KR960038721A - How to drive TFE LCD - Google Patents
How to drive TFE LCD Download PDFInfo
- Publication number
- KR960038721A KR960038721A KR1019950009242A KR19950009242A KR960038721A KR 960038721 A KR960038721 A KR 960038721A KR 1019950009242 A KR1019950009242 A KR 1019950009242A KR 19950009242 A KR19950009242 A KR 19950009242A KR 960038721 A KR960038721 A KR 960038721A
- Authority
- KR
- South Korea
- Prior art keywords
- line
- inverted
- tft lcd
- crosstalk
- inversion
- Prior art date
Links
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- Liquid Crystal Display Device Control (AREA)
- Control Of Indicators Other Than Cathode Ray Tubes (AREA)
Abstract
본 발명은 스캐닝 라인을 그룹단위로 인버젼하여 크로스토크를 감소시키는 TFT LCD 구동방법에 관한 것이다. 종래의 컬럼 인버젼 구동방법으로 TFT LCD를 구동할 경우 수평 크로스토크는 감소시킬 수 있으나 수직 크로스토크는 완전히 제거하지 못하는 단점이 있었던 점을 감안하여 본 발명은 TFT LCD 구동방법에 있어서, 컬럼 라인은 각 1개의 라인 별로 인버젼하고, 스캐닝 라인은 2라인 이상을 1조로 하여 상기 컬럼 라인의 인버젼과 동시에 인버젼하며 스캐닝 라인의 인버젼시 스캐닝 라인은 맨 처음 라인부터 차례대로 선택되도록 함으로써 수평 및 수직 인버젼을 동시에 실시하므로 TFT LCD에 발생되는 수평 및 수직 크로스토크를 동시에 감소시키는 것이 가능토록 한 것이다.The present invention relates to a TFT LCD driving method for reducing crosstalk by inverting scanning lines in group units. When the TFT LCD is driven by the conventional column inversion driving method, the horizontal crosstalk can be reduced, but the vertical crosstalk cannot be completely removed. Each line is inverted, and the scanning line is inverted simultaneously with the inversion of the column line using two or more sets as one set. When the scanning line is inverted, the scanning line is selected in order from the first line. By performing vertical inversion at the same time, it is possible to simultaneously reduce the horizontal and vertical crosstalk generated in the TFT LCD.
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음As this is a public information case, the full text was not included.
제5도는 본 발명을 구현하기 위한 하드웨어 블록도.5 is a hardware block diagram for implementing the present invention.
Claims (2)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019950009242A KR960038721A (en) | 1995-04-19 | 1995-04-19 | How to drive TFE LCD |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019950009242A KR960038721A (en) | 1995-04-19 | 1995-04-19 | How to drive TFE LCD |
Publications (1)
Publication Number | Publication Date |
---|---|
KR960038721A true KR960038721A (en) | 1996-11-21 |
Family
ID=66523031
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019950009242A KR960038721A (en) | 1995-04-19 | 1995-04-19 | How to drive TFE LCD |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR960038721A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100502809B1 (en) * | 1997-12-31 | 2005-10-19 | 삼성전자주식회사 | How to operate the LCD |
US7393489B2 (en) | 2003-02-08 | 2008-07-01 | Samsung Electronics Co., Ltd. | Mold die for molding chip array, molding equipment including the same, and method for molding chip array |
US7423625B2 (en) | 2003-11-18 | 2008-09-09 | Samsung Electronics, Co., Ltd. | Liquid crystal display and driving method thereof |
-
1995
- 1995-04-19 KR KR1019950009242A patent/KR960038721A/en not_active Application Discontinuation
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100502809B1 (en) * | 1997-12-31 | 2005-10-19 | 삼성전자주식회사 | How to operate the LCD |
US7393489B2 (en) | 2003-02-08 | 2008-07-01 | Samsung Electronics Co., Ltd. | Mold die for molding chip array, molding equipment including the same, and method for molding chip array |
US7423625B2 (en) | 2003-11-18 | 2008-09-09 | Samsung Electronics, Co., Ltd. | Liquid crystal display and driving method thereof |
US8174519B2 (en) | 2003-11-18 | 2012-05-08 | Samsung Electronics Co., Ltd. | Liquid crystal display and driving method thereof |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
N231 | Notification of change of applicant | ||
WITN | Withdrawal due to no request for examination |