KR940023567U - 핸들러의 에스.오.피 콘택트장치 - Google Patents

핸들러의 에스.오.피 콘택트장치

Info

Publication number
KR940023567U
KR940023567U KR2019930004649U KR930004649U KR940023567U KR 940023567 U KR940023567 U KR 940023567U KR 2019930004649 U KR2019930004649 U KR 2019930004649U KR 930004649 U KR930004649 U KR 930004649U KR 940023567 U KR940023567 U KR 940023567U
Authority
KR
South Korea
Prior art keywords
handler
contact device
contact
Prior art date
Application number
KR2019930004649U
Other languages
English (en)
Other versions
KR960007145Y1 (ko
Inventor
고성은
Original Assignee
미래산업 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 미래산업 주식회사 filed Critical 미래산업 주식회사
Priority to KR2019930004649U priority Critical patent/KR960007145Y1/ko
Publication of KR940023567U publication Critical patent/KR940023567U/ko
Application granted granted Critical
Publication of KR960007145Y1 publication Critical patent/KR960007145Y1/ko

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2896—Testing of IC packages; Test features related to IC packages

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
KR2019930004649U 1993-03-27 1993-03-27 핸들러의 에스.오.피 콘택트장치 KR960007145Y1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019930004649U KR960007145Y1 (ko) 1993-03-27 1993-03-27 핸들러의 에스.오.피 콘택트장치

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019930004649U KR960007145Y1 (ko) 1993-03-27 1993-03-27 핸들러의 에스.오.피 콘택트장치

Publications (2)

Publication Number Publication Date
KR940023567U true KR940023567U (ko) 1994-10-22
KR960007145Y1 KR960007145Y1 (ko) 1996-08-22

Family

ID=19352731

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019930004649U KR960007145Y1 (ko) 1993-03-27 1993-03-27 핸들러의 에스.오.피 콘택트장치

Country Status (1)

Country Link
KR (1) KR960007145Y1 (ko)

Also Published As

Publication number Publication date
KR960007145Y1 (ko) 1996-08-22

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Legal Events

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