SG11201911798UA - Method and device for the alignment of substrates - Google Patents
Method and device for the alignment of substratesInfo
- Publication number
- SG11201911798UA SG11201911798UA SG11201911798UA SG11201911798UA SG11201911798UA SG 11201911798U A SG11201911798U A SG 11201911798UA SG 11201911798U A SG11201911798U A SG 11201911798UA SG 11201911798U A SG11201911798U A SG 11201911798UA SG 11201911798U A SG11201911798U A SG 11201911798UA
- Authority
- SG
- Singapore
- Prior art keywords
- substrates
- alignment
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67259—Position monitoring, e.g. misposition detection or presence detection
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
- G03F7/70775—Position control, e.g. interferometers or encoders for determining the stage position
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/7085—Detection arrangement, e.g. detectors of apparatus alignment possibly mounted on wafers, exposure dose, photo-cleaning flux, stray light, thermal load
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F9/00—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
- G03F9/70—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography
- G03F9/7088—Alignment mark detection, e.g. TTR, TTL, off-axis detection, array detector, video detection
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67092—Apparatus for mechanical treatment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/68—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
- H01L21/681—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment using optical controlling means
Landscapes
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Multimedia (AREA)
- Health & Medical Sciences (AREA)
- Environmental & Geological Engineering (AREA)
- Epidemiology (AREA)
- Public Health (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/EP2019/072589 WO2021037328A1 (en) | 2019-08-23 | 2019-08-23 | Method and device for aligning substrates |
Publications (1)
Publication Number | Publication Date |
---|---|
SG11201911798UA true SG11201911798UA (en) | 2021-04-29 |
Family
ID=67766164
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG11201911798UA SG11201911798UA (en) | 2019-08-23 | 2019-08-23 | Method and device for the alignment of substrates |
Country Status (8)
Country | Link |
---|---|
US (1) | US20220301907A1 (en) |
EP (1) | EP4018472A1 (en) |
JP (1) | JP2022552053A (en) |
KR (1) | KR20220047756A (en) |
CN (1) | CN114144868A (en) |
SG (1) | SG11201911798UA (en) |
TW (1) | TW202123356A (en) |
WO (1) | WO2021037328A1 (en) |
Family Cites Families (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5175774A (en) * | 1990-10-16 | 1992-12-29 | Micron Technology, Inc. | Semiconductor wafer marking for identification during processing |
US5418613A (en) * | 1990-11-20 | 1995-05-23 | Canon Kabushiki Kaisha | Method and apparatus for detecting the position of a substrate having first and second patterns of different sizes |
AT405775B (en) | 1998-01-13 | 1999-11-25 | Thallner Erich | Method and apparatus for bringing together wafer-type (slice-type, disk-shaped) semiconductor substrates in an aligned manner |
US7015418B2 (en) * | 2002-05-17 | 2006-03-21 | Gsi Group Corporation | Method and system for calibrating a laser processing system and laser marking system utilizing same |
JP4046030B2 (en) * | 2002-08-30 | 2008-02-13 | 株式会社村田製作所 | Component mounting method and component mounting apparatus |
JP4626160B2 (en) * | 2004-03-04 | 2011-02-02 | 株式会社ニコン | Wafer overlay method and wafer overlay apparatus |
US7442476B2 (en) * | 2004-12-27 | 2008-10-28 | Asml Netherlands B.V. | Method and system for 3D alignment in wafer scale integration |
US7433038B2 (en) * | 2006-04-27 | 2008-10-07 | Asml Netherlands B.V. | Alignment of substrates for bonding |
TWI478271B (en) * | 2007-08-10 | 2015-03-21 | 尼康股份有限公司 | Substrate bonding device and substrate bonding method |
JP5353892B2 (en) * | 2008-10-01 | 2013-11-27 | 株式会社ニコン | Alignment apparatus and alignment method |
EP2299472B1 (en) | 2009-09-22 | 2020-07-08 | EV Group E. Thallner GmbH | Device for aligning two substrates |
EP2463892B1 (en) * | 2010-12-13 | 2013-04-03 | EV Group E. Thallner GmbH | Device, assembly and method for detecting alignment errors |
WO2014202106A1 (en) | 2013-06-17 | 2014-12-24 | Ev Group E. Thallner Gmbh | Device and method for aligning substrates |
US9851645B2 (en) | 2013-12-06 | 2017-12-26 | Ev Group E. Thallner Gmbh | Device and method for aligning substrates |
JP6271404B2 (en) * | 2014-11-27 | 2018-01-31 | 東京エレクトロン株式会社 | Joining method, program, computer storage medium, joining apparatus and joining system |
CN118098939A (en) | 2016-03-22 | 2024-05-28 | Ev 集团 E·索尔纳有限责任公司 | Apparatus and method for bonding substrates |
CN109496345B (en) | 2016-08-12 | 2023-07-18 | Ev 集团 E·索尔纳有限责任公司 | Method and sample holder for controlled bonding of substrates |
EP3734650B1 (en) * | 2016-08-29 | 2023-09-27 | EV Group E. Thallner GmbH | Device and method for aligning substrates |
CN110168711B (en) | 2017-09-21 | 2024-02-13 | Ev 集团 E·索尔纳有限责任公司 | Apparatus and method for bonding substrates |
JP6980562B2 (en) * | 2018-02-28 | 2021-12-15 | キヤノン株式会社 | Pattern forming device, alignment mark detection method and pattern forming method |
-
2019
- 2019-08-23 SG SG11201911798UA patent/SG11201911798UA/en unknown
- 2019-08-23 US US17/631,261 patent/US20220301907A1/en active Pending
- 2019-08-23 WO PCT/EP2019/072589 patent/WO2021037328A1/en unknown
- 2019-08-23 CN CN201980098936.3A patent/CN114144868A/en active Pending
- 2019-08-23 JP JP2022506269A patent/JP2022552053A/en active Pending
- 2019-08-23 KR KR1020227001909A patent/KR20220047756A/en not_active Application Discontinuation
- 2019-08-23 EP EP19758964.1A patent/EP4018472A1/en active Pending
-
2020
- 2020-07-31 TW TW109125920A patent/TW202123356A/en unknown
Also Published As
Publication number | Publication date |
---|---|
CN114144868A (en) | 2022-03-04 |
JP2022552053A (en) | 2022-12-15 |
TW202123356A (en) | 2021-06-16 |
US20220301907A1 (en) | 2022-09-22 |
EP4018472A1 (en) | 2022-06-29 |
WO2021037328A1 (en) | 2021-03-04 |
KR20220047756A (en) | 2022-04-19 |
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