SE7609913L - KIT AND DEVICE FOR NON-LARGE TEST BY FOUCAULT CURRENTS - Google Patents

KIT AND DEVICE FOR NON-LARGE TEST BY FOUCAULT CURRENTS

Info

Publication number
SE7609913L
SE7609913L SE7609913A SE7609913A SE7609913L SE 7609913 L SE7609913 L SE 7609913L SE 7609913 A SE7609913 A SE 7609913A SE 7609913 A SE7609913 A SE 7609913A SE 7609913 L SE7609913 L SE 7609913L
Authority
SE
Sweden
Prior art keywords
circuit
signal
signals
probe
frequency
Prior art date
Application number
SE7609913A
Other languages
Unknown language ( )
Swedish (sv)
Other versions
SE418905B (en
Inventor
M Pigeon
Original Assignee
Commissariat Energie Atomique
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Commissariat Energie Atomique filed Critical Commissariat Energie Atomique
Publication of SE7609913L publication Critical patent/SE7609913L/en
Publication of SE418905B publication Critical patent/SE418905B/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/9046Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents by analysing electrical signals
    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F28HEAT EXCHANGE IN GENERAL
    • F28FDETAILS OF HEAT-EXCHANGE AND HEAT-TRANSFER APPARATUS, OF GENERAL APPLICATION
    • F28F2265/00Safety or protection arrangements; Arrangements for preventing malfunction

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)

Abstract

1521203 Eddy current testing COMMISSARIAT A L'ENERGIE ATOMIQUE 8 Sept 1976 [9 Sept 1975] 37174/76 Heading G1N The invention relates to a process and apparatus for eddy current testing of objects wherein a part of the initial signal produced in the process or apparatus is eliminated, the part being due to a parameter or parameters of the object. The process comprises the steps of displacing a probe 12 in the proximity of the object, supplying the probe with an excitation current of n different frequencies as from oscillators 26, 28 and analyzing the components of each of the n frequencies in the signal provided by the probe. The analysis comprises for each component separating the resistive part in phase with the excitation current from the reactive part Y in quadrature. Parts X, Y of a component at a first frequency are then modified so that in the overall signal the part of the signal corresponding to a parameter to be eliminated is coincident and equal to the part of the signal corresponding to the parameter of a second frequency. The modified signal and signal at the second frequency are then subtracted to provide a signal corresponding solely to a fault. The signal produced by the subtraction is displayed as on a CRT 90. As shown the probe 12 comprises a bridge network of two resistances 18 and two inductances 20 the output at 24 being fed through a circuit comprising a pre-amp 34 or imbalance compensating circuit 36, an amplifier 42, two band pass filters 44, 46 each centred on one of the two frequencies respectively, amplifiers 48, 50, analyzing memory circuits 52, 54 receiving reference signals from respective oscillators 26, 28 and low pass filters 68, 70 to provide the respective resistive and reactive parts X A , Y A , X B , Y B . The last mentioned parts pass to the elimination circuit which comprises for each frequency a weighting circuit 80, 82 whereby the signals may be partly modified as stated above as by the employment of multipliers 80x, 80y, 82x, 82y. The phase of the partly modified signals from circuit 80 is then phase shifted in a dephasing circuit 84 from where the signals are fed to subtraction circuits 86, 88. A circuit 92 is interposed between the subtraction circuits 86, 88 and the CRT 90 such that the orientation of the signal displayed thereon may be adjusted. Switching means 94 may be provided such that signals at various points of the circuit may be applied to the CRT 90.
SE7609913A 1975-09-09 1976-09-08 KIT FOR NON-MAGNIFICENT TESTING BY FOUCAULT FLOWS AND DEVICE IMPLEMENTATION SE418905B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR7527615A FR2324003A1 (en) 1975-09-09 1975-09-09 NON DESTRUCTIVE EDD CURRENT CONTROL PROCESS AND CORRESPONDING DEVICE, USING MULTI-FREQUENCY EXCITATION AND ALLOWING THE ELIMINATION OF CERTAIN PARAMETERS

Publications (2)

Publication Number Publication Date
SE7609913L true SE7609913L (en) 1977-03-10
SE418905B SE418905B (en) 1981-06-29

Family

ID=9159766

Family Applications (1)

Application Number Title Priority Date Filing Date
SE7609913A SE418905B (en) 1975-09-09 1976-09-08 KIT FOR NON-MAGNIFICENT TESTING BY FOUCAULT FLOWS AND DEVICE IMPLEMENTATION

Country Status (14)

