NL6900671A - - Google Patents
Info
- Publication number
- NL6900671A NL6900671A NL6900671A NL6900671A NL6900671A NL 6900671 A NL6900671 A NL 6900671A NL 6900671 A NL6900671 A NL 6900671A NL 6900671 A NL6900671 A NL 6900671A NL 6900671 A NL6900671 A NL 6900671A
- Authority
- NL
- Netherlands
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/205—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials using diffraction cameras
Landscapes
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR136735 | 1968-01-19 |
Publications (1)
Publication Number | Publication Date |
---|---|
NL6900671A true NL6900671A (en) | 1969-07-22 |
Family
ID=8644824
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
NL6900671A NL6900671A (en) | 1968-01-19 | 1969-01-15 |
Country Status (6)
Country | Link |
---|---|
BE (1) | BE726954A (en) |
CH (1) | CH488180A (en) |
DE (1) | DE1901666A1 (en) |
FR (1) | FR1564558A (en) |
GB (1) | GB1246410A (en) |
NL (1) | NL6900671A (en) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2748501C3 (en) * | 1977-10-28 | 1985-05-30 | Born, Eberhard, Dr. | Method and device for creating texture topograms |
DE2925593A1 (en) * | 1979-06-25 | 1981-01-15 | Siemens Ag | DEVICE FOR X-RAY FLUORESCENCE ANALYSIS |
FR2668262B1 (en) * | 1990-10-23 | 1994-04-01 | Centre Nal Recherc Scientifique | X-RAY ANALYSIS PROCESS FOR MONOCRYSTALLINE PARTS. |
CN103983650B (en) * | 2014-05-15 | 2016-04-06 | 重庆大学 | Multiple degrees of freedom, multi-angle rotary device |
CN105758880B (en) * | 2016-04-11 | 2019-02-05 | 西北核技术研究所 | ULTRAFAST X-RAY DIFFRACTION imaging method and system based on flashing X-ray machine |
CN112670200A (en) * | 2020-12-29 | 2021-04-16 | 杭州中欣晶圆半导体股份有限公司 | Method for detecting oxidation stacking fault |
-
1968
- 1968-01-19 FR FR1564558D patent/FR1564558A/fr not_active Expired
-
1969
- 1969-01-14 DE DE19691901666 patent/DE1901666A1/en active Pending
- 1969-01-15 NL NL6900671A patent/NL6900671A/xx unknown
- 1969-01-16 BE BE726954D patent/BE726954A/xx unknown
- 1969-01-17 CH CH65169A patent/CH488180A/en not_active IP Right Cessation
- 1969-01-17 GB GB294769A patent/GB1246410A/en not_active Expired
Also Published As
Publication number | Publication date |
---|---|
GB1246410A (en) | 1971-09-15 |
DE1901666A1 (en) | 1969-09-04 |
BE726954A (en) | 1969-07-16 |
CH488180A (en) | 1970-03-31 |
FR1564558A (en) | 1969-04-25 |