PL3076148T3 - Urządzenie i sposób pomiaru właściwości odwzorowania optycznego systemu odwzorowującego - Google Patents

Urządzenie i sposób pomiaru właściwości odwzorowania optycznego systemu odwzorowującego

Info

Publication number
PL3076148T3
PL3076148T3 PL15161923T PL15161923T PL3076148T3 PL 3076148 T3 PL3076148 T3 PL 3076148T3 PL 15161923 T PL15161923 T PL 15161923T PL 15161923 T PL15161923 T PL 15161923T PL 3076148 T3 PL3076148 T3 PL 3076148T3
Authority
PL
Poland
Prior art keywords
measuring
imaging system
properties
optical imaging
optical
Prior art date
Application number
PL15161923T
Other languages
English (en)
Inventor
Aiko Ruprecht
Original Assignee
Trioptics Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Trioptics Gmbh filed Critical Trioptics Gmbh
Publication of PL3076148T3 publication Critical patent/PL3076148T3/pl

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/30—Collimators
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N17/00—Diagnosis, testing or measuring for television systems or their details
    • H04N17/002—Diagnosis, testing or measuring for television systems or their details for television cameras
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
    • G01M11/0257—Testing optical properties by measuring geometrical properties or aberrations by analyzing the image formed by the object to be tested
    • G01M11/0264—Testing optical properties by measuring geometrical properties or aberrations by analyzing the image formed by the object to be tested by using targets or reference patterns
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0292—Testing optical properties of objectives by measuring the optical modulation transfer function
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/42—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect
    • G02B27/4205—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect having a diffractive optical element [DOE] contributing to image formation, e.g. whereby modulation transfer function MTF or optical aberrations are relevant
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
    • G02B7/28—Systems for automatic generation of focusing signals
    • G02B7/36—Systems for automatic generation of focusing signals using image sharpness techniques, e.g. image processing techniques for generating autofocus signals
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03B—APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR
    • G03B43/00—Testing correct operation of photographic apparatus or parts thereof

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Biomedical Technology (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Geometry (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Length Measuring Devices By Optical Means (AREA)
PL15161923T 2015-03-31 2015-03-31 Urządzenie i sposób pomiaru właściwości odwzorowania optycznego systemu odwzorowującego PL3076148T3 (pl)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP15161923.6A EP3076148B1 (de) 2015-03-31 2015-03-31 Vorrichtung und verfahren zum messen von abbildungseigenschaften eines optischen abbildungssystems

Publications (1)

Publication Number Publication Date
PL3076148T3 true PL3076148T3 (pl) 2019-10-31

Family

ID=53039686

Family Applications (1)

Application Number Title Priority Date Filing Date
PL15161923T PL3076148T3 (pl) 2015-03-31 2015-03-31 Urządzenie i sposób pomiaru właściwości odwzorowania optycznego systemu odwzorowującego

Country Status (4)

Country Link
EP (1) EP3076148B1 (pl)
KR (1) KR102031947B1 (pl)
CN (1) CN106028024B (pl)
PL (1) PL3076148T3 (pl)

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EP3581880B1 (en) 2017-03-14 2022-02-09 JFE Steel Corporation Method and apparatus for measuring meandering amount of strip, and method and apparatus for detecting abnormal meandering of strip
KR102099977B1 (ko) 2018-02-20 2020-04-10 (주) 루리텍 콜리메이터쌍을 이용한 카메라 특성 관리장치
DE102019105622B4 (de) * 2019-03-06 2022-03-17 Konrad Gmbh Kollimator und Verfahren zum Testen einer Kamera
CN111971950B (zh) * 2019-03-19 2022-03-15 株式会社Pfa 摄像机模块制造装置以及摄像机模块制造方法
CN112203080B (zh) * 2019-07-08 2022-06-03 宁波舜宇光电信息有限公司 解像力测试方法、设备及存储介质
KR102083759B1 (ko) * 2019-07-31 2020-03-02 (주)이즈미디어 광학기구 정렬 검사장치
US11397417B2 (en) 2019-11-23 2022-07-26 Automation Engineering Inc. Hybrid wide field of view target system
DE102019135222A1 (de) * 2019-12-19 2021-06-24 Connaught Electronics Ltd. System zum Bestimmen des Sichtfelds (FOV - Field of View) einer Kamera
WO2021171412A1 (ja) * 2020-02-26 2021-09-02 株式会社Ｐｆａ カメラモジュール製造装置
KR20210145439A (ko) * 2020-05-25 2021-12-02 삼성전기주식회사 장착 구조물 및 이를 구비하는 검사 장치
IT202000014590A1 (it) * 2020-06-18 2021-12-18 Main Axis S R L Dispositivo di controllo per corpi ottici
CN111982472B (zh) * 2020-08-17 2022-06-21 福州锐景达光电科技有限公司 测量逆投影光路放大倍率的方法及建立mtf曲线的方法
CN116209886A (zh) 2020-10-15 2023-06-02 应用材料公司 用于光学装置的透视计量***、设备和方法
CN115550640B (zh) * 2022-10-09 2024-07-05 知行汽车科技(苏州)股份有限公司 一种逆畸变清晰度测试图卡设计方法

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US3733135A (en) * 1971-06-23 1973-05-15 Us Army Method and apparatus for measuring image forming properties of an image display panel
JPS5520420A (en) * 1978-07-29 1980-02-13 Ricoh Co Ltd Mtf examination unit
JPS5694883A (en) 1979-12-27 1981-07-31 Osawa Seimitsu Kogyo Kk Focus detector for video camera
JPS57172221A (en) * 1981-04-16 1982-10-23 Ricoh Co Ltd Mtf measuring device for image sensor
DE3225343A1 (de) * 1982-07-07 1984-01-12 Fa. Carl Zeiss, 7920 Heidenheim Verfahren und vorrichtung zur pruefung von linsen
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Also Published As

Publication number Publication date
CN106028024B (zh) 2019-11-05
KR20160117336A (ko) 2016-10-10
KR102031947B1 (ko) 2019-10-14
EP3076148A1 (de) 2016-10-05
EP3076148B1 (de) 2019-05-08
CN106028024A (zh) 2016-10-12

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