Classifications

• • H—ELECTRICITY
  • H01—ELECTRIC ELEMENTS
  • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
  • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
  • H01L31/02—Details
  • H01L31/0203—Containers; Encapsulations, e.g. encapsulation of photodiodes
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
  • G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
  • G01D5/26—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light
  • G01D5/264—Mechanical constructional elements therefor ; Mechanical adjustment thereof
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
  • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
  • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
  • G01N21/15—Preventing contamination of the components of the optical system or obstruction of the light path

Landscapes

• Physics & Mathematics (AREA)
• General Physics & Mathematics (AREA)
• Engineering & Computer Science (AREA)
• Microelectronics & Electronic Packaging (AREA)
• Biochemistry (AREA)
• Pathology (AREA)
• Computer Hardware Design (AREA)
• Power Engineering (AREA)
• Health & Medical Sciences (AREA)
• Life Sciences & Earth Sciences (AREA)
• Chemical & Material Sciences (AREA)
• Analytical Chemistry (AREA)
• Condensed Matter Physics & Semiconductors (AREA)
• General Health & Medical Sciences (AREA)
• Immunology (AREA)
• Electromagnetism (AREA)
• Photometry And Measurement Of Optical Pulse Characteristics (AREA)
• Optical Measuring Cells (AREA)
• Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
• Paper Feeding For Electrophotography (AREA)
• Controlling Sheets Or Webs (AREA)
• Control Or Security For Electrophotography (AREA)
• Length Measuring Devices By Optical Means (AREA)
• Geophysics And Detection Of Objects (AREA)
• Lens Barrels (AREA)
• Switches Operated By Changes In Physical Conditions (AREA)

Applications Claiming Priority (1)

Publications (3)

Family

ID=12286459

Family Applications (1)

Country Status (4)

Families Citing this family (5)

Family Cites Families (16)

• 1987
  • 1987-02-27 JP JP1987029813U patent/JPH052831Y2/ja not_active Expired - Lifetime
• 1988
  • 1988-02-18 SE SE8800561A patent/SE506659C2/sv not_active IP Right Cessation
  • 1988-02-22 DE DE3805522A patent/DE3805522A1/de active Granted
  • 1988-02-26 US US07/160,769 patent/US4841144A/en not_active Expired - Fee Related

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