SG10201500118XA - System and method for detecting a defective sample - Google Patents

System and method for detecting a defective sample

Info

Publication number
SG10201500118XA
SG10201500118XA SG10201500118XA SG10201500118XA SG10201500118XA SG 10201500118X A SG10201500118X A SG 10201500118XA SG 10201500118X A SG10201500118X A SG 10201500118XA SG 10201500118X A SG10201500118X A SG 10201500118XA SG 10201500118X A SG10201500118X A SG 10201500118XA
Authority
SG
Singapore
Prior art keywords
detecting
defective sample
defective
sample
Prior art date
Application number
SG10201500118XA
Inventor
Dmitry Isakov
Original Assignee
Agency Science Tech & Res
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agency Science Tech & Res filed Critical Agency Science Tech & Res
Priority to SG10201500118XA priority Critical patent/SG10201500118XA/en
Publication of SG10201500118XA publication Critical patent/SG10201500118XA/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00—Investigating or analyzing materials by the use of thermal means
    • G01N25/72—Investigating presence of flaws
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/0066—Radiation pyrometry, e.g. infrared or optical thermometry for hot spots detection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02—Constructional details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02—Constructional details
    • G01J5/07—Arrangements for adjusting the solid angle of collected radiation, e.g. adjusting or orienting field of view, tracking position or encoding angular position
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02—Constructional details
    • G01J5/08—Optical arrangements
    • G01J5/0896—Optical arrangements using a light source, e.g. for illuminating a surface
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J2005/0077—Imaging
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/48—Thermography; Techniques using wholly visual means
SG10201500118XA 2014-01-16 2015-01-07 System and method for detecting a defective sample SG10201500118XA (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
SG10201500118XA SG10201500118XA (en) 2014-01-16 2015-01-07 System and method for detecting a defective sample

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
SG2014003529 2014-01-16
SG10201500118XA SG10201500118XA (en) 2014-01-16 2015-01-07 System and method for detecting a defective sample

Publications (1)

Publication Number Publication Date
SG10201500118XA true SG10201500118XA (en) 2015-08-28

Family

ID=53521153

Family Applications (2)

Application Number Title Priority Date Filing Date
SG10201806086TA SG10201806086TA (en) 2014-01-16 2015-01-07 System and method for detecting a defective sample
SG10201500118XA SG10201500118XA (en) 2014-01-16 2015-01-07 System and method for detecting a defective sample

Family Applications Before (1)

Application Number Title Priority Date Filing Date
SG10201806086TA SG10201806086TA (en) 2014-01-16 2015-01-07 System and method for detecting a defective sample

Country Status (2)

Country Link
US (1) US10156532B2 (en)
SG (2) SG10201806086TA (en)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102014218136B4 (en) * 2014-09-10 2019-07-18 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Thermographic examination device and method for the non-destructive examination of a near-surface structure on a test object
JP5866585B1 (en) * 2015-05-20 2016-02-17 パナソニックＩｐマネジメント株式会社 Light receiving sensor, air conditioner and electronic cooker using the same
US9709443B2 (en) 2015-12-07 2017-07-18 The Boeing Company Detecting inclusions and disbonds in green material repairs with thermography
US10119866B2 (en) 2015-12-07 2018-11-06 The Boeing Company In-process monitoring, automated decision-making, and process control for composite manufacturing using part-referenced ply-by-ply infrared thermography and other non-contact non-destructive inspection
US10260953B2 (en) * 2016-08-11 2019-04-16 The Boeing Company Applique and method for thermographic inspection
JP6924504B2 (en) * 2019-09-30 2021-08-25 株式会社岩崎電機製作所 Mounting circuit board inspection device and mounting circuit board inspection method
US20230052634A1 (en) * 2021-05-28 2023-02-16 Wichita State University Joint autonomous repair verification and inspection system
US11650112B1 (en) * 2022-10-20 2023-05-16 Hebei University Of Technology Crack propagation and deformation measurement method coupling infrared and visible light images

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09138205A (en) * 1995-11-15 1997-05-27 Agency Of Ind Science & Technol Detection method for flaw of material by infrared thermography
US7083327B1 (en) * 1999-04-06 2006-08-01 Thermal Wave Imaging, Inc. Method and apparatus for detecting kissing unbond defects
WO2001009597A1 (en) * 1999-07-28 2001-02-08 Microcal, Llc Pressure perturbation calorimetry instruments and methods
EP1258136B8 (en) 1999-12-02 2009-04-22 Thermal Wave Imaging, Inc. Method and system for reference-free thermographic detection of subsurface defects using compressed image data
US20050002435A1 (en) * 2001-11-19 2005-01-06 Toshimasa Hashimoto Method for thermal analysis and system for thermal analysis
FR2887029B1 (en) * 2005-06-09 2007-08-03 Agence Spatiale Europeenne APPARATUS FOR NON-CONTACT TEMPERATURE MEASUREMENT OF SAMPLES OF VACUUM MATERIALS
US7365330B1 (en) 2006-09-18 2008-04-29 Uchicago Argonne, Llc Method for thermal tomography of thermal effusivity from pulsed thermal imaging
GB2442744B (en) * 2006-10-12 2009-07-08 Rolls Royce Plc A test apparatus and method

Also Published As

Publication number Publication date
SG10201806086TA (en) 2018-08-30
US20150198547A1 (en) 2015-07-16
US10156532B2 (en) 2018-12-18

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