SG11201506394WA - Measurement of focal points and other features in optical systems - Google Patents

Measurement of focal points and other features in optical systems

Info

Publication number
SG11201506394WA
SG11201506394WA SG11201506394WA SG11201506394WA SG11201506394WA SG 11201506394W A SG11201506394W A SG 11201506394WA SG 11201506394W A SG11201506394W A SG 11201506394WA SG 11201506394W A SG11201506394W A SG 11201506394WA SG 11201506394W A SG11201506394W A SG 11201506394WA
Authority
SG
Singapore
Prior art keywords
measurement
features
optical systems
focal points
focal
Prior art date
Application number
SG11201506394WA
Inventor
Matthias Maluck
Peter Roentgen
Original Assignee
Heptagon Micro Optics Pte Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Heptagon Micro Optics Pte Ltd filed Critical Heptagon Micro Optics Pte Ltd
Publication of SG11201506394WA publication Critical patent/SG11201506394WA/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0228—Testing optical properties by measuring refractive power
    • G01M11/0235—Testing optical properties by measuring refractive power by measuring multiple properties of lenses, automatic lens meters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0237—Adjustable, e.g. focussing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0208—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using focussing or collimating elements, e.g. lenses or mirrors; performing aberration correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0207—Details of measuring devices
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0064—Optical details of the image generation multi-spectral or wavelength-selective arrangements, e.g. wavelength fan-out, chromatic profiling
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
    • G02B7/02—Mountings, adjusting means, or light-tight connections, for optical elements for lenses
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
    • G02B7/02—Mountings, adjusting means, or light-tight connections, for optical elements for lenses
    • G02B7/04—Mountings, adjusting means, or light-tight connections, for optical elements for lenses with mechanism for focusing or varying magnification
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
    • G02B7/28—Systems for automatic generation of focusing signals

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Measurement Of Optical Distance (AREA)
  • Microscoopes, Condenser (AREA)
  • Automatic Focus Adjustment (AREA)
SG11201506394WA 2013-02-28 2014-02-18 Measurement of focal points and other features in optical systems SG11201506394WA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201361770755P 2013-02-28 2013-02-28
PCT/SG2014/000061 WO2014133455A1 (en) 2013-02-28 2014-02-18 Measurement of focal points and other features in optical systems

Publications (1)

Publication Number Publication Date
SG11201506394WA true SG11201506394WA (en) 2015-09-29

Family

ID=51428594

Family Applications (2)

Application Number Title Priority Date Filing Date
SG11201506394WA SG11201506394WA (en) 2013-02-28 2014-02-18 Measurement of focal points and other features in optical systems
SG10201706868WA SG10201706868WA (en) 2013-02-28 2014-02-18 Measurement of focal points and other features in optical systems

Family Applications After (1)

Application Number Title Priority Date Filing Date
SG10201706868WA SG10201706868WA (en) 2013-02-28 2014-02-18 Measurement of focal points and other features in optical systems

Country Status (5)

Country Link
US (1) US9945756B2 (en)
CN (1) CN105103027B (en)
SG (2) SG11201506394WA (en)
TW (1) TWI659201B (en)
WO (1) WO2014133455A1 (en)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102014212412A1 (en) * 2014-06-27 2015-12-31 Siemens Aktiengesellschaft Distance measuring method and distance measuring device
US20160292744A1 (en) * 2015-03-31 2016-10-06 Yahoo! Inc. Smart billboards
US9939605B2 (en) * 2015-08-06 2018-04-10 Qualcomm Incorporated Submicron wafer alignment
US10048473B2 (en) 2015-08-06 2018-08-14 Qualcomm Incorporated Submicron wafer alignment
US10261344B2 (en) * 2016-06-30 2019-04-16 Johnson & Johnson Vision Care, Inc. Methods for forming variable optic ophthalmic devices including shaped liquid crystal elements
CN107113421B (en) * 2016-08-09 2018-07-06 深圳市瑞立视多媒体科技有限公司 The detection method and device of a kind of optical system imaging quality
JP6819362B2 (en) * 2017-03-02 2021-01-27 オムロン株式会社 Confocal measuring device

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4914227B2 (en) 2007-01-16 2012-04-11 キヤノン株式会社 Optical device
CN101261347A (en) 2007-03-09 2008-09-10 鸿富锦精密工业（深圳）有限公司 Camera module group and method of manufacture
CN101276031A (en) 2007-03-29 2008-10-01 鸿富锦精密工业（深圳）有限公司 Method for manufacturing lens cone and lens module using the same
US7535556B2 (en) * 2007-05-31 2009-05-19 Genetix Limited Methods and apparatus for optical analysis of samples in biological sample containers
JP5063224B2 (en) 2007-07-03 2012-10-31 キヤノン株式会社 Projection lens and image projection apparatus
EP2314982B1 (en) * 2009-10-20 2020-12-02 Mitutoyo Corporation Method and apparatus for determining the height of a number of spatial positions on a sample defining a profile of a surface through white light interferometry
TWI547730B (en) 2010-08-17 2016-09-01 新加坡恒立私人有限公司 Method of manufacturing a plurality of optical devices for cameras, assembly comprising a plurality of optical devices, and assembly comprising a plurality of cameras containing optical devices
JP6193218B2 (en) 2011-05-20 2017-09-06 ユニベルシタート ポリテクニカ デ カタルーニャ Method and apparatus for non-contact measurement of surfaces
CN103066080B (en) 2011-10-21 2016-02-03 奇景光电股份有限公司 The manufacture method of light sensing module
CN102645322B (en) 2012-05-08 2014-07-16 北京理工大学 Spherical aberration measurement method of differential confocal system

Also Published As

Publication number Publication date
CN105103027B (en) 2018-02-23
SG10201706868WA (en) 2017-09-28
CN105103027A (en) 2015-11-25
US9945756B2 (en) 2018-04-17
WO2014133455A1 (en) 2014-09-04
TW201443412A (en) 2014-11-16
US20160011075A1 (en) 2016-01-14
TWI659201B (en) 2019-05-11

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