MY110622A - Blu-green laser diode - Google Patents

Blu-green laser diode

Info

Publication number
MY110622A
MY110622A MYPI92000817A MYPI19920817A MY110622A MY 110622 A MY110622 A MY 110622A MY PI92000817 A MYPI92000817 A MY PI92000817A MY PI19920817 A MYPI19920817 A MY PI19920817A MY 110622 A MY110622 A MY 110622A
Authority
MY
Malaysia
Prior art keywords
layer
type
energy
electrode
guiding
Prior art date
Application number
MYPI92000817A
Inventor
A Haase Michael
M Depuydt James
Cheng Hwa
Qiu Jun
Original Assignee
Minnesota Mining & Mfg
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US07/700,606 external-priority patent/US5274269A/en
Priority claimed from US07/700,580 external-priority patent/US5213998A/en
Application filed by Minnesota Mining & Mfg filed Critical Minnesota Mining & Mfg
Publication of MY110622A publication Critical patent/MY110622A/en

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/36—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the electrodes
    • H01L33/40—Materials therefor
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y20/00—Nanooptics, e.g. quantum optics or photonic crystals
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/005—Processes
    • H01L33/0083—Processes for devices with an active region comprising only II-VI compounds
    • H01L33/0087—Processes for devices with an active region comprising only II-VI compounds with a substrate not being a II-VI compound
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/02—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
    • H01L33/26—Materials of the light emitting region
    • H01L33/28—Materials of the light emitting region containing only elements of Group II and Group VI of the Periodic Table
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/02—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
    • H01L33/26—Materials of the light emitting region
    • H01L33/28—Materials of the light emitting region containing only elements of Group II and Group VI of the Periodic Table
    • H01L33/285—Materials of the light emitting region containing only elements of Group II and Group VI of the Periodic Table characterised by the doping materials
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/36—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the electrodes
    • H01L33/38—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the electrodes with a particular shape
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/04—Processes or apparatus for excitation, e.g. pumping, e.g. by electron beams
    • H01S5/042—Electrical excitation ; Circuits therefor
    • H01S5/0421—Electrical excitation ; Circuits therefor characterised by the semiconducting contacting layers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/30—Structure or shape of the active region; Materials used for the active region
    • H01S5/32—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures
    • H01S5/327—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures in AIIBVI compounds, e.g. ZnCdSe-laser
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/30—Structure or shape of the active region; Materials used for the active region
    • H01S5/34—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
    • H01S5/347—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIBVI compounds, e.g. ZnCdSe- laser
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/02—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
    • H01L33/14—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a carrier transport control structure, e.g. highly-doped semiconductor layer or current-blocking structure
    • H01L33/145—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a carrier transport control structure, e.g. highly-doped semiconductor layer or current-blocking structure with a current-blocking structure
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/20—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
    • H01S5/22—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure
    • H01S5/2205—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure comprising special burying or current confinement layers
    • H01S5/2213—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure comprising special burying or current confinement layers based on polyimide or resin
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/20—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
    • H01S5/22—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure
    • H01S5/223—Buried stripe structure
    • H01S5/2231—Buried stripe structure with inner confining structure only between the active layer and the upper electrode
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/30—Structure or shape of the active region; Materials used for the active region
    • H01S5/305—Structure or shape of the active region; Materials used for the active region characterised by the doping materials used in the laser structure
    • H01S5/3054—Structure or shape of the active region; Materials used for the active region characterised by the doping materials used in the laser structure p-doping
    • H01S5/3059—Structure or shape of the active region; Materials used for the active region characterised by the doping materials used in the laser structure p-doping in II-VI materials
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/30—Structure or shape of the active region; Materials used for the active region
    • H01S5/305—Structure or shape of the active region; Materials used for the active region characterised by the doping materials used in the laser structure
    • H01S5/3068—Structure or shape of the active region; Materials used for the active region characterised by the doping materials used in the laser structure deep levels
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/30—Structure or shape of the active region; Materials used for the active region
    • H01S5/34—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
    • H01S5/3403—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers having a strained layer structure in which the strain performs a special function, e.g. general strain effects, strain versus polarisation

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Optics & Photonics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Chemical & Material Sciences (AREA)
  • Nanotechnology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biophysics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Semiconductor Lasers (AREA)
  • Led Devices (AREA)
  • Luminescent Compositions (AREA)

