NL52393C - Device for examining material stresses with X-rays. - Google Patents
Device for examining material stresses with X-rays.Info
- Publication number
- NL52393C NL52393C NL86912A NL86912A NL52393C NL 52393 C NL52393 C NL 52393C NL 86912 A NL86912 A NL 86912A NL 86912 A NL86912 A NL 86912A NL 52393 C NL52393 C NL 52393C
- Authority
- NL
- Netherlands
- Prior art keywords
- rays
- material stresses
- examining material
- examining
- stresses
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
- G01N23/20025—Sample holders or supports therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/10—Different kinds of radiation or particles
- G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
- G01N2223/1016—X-ray
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/30—Accessories, mechanical or electrical features
- G01N2223/308—Accessories, mechanical or electrical features support of radiation source
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/40—Imaging
- G01N2223/415—Imaging radiographic film
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/60—Specific applications or type of materials
- G01N2223/607—Specific applications or type of materials strain
Landscapes
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Apparatus For Radiation Diagnosis (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE2184174X | 1937-03-17 |
Publications (1)
Publication Number | Publication Date |
---|---|
NL52393C true NL52393C (en) | 1942-05-15 |
Family
ID=7989024
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
NL86912A NL52393C (en) | 1937-03-17 | 1938-03-16 | Device for examining material stresses with X-rays. |
Country Status (5)
Country | Link |
---|---|
US (1) | US2184174A (en) |
AT (1) | AT155877B (en) |
FR (1) | FR835273A (en) |
GB (1) | GB493265A (en) |
NL (1) | NL52393C (en) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2462374A (en) * | 1944-10-04 | 1949-02-22 | Philips Lab Inc | Stress analysis by x-ray diffraction |
US4561062A (en) * | 1983-02-18 | 1985-12-24 | Her Majesty The Queen In Right Of Canada, As Represented By The Minister Of Energy, Mines And Resources | Stress measurement by X-ray diffractometry |
-
1938
- 1938-03-11 US US195409A patent/US2184174A/en not_active Expired - Lifetime
- 1938-03-14 GB GB7861/38A patent/GB493265A/en not_active Expired
- 1938-03-15 FR FR835273D patent/FR835273A/en not_active Expired
- 1938-03-16 NL NL86912A patent/NL52393C/en active
- 1938-03-17 AT AT155877D patent/AT155877B/en active
Also Published As
Publication number | Publication date |
---|---|
GB493265A (en) | 1938-10-05 |
FR835273A (en) | 1938-12-16 |
AT155877B (en) | 1939-04-11 |
US2184174A (en) | 1939-12-19 |
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