SE9402604D0 - Förfarande och system vid kretskort - Google Patents

Förfarande och system vid kretskort

Info

Publication number
SE9402604D0
SE9402604D0 SE9402604A SE9402604A SE9402604D0 SE 9402604 D0 SE9402604 D0 SE 9402604D0 SE 9402604 A SE9402604 A SE 9402604A SE 9402604 A SE9402604 A SE 9402604A SE 9402604 D0 SE9402604 D0 SE 9402604D0
Authority
SE
Sweden
Prior art keywords
measuring device
pct
computer
test object
stored
Prior art date
Application number
SE9402604A
Other languages
English (en)
Other versions
SE502575C2 (sv
SE9402604L (sv
Inventor
Anders Eriksson
Jan Eriksson
Per Oehman
Original Assignee
Anders Eriksson
Jan Eriksson
Oehman
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Anders Eriksson, Jan Eriksson, Oehman filed Critical Anders Eriksson
Priority to SE9402604A priority Critical patent/SE9402604L/sv
Publication of SE9402604D0 publication Critical patent/SE9402604D0/sv
Priority to DE69533258T priority patent/DE69533258T2/de
Priority to AT95926587T priority patent/ATE271228T1/de
Priority to AU30910/95A priority patent/AU3091095A/en
Priority to US08/776,314 priority patent/US5844414A/en
Priority to PCT/SE1995/000901 priority patent/WO1996004562A1/en
Priority to EP95926587A priority patent/EP0772784B1/en
Publication of SE502575C2 publication Critical patent/SE502575C2/sv
Publication of SE9402604L publication Critical patent/SE9402604L/sv
Priority to NO19970363A priority patent/NO319991B1/no
Priority to FI970358A priority patent/FI109837B/sv

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06705—Apparatus for holding or moving single probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
    • G01R31/002—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing where the device under test is an electronic circuit

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Measurement Of Velocity Or Position Using Acoustic Or Ultrasonic Waves (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Automobile Manufacture Line, Endless Track Vehicle, Trailer (AREA)
  • Application Of Or Painting With Fluid Materials (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)
  • Vehicle Body Suspensions (AREA)
  • Geophysics And Detection Of Objects (AREA)
SE9402604A 1994-07-29 1994-07-29 Förfarande och system vid kretskort SE9402604L (sv)

Priority Applications (9)

Application Number Priority Date Filing Date Title
SE9402604A SE9402604L (sv) 1994-07-29 1994-07-29 Förfarande och system vid kretskort
EP95926587A EP0772784B1 (en) 1994-07-29 1995-07-31 A method of and a system for moving a measuring means above a test object
US08/776,314 US5844414A (en) 1994-07-29 1995-07-31 Method and a system for moving a measuring means above a test object
AT95926587T ATE271228T1 (de) 1994-07-29 1995-07-31 Verfahren und system zum bewegen eines messgerätes über einem testgegenstand
AU30910/95A AU3091095A (en) 1994-07-29 1995-07-31 A method and a system for moving a measuring means above a test object
DE69533258T DE69533258T2 (de) 1994-07-29 1995-07-31 Verfahren und system zum bewegen eines messgerätes über einem testgegenstand
PCT/SE1995/000901 WO1996004562A1 (en) 1994-07-29 1995-07-31 A method and a system for moving a measuring means above a test object
NO19970363A NO319991B1 (no) 1994-07-29 1997-01-28 Fremgangsmate og system for a bevege en maleinnretning over et testobjekt
FI970358A FI109837B (sv) 1994-07-29 1997-01-28 Förfarande och system för förskjutning av ett mätorgan över ett testobjekt

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE9402604A SE9402604L (sv) 1994-07-29 1994-07-29 Förfarande och system vid kretskort

Publications (3)

Publication Number Publication Date
SE9402604D0 true SE9402604D0 (sv) 1994-07-29
SE502575C2 SE502575C2 (sv) 1995-11-13
SE9402604L SE9402604L (sv) 1995-11-13

Family

ID=20394826

Family Applications (1)

Application Number Title Priority Date Filing Date
SE9402604A SE9402604L (sv) 1994-07-29 1994-07-29 Förfarande och system vid kretskort

Country Status (9)

Country Link
US (1) US5844414A (sv)
EP (1) EP0772784B1 (sv)
AT (1) ATE271228T1 (sv)
AU (1) AU3091095A (sv)
DE (1) DE69533258T2 (sv)
FI (1) FI109837B (sv)
NO (1) NO319991B1 (sv)
SE (1) SE9402604L (sv)
WO (1) WO1996004562A1 (sv)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20020033706A1 (en) * 2000-08-03 2002-03-21 Mehyar Khazei System method, and apparatus for field scanning
FR2871580B1 (fr) * 2004-06-09 2006-10-27 Inrets Localisation d'une source de rayonnement electromagnetique sur un equipement electrique
US7876276B1 (en) 2006-08-02 2011-01-25 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Antenna near-field probe station scanner
US8810460B2 (en) * 2009-11-05 2014-08-19 Atc Logistics & Electronics, Inc. Multidimensional RF test fixture and method for securing a wireless device for RF testing
CN104251966A (zh) * 2013-06-25 2014-12-31 鸿富锦精密工业（深圳）有限公司 自动化测量***及方法
CN111665403B (zh) * 2020-04-29 2022-12-23 中国电子产品可靠性与环境试验研究所（（工业和信息化部电子第五研究所）（中国赛宝实验室）） 层叠型电子元件的失效点定位方法、装置和***

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SE451913B (sv) * 1982-09-21 1987-11-02 Michael Grimsland Forfarande och anordning for metning av frekvensgang
JPH0775155B2 (ja) * 1985-08-20 1995-08-09 富士通株式会社 ストロボ電子ビーム装置
US4840496A (en) * 1988-02-23 1989-06-20 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Noncontact temperature pattern measuring device
US5066921A (en) * 1990-08-01 1991-11-19 General Dynamics, Electronics Division Radome diagnostic system
US5119017A (en) * 1990-10-12 1992-06-02 Westinghouse Electric Corp. Bandwidth analysis system and method
RU2014624C1 (ru) * 1991-04-30 1994-06-15 Геруни Сурен Парисович Стенд для измерения электромагнитного поля вокруг объекта
US5432523A (en) * 1993-08-20 1995-07-11 The United States Of America As Represented By The Secretary Of The Air Force Elliptical near field test facility
US5483068A (en) * 1994-01-07 1996-01-09 Moulton; Russell D. Use of IR (thermal) imaging for determining cell diagnostics

Also Published As

Publication number Publication date
ATE271228T1 (de) 2004-07-15
EP0772784A1 (en) 1997-05-14
FI970358A (sv) 1997-01-28
WO1996004562A1 (en) 1996-02-15
US5844414A (en) 1998-12-01
AU3091095A (en) 1996-03-04
FI109837B (sv) 2002-10-15
NO319991B1 (no) 2005-10-10
SE502575C2 (sv) 1995-11-13
DE69533258D1 (de) 2004-08-19
NO970363L (no) 1997-03-21
SE9402604L (sv) 1995-11-13
FI970358A0 (sv) 1997-01-28
DE69533258T2 (de) 2005-07-28
EP0772784B1 (en) 2004-07-14
NO970363D0 (no) 1997-01-28

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