NL62791C - - Google Patents

Info

Publication number
NL62791C
NL62791C NL62791DA NL62791C NL 62791 C NL62791 C NL 62791C NL 62791D A NL62791D A NL 62791DA NL 62791 C NL62791 C NL 62791C
Authority
NL
Netherlands
Application number
Publication of NL62791C publication Critical patent/NL62791C/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
NL62791D NL62791C (en)

Publications (1)

Publication Number Publication Date
NL62791C true NL62791C (en)

Family

ID=1817363

Family Applications (1)

Application Number Title Priority Date Filing Date
NL62791D NL62791C (en)

Country Status (1)

Country Link
NL (1) NL62791C (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4458993A (en) * 1981-10-05 1984-07-10 Kempf Paul S Fingerprint comparator

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4458993A (en) * 1981-10-05 1984-07-10 Kempf Paul S Fingerprint comparator

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