MY6900250A - Arrangements for measuring electrical properties of semiconductors - Google Patents

Arrangements for measuring electrical properties of semiconductors

Info

Publication number
MY6900250A
MY6900250A MY250/69A MY6900250A MY6900250A MY 6900250 A MY6900250 A MY 6900250A MY 250/69 A MY250/69 A MY 250/69A MY 6900250 A MY6900250 A MY 6900250A MY 6900250 A MY6900250 A MY 6900250A
Authority
MY
Malaysia
Prior art keywords
semiconductors
arrangements
electrical properties
measuring electrical
measuring
Prior art date
Application number
MY250/69A
Original Assignee
Texas Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Texas Instruments Inc filed Critical Texas Instruments Inc
Publication of MY6900250A publication Critical patent/MY6900250A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2831—Testing of materials or semi-finished products, e.g. semiconductor wafers or substrates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2637—Circuits therefor for testing other individual devices
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
MY250/69A 1961-10-02 1969-12-30 Arrangements for measuring electrical properties of semiconductors MY6900250A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US14233661A 1961-10-02 1961-10-02

Publications (1)

Publication Number Publication Date
MY6900250A true MY6900250A (en) 1969-12-31

Family

ID=22499455

Family Applications (1)

Application Number Title Priority Date Filing Date
MY250/69A MY6900250A (en) 1961-10-02 1969-12-30 Arrangements for measuring electrical properties of semiconductors

Country Status (4)

Country Link
DE (1) DE1214792B (en)
FR (1) FR1447909A (en)
GB (1) GB1014829A (en)
MY (1) MY6900250A (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL8702373A (en) * 1987-10-05 1989-05-01 Imec Inter Uni Micro Electr SYSTEM FOR MEASURING STATE DENSITY IN A SEMICONDUCTOR ELEMENT AND METHOD THEREFOR
DE102014211352B4 (en) * 2014-06-13 2021-08-12 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Layer system and method for determining the specific resistance
CN107064642B (en) * 2017-06-23 2023-12-26 东旭光电科技股份有限公司 Resistivity measuring device and method
CN114325283A (en) * 2021-12-27 2022-04-12 哈尔滨工业大学 Semiconductor performance test system under vacuum light irradiation condition and control method thereof

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2790952A (en) * 1953-05-18 1957-04-30 Bell Telephone Labor Inc Method of optically testing semiconductor junctions
US2790141A (en) * 1953-08-05 1957-04-23 Motorola Inc Semiconductor measuring system

Also Published As

Publication number Publication date
DE1214792B (en) 1966-04-21
FR1447909A (en) 1966-08-05
GB1014829A (en) 1965-12-31

Similar Documents

Publication Publication Date Title
FR1314448A (en) Sub-subminiature electrical contacts
MY6900250A (en) Arrangements for measuring electrical properties of semiconductors
FR1249047A (en) Insulator for electrical conductors
MY6900298A (en) Electrical circuits
CH388448A (en) Electrical tester
CA617464A (en) Electrical test probes
CH409305A (en) Equipment for electrical boiling water preparation
FR1300259A (en) So-called superconducting electrical devices
FR1303567A (en) Insulator for electrical conductors
AT243355B (en) Electrical switchgear
CA628064A (en) Electrical measuring apparatus
CA631151A (en) Electrical measuring apparatus
CA614049A (en) Voltage measuring circuits
CA629526A (en) Cooling of electrical apparatus
CA631822A (en) Electrical gauging device
CA625975A (en) Potting of electrical apparatus
CA613947A (en) Electrical measuring instrument
AU251475B2 (en) Electrical measuring instrument
ES90149Y (en) Self-locking electrical conductor
CA624619A (en) Fabrication of electrical units
AU242637B2 (en) Improved apparatus for indicating the electrical characteristics of electrical devices
IE26037L (en) Making semiconductors
CA613625A (en) Electrical test instrument
CA618785A (en) Electric testing meter
AU249389B2 (en) Electrical indicating instruments