KR910016090A - Thin film transistor for liquid crystal display device and manufacturing method thereof - Google Patents

Thin film transistor for liquid crystal display device and manufacturing method thereof Download PDF

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Publication number
KR910016090A
KR910016090A KR1019900002830A KR900002830A KR910016090A KR 910016090 A KR910016090 A KR 910016090A KR 1019900002830 A KR1019900002830 A KR 1019900002830A KR 900002830 A KR900002830 A KR 900002830A KR 910016090 A KR910016090 A KR 910016090A
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South Korea
Prior art keywords
electrode
pixel
insulating layer
thin film
forming
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KR1019900002830A
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Korean (ko)
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KR920006195B1 (en
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최광수
권오균
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김정배
삼성전관 주식회사
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Priority to KR1019900002830A priority Critical patent/KR920006195B1/en
Publication of KR910016090A publication Critical patent/KR910016090A/en
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Publication of KR920006195B1 publication Critical patent/KR920006195B1/en

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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/76Unipolar devices, e.g. field effect transistors
    • H01L29/772Field effect transistors
    • H01L29/78Field effect transistors with field effect produced by an insulated gate

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  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Liquid Crystal (AREA)
  • Physics & Mathematics (AREA)
  • Ceramic Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Thin Film Transistor (AREA)

Abstract

내용 없음No content

Description

액정표시소자용 박막 트랜지스터 및 그의 제조방법Thin film transistor for liquid crystal display device and manufacturing method thereof

본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음Since this is an open matter, no full text was included.

제3도는 본 발명의 액정표시소자의 단면도, 제4도는 본 발명의 액정표시소자의 제조공정도, 제5도는 제3도의 본 발명의 액정표시소자의 평면도이다.3 is a cross-sectional view of the liquid crystal display device of the present invention, FIG. 4 is a manufacturing process diagram of the liquid crystal display device of the present invention, and FIG. 5 is a plan view of the liquid crystal display device of the present invention shown in FIG.

Claims (2)

유리기판(1)상에 게이트 전극(51)과 접촉(contact)용 금속패턴(52)이 형성되고, 상기 금속패턴(52)에 화소전극(2)이 접촉되어 형성됨과 동시에 그위에 화소절연층(3)이 형성되고, 상기 게이트 전극(51)상에는 제1게이트 절연층(61), 제2게이트 절연층(62), a-Si반도체층(7)과 n형 a-Si오믹층(8)이 순차 형성되며, 소오스 및 드레인 전극(9),(10)이 상기 오믹층(8)을 개재하여 a-Si반도체층(7)과 접촉되어 형성되고, 상기 소오스 전극(9)이 제1비아 픽셀(41)을 통하여 화소전극(2)과 접촉됨과 동시에 제2비아 픽셀(42)을 통하여 금속패턴(52)과 접촉되어 형성되는 것을 특징으로 하는 액정표시소자용 박막 트랜지스터.A metal pattern 52 for contacting the gate electrode 51 is formed on the glass substrate 1, and the pixel electrode 2 is formed in contact with the metal pattern 52, and a pixel insulating layer thereon. (3) is formed on the gate electrode 51, the first gate insulating layer 61, the second gate insulating layer 62, the a-Si semiconductor layer 7 and the n-type a-Si ohmic layer 8 ) Are sequentially formed, the source and drain electrodes 9, 10 are formed in contact with the a-Si semiconductor layer 7 via the ohmic layer 8, the source electrode 9 is a first A thin film transistor for a liquid crystal display device, wherein the thin film transistor is formed in contact with the pixel electrode 2 through the via pixel 41 and in contact with the metal pattern 52 through the second via pixel 42. 유리기판(1)상에 게이트 전극(51)과 소오스전극과 화소전극을 접촉시켜주기 위한 금속패턴(52)을 형성하는 공정과, 상기 게이트 전극(51)상부에 제1게이트 절연층(61)을 형성한 후, 투명도전막을 증착하고 패턴 형성하여 화소전극(2)을 형성하고, 그 위에 화소전극 절연층(3)을 증착시키는 공정과, 소오스 전극과 화소전극(2)을 접촉시키기 위하여 화소전극 절연층(3)을 전식식각하여 화소전극(52)상부에 제1비어 픽셀(41)을 형성하고, 금속패턴(2)상부에 제1비어 픽셀(42)을 각각 형성하는 공정과, 게이트 전극(51)상에 제2게이트 절연층(62)을 형성한 후, n형 a-Si오믹층(8), 소오스 및 드레인 전극(9),(10)과 소자보호층(11)을 순차 형성하는 공정을 포함하는 것을 특징으로 하는 액정표시소자용 박막 트랜지스터의 제조방법.Forming a metal pattern 52 for contacting the gate electrode 51, the source electrode and the pixel electrode on the glass substrate 1, and forming a first gate insulating layer 61 on the gate electrode 51. And then depositing a transparent conductive film and forming a pattern to form the pixel electrode 2, and depositing the pixel electrode insulating layer 3 thereon, and to contact the source electrode and the pixel electrode 2 with each other. Etching the electrode insulating layer 3 to form a first via pixel 41 on the pixel electrode 52, and forming a first via pixel 42 on the metal pattern 2, respectively; After forming the second gate insulating layer 62 on the electrode 51, the n-type a-Si ohmic layer 8, the source and drain electrodes 9, 10, and the element protection layer 11 are sequentially A method of manufacturing a thin film transistor for a liquid crystal display device, comprising the step of forming. ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.※ Note: The disclosure is based on the initial application.
KR1019900002830A 1990-02-28 1990-02-28 Manufacturing method of thin film transistor KR920006195B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1019900002830A KR920006195B1 (en) 1990-02-28 1990-02-28 Manufacturing method of thin film transistor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019900002830A KR920006195B1 (en) 1990-02-28 1990-02-28 Manufacturing method of thin film transistor

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KR910016090A true KR910016090A (en) 1991-09-30
KR920006195B1 KR920006195B1 (en) 1992-08-01

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KR920006195B1 (en) 1992-08-01

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