SE8304820D0 - Forfarande och anordning for iakttagande av kvistar eller motsvarande i sagat virke - Google Patents

Forfarande och anordning for iakttagande av kvistar eller motsvarande i sagat virke

Info

Publication number
SE8304820D0
SE8304820D0 SE8304820A SE8304820A SE8304820D0 SE 8304820 D0 SE8304820 D0 SE 8304820D0 SE 8304820 A SE8304820 A SE 8304820A SE 8304820 A SE8304820 A SE 8304820A SE 8304820 D0 SE8304820 D0 SE 8304820D0
Authority
SE
Sweden
Prior art keywords
lumber
piece
square
procedure
application
Prior art date
Application number
SE8304820A
Other languages
English (en)
Other versions
SE460504B (sv
SE8304820L (sv
Inventor
P Jakkula
Original Assignee
Ahlstroem Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ahlstroem Oy filed Critical Ahlstroem Oy
Publication of SE8304820D0 publication Critical patent/SE8304820D0/sv
Publication of SE8304820L publication Critical patent/SE8304820L/sv
Publication of SE460504B publication Critical patent/SE460504B/sv

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/04Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant in circuits having distributed constants, e.g. having very long conductors or involving high frequencies
    • G01R27/06Measuring reflection coefficients; Measuring standing-wave ratio
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N22/00Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/46Wood

Landscapes

  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Electromagnetism (AREA)
  • Wood Science & Technology (AREA)
  • Food Science & Technology (AREA)
  • Medicinal Chemistry (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
SE8304820A 1982-09-10 1983-09-08 Foerfarande och anordning foer iakttagande av kvistar eller motsvarande i saagat virke SE460504B (sv)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FI823151A FI65673C (fi) 1982-09-10 1982-09-10 Foerfarande och anordning foer detektering av kvistar eller dyikt i saogat virke

Publications (3)

Publication Number Publication Date
SE8304820D0 true SE8304820D0 (sv) 1983-09-08
SE8304820L SE8304820L (sv) 1984-03-11
SE460504B SE460504B (sv) 1989-10-16

Family

ID=8516025

Family Applications (1)

Application Number Title Priority Date Filing Date
SE8304820A SE460504B (sv) 1982-09-10 1983-09-08 Foerfarande och anordning foer iakttagande av kvistar eller motsvarande i saagat virke

Country Status (4)

Country Link
US (1) US4607212A (sv)
FI (1) FI65673C (sv)
SE (1) SE460504B (sv)
SU (1) SU1322992A3 (sv)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4831545A (en) * 1987-06-26 1989-05-16 Weyerhaeuser Company Method for determination of pith location relative to lumber surfaces
US4916629A (en) * 1987-06-26 1990-04-10 Weyerhaeuser Company Method for determination of pith location relative to lumber surfaces
US4926350A (en) * 1987-09-14 1990-05-15 Metriguard, Inc. Non-destructive testing methods for lumber
FR2635187B1 (fr) * 1988-08-03 1990-11-09 Centre Nat Rech Scient Dispositif d'emission et de reception d'un rayonnement micro-onde, pour imagerie d'objets enfouis
JP3262606B2 (ja) * 1992-03-27 2002-03-04 旭硝子株式会社 溶融鋳造耐火物の内部品質評価方法
US5393557A (en) * 1992-12-17 1995-02-28 Northrop Grumman Corporation Method for measuring electromagnetic properties
US5960104A (en) * 1996-08-16 1999-09-28 Virginia Polytechnic & State University Defect detection system for lumber
US6756789B1 (en) * 1999-05-27 2004-06-29 New Zealand Forest Research Institute Limited Method for imaging logs or stems and apparatus
US6480141B1 (en) 2001-03-13 2002-11-12 Sandia Corporation Detection of contraband using microwave radiation
RU2003112482A (ru) * 2003-04-29 2004-10-20 Юрий Михайлович Ермолаев (RU) Способ и устройство для просвечивания объектов и сред на продольных электрических волнах (пэв)
US8400166B2 (en) * 2009-04-29 2013-03-19 The Boeing Company Non-destructive determination of electromagnetic properties

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4123702A (en) * 1976-02-13 1978-10-31 Ilmari Kinanen Method for classifying and measuring of timbers
US4123703A (en) * 1977-09-02 1978-10-31 Sri International Microwave method of and apparatus for flaw detection
FI57490C (fi) * 1978-06-01 1980-08-11 Innotec Oy Foerfarande foer bestaemning av snedfibrigheten i virke i synnerhet i saogat virke
DD139028A1 (de) * 1978-10-26 1979-12-05 Ludwig Weisser Streifenleiter zur feuchtigkeitsmessung bahnenfoermiger fester stoffe mittels mikrowellen
DE3107675C2 (de) * 1981-02-28 1985-06-20 Elektro-Physik Hans Nix & Dr.-Ing. E. Steingroever KG, 5000 Köln Verfahren und Vorrichtung zur elektronischen Messung der Dicke sehr dünner elektrisch leitfähiger Schichten auf nichtleitendem Trägermaterial

Also Published As

Publication number Publication date
SE460504B (sv) 1989-10-16
SE8304820L (sv) 1984-03-11
FI65673C (fi) 1984-06-11
FI65673B (fi) 1984-02-29
SU1322992A3 (ru) 1987-07-07
FI823151A0 (fi) 1982-09-10
US4607212A (en) 1986-08-19

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