KR950028685U - 카너비 조절이 가능한 반도체 소자 매뉴얼 테스트용 텍스트 툴 - Google Patents
카너비 조절이 가능한 반도체 소자 매뉴얼 테스트용 텍스트 툴Info
- Publication number
- KR950028685U KR950028685U KR2019940006016U KR19940006016U KR950028685U KR 950028685 U KR950028685 U KR 950028685U KR 2019940006016 U KR2019940006016 U KR 2019940006016U KR 19940006016 U KR19940006016 U KR 19940006016U KR 950028685 U KR950028685 U KR 950028685U
- Authority
- KR
- South Korea
- Prior art keywords
- semiconductor device
- manual test
- adjustable width
- device manual
- text tool
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR2019940006016U KR0112079Y1 (ko) | 1994-03-24 | 1994-03-24 | 카너비 조절이 가능한 반도체 소자 매뉴얼 테스트용 텍스트 툴 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR2019940006016U KR0112079Y1 (ko) | 1994-03-24 | 1994-03-24 | 카너비 조절이 가능한 반도체 소자 매뉴얼 테스트용 텍스트 툴 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR950028685U true KR950028685U (ko) | 1995-10-20 |
KR0112079Y1 KR0112079Y1 (ko) | 1998-04-08 |
Family
ID=19379575
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR2019940006016U KR0112079Y1 (ko) | 1994-03-24 | 1994-03-24 | 카너비 조절이 가능한 반도체 소자 매뉴얼 테스트용 텍스트 툴 |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR0112079Y1 (ko) |
-
1994
- 1994-03-24 KR KR2019940006016U patent/KR0112079Y1/ko not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
KR0112079Y1 (ko) | 1998-04-08 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
DE69534552D1 (de) | Vorrichtung zum Querschneiden | |
DE19983412T1 (de) | Werkstückspannvorrichtung | |
NO301562B1 (no) | Anordning for måling | |
ATE194532T1 (de) | Schneidwerkzeug mit klemmvorrichtung | |
ATA70098A (de) | Kalibriervorrichtung mit zumindest einem kalibrierwerkzeug | |
DE69723261D1 (de) | Immunochromatographische testvorrichtung | |
DE59602380D1 (de) | Werkzeugspanneinrichtung | |
FI954943A0 (fi) | Nipistinkokoonpano | |
DE59704570D1 (de) | Werkstückspannvorrichtung | |
DE59902163D1 (de) | Spannvorrichtung für Werkzeugspindel | |
DE69921228D1 (de) | Einspannvorrichtung zum Schleifen von scharfkantigen Werkzeugen | |
KR950028685U (ko) | 카너비 조절이 가능한 반도체 소자 매뉴얼 테스트용 텍스트 툴 | |
NO931427L (no) | Anordning for dimensjonsmåling | |
FI952247A0 (fi) | Laite pinnan lastuavaan työstöön | |
KR960020510U (ko) | 공작물의 클램핑장치 | |
DE59502976D1 (de) | Vorrichtung zum Mischen zweier Komponenten | |
KR960002599U (ko) | 공구길이 자동측정장치 | |
FI953850A (fi) | Luotainsovitus | |
FI96012C (fi) | Säädettävä lukkiutuva nivellaite | |
KR940004344U (ko) | 반도체 디바이스 테스트용 매뉴얼 소켓 | |
KR950033187U (ko) | 스프레더 안내장치용 클램프 장치 | |
KR960026823U (ko) | 작업용 절첩식 차단장치 | |
NO931428D0 (no) | Anordning for dimensjonsmaaling | |
KR980001064U (ko) | 안내턱이 형성된 펀치 안내장치 | |
KR960025428U (ko) | 웨이퍼 검사용 클램핑장치 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
E701 | Decision to grant or registration of patent right | ||
REGI | Registration of establishment | ||
FPAY | Annual fee payment |
Payment date: 20050923 Year of fee payment: 9 |
|
LAPS | Lapse due to unpaid annual fee |