SE8702890L - Optiskt vinkelmaetdon - Google Patents

Optiskt vinkelmaetdon

Info

Publication number
SE8702890L
SE8702890L SE8702890A SE8702890A SE8702890L SE 8702890 L SE8702890 L SE 8702890L SE 8702890 A SE8702890 A SE 8702890A SE 8702890 A SE8702890 A SE 8702890A SE 8702890 L SE8702890 L SE 8702890L
Authority
SE
Sweden
Prior art keywords
pct
methodon
sec
interference pattern
date
Prior art date
Application number
SE8702890A
Other languages
Unknown language ( )
English (en)
Other versions
SE458153B (sv
SE8702890D0 (sv
Inventor
E Ordell
Original Assignee
Polymetric Ab
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Polymetric Ab filed Critical Polymetric Ab
Priority to SE8702890A priority Critical patent/SE458153B/sv
Publication of SE8702890D0 publication Critical patent/SE8702890D0/sv
Priority to US07/326,569 priority patent/US4969744A/en
Priority to JP63506025A priority patent/JPH02500860A/ja
Priority to EP88906202A priority patent/EP0323998A1/en
Priority to PCT/SE1988/000363 priority patent/WO1989000674A1/en
Publication of SE8702890L publication Critical patent/SE8702890L/sv
Publication of SE458153B publication Critical patent/SE458153B/sv

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
SE8702890A 1987-07-16 1987-07-16 Optiskt vinkelmaetdon SE458153B (sv)

Priority Applications (5)

Application Number Priority Date Filing Date Title
SE8702890A SE458153B (sv) 1987-07-16 1987-07-16 Optiskt vinkelmaetdon
US07/326,569 US4969744A (en) 1987-07-16 1988-06-30 Optical angle-measuring device
JP63506025A JPH02500860A (ja) 1987-07-16 1988-06-30 光学角度測定装置
EP88906202A EP0323998A1 (en) 1987-07-16 1988-06-30 An optical angle-measuring device
PCT/SE1988/000363 WO1989000674A1 (en) 1987-07-16 1988-06-30 An optical angle-measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE8702890A SE458153B (sv) 1987-07-16 1987-07-16 Optiskt vinkelmaetdon

Publications (3)

Publication Number Publication Date
SE8702890D0 SE8702890D0 (sv) 1987-07-16
SE8702890L true SE8702890L (sv) 1989-01-17
SE458153B SE458153B (sv) 1989-02-27

Family

ID=20369141

Family Applications (1)

Application Number Title Priority Date Filing Date
SE8702890A SE458153B (sv) 1987-07-16 1987-07-16 Optiskt vinkelmaetdon

Country Status (5)

Country Link
US (1) US4969744A (sv)
EP (1) EP0323998A1 (sv)
JP (1) JPH02500860A (sv)
SE (1) SE458153B (sv)
WO (1) WO1989000674A1 (sv)

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2254710B (en) * 1991-04-12 1994-01-26 Northern Telecom Europ Ltd Fabry-perot optical filters
GB2266366B (en) * 1992-04-16 1996-04-24 Rank Taylor Hobson Ltd Angle detection
TW538233B (en) 2000-05-03 2003-06-21 Zygo Corp Dynamic angle measuring interferometer and method for measuring differences between the angular direction of travel of light beams
US6674521B1 (en) 2000-05-12 2004-01-06 The Regents Of The University Of Michigan Optical method and system for rapidly measuring relative angular alignment of flat surfaces
WO2003036223A1 (en) * 2001-10-19 2003-05-01 Zygo Corporation Interferometers for measuring changes in optical beam direction
US7136169B2 (en) * 2002-10-31 2006-11-14 Cymer, Inc. Etalon testing system and process
DE102004014095B4 (de) * 2004-03-13 2005-12-22 Technische Universität Dresden Laser-Goniometer
US8451195B2 (en) * 2006-02-15 2013-05-28 Prysm, Inc. Servo-assisted scanning beam display systems using fluorescent screens
US8556430B2 (en) 2007-06-27 2013-10-15 Prysm, Inc. Servo feedback control based on designated scanning servo beam in scanning beam display systems with light-emitting screens
US8292809B2 (en) 2008-03-31 2012-10-23 Nellcor Puritan Bennett Llc Detecting chemical components from spectroscopic observations
CN101949690B (zh) * 2010-08-24 2012-08-22 中国科学院光电技术研究所 光学面形的检测装置及光学面形的检测方法
DE102012205380B4 (de) * 2012-04-02 2014-09-25 Carl Zeiss Industrielle Messtechnik Gmbh Verfahren und Anordnung zum Messen der relativen Ausrichtung von zueinander beweglichen Bauteilen einer Vorrichtung und Sensor für ein Koordinatenmessgerät
WO2015048993A1 (de) 2013-10-02 2015-04-09 Carl Zeiss Industrielle Messtechnik Gmbh Messen der relativen ausrichtung und/oder relativen lage von zueinander beweglichen bauteilen einer vorrichtung, insbesondere eines koordinatenmessgerätes
RU2599912C2 (ru) * 2014-01-30 2016-10-20 Федеральное государственное бюджетное образовательное учреждение высшего профессионального образования Московский государственный университет геодезии и картографии (МИИГАиК) Устройство для измерения изменения угловой координаты объекта в плоскости
AT515788B1 (de) * 2014-06-27 2015-12-15 Wögerbauer Johann Ing Vorrichtung zum Bestimmen des Winkels zwischen zwei ebenen Werkstückflächen
CN106092515B (zh) 2015-04-30 2019-09-20 清华大学 一种用法布里-珀罗标准具测量焦距和转角的方法
WO2017171042A1 (ja) 2016-03-31 2017-10-05 積水化学工業株式会社 ポリビニルアセタールアイオノマー樹脂フィルム及び合わせガラス
US11034137B2 (en) 2016-03-31 2021-06-15 Sekisui Chemical Co., Ltd. Interlayer film for laminated glass, and laminated glass
AT518637B1 (de) * 2016-08-24 2017-12-15 Keba Ag Vorrichtung zum Ausrichten eines Winkelmessgeräts
CN111238409A (zh) * 2020-02-28 2020-06-05 中国科学院上海技术物理研究所 一种高精度测量大角度光楔楔角的装置及方法
CN111238408A (zh) * 2020-02-28 2020-06-05 中国科学院上海技术物理研究所 一种快速测量平行平板平行度的装置和方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3782826A (en) * 1972-08-21 1974-01-01 Cutler Hammer Inc Method and apparatus for measuring rotational angles by measuring changes in optical beam path length
SU504080A1 (ru) * 1974-03-20 1976-02-25 Предприятие П/Я Р-6324 Интерференционный датчик измерени углов поворота объекта с отражающей поверхностью
GB2044920B (en) * 1979-01-27 1983-02-09 Barr & Stroud Ltd Optical interferometer
DE3271143D1 (en) * 1982-07-28 1986-06-19 Maihak Ag Process and device for an interferometric measurement of the linear displacement of an object with recognition of its direction of movement

Also Published As

Publication number Publication date
US4969744A (en) 1990-11-13
WO1989000674A1 (en) 1989-01-26
SE458153B (sv) 1989-02-27
JPH02500860A (ja) 1990-03-22
EP0323998A1 (en) 1989-07-19
SE8702890D0 (sv) 1987-07-16

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