MY193492A - Dryness sensor - Google Patents

Dryness sensor

Info

Publication number
MY193492A
MY193492A MYPI2019004628A MYPI2019004628A MY193492A MY 193492 A MY193492 A MY 193492A MY PI2019004628 A MYPI2019004628 A MY PI2019004628A MY PI2019004628 A MYPI2019004628 A MY PI2019004628A MY 193492 A MY193492 A MY 193492A
Authority
MY
Malaysia
Prior art keywords
wavelength band
light
bandpass filter
electric signal
wavelength
Prior art date
Application number
MYPI2019004628A
Inventor
Baba Toru
Matsunami Hirotaka
Watabe Yoshifumi
Original Assignee
Panasonic Ip Man Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Panasonic Ip Man Co Ltd filed Critical Panasonic Ip Man Co Ltd
Publication of MY193492A publication Critical patent/MY193492A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3554—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for determining moisture content
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/02—Details
    • H01L31/0232—Optical elements or arrangements associated with the device
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/08—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
    • H01L31/10—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors characterised by potential barriers, e.g. phototransistors

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Computer Hardware Design (AREA)
  • Analytical Chemistry (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Electromagnetism (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Theoretical Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

A dryness sensor (1) includes: a first bandpass filter (32) configured to extract light in a first wavelength band in which absorption by water is high; a second bandpass filter (42) configured to extract light in a second wavelength band in which the absorption by water is lower than in the first wavelength band; a first light-receiving unit (33) configured to convert the light in the first wavelength band reflected by an object (2) and passed through the first bandpass filter (32) into a first electric signal; a second light-receiving unit (43) configured to convert the light in the second wavelength band reflected by the object (2) and passed through the second bandpass filter (42) into a second electric signal; and a calculation processing unit (56) configured to detect a dryness of the object (2) based on the first electric signal and the second electric signal. A center wavelength of the first wavelength band and a center wavelength of the second wavelength band constitute a combination selected from 1400 nm or more to 1600 nm, the combination being capable of producing a change in a signal ratio for each of a plurality of material candidates for the object (2).
MYPI2019004628A 2017-02-24 2018-02-15 Dryness sensor MY193492A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2017034176 2017-02-24
PCT/JP2018/005161 WO2018155289A1 (en) 2017-02-24 2018-02-15 Dryness sensor

Publications (1)

Publication Number Publication Date
MY193492A true MY193492A (en) 2022-10-17

Family

ID=63252781

Family Applications (1)

Application Number Title Priority Date Filing Date
MYPI2019004628A MY193492A (en) 2017-02-24 2018-02-15 Dryness sensor

Country Status (4)

Country Link
JP (1) JP6712792B2 (en)
CN (1) CN110312924B (en)
MY (1) MY193492A (en)
WO (1) WO2018155289A1 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7170237B2 (en) * 2019-06-20 2022-11-14 パナソニックＩｐマネジメント株式会社 SENSITIVITY ADJUSTMENT PLATE AND SENSOR DEVICE MANUFACTURING METHOD

Family Cites Families (25)

* Cited by examiner, † Cited by third party
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US4577104A (en) * 1984-01-20 1986-03-18 Accuray Corporation Measuring the percentage or fractional moisture content of paper having a variable infrared radiation scattering characteristic and containing a variable amount of a broadband infrared radiation absorber
JPH06123700A (en) * 1992-06-03 1994-05-06 Hamamatsu Photonics Kk Method and device for measuring infrared-ray absorption
US6115644A (en) * 1993-03-11 2000-09-05 Cedarapids, Inc., Moisture content measuring apparatus and method
US5343045A (en) * 1993-06-11 1994-08-30 Ontario Hydro Method and device for measuring moisture content
JPH08201286A (en) * 1995-01-24 1996-08-09 Chino Corp Optical measuring apparatus
JPH09210905A (en) * 1996-02-06 1997-08-15 Ishikawajima Harima Heavy Ind Co Ltd Sensing device for road surface moistness with laser
JPH10232200A (en) * 1997-02-19 1998-09-02 Matsushita Electric Ind Co Ltd Dryness informing device
US9075008B2 (en) * 2003-11-07 2015-07-07 Kyle H. Holland Plant treatment based on a water invariant chlorophyll index
EP2026058A4 (en) * 2006-06-08 2009-12-30 Omron Healthcare Co Ltd Biological component measurement device capable of accurately noninvasively measuring biological component
CN101501491B (en) * 2006-08-04 2012-08-29 爱科来株式会社 Analysis method and analysis apparatus
AT507221B1 (en) * 2009-04-16 2010-03-15 Dietmar Ueblacker DEVICE FOR MEASURING THE WATER CONTENT OF A SUBSTANCE MIXTURE
CN201819877U (en) * 2010-03-30 2011-05-04 浙江师范大学 Fast milk moisture monitoring device based on near infrared spectral analysis technology
JP5531832B2 (en) * 2010-07-06 2014-06-25 セイコーエプソン株式会社 Optical filter, optical filter module, spectrophotometer and optical instrument
JP5539176B2 (en) * 2010-12-10 2014-07-02 アズビル株式会社 Dryness measuring device and dryness measuring method
JP5741088B2 (en) * 2011-03-14 2015-07-01 セイコーエプソン株式会社 Position detection system and projection display system
CN102279164A (en) * 2011-07-21 2011-12-14 东北大学 Difference measurement method and device for low moisture content of fiber bragg grating with double wavelengths and double light paths
JP6075372B2 (en) * 2012-03-28 2017-02-08 横河電機株式会社 Material property measuring device
WO2013157217A1 (en) * 2012-04-19 2013-10-24 パナソニック株式会社 Device for detecting fluctuation in moisture content, method for detecting fluctuation in moisture content, vacuum gauge, and method for detecting fluctuation in vacuum degree
US9829380B2 (en) * 2013-07-17 2017-11-28 Panasonic Intellectual Property Management Co., Ltd. Spectroscopic apparatus
WO2015091245A1 (en) * 2013-12-18 2015-06-25 Robert Bosch Gmbh Skin sensing using spectral analysis
US9322756B2 (en) * 2014-02-21 2016-04-26 Maxim Integrated Products, Inc. Nondispersive infrared micro-optics sensor for blood alcohol concentration measurements
EP3175032B1 (en) * 2014-07-31 2018-09-12 Electrolux Appliances Aktiebolag Laundry treatment apparatus with humidity detector
JP6467801B2 (en) * 2014-07-31 2019-02-13 セイコーエプソン株式会社 Spectral image acquisition device and received light wavelength acquisition method
US9423302B2 (en) * 2014-09-02 2016-08-23 Shimadzu Corporation Spectroscopic analysis device, spectroscopic analysis method and program for spectroscopic analysis device
JP6498479B2 (en) * 2015-03-10 2019-04-10 日置電機株式会社 Light intensity measuring device

Also Published As

Publication number Publication date
CN110312924A (en) 2019-10-08
JP6712792B2 (en) 2020-06-24
WO2018155289A1 (en) 2018-08-30
CN110312924B (en) 2021-11-23
JPWO2018155289A1 (en) 2019-11-07

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