Abstract

A II-VI COMPOUND SEMICONDUCTOR LASER DIODE (10) IS FORMED FROM OVERLAYING LAYERS OF MATERIAL INCLUDING AN N-TYPE SINGLE CRYSTAL SEMICONDUCTOR SUBSTRATE (12), ADJACENT N-TYPE AND P-TYPE GUIDING LASERS (14 AND 16) OF II-VI SEMICONDUCTOR FORMING A PN JUCTION, A QUANTUM WELL ACTIVE LAYER (18) OF II-VI SEMICONDUCTOR BETWEEN THE GUIDING LAYERS (14 AND 16), FIRST ELECTRODE (32) OPPOSITE THE SUBSTRATE (12) FROM THE N-TYPE GUIDING LAYER (14), AND A SECOND ELECTRODE (30) OPPOSITE THE P-TYPE GUIDING LAYER (16) FROM THE QUANTUM WELL LAYER (18). ELECTRODE LAYER (30) IS CHARACTERIZED BY AFERMI ENERGY. A P-TYPE OHMIC CONTACT LAYER (26) IS DOPED, WITH SHALLOW ACCEPTORS HAVING A SHALLOW ACCEPTOR ENERGY, TO A NET ACCEPTOR CONCENTRATION OF AT LEAST 1 x 1017CM-3, AND INCLUDES SUFFICIENT DEEP ENERGY STATES BETWEEN THE SHALLOW ACCEPTOR ENERGY AND THE ELECTRODE LAYER FERMI ENERGY TO ENABLE CASCADE TUNNELING BY CHARGE CARRIERS.
MYPI92000817A 1991-05-15 1992-05-14 Blu-green laser diode MY110622A (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US70060191A 1991-05-15 1991-05-15
US07/700,606 US5274269A (en) 1991-05-15 1991-05-15 Ohmic contact for p-type group II-IV compound semiconductors
US07/700,580 US5213998A (en) 1991-05-15 1991-05-15 Method for making an ohmic contact for p-type group II-VI compound semiconductors

Publications (1)

Publication Number Publication Date
MY110622A true MY110622A (en) 1998-09-30

Family

ID=27418708

Family Applications (2)

Application Number Title Priority Date Filing Date
MYPI95003142A MY111574A (en) 1991-05-15 1992-05-14 Blue-green laser diode
MYPI92000817A MY110622A (en) 1991-05-15 1992-05-14 Blu-green laser diode

Family Applications Before (1)

Application Number Title Priority Date Filing Date
MYPI95003142A MY111574A (en) 1991-05-15 1992-05-14 Blue-green laser diode

Country Status (16)

Country Link
EP (2) EP0584236B1 (en)
JP (1) JP3269558B2 (en)
KR (1) KR100247682B1 (en)
CN (2) CN1321488C (en)
AU (1) AU654726B2 (en)
BR (1) BR9205993A (en)
CA (1) CA2109310C (en)
DE (1) DE69220942T2 (en)
ES (1) ES2104931T3 (en)
FI (1) FI110971B (en)
HK (1) HK1001353A1 (en)
IL (1) IL101857A (en)
MY (2) MY111574A (en)
RU (1) RU2127478C1 (en)
SG (1) SG46466A1 (en)
WO (1) WO1992021170A2 (en)

