KR940004358U - 디바이스의 피딩장치 - Google Patents

디바이스의 피딩장치

Info

Publication number
KR940004358U
KR940004358U KR2019920013188U KR920013188U KR940004358U KR 940004358 U KR940004358 U KR 940004358U KR 2019920013188 U KR2019920013188 U KR 2019920013188U KR 920013188 U KR920013188 U KR 920013188U KR 940004358 U KR940004358 U KR 940004358U
Authority
KR
South Korea
Prior art keywords
feeding
feeding device
device feeding
Prior art date
Application number
KR2019920013188U
Other languages
English (en)
Other versions
KR950010442Y1 (ko
Inventor
김철
Original Assignee
Lg 일렉트론 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Lg 일렉트론 주식회사 filed Critical Lg 일렉트론 주식회사
Priority to KR92013188U priority Critical patent/KR950010442Y1/ko
Publication of KR940004358U publication Critical patent/KR940004358U/ko
Application granted granted Critical
Publication of KR950010442Y1 publication Critical patent/KR950010442Y1/ko

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2865—Holding devices, e.g. chucks; Handlers or transport devices
    • G01R31/2867—Handlers or transport devices, e.g. loaders, carriers, trays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2891—Features relating to contacting the IC under test, e.g. probe heads; chucks related to sensing or controlling of force, position, temperature

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Environmental & Geological Engineering (AREA)
  • Branching, Merging, And Special Transfer Between Conveyors (AREA)
  • Control Of Conveyors (AREA)
KR92013188U 1992-07-16 1992-07-16 디바이스의 피딩장치 KR950010442Y1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR92013188U KR950010442Y1 (ko) 1992-07-16 1992-07-16 디바이스의 피딩장치

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR92013188U KR950010442Y1 (ko) 1992-07-16 1992-07-16 디바이스의 피딩장치

Publications (2)

Publication Number Publication Date
KR940004358U true KR940004358U (ko) 1994-02-24
KR950010442Y1 KR950010442Y1 (ko) 1995-12-13

Family

ID=19336862

Family Applications (1)

Application Number Title Priority Date Filing Date
KR92013188U KR950010442Y1 (ko) 1992-07-16 1992-07-16 디바이스의 피딩장치

Country Status (1)

Country Link
KR (1) KR950010442Y1 (ko)

Also Published As

Publication number Publication date
KR950010442Y1 (ko) 1995-12-13

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Legal Events

Date Code Title Description
A201 Request for examination
E701 Decision to grant or registration of patent right
REGI Registration of establishment
FPAY Annual fee payment

Payment date: 20061122

Year of fee payment: 12

EXPY Expiration of term