KR950028685U - 카너비 조절이 가능한 반도체 소자 매뉴얼 테스트용 텍스트 툴 - Google Patents

카너비 조절이 가능한 반도체 소자 매뉴얼 테스트용 텍스트 툴

Info

Publication number
KR950028685U
KR950028685U KR2019940006016U KR19940006016U KR950028685U KR 950028685 U KR950028685 U KR 950028685U KR 2019940006016 U KR2019940006016 U KR 2019940006016U KR 19940006016 U KR19940006016 U KR 19940006016U KR 950028685 U KR950028685 U KR 950028685U
Authority
KR
South Korea
Prior art keywords
semiconductor device
manual test
adjustable width
device manual
text tool
Prior art date
Application number
KR2019940006016U
Other languages
English (en)
Other versions
KR0112079Y1 (ko
Inventor
정재우
Original Assignee
금성일렉트론 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 금성일렉트론 주식회사 filed Critical 금성일렉트론 주식회사
Priority to KR2019940006016U priority Critical patent/KR0112079Y1/ko
Publication of KR950028685U publication Critical patent/KR950028685U/ko
Application granted granted Critical
Publication of KR0112079Y1 publication Critical patent/KR0112079Y1/ko

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
KR2019940006016U 1994-03-24 1994-03-24 카너비 조절이 가능한 반도체 소자 매뉴얼 테스트용 텍스트 툴 KR0112079Y1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019940006016U KR0112079Y1 (ko) 1994-03-24 1994-03-24 카너비 조절이 가능한 반도체 소자 매뉴얼 테스트용 텍스트 툴

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019940006016U KR0112079Y1 (ko) 1994-03-24 1994-03-24 카너비 조절이 가능한 반도체 소자 매뉴얼 테스트용 텍스트 툴

Publications (2)

Publication Number Publication Date
KR950028685U true KR950028685U (ko) 1995-10-20
KR0112079Y1 KR0112079Y1 (ko) 1998-04-08

Family

ID=19379575

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019940006016U KR0112079Y1 (ko) 1994-03-24 1994-03-24 카너비 조절이 가능한 반도체 소자 매뉴얼 테스트용 텍스트 툴

Country Status (1)

Country Link
KR (1) KR0112079Y1 (ko)

Also Published As

Publication number Publication date
KR0112079Y1 (ko) 1998-04-08

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