SG11201509562TA - Analytical device - Google Patents

Analytical device

Info

Publication number
SG11201509562TA
SG11201509562TA SG11201509562TA SG11201509562TA SG11201509562TA SG 11201509562T A SG11201509562T A SG 11201509562TA SG 11201509562T A SG11201509562T A SG 11201509562TA SG 11201509562T A SG11201509562T A SG 11201509562TA SG 11201509562T A SG11201509562T A SG 11201509562TA
Authority
SG
Singapore
Prior art keywords
analytical device
analytical
Prior art date
Application number
SG11201509562TA
Inventor
Prakash Sreedhar Murthy
Original Assignee
Atonarp Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Atonarp Inc filed Critical Atonarp Inc
Publication of SG11201509562TA publication Critical patent/SG11201509562TA/en

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0027—Methods for using particle spectrometers
    • H01J49/0031—Step by step routines describing the use of the apparatus
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/107—Arrangements for using several ion sources
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/025—Detectors specially adapted to particle spectrometers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • H01J49/147—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers with electrons, e.g. electron impact ionisation, electron attachment
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/20—Magnetic deflection
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205—Device types
    • H01J49/421—Mass filters, i.e. deviating unwanted ions without trapping

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
SG11201509562TA 2013-08-30 2014-08-29 Analytical device SG11201509562TA (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2013180493 2013-08-30
JP2013180483 2013-08-30
PCT/JP2014/004450 WO2015029449A1 (en) 2013-08-30 2014-08-29 Analytical device

Publications (1)

Publication Number Publication Date
SG11201509562TA true SG11201509562TA (en) 2015-12-30

Family

ID=52586037

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11201509562TA SG11201509562TA (en) 2013-08-30 2014-08-29 Analytical device

Country Status (6)

Country Link
US (3) US9666422B2 (en)
EP (1) EP3041027A4 (en)
JP (2) JP6059814B2 (en)
CN (1) CN105493228B (en)
SG (1) SG11201509562TA (en)
WO (1) WO2015029449A1 (en)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6059814B2 (en) * 2013-08-30 2017-01-11 アトナープ株式会社 Analysis equipment
WO2016054402A2 (en) * 2014-10-02 2016-04-07 908 Devices Inc. Mass spectrometry by detecting positively and negatively charged particles
WO2017086393A1 (en) 2015-11-17 2017-05-26 アトナープ株式会社 Analysis device and control method therefor
JP6926544B2 (en) * 2016-08-05 2021-08-25 株式会社リコー Cleaning air creation device and measurement system
CN109844515B (en) 2016-10-04 2022-06-17 Atonarp株式会社 System and method for accurately quantifying composition of target sample
WO2018097129A1 (en) 2016-11-23 2018-05-31 Atonarp Inc. System and method for determining set of mass to charge ratios for set of gases
WO2019138977A1 (en) * 2018-01-09 2019-07-18 Atonarp Inc. System and method for optimizing peak shapes
JP7314000B2 (en) * 2019-09-19 2023-07-25 キヤノンアネルバ株式会社 Electron generator and ionization vacuum gauge
US11728149B2 (en) 2020-08-26 2023-08-15 Waters Technologies Ireland Limited Methods, mediums, and systems for selecting values for parameters when tuning a mass spectrometry apparatus
US11658020B2 (en) * 2020-11-24 2023-05-23 Inficon, Inc. Ion source assembly with multiple ionization volumes for use in a mass spectrometer

