NL6511843A - - Google Patents
Info
- Publication number
- NL6511843A NL6511843A NL6511843A NL6511843A NL6511843A NL 6511843 A NL6511843 A NL 6511843A NL 6511843 A NL6511843 A NL 6511843A NL 6511843 A NL6511843 A NL 6511843A NL 6511843 A NL6511843 A NL 6511843A
- Authority
- NL
- Netherlands
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/203—Measuring back scattering
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
Landscapes
- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Crystallography & Structural Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB3723664A GB1065918A (en) | 1964-09-11 | 1964-09-11 | Improvements in or relating to apparatus for x-ray analysis |
GB3723764A GB1065919A (en) | 1964-09-11 | 1964-09-11 | Improvements in or relating to methods of x-ray analysis |
GB1188765 | 1965-03-19 | ||
GB1188665 | 1965-03-19 |
Publications (1)
Publication Number | Publication Date |
---|---|
NL6511843A true NL6511843A (de) | 1966-03-14 |
Family
ID=27448118
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
NL6511843A NL6511843A (de) | 1964-09-11 | 1965-09-10 | |
NL6511844A NL6511844A (de) | 1964-09-11 | 1965-09-10 |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
NL6511844A NL6511844A (de) | 1964-09-11 | 1965-09-10 |
Country Status (3)
Country | Link |
---|---|
US (1) | US3496353A (de) |
DE (2) | DE1673164A1 (de) |
NL (2) | NL6511843A (de) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2003021244A1 (en) * | 2001-09-04 | 2003-03-13 | Quality Control, Inc. | X-ray fluorescence measuring system and methods for trace elements |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2964631A (en) * | 1958-06-30 | 1960-12-13 | Industrial Nucleonics Corp | Measuring system |
-
1965
- 1965-09-08 US US485708A patent/US3496353A/en not_active Expired - Lifetime
- 1965-09-10 NL NL6511843A patent/NL6511843A/xx unknown
- 1965-09-10 NL NL6511844A patent/NL6511844A/xx unknown
- 1965-09-11 DE DE19651673164 patent/DE1673164A1/de active Pending
- 1965-09-11 DE DE19651673163 patent/DE1673163A1/de active Pending
Also Published As
Publication number | Publication date |
---|---|
DE1673163A1 (de) | 1970-04-16 |
NL6511844A (de) | 1966-03-14 |
US3496353A (en) | 1970-02-17 |
DE1673164A1 (de) | 1970-04-16 |