KR940023567U - 핸들러의 에스.오.피 콘택트장치 - Google Patents
핸들러의 에스.오.피 콘택트장치Info
- Publication number
- KR940023567U KR940023567U KR2019930004649U KR930004649U KR940023567U KR 940023567 U KR940023567 U KR 940023567U KR 2019930004649 U KR2019930004649 U KR 2019930004649U KR 930004649 U KR930004649 U KR 930004649U KR 940023567 U KR940023567 U KR 940023567U
- Authority
- KR
- South Korea
- Prior art keywords
- handler
- contact device
- contact
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
- G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2896—Testing of IC packages; Test features related to IC packages
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR2019930004649U KR960007145Y1 (ko) | 1993-03-27 | 1993-03-27 | 핸들러의 에스.오.피 콘택트장치 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR2019930004649U KR960007145Y1 (ko) | 1993-03-27 | 1993-03-27 | 핸들러의 에스.오.피 콘택트장치 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR940023567U true KR940023567U (ko) | 1994-10-22 |
KR960007145Y1 KR960007145Y1 (ko) | 1996-08-22 |
Family
ID=19352731
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR2019930004649U KR960007145Y1 (ko) | 1993-03-27 | 1993-03-27 | 핸들러의 에스.오.피 콘택트장치 |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR960007145Y1 (ko) |
-
1993
- 1993-03-27 KR KR2019930004649U patent/KR960007145Y1/ko not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
KR960007145Y1 (ko) | 1996-08-22 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
E701 | Decision to grant or registration of patent right | ||
REGI | Registration of establishment | ||
FPAY | Annual fee payment |
Payment date: 20070803 Year of fee payment: 12 |
|
EXPY | Expiration of term |