PT3249415T - Dispositivo de placa de ponto de teste para uma bancada de teste com deteção de defeitos - Google Patents
Dispositivo de placa de ponto de teste para uma bancada de teste com deteção de defeitosInfo
- Publication number
- PT3249415T PT3249415T PT171693682T PT17169368T PT3249415T PT 3249415 T PT3249415 T PT 3249415T PT 171693682 T PT171693682 T PT 171693682T PT 17169368 T PT17169368 T PT 17169368T PT 3249415 T PT3249415 T PT 3249415T
- Authority
- PT
- Portugal
- Prior art keywords
- test
- card device
- point card
- fault finding
- test point
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/08—Locating faults in cables, transmission lines, or networks
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/58—Testing of lines, cables or conductors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
- G01R31/68—Testing of releasable connections, e.g. of terminals mounted on a printed circuit board
- G01R31/69—Testing of releasable connections, e.g. of terminals mounted on a printed circuit board of terminals at the end of a cable or a wire harness; of plugs; of sockets, e.g. wall sockets or power sockets in appliances
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Tests Of Electronic Circuits (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102016109741.1A DE102016109741B4 (de) | 2016-05-26 | 2016-05-26 | Testpunktkarten-Einrichtung für einen Prüftisch |
Publications (1)
Publication Number | Publication Date |
---|---|
PT3249415T true PT3249415T (pt) | 2022-03-01 |
Family
ID=58701416
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PT171693682T PT3249415T (pt) | 2016-05-26 | 2017-05-04 | Dispositivo de placa de ponto de teste para uma bancada de teste com deteção de defeitos |
Country Status (9)
Country | Link |
---|---|
EP (1) | EP3249415B1 (pt) |
CN (1) | CN107436395B (pt) |
DE (1) | DE102016109741B4 (pt) |
ES (1) | ES2907930T3 (pt) |
HU (1) | HUE058094T2 (pt) |
MX (1) | MX2017006876A (pt) |
PL (1) | PL3249415T3 (pt) |
PT (1) | PT3249415T (pt) |
RS (1) | RS62965B1 (pt) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2020119889A1 (de) * | 2018-12-11 | 2020-06-18 | Lisa Dräxlmaier GmbH | Kontaktierungssystem und prüfvorrichtung mit flexiblem steckeradapter sowie entsprechendes prüfverfahren |
DE102021107121A1 (de) | 2021-03-23 | 2022-09-29 | Md Elektronik Gmbh | Kabeltester |
DE102021132297A1 (de) * | 2021-12-08 | 2023-06-15 | Lisa Dräxlmaier GmbH | Adapter und schienenanordnung zur prüfung von elektrischen komponenten und positionierung von adaptern auf einer schienenanordnung |
CN114325488B (zh) * | 2021-12-29 | 2024-03-12 | 北京朝阳隆华电线电缆有限公司 | 一种线束故障检验台以及线束故障检测方法 |
DE102022110739B3 (de) * | 2022-05-02 | 2023-09-07 | Lisa Dräxlmaier GmbH | Palette für einen leitungssatzautomat und verfahren zum herstellen eines leitungssatzes |
EP4336201A1 (de) * | 2022-09-08 | 2024-03-13 | ESPI Logistics GmbH | Vereinfachter prüfaufbau bei der kabelbaumprüfung |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE8713233U1 (de) * | 1987-10-01 | 1988-02-11 | Lutzke, Werner, 8900 Augsburg | Vorrichtung zum Zusammenstellen und Prüfen von Kabelbäumen aus Einzelkabeln |
JPH05297025A (ja) * | 1992-04-16 | 1993-11-12 | Mitsubishi Heavy Ind Ltd | 電子機器トラブルシュート用計測装置 |
DE4436354A1 (de) * | 1994-10-12 | 1996-04-25 | Hanno Link | Vorrichtung zum gleichzeitigen Prüfen einer Mehrzahl von elektrischen oder elektronischen Teilen |
DE19500113C2 (de) * | 1995-01-04 | 1996-03-28 | Klaus Wurmhoeringer | Kabeltestadapter |
GB2315334A (en) * | 1996-07-16 | 1998-01-28 | Michael Patrick Creamer | Circuit feed detector |
JP3161351B2 (ja) * | 1997-02-24 | 2001-04-25 | 住友電装株式会社 | オートロック式導通検査ユニット |
DE29920214U1 (de) * | 1999-11-17 | 2000-01-20 | TSK Prüfsysteme für elektrische Komponenten GmbH, 32457 Porta Westfalica | Einrichtung zum Testen von mit Steckern versehenen Kabeln |
DE10019860C1 (de) * | 2000-04-18 | 2001-10-31 | Wee Electrotest Engineering Gm | Verfahren und Einrichtung zum Prüfen von Kabelbäumen |
WO2001079871A1 (de) * | 2000-04-18 | 2001-10-25 | Wee Electrotest Engineering Gmbh | Verfahren und einrichtung zum prüfen von kabelbäumen |
CN103018647B (zh) * | 2011-09-27 | 2015-07-22 | 致茂电子(苏州)有限公司 | 多芯片的测试方法及其点测机 |
DE102011087152B4 (de) * | 2011-11-25 | 2013-08-14 | Digalog Industrie-Mikroelektronik Gmbh | Testsystem und Testverfahren für Kabelbäume |
CN203133118U (zh) * | 2013-01-04 | 2013-08-14 | 航天科工防御技术研究试验中心 | 电连接器测试适配器 |
-
2016
- 2016-05-26 DE DE102016109741.1A patent/DE102016109741B4/de active Active
-
2017
- 2017-05-04 PT PT171693682T patent/PT3249415T/pt unknown
- 2017-05-04 PL PL17169368T patent/PL3249415T3/pl unknown
- 2017-05-04 ES ES17169368T patent/ES2907930T3/es active Active
- 2017-05-04 RS RS20220213A patent/RS62965B1/sr unknown
- 2017-05-04 HU HUE17169368A patent/HUE058094T2/hu unknown
- 2017-05-04 EP EP17169368.2A patent/EP3249415B1/de active Active
- 2017-05-25 MX MX2017006876A patent/MX2017006876A/es unknown
- 2017-05-26 CN CN201710384098.9A patent/CN107436395B/zh active Active
Also Published As
Publication number | Publication date |
---|---|
DE102016109741B4 (de) | 2017-12-21 |
EP3249415A1 (de) | 2017-11-29 |
CN107436395A (zh) | 2017-12-05 |
CN107436395B (zh) | 2021-09-07 |
PL3249415T3 (pl) | 2022-03-28 |
MX2017006876A (es) | 2018-08-28 |
ES2907930T3 (es) | 2022-04-27 |
HUE058094T2 (hu) | 2022-07-28 |
DE102016109741A1 (de) | 2017-11-30 |
RS62965B1 (sr) | 2022-03-31 |
EP3249415B1 (de) | 2021-12-01 |
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