Country Link
JP (1) JPS602619B2 (en)
BE (1) BE845928A (en)
BR (1) BR7605858A (en)
CA (1) CA1070766A (en)
DD (1) DD126270A5 (en)
DE (1) DE2637201A1 (en)
ES (1) ES451374A1 (en)
FI (1) FI59302C (en)
FR (1) FR2324003A1 (en)
GB (1) GB1521203A (en)
IT (1) IT1074264B (en)
NL (1) NL184387C (en)
SE (1) SE418905B (en)
ZA (1) ZA764982B (en)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2428234A1 (en) * 1978-06-07 1980-01-04 Tornbloms Kvalitetskontroll Ab Non-destructive electrically conducting material testing - using magnetic fields of different fields and variable control signal detector (SW 3.7.78)
FR2443682A1 (en) * 1978-12-07 1980-07-04 Commissariat Energie Atomique CIRCUIT FOR AUTOMATIC CORRECTION OF A SIGNAL TRANSMITTED BY AN IMBALANCE DIFFERENTIAL SENSOR
US4292589A (en) * 1979-05-09 1981-09-29 Schlumberger Technology Corporation Eddy current method and apparatus for inspecting ferromagnetic tubular members
US4303885A (en) * 1979-06-18 1981-12-01 Electric Power Research Institute, Inc. Digitally controlled multifrequency eddy current test apparatus and method
US4467281A (en) * 1980-02-29 1984-08-21 Electric Power Research Institute, Inc. Multi frequency eddy current test apparatus with intermediate frequency processing
US4424486A (en) * 1980-10-14 1984-01-03 Zetec, Inc. Phase rotation circuit for an eddy current tester
JPS5791058U (en) * 1980-11-25 1982-06-04
JPS5817354A (en) * 1981-06-12 1983-02-01 Kobe Steel Ltd Inspection of pipe material by multifrequency eddy current flaw detection
JPS58137748A (en) * 1982-02-12 1983-08-16 Ishikawajima Harima Heavy Ind Co Ltd Eddy current examination method
DE3313820A1 (en) * 1983-04-16 1984-10-18 Institut Dr. Friedrich Förster Prüfgerätebau GmbH & Co KG, 7410 Reutlingen DEVICE FOR TESTING THE SURFACE OF A METAL TEST PART
CA1212997A (en) * 1983-12-16 1986-10-21 Gerard Durou Frequency scanning eddy current non destructive testing method and system
FR2562668B1 (en) * 1984-04-05 1987-11-27 Sncf DEVICE FOR TRACKING DEFECTS OF RAILWAY RAILS BY EDGE CURRENTS, CAPABLE OF DISCRIMINATING DEFECTS OF CERTAIN DISCONTINUITIES IN RAIL CONSTRUCTION
JPS60262052A (en) * 1984-06-08 1985-12-25 Sumitomo Metal Ind Ltd Heterogeneous material discrimination
JPS6273158A (en) * 1985-09-27 1987-04-03 Daizaburo Iwasaki Signal processing method and apparatus in eddy current flaw detection test
JPS62255863A (en) * 1986-04-28 1987-11-07 Furukawa Electric Co Ltd:The Eddy current flaw detector
SE456864B (en) * 1986-08-27 1988-11-07 Toernbloms Kvalitetskontroll DEVICE FOR DETECTING AND SUPPRESSING THE IMPACT OF INTERNATIONAL MAGNETIC FIELD DURING THE VERTICAL FLOW TEST OF OMAGNETIC PROVOBJECTS
FR2627862A1 (en) * 1988-02-26 1989-09-01 Commissariat Energie Atomique IMPULSIVE FOUCAULT CURRENT MONITORING METHOD AND DEVICE FOR IMPLEMENTING THE SAME
US5017869A (en) * 1989-12-14 1991-05-21 General Electric Company Swept frequency eddy current system for measuring coating thickness
FR2724019B1 (en) * 1994-08-31 1997-04-30 Intercontrole Sa METHOD OF DIGITAL ANALYSIS OF A SIGNAL, IN PARTICULAR FOR EDGE CURRENT CONTROL
FR2758882B1 (en) * 1997-01-27 1999-04-09 Intercontrole Sa METHOD OF NON-DESTRUCTIVE MONITORING BY EDGE CURRENTS OF NUCLEAR REACTOR CONTROL CLUSTERS IN THE PRESENCE OF DISTURBING ELEMENTS
US6815957B2 (en) 2001-09-24 2004-11-09 Alstom (Switzerland) Ltd Method and device for inspecting laminated iron cores of electrical machines for interlamination shorts
EP1430297B1 (en) * 2001-09-24 2006-06-14 ALSTOM Technology Ltd Method and device for controlling laminated steel sheet stacks of electrical machines in a view to detect steel sheet short-circuits
JP4762672B2 (en) * 2005-10-27 2011-08-31 非破壊検査株式会社 Magnetic material bending portion fracture inspection method and inspection apparatus
CZ306012B6 (en) * 2014-09-03 2016-06-22 Vysoké Učení Technické V Brně Non-destructive indicator of local subsurface non-homogeneities

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3706029A (en) * 1971-11-16 1972-12-12 Atomic Energy Commission Multiple parameter eddy current nondestructive testing device using plural transformation rotators to resolve each parameter

Also Published As

Publication number Publication date
DD126270A5 (en) 1977-07-06
DE2637201A1 (en) 1977-03-17
FR2324003B1 (en) 1979-03-02
NL184387C (en) 1989-07-03
IT1074264B (en) 1985-04-20
DE2637201C2 (en) 1987-10-08
SE418905B (en) 1981-06-29
JPS602619B2 (en) 1985-01-23
ZA764982B (en) 1977-07-27
CA1070766A (en) 1980-01-29
FI59302C (en) 1981-07-10
BE845928A (en) 1976-12-31
FI762581A (en) 1977-03-10
ES451374A1 (en) 1977-12-16
FR2324003A1 (en) 1977-04-08
FI59302B (en) 1981-03-31
GB1521203A (en) 1978-08-16
JPS5233791A (en) 1977-03-15
BR7605858A (en) 1977-08-16
NL7609666A (en) 1977-03-11

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