Family Cites Families (44)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3566674A (en) * 1967-11-29 1971-03-02 Viktro Lvovich Talroze Device for analyzing gas mixtures by a combination of a chromatographic column and a mass spectrometer
US3946229A (en) * 1974-03-29 1976-03-23 The Bendix Corporation Gain control for a quadrupole mass spectrometer
US4016421A (en) * 1975-02-13 1977-04-05 E. I. Du Pont De Nemours And Company Analytical apparatus with variable energy ion beam source
JPS5333689A (en) * 1976-09-10 1978-03-29 Hitachi Ltd Composite ion source for mass spectrometer
GB1593998A (en) * 1977-11-29 1981-07-22 California Inst Of Techn Mass spectrometer analysis system
JPS60152949A (en) * 1984-01-23 1985-08-12 Toshiba Corp Ion detector of mass spectrometer
JPS6290980A (en) 1985-06-13 1987-04-25 Jeol Ltd Ion detecting element and ion detecting array
US4973841A (en) * 1990-02-02 1990-11-27 Genus, Inc. Precision ultra-sensitive trace detector for carbon-14 when it is at concentration close to that present in recent organic materials
US5077470A (en) 1991-01-11 1991-12-31 Jeol Ltd. Mass spectrometer
JPH05135734A (en) * 1991-11-08 1993-06-01 Jeol Ltd Surface analyzer with ion source
WO1999031707A1 (en) * 1997-12-16 1999-06-24 Stephen Douglas Fuerstenau Method and apparatus for detection of charge on ions and particles
GB2349270B (en) 1999-04-15 2002-02-13 Hitachi Ltd Mass analysis apparatus and method for mass analysis
JP2002071821A (en) 2000-08-25 2002-03-12 Inst Of Physical & Chemical Res Charged particle detecting device
WO2003102537A2 (en) * 2002-05-31 2003-12-11 Waters Investments Limited A high speed combination multi-mode ionization source for mass spectrometers
EP1509943A2 (en) * 2002-05-31 2005-03-02 Thermo Finnigan LLC Mass spectrometer with improved mass accuracy
US6646257B1 (en) 2002-09-18 2003-11-11 Agilent Technologies, Inc. Multimode ionization source
US20050080578A1 (en) * 2003-10-10 2005-04-14 Klee Matthew S. Mass spectrometry spectral correction
US20050080571A1 (en) * 2003-10-10 2005-04-14 Klee Matthew S. Mass spectrometry performance enhancement
GB0327241D0 (en) * 2003-11-21 2003-12-24 Gv Instr Ion detector
US7498585B2 (en) * 2006-04-06 2009-03-03 Battelle Memorial Institute Method and apparatus for simultaneous detection and measurement of charged particles at one or more levels of particle flux for analysis of same
JP2006221876A (en) * 2005-02-08 2006-08-24 Gv Instruments Ltd Ion detector, mass spectrometer having the same, and method for operating ion detector
WO2007083403A1 (en) 2006-01-20 2007-07-26 Shimadzu Corporation Quadrupole mass spectroscope
US7476855B2 (en) * 2006-09-19 2009-01-13 Axcelis Technologies, Inc. Beam tuning with automatic magnet pole rotation for ion implanters
GB0704764D0 (en) * 2007-03-12 2007-04-18 Electrophoretics Ltd Isobarically labelled reagents and methods of their use
JP5087079B2 (en) 2007-04-13 2012-11-28 株式会社堀場エステック Gas analyzer
US20090108191A1 (en) * 2007-10-30 2009-04-30 George Yefchak Mass Spectrometer gain adjustment using ion ratios
US8426805B2 (en) * 2008-02-05 2013-04-23 Thermo Finnigan Llc Method and apparatus for response and tune locking of a mass spectrometer
WO2009141847A1 (en) * 2008-05-20 2009-11-26 株式会社島津製作所 Atmospheric pressure ionization mass analyzer
JP2010177120A (en) 2009-01-30 2010-08-12 Ulvac Japan Ltd Ion detector and quadrupole mass spectrometer equipped with the same, and faraday cup
CN102326073B (en) * 2009-03-05 2013-11-13 株式会社日立高新技术 Analysis apparatus
FR2943173B1 (en) 2009-03-11 2016-03-18 Alcatel Lucent IONIZATION CELL FOR MASS SPECTROMETER AND CORRESPONDING LEAK DETECTOR
US8648293B2 (en) * 2009-07-08 2014-02-11 Agilent Technologies, Inc. Calibration of mass spectrometry systems
US8389929B2 (en) * 2010-03-02 2013-03-05 Thermo Finnigan Llc Quadrupole mass spectrometer with enhanced sensitivity and mass resolving power
JP5454311B2 (en) * 2010-04-02 2014-03-26 株式会社島津製作所 MS / MS mass spectrometer
WO2011146269A1 (en) * 2010-05-21 2011-11-24 Waters Technologies Corporation Techniques for automated parameter adjustment using ion signal intensity feedback
JP5316481B2 (en) * 2010-06-11 2013-10-16 株式会社島津製作所 Mass spectrometer
JP5454484B2 (en) 2011-01-31 2014-03-26 株式会社島津製作所 Triple quadrupole mass spectrometer
EP2685487B1 (en) * 2011-03-11 2018-05-09 Shimadzu Corporation Mass spectrometer
JP5771456B2 (en) * 2011-06-24 2015-09-02 株式会社日立ハイテクノロジーズ Mass spectrometry method
US9040907B2 (en) * 2011-10-31 2015-05-26 Mks Instruments, Inc. Method and apparatus for tuning an electrostatic ion trap
GB201204723D0 (en) * 2012-03-19 2012-05-02 Micromass Ltd Improved time of flight quantitation using alternative characteristic ions
US8704162B1 (en) * 2012-12-21 2014-04-22 Shimadzu Corporation Mass spectrometer
EP2986980B1 (en) * 2013-04-15 2020-05-06 Thermo Fisher Scientific (Bremen) GmbH Gas inlet system for isotope ratio analyser
JP6059814B2 (en) * 2013-08-30 2017-01-11 アトナープ株式会社 Analysis equipment

Also Published As

Publication number Publication date
US20170178881A1 (en) 2017-06-22
US9666422B2 (en) 2017-05-30
WO2015029449A1 (en) 2015-03-05
CN105493228A (en) 2016-04-13
EP3041027A4 (en) 2017-04-12
CN105493228B (en) 2017-11-14
US20180197725A1 (en) 2018-07-12
JP6059814B2 (en) 2017-01-11
JP6419765B2 (en) 2018-11-07
JPWO2015029449A1 (en) 2017-03-02
US10366871B2 (en) 2019-07-30
EP3041027A1 (en) 2016-07-06
JP2017045736A (en) 2017-03-02
US20160172170A1 (en) 2016-06-16

Similar Documents

Publication Publication Date Title
IL256021B (en) Walker-assist device
GB201304738D0 (en) Sampling Device
EP2986530A4 (en) Novel device
SG11201509562TA (en) Analytical device
EP2982438A4 (en) Pipette device
EP2988582A4 (en) Substrate-clamp device
GB201317499D0 (en) Naso-Oral Device
GB201314474D0 (en) MOS-Bipolar device
EP2947000A4 (en) Airship-mooring device
IL227858A0 (en) Device
GB201315649D0 (en) Device
GB201310610D0 (en) Object-handling device
GB201303718D0 (en) Device
GB201315508D0 (en) State-changeable device
LU92261B1 (en) Sinterstrand-charging device
GB201312493D0 (en) Stopperr device
GB201307466D0 (en) Device
HK1201056A1 (en) Bend-breaking device
GB201322360D0 (en) Grippling device
GB201316749D0 (en) Device
GB201311454D0 (en) Envelope-outlining device
IL245207A0 (en) Walker-assist device
GB201406464D0 (en) Device
GB201321566D0 (en) Box-outlining device
GB201320449D0 (en) Device