PE20141402A1 - AN EMISSION SPECTROMETER AND METHOD OF OPERATION - Google Patents
AN EMISSION SPECTROMETER AND METHOD OF OPERATIONInfo
- Publication number
- PE20141402A1 PE20141402A1 PE2013001595A PE2013001595A PE20141402A1 PE 20141402 A1 PE20141402 A1 PE 20141402A1 PE 2013001595 A PE2013001595 A PE 2013001595A PE 2013001595 A PE2013001595 A PE 2013001595A PE 20141402 A1 PE20141402 A1 PE 20141402A1
- Authority
- PE
- Peru
- Prior art keywords
- radiation
- spectral characteristics
- sample
- detector
- spectral
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
- G01N21/274—Calibration, base line adjustment, drift correction
- G01N21/276—Calibration, base line adjustment, drift correction with alternation of sample and standard in optical path
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
- G01N21/718—Laser microanalysis, i.e. with formation of sample plasma
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Mathematical Physics (AREA)
- Theoretical Computer Science (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Spectrometry And Color Measurement (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Abstract
REFERIDO A UN METODO PARA CALIBRAR UN ESPECTROMETRO DE EMISION QUE DISPONE DE UN DETECTOR CAPAZ DE DETECTAR LOS COMPONENTES ESPECTRALES DE LA RADIACION INCIDENTE, Y UN PASO OPTICO DE MEDICION QUE DIRIGE UN HAZ DE ENERGIA A UNA MUESTRA EN DONDE LA RADIACION EMITIDA POR LA MUESTRA AL IRRADIARLA CON EL HAZ DE ENERGIA ES DIRIGIDA AL DETECTOR DE RADIACION. EL METODO COMPRENDE DIRIGIR RADIACION DE CARACTERISTICAS ESPECTRALES CONOCIDAS A LO LARGO DE UN PASO ALTERNATIVO AL DETECTOR. EL DETECTOR DETECTA CARACTERISTICAS ESPECTRALES DE LA RADIACION Y REALIZA UNA COMPARACION CON LAS CARACTERISTICAS ESPECTRALES CONOCIDAS. LOS DATOS DE DESPLAZAMIENTO SE DETERMINAN EN FUNCION DE CUALQUIER VARIACION ENTRE LAS CARACTERISTICAS ESPECTRALES CONOCIDAS Y LAS DETECTADAS. LOS DATOS DE DESPLAZAMIENTO SE ARCHIVAN Y POSTERIORMENTE SE UTILIZAN PARA AJUSTAR LAS CARACTERISTICAS ESPECTRALES DETECTADAS DE UNA MUESTRA EN EL PASO OPTICO DE MEDICION PARA OBTENER UN ANALISIS ESPECTRAL DE LAS SENALES CALIBRADAS PARA EL DESPLAZAMIENTO DE LA MUESTRA. SU APLICACION PERMITE DETECTAR LA COMPOSICION ELEMENTAL DE UNA MUESTRAREFERRED TO A METHOD TO CALIBRATE AN EMISSION SPECTROMETER THAT HAS A DETECTOR CAPABLE OF DETECTING THE SPECTRAL COMPONENTS OF INCIDENT RADIATION, AND AN OPTICAL MEASUREMENT STEP THAT DIRECTS AN ENERGY BEAM TO A SAMPLE WHERE THE RADIATION IS RADIATION IRRADIATING IT WITH THE ENERGY BEAM IS DIRECTED TO THE RADIATION DETECTOR. THE METHOD INCLUDES DIRECTING RADIATION OF KNOWN SPECTRAL CHARACTERISTICS ALONG AN ALTERNATIVE PASSAGE TO THE DETECTOR. THE DETECTOR DETECTS SPECTRAL CHARACTERISTICS OF RADIATION AND MAKES A COMPARISON WITH THE KNOWN SPECTRAL CHARACTERISTICS. THE DISPLACEMENT DATA IS DETERMINED AS A FUNCTION OF ANY VARIATION BETWEEN THE KNOWN AND DETECTED SPECTRAL CHARACTERISTICS. THE DISPLACEMENT DATA IS ARCHIVED AND SUBSEQUENTLY USED TO ADJUST THE SPECTRAL CHARACTERISTICS DETECTED FROM A SAMPLE IN THE OPTICAL MEASUREMENT STEP TO OBTAIN A SPECTRAL ANALYSIS OF THE CALIBRATED SIGNALS FOR THE DISPLACEMENT OF THE SAMPLE. ITS APPLICATION ALLOWS TO DETECT THE ELEMENTARY COMPOSITION OF A SAMPLE