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US5396103A (en) * 1991-05-15 1995-03-07 Minnesota Mining And Manufacturing Company Graded composition ohmic contact for P-type II-VI semiconductors
US5341001A (en) * 1992-02-13 1994-08-23 Matsushita Electric Industrial Co., Ltd. Sulfide-selenide manganese-zinc mixed crystal photo semiconductor and laser diode
JP3453787B2 (en) * 1993-06-18 2003-10-06 ソニー株式会社 Semiconductor laser and manufacturing method thereof
US5640409A (en) * 1993-07-02 1997-06-17 Sony Corporation Semiconductor laser
US5422902A (en) * 1993-07-02 1995-06-06 Philips Electronics North America Corporation BeTe-ZnSe graded band gap ohmic contact to p-type ZnSe semiconductors
MY111898A (en) * 1993-07-02 2001-02-28 Sony Corp Semiconductor laser
JPH07231142A (en) * 1994-02-18 1995-08-29 Mitsubishi Electric Corp Semiconductor light emitting element
JPH07263372A (en) * 1994-03-24 1995-10-13 Sharp Corp Ii-vi compound semiconductor device and its manufacture
US5442204A (en) * 1994-05-12 1995-08-15 Philips Electronics North America Corporation III-V Semiconductor heterostructure contacting a P-type II-VI compound
US6876003B1 (en) 1999-04-15 2005-04-05 Sumitomo Electric Industries, Ltd. Semiconductor light-emitting device, method of manufacturing transparent conductor film and method of manufacturing compound semiconductor light-emitting device
DE10260183A1 (en) * 2002-12-20 2004-07-15 Osram Opto Semiconductors Gmbh Vertically emitting optically pumped semiconductor laser with external resonator and semiconductor body with quantum trough structure as active zone with intertrough barriers
JP4085953B2 (en) * 2003-10-22 2008-05-14 住友電気工業株式会社 Semiconductor optical device
JP4411540B2 (en) * 2005-09-15 2010-02-10 ソニー株式会社 Semiconductor laser device
TWI649895B (en) * 2010-04-30 2019-02-01 美國波士頓大學信託會 High-efficiency ultraviolet light-emitting diode with variable structure position
CN102185058B (en) * 2011-04-02 2013-09-25 映瑞光电科技(上海)有限公司 Nitride light-emitting diode (LED) structure and preparation method thereof
CN102185060B (en) * 2011-04-15 2014-07-16 映瑞光电科技(上海)有限公司 Nitride light emitting diode (LED) structure and preparation method thereof
WO2014188149A1 (en) 2013-05-20 2014-11-27 Milan Momcilo Popovich Holographic waveguide eye tracker
US20180275402A1 (en) 2015-01-12 2018-09-27 Digilens, Inc. Holographic waveguide light field displays
CN107873086B (en) 2015-01-12 2020-03-20 迪吉伦斯公司 Environmentally isolated waveguide display
CN108474945B (en) 2015-10-05 2021-10-01 迪吉伦斯公司 Waveguide display
DE102019205376A1 (en) * 2019-04-15 2020-10-15 Forschungszentrum Jülich Establishing an ohmic contact and an electronic component with an ohmic contact
JP7207365B2 (en) * 2019-06-19 2023-01-18 株式会社デンソー Semiconductor laser light source module, semiconductor laser device
KR20220054386A (en) 2019-08-29 2022-05-02 디지렌즈 인코포레이티드. Vacuum Bragg grating and manufacturing method thereof
DE102021004609A1 (en) 2021-09-11 2023-03-16 Eques Consulting GmbH Device and method that can be carried out with it for the non-invasive determination of the concentration of components in the human bloodstream and use of the method.
CN115498077A (en) * 2022-09-22 2022-12-20 深圳市思坦科技有限公司 Preparation method of red light micro LED chip, red light micro LED chip and display device

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Also Published As

Publication number Publication date
WO1992021170A2 (en) 1992-11-26
IL101857A0 (en) 1992-12-30
AU2026492A (en) 1992-12-30
RU2127478C1 (en) 1999-03-10
JPH06508003A (en) 1994-09-08
EP0584236B1 (en) 1997-07-16
CA2109310A1 (en) 1992-11-16
EP0670593A2 (en) 1995-09-06
FI935022A (en) 1993-11-12
WO1992021170A3 (en) 1993-03-04
CN1097317C (en) 2002-12-25
MY111574A (en) 2000-08-30
BR9205993A (en) 1994-08-02
KR100247682B1 (en) 2000-03-15
CN1066936A (en) 1992-12-09
DE69220942T2 (en) 1998-03-05
ES2104931T3 (en) 1997-10-16
IL101857A (en) 1998-12-06
CN1474485A (en) 2004-02-11
AU654726B2 (en) 1994-11-17
CA2109310C (en) 2001-10-02
SG46466A1 (en) 1998-02-20
FI110971B (en) 2003-04-30
EP0584236A1 (en) 1994-03-02
CN1321488C (en) 2007-06-13
JP3269558B2 (en) 2002-03-25
HK1001353A1 (en) 1998-06-12
FI935022A0 (en) 1993-11-12
DE69220942D1 (en) 1997-08-21
EP0670593A3 (en) 1996-02-07

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