SE415309B - Anordning innefattande ett foremal som er paverkbart medelst korpuskularstralning - Google Patents

Anordning innefattande ett foremal som er paverkbart medelst korpuskularstralning

Info

Publication number
SE415309B
SE415309B SE7705531A SE7705531A SE415309B SE 415309 B SE415309 B SE 415309B SE 7705531 A SE7705531 A SE 7705531A SE 7705531 A SE7705531 A SE 7705531A SE 415309 B SE415309 B SE 415309B
Authority
SE
Sweden
Prior art keywords
formal
device including
portable medium
corpuscular radiation
corpuscular
Prior art date
Application number
SE7705531A
Other languages
English (en)
Swedish (sv)
Other versions
SE7705531L (sv
Inventor
J Trotel
Original Assignee
Thomson Csf
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from FR7614719A external-priority patent/FR2351497A1/fr
Priority claimed from FR7702600A external-priority patent/FR2379159A2/fr
Application filed by Thomson Csf filed Critical Thomson Csf
Publication of SE7705531L publication Critical patent/SE7705531L/
Publication of SE415309B publication Critical patent/SE415309B/xx

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
    • H01J37/3002—Details
    • H01J37/3007—Electron or ion-optical systems
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
    • H01J37/302—Controlling tubes by external information, e.g. programme control

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Beam Exposure (AREA)
SE7705531A 1976-05-14 1977-05-12 Anordning innefattande ett foremal som er paverkbart medelst korpuskularstralning SE415309B (sv)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR7614719A FR2351497A1 (fr) 1976-05-14 1976-05-14 Dispositif permettant le trace programme de figures de formes differentes
FR7702600A FR2379159A2 (fr) 1977-01-31 1977-01-31 Dispositif permettant le trace programme de figures de formes differentes

Publications (2)

Publication Number Publication Date
SE7705531L SE7705531L (sv) 1977-11-15
SE415309B true SE415309B (sv) 1980-09-22

Family

ID=26219446

Family Applications (1)

Application Number Title Priority Date Filing Date
SE7705531A SE415309B (sv) 1976-05-14 1977-05-12 Anordning innefattande ett foremal som er paverkbart medelst korpuskularstralning

Country Status (7)

Country Link
US (1) US4110622A (xx)
JP (1) JPS538064A (xx)
CA (1) CA1085073A (xx)
DE (1) DE2721704A1 (xx)
GB (1) GB1570347A (xx)
NL (1) NL177578C (xx)
SE (1) SE415309B (xx)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA1166766A (en) * 1977-02-23 1984-05-01 Hans C. Pfeiffer Method and apparatus for forming a variable size electron beam
US4167676A (en) * 1978-02-21 1979-09-11 Bell Telephone Laboratories, Incorporated Variable-spot scanning in an electron beam exposure system
US4475044A (en) * 1979-04-23 1984-10-02 Hitachi, Ltd. Apparatus for focus-deflecting a charged particle beam
FR2472831A1 (fr) * 1979-08-08 1981-07-03 Zeiss Jena Veb Carl Procede et dispositif pour l'inclinaison de sondes de rayonnement superficiel
JPS57206173A (en) * 1981-06-15 1982-12-17 Nippon Telegr & Teleph Corp <Ntt> Focusing deflecting device for charged corpuscule beam
GB2115976A (en) * 1982-02-26 1983-09-14 Philips Electronic Associated Charged particle beam apparatus
EP0242602B1 (de) * 1986-04-24 1993-07-21 ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH Elektrostatisch-magnetische-Linse für Korpuskularstrahlgeräte
DE3766092D1 (de) * 1986-12-12 1990-12-13 Integrated Circuit Testing Detektoranordnung mit einem detektorobjektiv fuer korpuskularstrahlgeraete.
JP2002217088A (ja) * 2001-01-17 2002-08-02 Nikon Corp 荷電粒子線露光装置、荷電粒子線露光方法及び半導体デバイスの製造方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2356535A (en) * 1940-08-31 1944-08-22 Ruska Ernst Electronic lens
NL154050B (nl) * 1966-08-13 1977-07-15 Philips Nv Elektronenmicroscoop.
NL6807439A (xx) * 1968-05-27 1969-12-01
US3857034A (en) * 1970-08-31 1974-12-24 Max Planck Gesellschaft Scanning charged beam particle beam microscope
US3996468A (en) * 1972-01-28 1976-12-07 Nasa Electron microscope aperture system
US4000440A (en) * 1974-07-26 1976-12-28 International Business Machines Corporation Method and apparatus for controlling brightness and alignment of a beam of charged particles
GB1557924A (en) * 1976-02-05 1979-12-19 Western Electric Co Irradiation apparatus and methods
JPS52147977A (en) * 1976-04-02 1977-12-08 Jeol Ltd Electronic lens unit
JPS5320391A (en) * 1976-08-09 1978-02-24 Becton Dickinson Co Blood inspection apparatus

Also Published As

Publication number Publication date
NL7705207A (nl) 1977-11-16
SE7705531L (sv) 1977-11-15
GB1570347A (en) 1980-07-02
NL177578C (nl) 1985-10-16
DE2721704C2 (xx) 1987-05-07
JPS538064A (en) 1978-01-25
CA1085073A (en) 1980-09-02
DE2721704A1 (de) 1977-11-24
NL177578B (nl) 1985-05-17
US4110622A (en) 1978-08-29

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