SG11201801479YA - Vision inspection module and device inspection system having same - Google Patents

Vision inspection module and device inspection system having same

Info

Publication number
SG11201801479YA
SG11201801479YA SG11201801479YA SG11201801479YA SG11201801479YA SG 11201801479Y A SG11201801479Y A SG 11201801479YA SG 11201801479Y A SG11201801479Y A SG 11201801479YA SG 11201801479Y A SG11201801479Y A SG 11201801479YA SG 11201801479Y A SG11201801479Y A SG 11201801479YA
Authority
SG
Singapore
Prior art keywords
same
vision
module
inspection system
inspection
Prior art date
Application number
SG11201801479YA
Inventor
Hong Jun You
Myeong Kuk Lee
Su Min Bae
Original Assignee
Jt Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jt Corp filed Critical Jt Corp
Publication of SG11201801479YA publication Critical patent/SG11201801479YA/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis

Landscapes

  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Immunology (AREA)
  • Theoretical Computer Science (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Signal Processing (AREA)
  • Quality & Reliability (AREA)
SG11201801479YA 2015-08-26 2016-08-10 Vision inspection module and device inspection system having same SG11201801479YA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR1020150120312A KR101784987B1 (en) 2015-08-26 2015-08-26 Vision inspection module and device inspection system having the same
PCT/KR2016/008769 WO2017034184A1 (en) 2015-08-26 2016-08-10 Vision inspection module and element inspection system having same

Publications (1)

Publication Number Publication Date
SG11201801479YA true SG11201801479YA (en) 2018-03-28

Family

ID=58100643

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11201801479YA SG11201801479YA (en) 2015-08-26 2016-08-10 Vision inspection module and device inspection system having same

Country Status (5)

Country Link
KR (1) KR101784987B1 (en)
CN (1) CN108449975A (en)
SG (1) SG11201801479YA (en)
TW (1) TWI637165B (en)
WO (1) WO2017034184A1 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20190106098A (en) * 2018-03-07 2019-09-18 (주)제이티 Vision inspection module, device inspection system having the same and device inspection method using the same
TWI729520B (en) * 2019-10-04 2021-06-01 致茂電子股份有限公司 Electronic assembly detecting system

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5452080A (en) * 1993-06-04 1995-09-19 Sony Corporation Image inspection apparatus and method
JPH1144513A (en) * 1997-05-29 1999-02-16 Sony Corp Visual examination device for semiconductor device and method therefor
DE602004021240D1 (en) * 2003-03-07 2009-07-09 Ismeca Semiconductor Holding OPTICAL EQUIPMENT AND INSPECTION MODULE
WO2006128442A1 (en) 2005-05-31 2006-12-07 W.O.M. World Of Medicine Ag Method and apparatus for visual characterization of tissue
TWI280361B (en) * 2005-12-28 2007-05-01 Nat Pingtung University Of Sci Examining apparatus for an outer perimeter of a component
KR101108672B1 (en) * 2009-05-12 2012-01-25 (주)제이티 Vision inspection apparatus and vision inspection method therefor
KR101269976B1 (en) * 2011-07-13 2013-06-05 주식회사 미르기술 3d vision inspection method and 3d vision inspection apparatus for light emitting diode
KR101275134B1 (en) * 2012-04-27 2013-06-17 한미반도체 주식회사 Semiconductor package inspecting device and semiconductor package inspecting method using the same
KR20130135583A (en) * 2012-06-01 2013-12-11 (주)제이티 Vision inspection module and device inspection apparatus having the same
TWM477571U (en) * 2013-10-09 2014-05-01 Utechzone Co Ltd Image inspection device

Also Published As

Publication number Publication date
TWI637165B (en) 2018-10-01
TW201713939A (en) 2017-04-16
CN108449975A (en) 2018-08-24
KR101784987B1 (en) 2017-10-12
KR20170024808A (en) 2017-03-08
WO2017034184A1 (en) 2017-03-02

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