SE7507405L - Forfarande och anordning for att prova en ledare. - Google Patents
Forfarande och anordning for att prova en ledare.Info
- Publication number
- SE7507405L SE7507405L SE7507405A SE7507405A SE7507405L SE 7507405 L SE7507405 L SE 7507405L SE 7507405 A SE7507405 A SE 7507405A SE 7507405 A SE7507405 A SE 7507405A SE 7507405 L SE7507405 L SE 7507405L
- Authority
- SE
- Sweden
- Prior art keywords
- leader
- testing
- procedure
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/12—Measuring magnetic properties of articles or specimens of solids or fluids
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
- G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
- G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/58—Testing of lines, cables or conductors
- G01R31/59—Testing of lines, cables or conductors while the cable continuously passes the testing apparatus, e.g. during manufacture
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/12—Measuring magnetic properties of articles or specimens of solids or fluids
- G01R33/1238—Measuring superconductive properties
- G01R33/1246—Measuring critical current
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S505/00—Superconductor technology: apparatus, material, process
- Y10S505/825—Apparatus per se, device per se, or process of making or operating same
- Y10S505/842—Measuring and testing
- Y10S505/843—Electrical
- Y10S505/845—Magnetometer
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S505/00—Superconductor technology: apparatus, material, process
- Y10S505/825—Apparatus per se, device per se, or process of making or operating same
- Y10S505/872—Magnetic field shield
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49004—Electrical device making including measuring or testing of device or component part
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Measuring Magnetic Variables (AREA)
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
- Superconductor Devices And Manufacturing Methods Thereof (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE2431505A DE2431505C2 (de) | 1974-07-01 | 1974-07-01 | Verfahren und Vorrichtung zur kontinuierlichen, kontaktlosen Prüfung eines langgestreckten, wenigstens teilweise aus Supraleitermaterial bestehenden Leiters |
Publications (2)
Publication Number | Publication Date |
---|---|
SE7507405L true SE7507405L (sv) | 1976-01-02 |
SE400386B SE400386B (sv) | 1978-03-20 |
Family
ID=5919387
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SE7507405A SE400386B (sv) | 1974-07-01 | 1975-06-27 | Forfarande och anordning for kontinuerlig, kontaktlos provning av en langstreckt, atminstone delvis av supraledarmaterial bestaende ledare |
Country Status (10)
Country | Link |
---|---|
US (1) | US3976934A (sv) |
JP (1) | JPS5125995A (sv) |
CA (1) | CA1031036A (sv) |
CH (1) | CH579778A5 (sv) |
DE (1) | DE2431505C2 (sv) |
FR (1) | FR2277348A1 (sv) |
GB (1) | GB1499164A (sv) |
IT (1) | IT1039442B (sv) |
NL (1) | NL7506562A (sv) |
SE (1) | SE400386B (sv) |
Families Citing this family (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2606504C3 (de) * | 1976-02-18 | 1978-08-17 | Siemens Ag, 1000 Berlin Und 8000 Muenchen | Verfahren und Vorrichtung zur kontinuierlichen, kontaktlosen Prüfung eines langgestreckten, wenigstens teilweise aus Supraleitermaterial bestehenden Leiters |
US5030614A (en) * | 1987-05-15 | 1991-07-09 | Omega Engineering, Inc. | Superconductor sensors |
