KR940016880U - Circuit inspection device for liquid crystal display elements - Google Patents

Circuit inspection device for liquid crystal display elements

Info

Publication number
KR940016880U
KR940016880U KR2019920027427U KR920027427U KR940016880U KR 940016880 U KR940016880 U KR 940016880U KR 2019920027427 U KR2019920027427 U KR 2019920027427U KR 920027427 U KR920027427 U KR 920027427U KR 940016880 U KR940016880 U KR 940016880U
Authority
KR
South Korea
Prior art keywords
liquid crystal
crystal display
inspection device
display elements
circuit inspection
Prior art date
Application number
KR2019920027427U
Other languages
Korean (ko)
Other versions
KR950006924Y1 (en
Inventor
예용수
Original Assignee
오리온전기 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 오리온전기 주식회사 filed Critical 오리온전기 주식회사
Priority to KR92027427U priority Critical patent/KR950006924Y1/en
Publication of KR940016880U publication Critical patent/KR940016880U/en
Application granted granted Critical
Publication of KR950006924Y1 publication Critical patent/KR950006924Y1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
KR92027427U 1992-12-30 1992-12-30 Circuit checking device for lcd KR950006924Y1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR92027427U KR950006924Y1 (en) 1992-12-30 1992-12-30 Circuit checking device for lcd

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR92027427U KR950006924Y1 (en) 1992-12-30 1992-12-30 Circuit checking device for lcd

Publications (2)

Publication Number Publication Date
KR940016880U true KR940016880U (en) 1994-07-25
KR950006924Y1 KR950006924Y1 (en) 1995-08-23

Family

ID=19348608

Family Applications (1)

Application Number Title Priority Date Filing Date
KR92027427U KR950006924Y1 (en) 1992-12-30 1992-12-30 Circuit checking device for lcd

Country Status (1)

Country Link
KR (1) KR950006924Y1 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100303536B1 (en) * 1994-10-25 2001-12-01 김순택 Highly integrated micro-connector and manufacturing method thereof
KR100647494B1 (en) * 2006-03-29 2006-11-23 주식회사 엠디플렉스 Measurement device for the electronic circuit and the method for measuring of the same

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100303536B1 (en) * 1994-10-25 2001-12-01 김순택 Highly integrated micro-connector and manufacturing method thereof
KR100647494B1 (en) * 2006-03-29 2006-11-23 주식회사 엠디플렉스 Measurement device for the electronic circuit and the method for measuring of the same

Also Published As

Publication number Publication date
KR950006924Y1 (en) 1995-08-23

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Legal Events

Date Code Title Description
A201 Request for examination
E701 Decision to grant or registration of patent right
REGI Registration of establishment
LAPS Lapse due to unpaid annual fee