KR970048574A - Boundary scan input circuit - Google Patents

Boundary scan input circuit Download PDF

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Publication number
KR970048574A
KR970048574A KR1019950055928A KR19950055928A KR970048574A KR 970048574 A KR970048574 A KR 970048574A KR 1019950055928 A KR1019950055928 A KR 1019950055928A KR 19950055928 A KR19950055928 A KR 19950055928A KR 970048574 A KR970048574 A KR 970048574A
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South Korea
Prior art keywords
boundary scan
input
reset
signal
input circuit
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KR1019950055928A
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Korean (ko)
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KR100209221B1 (en
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김민환
김영복
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김주용
현대전자산업 주식회사
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Priority to KR1019950055928A priority Critical patent/KR100209221B1/en
Publication of KR970048574A publication Critical patent/KR970048574A/en
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Publication of KR100209221B1 publication Critical patent/KR100209221B1/en

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317Testing of digital circuits
    • G01R31/3181Functional testing
    • G01R31/3185Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

본 발명은 바운더리 스캔 입력회로에 관한 것으로, 특히 반도체 소자에서 리셋 핀과 코어 로직 리셋(core logic reset) 입력 사이에 바운더리 스캔을 제공하는 회로에 관한 것으로, 바운더리 스캔 입력 회로는 각 테스트 모드사이에서 시스템 리셋이 논리적으로 연결되어 있지 않더라도 테스트의 끝부분이나 시작전에 코어 로직을 리셋시켜 주는 역할을 한다. 따라서 본 발명은 여러가지 테스트 모드를 안정적으로 연속 테스트할 수 있으며, 리셋 핀을 가지고 있는 모든 반도체 소자에서 바운더리 스캔 테스트 기능을 제공할 뿐만 아니라 테스트에 있어서도 편리한 잇점이 있다.The present invention relates to a boundary scan input circuit, and more particularly to a circuit providing a boundary scan between a reset pin and a core logic reset input in a semiconductor device, the boundary scan input circuit is a system between each test mode Even if the reset is not logically connected, it resets the core logic before the end or beginning of the test. Accordingly, the present invention can stably and continuously test various test modes, and provides a boundary scan test function in all semiconductor devices having a reset pin, as well as a convenient test.

Description

바운더리 스캔 입력회로Boundary scan input circuit

본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음As this is a public information case, the full text was not included.

제1도는 본 발명에 따른 바운더리 스캔 입력 회로의 구성도.1 is a block diagram of a boundary scan input circuit according to the present invention.

Claims (8)

바운더리 스캔 리셋 입력회로에 있어서, 바운더리 스캔제어신호를 입력으로 하고 외부 리셋 신호를 저장하기 위한 저장수단; 리셋 제어신호와 BIST(built-in-self-test) 제어신호를 논리 결합하는 제1논리수단; 시스템 리셋 신호에 연결된 첫번째 입력과 BIST 제어신호와 상기 저장 수단의 출력인 두번째 입력을 선택하기 위한 선택신호로 이루어진 제어 가능한 전환 수단; 외부 테스트 제어신호와 상기 전환수단의 출력을 복수 입력으로 하고 코어로직 리셋을 제공하는 제2논리수단을 구비하는 것을 특징으로 하는 바운더리 스캔 리셋입력회로.A boundary scan reset input circuit, comprising: storage means for inputting a boundary scan control signal and storing an external reset signal; First logic means for logically combining a reset control signal and a built-in-self-test (BIST) control signal; Controllable switching means comprising a first input coupled to a system reset signal and a BIST control signal and a selection signal for selecting a second input that is an output of said storage means; 2. A boundary scan reset input circuit comprising a second logic means for providing a plurality of inputs of an external test control signal and the output of the switching means and providing a core logic reset. 제1항에 있어서, 상기 저장수단은, 래치인 것을 특징으로 하는 바운더리 스캔 리셋입력회로.2. The boundary scan reset input circuit according to claim 1, wherein said storage means is a latch. 제1항에 있어서, 상기 제1논리수단은, 논리합 연산기인 것을 특징으로 바운더리 스캔 리셋입력회로.2. The boundary scan reset input circuit according to claim 1, wherein said first logic means is a logical sum calculator. 제1항에 있어서, 상기 전환수단은, 멀티플렉서인 것을 특징으로 하는 바운더리 스캔 리셋입력회로.2. The boundary scan reset input circuit according to claim 1, wherein said switching means is a multiplexer. 제1항에 있어서, 상기 제2논리수단은, 논리합 연산기인 것을 특징으로 하는 바운더리 스캔 리셋입력회로.2. The boundary scan reset input circuit according to claim 1, wherein said second logic means is a logical sum calculator. 바운더리 스캔 제어회로에 있어서, 시스템 리셋 신호에 연결된 첫번째 BIST제어신호와 상기 저장 수단의 출력인 두번째 입력과 복수 입력을 선택하기 위한 선택 신호로 이루어진 제어가능한 제1전환 수단; 상기 제어 가능한 제1전환수단의 출력을 첫번째 입력으로 하고 전단의 바운더리 스캔 출력을 첫번째 입력으로 하고 전단의 바운더리 스캔 출력 신호를 두번째 입력으로하고 이 두복수의 입력을 선택 하기 위한 선택 신호로 이루어진 제어 가능한 제2전환수단; 상기 제어가능한 제2전환수단의 출력을 데이타 입력으로 하고 외부 클럭을 입력으로 하고 외부 리셋신호를 입력으로 하는 저장수단을 구비하는 것을 특징으로 하는 바운더리 스캔 제어회로.1. A boundary scan control circuit, comprising: first control means for switching comprising a first BIST control signal coupled to a system reset signal and a selection signal for selecting a second input and a plurality of inputs that are outputs of said storage means; A controllable signal consisting of a selection signal for selecting the output of the controllable first switching means as the first input, the boundary scan output of the front end as the first input, the boundary scan output signal of the front end as the second input, and selecting the plurality of inputs. Second switching means; A boundary scan control circuit comprising an output of said controllable second switching means as a data input, an external clock as an input, and an external reset signal as an input. 제6항에 있어서, 상기 제어 가능한 제2전환 수단은, 멀티플렉서인 것을 특징으로 하는 바운더리 스캔제어회로.7. The boundary scan control circuit according to claim 6, wherein said controllable second switching means is a multiplexer. 제6항에 있어서, 상기 저장 수단은, D플립플롭인 것을 특징으로 하는 바운더리 스캔 제어회로.7. The boundary scan control circuit according to claim 6, wherein the storage means is a D flip flop. ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.※ Note: The disclosure is based on the initial application.
KR1019950055928A 1995-12-23 1995-12-23 Boundary-scan circuit KR100209221B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1019950055928A KR100209221B1 (en) 1995-12-23 1995-12-23 Boundary-scan circuit

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Application Number Priority Date Filing Date Title
KR1019950055928A KR100209221B1 (en) 1995-12-23 1995-12-23 Boundary-scan circuit

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KR970048574A true KR970048574A (en) 1997-07-29
KR100209221B1 KR100209221B1 (en) 1999-07-15

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