SG11201406561XA - Test probe assembly and related methods - Google Patents

Test probe assembly and related methods

Info

Publication number
SG11201406561XA
SG11201406561XA SG11201406561XA SG11201406561XA SG11201406561XA SG 11201406561X A SG11201406561X A SG 11201406561XA SG 11201406561X A SG11201406561X A SG 11201406561XA SG 11201406561X A SG11201406561X A SG 11201406561XA SG 11201406561X A SG11201406561X A SG 11201406561XA
Authority
SG
Singapore
Prior art keywords
probe assembly
related methods
test probe
test
methods
Prior art date
Application number
SG11201406561XA
Inventor
Valts Treibergs
Aaron Magnuson
Sergey Yakushev
Scott Hanson
Original Assignee
Capital Formation Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Capital Formation Inc filed Critical Capital Formation Inc
Publication of SG11201406561XA publication Critical patent/SG11201406561XA/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0416—Connectors, terminals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06705—Apparatus for holding or moving single probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R3/00—Apparatus or processes specially adapted for the manufacture or maintenance of measuring instruments, e.g. of probe tips
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00—Metal working
    • Y10T29/49—Method of mechanical manufacture
    • Y10T29/49002—Electrical device making
    • Y10T29/49117—Conductor or circuit manufacturing
    • Y10T29/49119—Brush

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
SG11201406561XA 2012-04-13 2013-03-14 Test probe assembly and related methods SG11201406561XA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201261624083P 2012-04-13 2012-04-13
PCT/US2013/031240 WO2013154738A1 (en) 2012-04-13 2013-03-14 Test probe assembly and related methods

Publications (1)

Publication Number Publication Date
SG11201406561XA true SG11201406561XA (en) 2014-11-27

Family

ID=48045061

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11201406561XA SG11201406561XA (en) 2012-04-13 2013-03-14 Test probe assembly and related methods

Country Status (7)

Country Link
US (1) US9829506B2 (en)
EP (1) EP2836847B1 (en)
JP (1) JP6230595B2 (en)
MY (1) MY176424A (en)
PT (1) PT2836847T (en)
SG (1) SG11201406561XA (en)
WO (1) WO2013154738A1 (en)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI573332B (en) * 2014-07-23 2017-03-01 鴻騰精密科技股份有限公司 Electric connector and contacts thereof
US20180095110A1 (en) * 2016-09-30 2018-04-05 Xcerra Corporation Compact testing system
SG11201903814UA (en) * 2016-11-30 2019-05-30 Nidec Read Corp Contact terminal, inspection jig, and inspection device
JP1592871S (en) * 2017-02-10 2017-12-11
USD869305S1 (en) * 2017-02-10 2019-12-10 Kabushiki Kaisha Nihon Micronics Probe pin
JP1626668S (en) * 2018-02-02 2019-03-18
JP1623279S (en) * 2018-02-02 2019-01-28
JP1622969S (en) * 2018-02-02 2019-01-28
JP1623280S (en) * 2018-02-02 2019-01-28
JP1622968S (en) * 2018-02-02 2019-01-28
JP1622970S (en) * 2018-02-02 2019-01-28
JP1626667S (en) * 2018-02-02 2019-03-18
USD873161S1 (en) * 2018-02-02 2020-01-21 Kabushiki Kaisha Nihon Micronics Electric contact
WO2020217816A1 (en) 2019-04-23 2020-10-29 株式会社ヨコオ Contact probe
CN113009196B (en) * 2021-03-02 2022-03-18 上海捷策创电子科技有限公司 Probe for chip test and chip test device
US11387587B1 (en) * 2021-03-13 2022-07-12 Plastronics Socket Partners, Ltd. Self-retained slider contact pin
US11906576B1 (en) 2021-05-04 2024-02-20 Johnstech International Corporation Contact assembly array and testing system having contact assembly array
US11867752B1 (en) 2021-05-13 2024-01-09 Johnstech International Corporation Contact assembly and kelvin testing system having contact assembly
USD1015282S1 (en) * 2022-02-01 2024-02-20 Johnstech International Corporation Spring pin tip

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5936421A (en) * 1994-10-11 1999-08-10 Virginia Panel Corporation Coaxial double-headed spring contact probe assembly and coaxial surface contact for engagement therewith
JP4060919B2 (en) * 1997-11-28 2008-03-12 富士通株式会社 Electrical connection device, contact manufacturing method, and semiconductor test method
JP2002501289A (en) * 1998-01-05 2002-01-15 ライカ エレクトロニクス インターナショナル、 インコーポレイテッド Coaxial contact assembly device
US6506082B1 (en) * 2001-12-21 2003-01-14 Interconnect Devices, Inc. Electrical contact interface
US6746252B1 (en) * 2002-08-01 2004-06-08 Plastronics Socket Partners, L.P. High frequency compression mount receptacle with lineal contact members
US6967492B2 (en) * 2003-11-26 2005-11-22 Asm Assembly Automation Ltd. Spring contact probe device for electrical testing
KR101012712B1 (en) * 2005-06-10 2011-02-09 델라웨어 캐피탈 포메이션, 인코포레이티드 Compliant electrical interconnect and electrical contact probe
JP4999079B2 (en) * 2007-04-10 2012-08-15 サンユー工業株式会社 probe
US7862391B2 (en) * 2007-09-18 2011-01-04 Delaware Capital Formation, Inc. Spring contact assembly
DE102008023761B9 (en) * 2008-05-09 2012-11-08 Feinmetall Gmbh Electrical contact element for contact contacting of electrical specimens and corresponding contacting arrangement
US8105119B2 (en) * 2009-01-30 2012-01-31 Delaware Capital Formation, Inc. Flat plunger round barrel test probe
WO2011036800A1 (en) 2009-09-28 2011-03-31 株式会社日本マイクロニクス Contactor and electrical connection device
US8710856B2 (en) * 2010-01-15 2014-04-29 LTX Credence Corporation Terminal for flat test probe
JPWO2011096067A1 (en) * 2010-02-05 2013-06-10 株式会社日本マイクロニクス Contactor and electrical connection device
JP5352525B2 (en) * 2010-04-28 2013-11-27 日本航空電子工業株式会社 Probe pin contact, probe pin, and connection jig for electronic devices
TWM393066U (en) * 2010-05-06 2010-11-21 Hon Hai Prec Ind Co Ltd Electrical connector
JP5618729B2 (en) 2010-09-24 2014-11-05 シチズンセイミツ株式会社 Contact probe and electronic circuit test apparatus using the same

Also Published As

Publication number Publication date
WO2013154738A1 (en) 2013-10-17
PT2836847T (en) 2016-08-23
JP2015516571A (en) 2015-06-11
EP2836847A1 (en) 2015-02-18
US20150070040A1 (en) 2015-03-12
JP6230595B2 (en) 2017-11-15
MY176424A (en) 2020-08-07
EP2836847B1 (en) 2016-05-18
US9829506B2 (en) 2017-11-28

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