---|
US (2) | US11189945B2 (en) |
JP (2) | JP7153670B2 (en) |
CN (2) | CN111316112B (en) |
SG (2) | SG11202004961XA (en) |
WO (2) | WO2019106871A1 (en) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9341671B2 (en) * | 2013-03-14 | 2016-05-17 | Taiwan Semiconductor Manufacturing Company, Ltd. | Testing holders for chip unit and die package |
US11495901B2 (en) * | 2017-09-08 | 2022-11-08 | Enplas Corporation | Electric connection socket connecting a circuit board and an integrated circuit package |
CN111316112B (en) * | 2017-11-30 | 2022-08-09 | 恩普乐股份有限公司 | Socket for electric connection |
US11518005B2 (en) * | 2017-12-12 | 2022-12-06 | Bae Systems Information And Electronic Systems Integration Inc. | Apparatus for engaging a guide pin |
KR102455150B1 (en) * | 2020-02-10 | 2022-10-18 | 주식회사 아이에스시 | Test socket for use in testing device under test |
US11539167B2 (en) | 2020-09-17 | 2022-12-27 | Carlisle Interconnect Technologies, Inc. | Adjustable push on connector/adaptor |
US11293976B1 (en) * | 2020-09-25 | 2022-04-05 | Essai, Inc. | Integrated circuit device test tooling with dual angle cavities |
US11502440B2 (en) * | 2020-10-23 | 2022-11-15 | Carlisle Interconnect Technologies, Inc. | Multiport connector interface system |
JP7522698B2 (en) * | 2021-04-28 | 2024-07-25 | ヒロセ電機株式会社 | Electrical connector and electrical connector with circuit board |
Family Cites Families (25)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0687874U (en) * | 1993-05-28 | 1994-12-22 | 安藤電気株式会社 | Inspection jig for connection ring for IC tester |
JP3634074B2 (en) * | 1996-06-28 | 2005-03-30 | 日本発条株式会社 | Conductive contact |
JP2004325306A (en) * | 2003-04-25 | 2004-11-18 | Yokowo Co Ltd | Coaxial probe for inspection, and inspection unit using the same |
JP4242199B2 (en) | 2003-04-25 | 2009-03-18 | 株式会社ヨコオ | IC socket |
JP4535828B2 (en) * | 2004-09-30 | 2010-09-01 | 株式会社ヨコオ | Inspection unit manufacturing method |
TWM268766U (en) * | 2004-10-15 | 2005-06-21 | Hon Hai Prec Ind Co Ltd | Electrical connector |
JP4438601B2 (en) | 2004-10-28 | 2010-03-24 | 株式会社ヨコオ | Inspection unit manufacturing method |
JP2006210293A (en) * | 2005-01-31 | 2006-08-10 | Toshiba Corp | Socket for circuit component and its mounting method |
US7220134B2 (en) * | 2005-02-24 | 2007-05-22 | Advanced Interconnections Corporation | Low profile LGA socket assembly |
US7690925B2 (en) * | 2005-02-24 | 2010-04-06 | Advanced Interconnections Corp. | Terminal assembly with pin-retaining socket |
JP2007198835A (en) | 2006-01-25 | 2007-08-09 | Murata Mfg Co Ltd | High-frequency characteristic measuring tool |
CN101454676B (en) * | 2006-04-28 | 2011-12-07 | 日本发条株式会社 | Conductive contact holder |
JP2008059810A (en) * | 2006-08-29 | 2008-03-13 | Japan Aviation Electronics Industry Ltd | Connector |
JPWO2008072699A1 (en) * | 2006-12-15 | 2010-04-02 | 日本発條株式会社 | Conductive contact holder and conductive contact unit |
TWM344664U (en) * | 2008-04-07 | 2008-11-11 | Hon Hai Prec Ind Co Ltd | Electrical contact |
JP2011075313A (en) * | 2009-09-29 | 2011-04-14 | Three M Innovative Properties Co | Ic device testing socket |
US8808010B2 (en) | 2011-06-06 | 2014-08-19 | Interconnect Devices, Inc. | Insulated metal socket |
US8758066B2 (en) | 2012-02-03 | 2014-06-24 | Interconnect Devices, Inc. | Electrical connector with insulation member |
JP6475479B2 (en) | 2014-11-27 | 2019-02-27 | 株式会社ヨコオ | Inspection unit |
JP6404104B2 (en) * | 2014-12-11 | 2018-10-10 | 株式会社エンプラス | Socket for electrical parts |
US20160216294A1 (en) * | 2015-01-27 | 2016-07-28 | Kurt F. Kaashoek | Electrical Spring Probe with Stabilization |
US9478881B2 (en) * | 2015-03-09 | 2016-10-25 | Intel Corporation | Snap connector for socket assembly and associated techniques and configurations |
US20170059611A1 (en) * | 2015-09-02 | 2017-03-02 | Oracle International Corporation | Coaxial integrated circuit test socket |
JP6601138B2 (en) * | 2015-10-16 | 2019-11-06 | 山一電機株式会社 | IC socket |
CN111316112B (en) * | 2017-11-30 | 2022-08-09 | 恩普乐股份有限公司 | Socket for electric connection |
-
2018
- 2018-06-29 CN CN201880072149.7A patent/CN111316112B/en active Active
- 2018-06-29 CN CN201880072140.6A patent/CN111316111B/en active Active
- 2018-06-29 SG SG11202004961XA patent/SG11202004961XA/en unknown
- 2018-06-29 SG SG11202004959VA patent/SG11202004959VA/en unknown
- 2018-06-29 US US16/768,039 patent/US11189945B2/en active Active
- 2018-06-29 WO PCT/JP2018/024823 patent/WO2019106871A1/en active Application Filing
- 2018-06-29 WO PCT/JP2018/024827 patent/WO2019106872A1/en active Application Filing
- 2018-06-29 US US16/768,044 patent/US11329411B2/en active Active
- 2018-06-29 JP JP2019557003A patent/JP7153670B2/en active Active
- 2018-06-29 JP JP2019556541A patent/JP7169989B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
CN111316112B (en) | 2022-08-09 |
JP7169989B2 (en) | 2022-11-11 |
US20200366018A1 (en) | 2020-11-19 |
SG11202004961XA (en) | 2020-06-29 |
JPWO2019106871A1 (en) | 2020-12-03 |
US11329411B2 (en) | 2022-05-10 |
US11189945B2 (en) | 2021-11-30 |
CN111316112A (en) | 2020-06-19 |
JP7153670B2 (en) | 2022-10-14 |
WO2019106872A1 (en) | 2019-06-06 |
JPWO2019106872A1 (en) | 2020-11-19 |
US20210190820A1 (en) | 2021-06-24 |
WO2019106871A1 (en) | 2019-06-06 |
CN111316111A (en) | 2020-06-19 |
CN111316111B (en) | 2022-08-05 |
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