PL3475926T3 - Wykrywanie nieprawidłowości powierzchni w monetach - Google Patents

Wykrywanie nieprawidłowości powierzchni w monetach

Info

Publication number
PL3475926T3
PL3475926T3 PL17814381.4T PL17814381T PL3475926T3 PL 3475926 T3 PL3475926 T3 PL 3475926T3 PL 17814381 T PL17814381 T PL 17814381T PL 3475926 T3 PL3475926 T3 PL 3475926T3
Authority
PL
Poland
Prior art keywords
coins
detection
surface irregularities
irregularities
Prior art date
Application number
PL17814381.4T
Other languages
English (en)
Inventor
Serge Levesque
Original Assignee
Ultra Electronics Forensic Technology Inc.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ultra Electronics Forensic Technology Inc. filed Critical Ultra Electronics Forensic Technology Inc.
Publication of PL3475926T3 publication Critical patent/PL3475926T3/pl

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/001—Industrial image inspection using an image reference approach
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/20—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring contours or curvatures, e.g. determining profile
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/50—Depth or shape recovery
    • G06T7/55—Depth or shape recovery from multiple images
    • G06T7/586—Depth or shape recovery from multiple images from multiple light sources, e.g. photometric stereo
    • G—PHYSICS
    • G07—CHECKING-DEVICES
    • G07D—HANDLING OF COINS OR VALUABLE PAPERS, e.g. TESTING, SORTING BY DENOMINATIONS, COUNTING, DISPENSING, CHANGING OR DEPOSITING
    • G07D5/00—Testing specially adapted to determine the identity or genuineness of coins, e.g. for segregating coins which are unacceptable or alien to a currency
    • G07D5/005—Testing the surface pattern, e.g. relief
    • G—PHYSICS
    • G07—CHECKING-DEVICES
    • G07D—HANDLING OF COINS OR VALUABLE PAPERS, e.g. TESTING, SORTING BY DENOMINATIONS, COUNTING, DISPENSING, CHANGING OR DEPOSITING
    • G07D5/00—Testing specially adapted to determine the identity or genuineness of coins, e.g. for segregating coins which are unacceptable or alien to a currency
    • G07D5/10—Testing the rim, e.g. the milling of the rim
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2200/00—Indexing scheme for image data processing or generation, in general
    • G06T2200/04—Indexing scheme for image data processing or generation, in general involving 3D image data
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10028—Range image; Depth image; 3D point clouds
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30136—Metal

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Image Analysis (AREA)
  • Testing Of Coins (AREA)
PL17814381.4T 2016-06-23 2017-06-22 Wykrywanie nieprawidłowości powierzchni w monetach PL3475926T3 (pl)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201662353756P 2016-06-23 2016-06-23
PCT/CA2017/050760 WO2017219141A1 (en) 2016-06-23 2017-06-22 Detection of surface irregularities in coins

Publications (1)

Publication Number Publication Date
PL3475926T3 true PL3475926T3 (pl) 2022-10-24

Family

ID=60783129

Family Applications (1)

Application Number Title Priority Date Filing Date
PL17814381.4T PL3475926T3 (pl) 2016-06-23 2017-06-22 Wykrywanie nieprawidłowości powierzchni w monetach

Country Status (13)

Country Link
US (1) US10902584B2 (pl)
EP (1) EP3475926B1 (pl)
CA (1) CA3029069A1 (pl)
DK (1) DK3475926T3 (pl)
ES (1) ES2923881T3 (pl)
HR (1) HRP20220883T1 (pl)
HU (1) HUE059751T2 (pl)
LT (1) LT3475926T (pl)
MX (1) MX2019000214A (pl)
PL (1) PL3475926T3 (pl)
PT (1) PT3475926T (pl)
SI (1) SI3475926T1 (pl)
WO (1) WO2017219141A1 (pl)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11852980B2 (en) * 2021-03-05 2023-12-26 Taiwan Semiconductor Manufacturing Company, Ltd. Techniques for correction of aberrations