US4939458A (en) * | 1988-02-08 | 1990-07-03 | Colorado School Of Mines | Method and apparatus for quantifying superconductivity |
US5004724A (en) * | 1989-03-09 | 1991-04-02 | International Superconductor Corp. | Superconductive quantum interference device for the non-destructive evaluation of metals |
DE19612613C2 (de) * | 1996-03-29 | 1999-12-16 | Karlsruhe Forschzent | Verfahren zur Bestimmung des kritischen Stromes I¶c¶ von Supraleitern und Meßeinrichtung zur Durchführung des Verfahrens |
JPH1010091A (ja) * | 1996-06-21 | 1998-01-16 | Sumitomo Electric Ind Ltd | 磁性体微粉の検出装置 |
JP3171131B2 (ja) * | 1997-02-25 | 2001-05-28 | 住友電気工業株式会社 | 超電導線の臨界電流値を測定する方法および装置 |
DE19717283C1 (de) * | 1997-04-24 | 1998-04-23 | Karlsruhe Forschzent | Verfahren zur kontaktfreien, longitudinalen und transversalen Homogenitätsuntersuchung der kritischen Stromdiche j¶c¶ in Band-Supraleitern und eine Meßapparatur zur Durchführung des Verfahrens |
EP1105744B1 (en) * | 1998-07-16 | 2002-09-18 | Nordic Superconductor Technologies A/S | A method for the determination of the critical current for a conductor including superconducting material, and an apparatus for performing the method |
US6841988B1 (en) * | 1998-07-16 | 2005-01-11 | American Superconductor Corporation | Method for the determination of the critical current for a conductor including superconducting material, and an apparatus for performing the method |
US20040008022A1 (en) * | 2002-07-11 | 2004-01-15 | Viola Jeffrey L. | Current sensor |
JP4579107B2 (ja) * | 2005-09-06 | 2010-11-10 | 財団法人国際超電導産業技術研究センター | 連続型磁束観察装置および方法 |
US20090006015A1 (en) * | 2007-06-29 | 2009-01-01 | Mueller Frederick M | Method and apparatus for measuring current density in conductive materials |
KR101569951B1 (ko) * | 2008-03-05 | 2015-11-17 | 고꾸리쯔 다이가꾸 호우징 도요하시 기쥬쯔 가가꾸 다이가꾸 | Squid 자기 센서를 사용하는 비파괴 검사 장치 |
US20100019776A1 (en) * | 2008-07-23 | 2010-01-28 | Folts Douglas C | Method for analyzing superconducting wire |
CN108982950B (zh) * | 2018-07-02 | 2021-10-22 | 东北大学 | 测试ybco膜超导环流电压信号的传感器及其制作方法 |
CN109030568B (zh) * | 2018-09-07 | 2023-09-19 | 西南交通大学 | 一种高温超导膜临界电流无损检测装置及其检测方法 |
CN111351844B (zh) * | 2020-03-16 | 2023-11-03 | 中国工程物理研究院材料研究所 | 一种基于超导量子干涉仪的涡流检测装置 |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1128972A (en) * | 1965-08-19 | 1968-10-02 | Atomic Energy Authority Uk | Improvements in or relating to superconductors |
-
1974
- 1974-07-01 DE DE2431505A patent/DE2431505C2/de not_active Expired
-
1975
- 1975-06-03 NL NL7506562A patent/NL7506562A/xx not_active Application Discontinuation
- 1975-06-20 CH CH805175A patent/CH579778A5/xx not_active IP Right Cessation
- 1975-06-24 FR FR7519761A patent/FR2277348A1/fr active Granted
- 1975-06-26 US US05/590,678 patent/US3976934A/en not_active Expired - Lifetime
- 1975-06-27 SE SE7507405A patent/SE400386B/sv unknown
- 1975-06-27 IT IT24865/75A patent/IT1039442B/it active
- 1975-06-30 CA CA230,497A patent/CA1031036A/en not_active Expired
- 1975-06-30 GB GB27591/75A patent/GB1499164A/en not_active Expired
- 1975-07-01 JP JP50081378A patent/JPS5125995A/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
SE400386B (sv) | 1978-03-20 |
FR2277348A1 (fr) | 1976-01-30 |
CH579778A5 (sv) | 1976-09-15 |
GB1499164A (en) | 1978-01-25 |
NL7506562A (nl) | 1976-01-05 |
DE2431505B1 (de) | 1975-04-17 |
JPS5125995A (sv) | 1976-03-03 |
CA1031036A (en) | 1978-05-09 |
US3976934A (en) | 1976-08-24 |
FR2277348B1 (sv) | 1978-03-17 |
IT1039442B (it) | 1979-12-10 |
DE2431505C2 (de) | 1975-11-27 |
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