MX2017015177A - Dispositivo optico para detectar un defecto interno de un sustrato transparente y metodo para el mismo. - Google Patents

Dispositivo optico para detectar un defecto interno de un sustrato transparente y metodo para el mismo.

Info

Publication number
MX2017015177A
MX2017015177A MX2017015177A MX2017015177A MX2017015177A MX 2017015177 A MX2017015177 A MX 2017015177A MX 2017015177 A MX2017015177 A MX 2017015177A MX 2017015177 A MX2017015177 A MX 2017015177A MX 2017015177 A MX2017015177 A MX 2017015177A
Authority
MX
Mexico
Prior art keywords
substrate
detection unit
detecting
optical device
photosensitive element
Prior art date
Application number
MX2017015177A
Other languages
English (en)
Inventor
Zheng Yuan
Zhu Jia
Original Assignee
Saint Gobain
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Saint Gobain filed Critical Saint Gobain
Publication of MX2017015177A publication Critical patent/MX2017015177A/es

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8914—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G01N2021/8867—Grading and classifying of flaws using sequentially two or more inspection runs, e.g. coarse and fine, or detecting then analysing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
    • G01N2021/8967—Discriminating defects on opposite sides or at different depths of sheet or rod

Landscapes

  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Pathology (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

Se proporciona un dispositivo óptico (100) y un método para detectar un defecto de un sustrato transparente (130). El dispositivo óptico (100) para detectar un defecto interno de un sustrato transparente (130) incluye: una primera unidad de detección (110) configurada para detectar el sustrato (130) en una baja resolución predeterminada, donde la primera unidad de detección (110) incluye un primer elemento fotosensible (111) y una primera lente (112) entre el sustrato (130) y el primer elemento fotosensible (111), y el primer elemento fotosensible (111) y la primera lente (112) se disponen de modo que un plano objeto se incline en relación con el sustrato (130); una segunda unidad de detección (120) configurada para detectar el sustrato (130) en una alta resolución predeterminada, donde la segunda unidad de detección (120) incluye un segundo elemento fotosensible (121) y una segunda lente (122) entre el sustrato (130) y el segundo elemento fotosensible (121); y un procesador (150) configurado para determinar una porción de los defectos detectados por la primera unidad de detección (110) como defectos que se detectarán por la segunda unidad de detección (120), y determinar un tipo del defecto con base en una imagen para el sustrato (130) capturado por la segunda unidad de detección (120).
MX2017015177A 2015-06-03 2016-05-18 Dispositivo optico para detectar un defecto interno de un sustrato transparente y metodo para el mismo. MX2017015177A (es)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CN201510301023.0A CN106248684B (zh) 2015-06-03 2015-06-03 用于检测透明基底的内部瑕疵的光学装置及方法
PCT/CN2016/082440 WO2016192534A1 (en) 2015-06-03 2016-05-18 Optical device for detecting an internal flaw of a transparent substrate and method for the same

Publications (1)

Publication Number Publication Date
MX2017015177A true MX2017015177A (es) 2018-04-13

Family

ID=57440044

Family Applications (1)

Application Number Title Priority Date Filing Date
MX2017015177A MX2017015177A (es) 2015-06-03 2016-05-18 Dispositivo optico para detectar un defecto interno de un sustrato transparente y metodo para el mismo.

Country Status (8)

Country Link
US (1) US10429317B2 (es)
EP (1) EP3304055A4 (es)
KR (1) KR20180015139A (es)
CN (1) CN106248684B (es)
BR (1) BR112017025162B1 (es)
DE (1) DE202016009070U1 (es)
MX (1) MX2017015177A (es)
WO (1) WO2016192534A1 (es)

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KR102373458B1 (ko) 2018-02-07 2022-03-10 주식회사 엘지에너지솔루션 배터리를 위한 등가 회로 모델의 파라미터 추정 방법 및 배터리 관리 시스템
US10599951B2 (en) * 2018-03-28 2020-03-24 Kla-Tencor Corp. Training a neural network for defect detection in low resolution images
FR3101420A1 (fr) * 2019-09-30 2021-04-02 Saint-Gobain Glass France Méthode d’évaluation de la qualité optique d’une zone délimitée d’un vitrage
CN110987954B (zh) * 2019-12-30 2021-10-22 江南大学 一种消除皮革表面缺陷检测盲区的方法及***
CN116309559B (zh) * 2023-05-17 2023-08-04 山东鲁玻玻璃科技有限公司 一种中硼硅玻璃生产瑕疵智能识别方法
JP7415215B1 (ja) 2023-09-05 2024-01-17 ダイトロン株式会社 外観検査装置
CN117191807B (zh) * 2023-11-06 2024-01-30 常州讯磊电子科技有限公司 一种基于工业相机的产品在线缺陷检测装置

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Also Published As

Publication number Publication date
US10429317B2 (en) 2019-10-01
KR20180015139A (ko) 2018-02-12
CN106248684B (zh) 2019-12-17
BR112017025162B1 (pt) 2022-03-03
DE202016009070U1 (de) 2021-11-18
EP3304055A1 (en) 2018-04-11
WO2016192534A1 (en) 2016-12-08
US20180164225A1 (en) 2018-06-14
BR112017025162A2 (pt) 2018-08-07
EP3304055A4 (en) 2019-01-09
CN106248684A (zh) 2016-12-21

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