NL7000860A - - Google Patents

Info

Publication number
NL7000860A
NL7000860A NL7000860A NL7000860A NL7000860A NL 7000860 A NL7000860 A NL 7000860A NL 7000860 A NL7000860 A NL 7000860A NL 7000860 A NL7000860 A NL 7000860A NL 7000860 A NL7000860 A NL 7000860A
Authority
NL
Netherlands
Application number
NL7000860A
Other versions
NL143045B (nl
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of NL7000860A publication Critical patent/NL7000860A/xx
Publication of NL143045B publication Critical patent/NL143045B/xx

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/073Multiple probes
    • G01R1/07307Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • CCHEMISTRY; METALLURGY
    • C04CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
    • C04BLIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
    • C04B2237/00Aspects relating to ceramic laminates or to joining of ceramic articles with other articles by heating
    • C04B2237/30Composition of layers of ceramic laminates or of ceramic or metallic articles to be joined by heating, e.g. Si substrates
    • C04B2237/32Ceramic
    • C04B2237/36Non-oxidic
    • C04B2237/366Aluminium nitride

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
NL7000860A 1969-01-22 1970-01-21 Contactinrichting. NL143045B (nl)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19691903088 DE1903088A1 (de) 1969-01-22 1969-01-22 Kontaktvorrichtung

Publications (2)

Publication Number Publication Date
NL7000860A true NL7000860A (de) 1970-07-24
NL143045B NL143045B (nl) 1974-08-15

Family

ID=5723108

Family Applications (1)

Application Number Title Priority Date Filing Date
NL7000860A NL143045B (nl) 1969-01-22 1970-01-21 Contactinrichting.

Country Status (6)

Country Link
JP (1) JPS502060B1 (de)
AT (1) AT300955B (de)
DE (1) DE1903088A1 (de)
FR (1) FR2028879A1 (de)
GB (1) GB1255465A (de)
NL (1) NL143045B (de)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3142817A1 (de) * 1980-10-30 1982-07-08 Everett/Charles, Inc., 91730 Rancho Cucamonga, Calif. Uebertragungseinrichtung, test-spannvorrichtung mit uebertragungseinrichtung und verfahren zur bildung einer uebertragungseinrichtung
DE3108523A1 (de) * 1981-03-06 1982-09-23 Feinmetall Gmbh, 7033 Herrenberg Kontaktvorrichtung
EP0069592B1 (de) * 1981-07-08 1985-04-24 Fujitsu Limited Vorrichtung zum Prüfen von Halbleitereinheiten bei einer hohen Temperatur
DE3136896A1 (de) * 1981-09-17 1983-04-14 Ingun Prüfmittelbau GmbH & Co KG Elektronik, 7750 Konstanz Vorrichtung zum pruefen einer elektronischen leiterplatte
FR2547959B1 (fr) * 1983-06-23 1986-06-13 Laudren Cie Ets Dispositif de prise de test pour tete de cable
DE3421799A1 (de) * 1984-06-12 1985-12-12 Feinmetall Gmbh, 7033 Herrenberg Kontaktelement fuer pruefadapter
DE3844685C2 (de) * 1987-04-16 1995-05-18 Teradyne Inc Kontaktsonde
DE3722485A1 (de) * 1987-07-03 1989-01-12 Deutsche Telephonwerk Kabel Federnde kontaktnadel und kontaktiereinrichtung
JPS6430028U (de) * 1987-08-14 1989-02-23
EP0346737A3 (de) * 1988-06-13 1991-04-03 Siemens Aktiengesellschaft Dehnbares Nadelfeld
FI89842C (fi) * 1989-04-12 1993-11-25 Nokia Mobira Oy Fjaedrande kontaktdon foer radiofrekventa signaler
FI84948C (fi) * 1989-04-12 1992-02-10 Nokia Mobira Oy Ytkontaktdon foer radiofrekventa signaler.
JP4689196B2 (ja) * 2003-11-05 2011-05-25 日本発條株式会社 導電性接触子ホルダ、導電性接触子ユニット
JP4757531B2 (ja) 2005-04-28 2011-08-24 日本発條株式会社 導電性接触子ホルダおよび導電性接触子ユニット

Also Published As

Publication number Publication date
GB1255465A (en) 1971-12-01
FR2028879A1 (de) 1970-10-16
AT300955B (de) 1972-08-10
JPS502060B1 (de) 1975-01-23
DE1903088A1 (de) 1971-01-21
NL143045B (nl) 1974-08-15

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