SE9402155L - Adapter för användning vid en apparat för testning av kretskort - Google Patents
Adapter för användning vid en apparat för testning av kretskortInfo
- Publication number
- SE9402155L SE9402155L SE9402155A SE9402155A SE9402155L SE 9402155 L SE9402155 L SE 9402155L SE 9402155 A SE9402155 A SE 9402155A SE 9402155 A SE9402155 A SE 9402155A SE 9402155 L SE9402155 L SE 9402155L
- Authority
- SE
- Sweden
- Prior art keywords
- contact
- adapter
- test
- electrically conducting
- spots
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
- G01R1/07378—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate adapter, e.g. space transformers
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SE9402155A SE504286C2 (sv) | 1994-06-17 | 1994-06-17 | Adapter för användning vid en apparat för testning av kretskort |
EP95923630A EP0793905A1 (en) | 1994-06-17 | 1995-06-15 | Adapter for use in an apparatus for testing circuit cards |
PCT/SE1995/000728 WO1995035648A1 (en) | 1994-06-17 | 1995-06-15 | Adapter for use in an apparatus for testing circuit cards |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SE9402155A SE504286C2 (sv) | 1994-06-17 | 1994-06-17 | Adapter för användning vid en apparat för testning av kretskort |
Publications (3)
Publication Number | Publication Date |
---|---|
SE9402155D0 SE9402155D0 (sv) | 1994-06-17 |
SE9402155L true SE9402155L (sv) | 1995-12-18 |
SE504286C2 SE504286C2 (sv) | 1996-12-23 |
Family
ID=20394443
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SE9402155A SE504286C2 (sv) | 1994-06-17 | 1994-06-17 | Adapter för användning vid en apparat för testning av kretskort |
Country Status (3)
Country | Link |
---|---|
EP (1) | EP0793905A1 (sv) |
SE (1) | SE504286C2 (sv) |
WO (1) | WO1995035648A1 (sv) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5945836A (en) * | 1996-10-29 | 1999-08-31 | Hewlett-Packard Company | Loaded-board, guided-probe test fixture |
US6784675B2 (en) | 2002-06-25 | 2004-08-31 | Agilent Technologies, Inc. | Wireless test fixture adapter for printed circuit assembly tester |
DE10254520A1 (de) * | 2002-11-22 | 2004-06-09 | Bruno Ratzky | Verfahren zur einfachen Erstellung der Leitungsverbindungen und Erzielung von kleinsten Prüfrastern, auf kleinstem Raum, bei einem Prüfadapter bzw. einer Adaptereinrichtung |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3866119A (en) * | 1973-09-10 | 1975-02-11 | Probe Rite Inc | Probe head-probing machine coupling adaptor |
DE3038665C2 (de) * | 1980-10-13 | 1990-03-29 | Riba-Prüftechnik GmbH, 7801 Schallstadt | Prüfeinrichtung zum Überprüfen von mit Leiterbahnen versehenen Leiterplatten |
JPS6180067A (ja) * | 1984-09-21 | 1986-04-23 | インタ−ナショナル ビジネス マシ−ンズ コ−ポレ−ション | テスト・プロ−ブ装置 |
SE458005B (sv) * | 1987-11-16 | 1989-02-13 | Reinhold Strandberg | Foerfarande foer provning av kretskort samt apparat foer utfoerande av provningen |
-
1994
- 1994-06-17 SE SE9402155A patent/SE504286C2/sv not_active IP Right Cessation
-
1995
- 1995-06-15 EP EP95923630A patent/EP0793905A1/en not_active Withdrawn
- 1995-06-15 WO PCT/SE1995/000728 patent/WO1995035648A1/en not_active Application Discontinuation
Also Published As
Publication number | Publication date |
---|---|
EP0793905A1 (en) | 1997-09-10 |
SE9402155D0 (sv) | 1994-06-17 |
WO1995035648A1 (en) | 1995-12-28 |
SE504286C2 (sv) | 1996-12-23 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
SE8106000L (sv) | Provningsanordning | |
DK0920714T3 (da) | Elektrisk eller elektronisk apparat | |
ATE7186T1 (de) | Brueckenverbinder zum elektrischen verbinden paralleler stifte. | |
ATE137338T1 (de) | Testanordnung mit filmadaptor fuer leiterplatten | |
ATE172306T1 (de) | Vorrichtung zum elektronischen prüfen von leiterplatten mit kontaktpunkten in extrem feinem raster (1/20 bis 1/10 zoll) | |
ATE265050T1 (de) | Vorrichtung zum testen von leiterplatten | |
DE3065137D1 (en) | Electrical test probe for use in testing circuits on printed circuit boards and the like | |
CA2042047A1 (en) | A function unit | |
ATE45427T1 (de) | Adapter fuer ein leiterplattenpruefgeraet. | |
ATE287543T1 (de) | Testeinrichtung zum testen eines moduls für einen zum kontaktlosen kommunizieren vorgesehenen datenträger | |
EP0294925A3 (en) | Coplanarity testing device for surface mounted components | |
HK133996A (en) | Adapter for a device for electronic testing of printed circuit boards | |
SE9402155L (sv) | Adapter för användning vid en apparat för testning av kretskort | |
TW358885B (en) | Apparatus and method for testing non-componented printed circuit boards | |
CA1269758C (en) | ELECTRONIC CASSETTE VERIFICATION DEVICE | |
HUP9901931A2 (hu) | Berendezés nyomtatott áramköri lapok áramköreinek villamos vizsgálatára | |
MY115457A (en) | Structure of ic device interface unit | |
ATE49303T1 (de) | Einrichtung fuer die funktionspruefung integrierter schaltkreise. | |
KR960026523A (ko) | 반도체 시험장치의 핀 시험회로 | |
ATE69652T1 (de) | Vorrichtung zur selbsttaetigen ueberpruefung von auf flaechen zu montierenden komponenten. | |
DE50106269D1 (de) | Modul für eine prüfvorrichtung zum testen von leiterplatten | |
CA2141650A1 (en) | Marking system for printed circuit boards | |
ATE238560T1 (de) | Leiterplattenprüfvorrichtung | |
SE8704467D0 (sv) | Apparat for provning av kretskort | |
NZ306552A (en) | Testing printed circuit boards by passing them between opposed boards bearing test probes |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
NUG | Patent has lapsed |