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201161436328P | 2011-01-26 | 2011-01-26 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| PE20141402A1 true PE20141402A1 (en) | 2014-10-29 |
Family
ID=46580110
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PE2013001595A PE20141402A1 (en) | 2011-01-26 | 2012-01-11 | AN EMISSION SPECTROMETER AND METHOD OF OPERATION |
Country Status (7)
| Country | Link |
|---|---|
| CN (1) | CN103518121A (en) |
| AU (1) | AU2012211024A1 (en) |
| BR (1) | BR112013018523A2 (en) |
| CA (1) | CA2824940A1 (en) |
| CL (1) | CL2013002117A1 (en) |
| PE (1) | PE20141402A1 (en) |
| WO (1) | WO2012100284A1 (en) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2014202618A2 (en) * | 2013-06-17 | 2014-12-24 | University Of Neuchâtel | Method for determining the configuration of a structure |
| CN107037012B (en) * | 2017-04-05 | 2019-10-25 | 华中科技大学 | Echelle spectrometer dynamic correcting method for laser induced breakdown spectroscopy acquisition |
| CN115839943B (en) * | 2023-02-13 | 2023-07-11 | 合肥金星智控科技股份有限公司 | Laser-induced spectrum system, spectrum calibration method and electronic equipment |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6621574B1 (en) * | 2000-05-25 | 2003-09-16 | Inphotonics, Inc. | Dual function safety and calibration accessory for raman and other spectroscopic sampling |
| US7321424B2 (en) * | 2004-08-05 | 2008-01-22 | Acton Research Corp. | Self-referencing instrument and method thereof for measuring electromagnetic properties |
| US7502105B2 (en) * | 2004-09-15 | 2009-03-10 | General Electric Company | Apparatus and method for producing a calibrated Raman spectrum |
| US7994479B2 (en) * | 2006-11-30 | 2011-08-09 | The Science And Technology Facilities Council | Infrared spectrometer |
| CN101689222B (en) * | 2007-05-07 | 2012-12-26 | 真实仪器公司 | Calibration of a radiometric optical monitoring system used for fault detection and process monitoring |
| CN101354287B (en) * | 2007-07-24 | 2010-12-22 | 杭州远方光电信息有限公司 | Spectrometer and method for correcting the same |
-
2012
- 2012-01-11 BR BR112013018523A patent/BR112013018523A2/en not_active IP Right Cessation
- 2012-01-11 AU AU2012211024A patent/AU2012211024A1/en not_active Abandoned
- 2012-01-11 WO PCT/AU2012/000016 patent/WO2012100284A1/en active Application Filing
- 2012-01-11 CA CA2824940A patent/CA2824940A1/en not_active Abandoned
- 2012-01-11 CN CN201280006560.7A patent/CN103518121A/en active Pending
- 2012-01-11 PE PE2013001595A patent/PE20141402A1/en not_active Application Discontinuation
-
2013
- 2013-07-24 CL CL2013002117A patent/CL2013002117A1/en unknown
Also Published As
| Publication number | Publication date |
|---|---|
| CL2013002117A1 (en) | 2013-12-13 |
| CN103518121A (en) | 2014-01-15 |
| CA2824940A1 (en) | 2012-08-02 |
| BR112013018523A2 (en) | 2017-08-01 |
| AU2012211024A1 (en) | 2013-08-01 |
| WO2012100284A1 (en) | 2012-08-02 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| FD | Application declared void or lapsed |