SG11201403446XA - Sensor for measuring surface non-uniformity - Google Patents

Sensor for measuring surface non-uniformity

Info

Publication number
SG11201403446XA
SG11201403446XA SG11201403446XA SG11201403446XA SG11201403446XA SG 11201403446X A SG11201403446X A SG 11201403446XA SG 11201403446X A SG11201403446X A SG 11201403446XA SG 11201403446X A SG11201403446X A SG 11201403446XA SG 11201403446X A SG11201403446X A SG 11201403446XA
Authority
SG
Singapore
Prior art keywords
uniformity
sensor
measuring surface
surface non
measuring
Prior art date
Application number
SG11201403446XA
Inventor
Yi Qiao
Jack W Lai
Evan J Ribnick
David L Hofeldt
Original Assignee
3M Innovative Properties Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 3M Innovative Properties Co filed Critical 3M Innovative Properties Co
Publication of SG11201403446XA publication Critical patent/SG11201403446XA/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/303—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/061—Sources
    • G01N2201/06113—Coherent sources; lasers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/12—Circuits of general importance; Signal processing

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
SG11201403446XA 2011-12-20 2012-12-11 Sensor for measuring surface non-uniformity SG11201403446XA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201161578174P 2011-12-20 2011-12-20
PCT/US2012/068935 WO2013096003A1 (en) 2011-12-20 2012-12-11 Sensor for measuring surface non-uniformity

Publications (1)

Publication Number Publication Date
SG11201403446XA true SG11201403446XA (en) 2014-10-30

Family

ID=48669363

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11201403446XA SG11201403446XA (en) 2011-12-20 2012-12-11 Sensor for measuring surface non-uniformity

Country Status (8)

Country Link
US (1) US20140362371A1 (en)
EP (1) EP2795250A4 (en)
JP (1) JP2015503110A (en)
KR (1) KR20140105593A (en)
CN (1) CN104797906A (en)
BR (1) BR112014014823A2 (en)
SG (1) SG11201403446XA (en)
WO (1) WO2013096003A1 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106970049B (en) * 2017-05-15 2024-01-02 中国工程物理研究院激光聚变研究中心 Transmission distribution measuring system and method
CN108007397A (en) * 2018-01-09 2018-05-08 常州华达科捷光电仪器有限公司 A kind of Laser Measuring Barebone
CN109870128B (en) * 2019-03-19 2022-06-28 青岛科技大学 Micro-nano structure morphology real-time monitoring optical path system in ink-jet printing

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2808359C3 (en) * 1978-02-27 1980-09-04 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Finding device for holes in lanes
DE3334357C2 (en) * 1983-09-22 1986-04-10 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Optical fault locator for railways
JPH0641923B2 (en) * 1988-09-20 1994-06-01 株式会社東芝 Surface inspection device
US5966212A (en) * 1996-07-18 1999-10-12 Pixel Systems, Inc. High-speed, high-resolution, large area inspection using multiple optical fourier transform cells
JP2000180373A (en) * 1998-12-15 2000-06-30 Hoya Corp Method and apparatus for inspection of defect
US7830522B2 (en) * 2002-09-25 2010-11-09 New York University Method and apparatus for determining reflectance data of a subject
CN1247956C (en) * 2002-12-25 2006-03-29 合肥工业大学 Parallel astigmatic three-dimensional focusing detecting method and apparatus thereof
US7292333B2 (en) * 2003-06-24 2007-11-06 Corning Incorporated Optical interrogation system and method for 2-D sensor arrays
KR100662904B1 (en) * 2004-03-09 2007-01-02 삼성전자주식회사 The method and device for discriminating the deflecting disc
CN101171090B (en) * 2005-03-09 2010-06-16 3M创新有限公司 Apparatus and method for making microreplicated article
US7623251B2 (en) * 2006-04-07 2009-11-24 Amo Wavefront Sciences, Llc. Geometric measurement system and method of measuring a geometric characteristic of an object
CN1971232B (en) * 2006-12-13 2010-06-16 中国科学院光电技术研究所 Hartmann wavefront sensor with active alignment function and detection method thereof
KR101493115B1 (en) * 2007-06-19 2015-02-12 쓰리엠 이노베이티브 프로퍼티즈 컴파니 Systems and methods for indicating the position of a web
US7777872B2 (en) * 2007-07-31 2010-08-17 Alcon Research, Ltd. Method of measuring diffractive lenses
WO2009085004A1 (en) * 2007-12-28 2009-07-09 Rolling Optics Ab Method of producing a microstructured product
WO2011123485A2 (en) * 2010-04-01 2011-10-06 3M Innovative Properties Company Precision control of web material having micro-replicated lens array
CN102226738B (en) * 2011-03-25 2013-03-13 宁波大学 Infrared glass non-uniformity detection method

Also Published As

Publication number Publication date
BR112014014823A2 (en) 2017-06-13
US20140362371A1 (en) 2014-12-11
KR20140105593A (en) 2014-09-01
WO2013096003A1 (en) 2013-06-27
JP2015503110A (en) 2015-01-29
CN104797906A (en) 2015-07-22
EP2795250A4 (en) 2015-09-16
EP2795250A1 (en) 2014-10-29

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