Family Cites Families (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5624019A (en) * 1991-04-18 1997-04-29 Mars Incorporated Method and apparatus for validating money
US6685000B2 (en) * 2000-05-19 2004-02-03 Kabushiki Kaisha Nippon Conlux Coin discrimination method and device
DE10051009A1 (de) 2000-10-14 2002-05-02 Nat Rejectors Gmbh Verfahren zur Erkennung eines Prägebilds einer Münze in einem Münzautomaten
DE10202383A1 (de) 2002-01-16 2003-08-14 Nat Rejectors Gmbh Verfahren zur Erkennung eines Prägebildes einer Münze in einem Münzautomaten
DE10300608B4 (de) 2003-01-10 2004-09-30 National Rejectors, Inc. Gmbh Verfahren zur Erkennung eines Prägebildes einer Münze in einem Münzautomaten
US7019826B2 (en) 2003-03-20 2006-03-28 Agilent Technologies, Inc. Optical inspection system, apparatus and method for reconstructing three-dimensional images for printed circuit board and electronics manufacturing inspection
US20040184653A1 (en) 2003-03-20 2004-09-23 Baer Richard L. Optical inspection system, illumination apparatus and method for use in imaging specular objects based on illumination gradients
WO2005086100A1 (en) 2004-03-09 2005-09-15 Council Of Scientific & Industrial Research Improved fake currency detector using visual and reflective spectral response
US20060032726A1 (en) * 2004-08-10 2006-02-16 Vook Dietrich W Optical inspection system for reconstructing three-dimensional images of coins and for sorting coins
US8695416B2 (en) * 2006-10-20 2014-04-15 Coin Acceptors, Inc. Method of examining a coin for determining its validity and denomination
ATE529836T1 (de) 2007-08-13 2011-11-15 Aqsense S L Verfahren und system zur ausrichtung dreidimensionaler oberflächen
US20090296365A1 (en) 2008-04-18 2009-12-03 Coinsecure, Inc. Calibrated and color-controlled multi-source lighting system for specimen illumination
CN101819692B (zh) * 2010-04-12 2012-08-15 高新现代智能***股份有限公司 硬币图像识别方法及装置
MX2012014516A (es) * 2010-06-16 2013-01-29 Forensic Technology Wai Inc Adquisicion de imagenes topograficas en 3d de marcas de herramientas utilizando un metodo estereo fotometrico no lineal.
AU2011302414A1 (en) * 2010-09-15 2013-05-02 Identicoin, Inc. Coin identification method and apparatus
US8615125B2 (en) * 2010-10-08 2013-12-24 Omron Corporation Apparatus and method for inspecting surface state
US9558544B2 (en) * 2011-04-29 2017-01-31 Monnaie Royale Canadienne/Royal Canadian Mint Method and apparatus for authentication of a coin or other manufactured item
US20120293623A1 (en) 2011-05-17 2012-11-22 Gii Acquisition, Llc Dba General Inspection, Llc Method and system for inspecting small manufactured objects at a plurality of inspection stations and sorting the inspected objects
US9053595B2 (en) 2012-02-02 2015-06-09 Jared Grove Coin identification system and method using image processing
US9595091B2 (en) * 2012-04-19 2017-03-14 Applied Materials Israel, Ltd. Defect classification using topographical attributes
KR20130119196A (ko) 2012-04-23 2013-10-31 에스케이하이닉스 주식회사 반도체 장치
US8750570B2 (en) * 2012-05-25 2014-06-10 Security Pacific Capital Corporation Methods, systems and apparatus for automated authentication
JP6419086B2 (ja) * 2013-01-24 2018-11-07 モネ ロワイヤル カナディエンヌ／ロイヤル カナディアン ミントＭｏｎｎａｉｅ Ｒｏｙａｌｅ Ｃａｎａｄｉｅｎｎｅ／Ｒｏｙａｌ Ｃａｎａｄｉａｎ Ｍｉｎｔ 硬貨または他のオブジェクトの一意の識別
AT514749A1 (de) 2013-09-09 2015-03-15 Economa Automatisierungstechnik Gmbh Verfahren zum Prüfen der Oberfläche von Gegenständen und Münze mit Echtheitsmerkmal
GB2526866A (en) * 2014-06-05 2015-12-09 Univ Bristol Apparatus for and method of inspecting surface topography of a moving object
JP6408259B2 (ja) * 2014-06-09 2018-10-17 株式会社キーエンス 画像検査装置、画像検査方法、画像検査プログラム及びコンピュータで読み取り可能な記録媒体並びに記録した機器

Also Published As

Publication number Publication date
SI3475926T1 (sl) 2022-10-28
HUE059751T2 (hu) 2022-12-28
EP3475926A1 (en) 2019-05-01
EP3475926B1 (en) 2022-04-27
CA3029069A1 (en) 2017-12-28
HRP20220883T1 (hr) 2022-10-28
US10902584B2 (en) 2021-01-26
WO2017219141A1 (en) 2017-12-28
PT3475926T (pt) 2022-08-01
US20200184616A1 (en) 2020-06-11
MX2019000214A (es) 2019-08-01
DK3475926T3 (da) 2022-07-25
LT3475926T (lt) 2022-08-25
ES2923881T3 (es) 2022-10-03
EP3475926A4 (en) 2020-02-26

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