KR910008376A - 렌즈의 표면질 측정방법 - Google Patents

렌즈의 표면질 측정방법 Download PDF

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Publication number
KR910008376A
KR910008376A KR1019890015431A KR890015431A KR910008376A KR 910008376 A KR910008376 A KR 910008376A KR 1019890015431 A KR1019890015431 A KR 1019890015431A KR 890015431 A KR890015431 A KR 890015431A KR 910008376 A KR910008376 A KR 910008376A
Authority
KR
South Korea
Prior art keywords
lens
surface quality
measure
wavelength
measuring
Prior art date
Application number
KR1019890015431A
Other languages
English (en)
Inventor
게라드 루니 제임스
맥브리어티 빈센트
컬리지 듀블린 트리니티
Original Assignee
다니엘 이.길
바슈 앤드롬 버뮤다 테크놀로지 리미티드
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 다니엘 이.길, 바슈 앤드롬 버뮤다 테크놀로지 리미티드 filed Critical 다니엘 이.길
Publication of KR910008376A publication Critical patent/KR910008376A/ko

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/303—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

내용 없음

Description

렌즈의 표면질 측정방법
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제 1 도는 본 발명에 따른 방법을 수행하기 위한 광학 장치의 예시도,
제 2 도는 본 발명에 따른 방법을 수행하기 위한 또 다른 광학 장치의 예시도,
제 3 도는 광검출기 위치에 대한 광검출기의 출력도.

Claims (3)

  1. 렌즈의 표면상에 200㎚ 내지 2000㎚ 범위의 파장을 갖는 평행한 전자계 방사빔을 집속하는 단계와, 상기 렌즈의 표면으로부터 반사편향된 광의 강도를 측정하기 위한 단계를 포함하는 것을 특징으로 하는 렌즈의 표면질 측정방법.
  2. 제 1 항에 있어서, 레이저 비임인 전자계 방사 비임이 스펙트럼의 자외선영역 부근, 가시광선 또는 적외선 영역 부근의 파장을 갖는 것을 특징으로 하는 렌즈의 표면질 측정방법.
  3. 제1항 또는 제2항에 있어서, 상기 렌즈가 렌즈 표면을 마모시키는 레이저 방사에 연속적으로 영향을 받는 것을 특징으로 하는 렌즈의 표면질 측정방법.
    ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
KR1019890015431A 1988-10-25 1989-10-25 렌즈의 표면질 측정방법 KR910008376A (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
IE3229/88 1988-10-25
IE883229A IE883229L (en) 1988-10-25 1988-10-25 Measuring surface quality of a lens

Publications (1)

Publication Number Publication Date
KR910008376A true KR910008376A (ko) 1991-05-31

Family

ID=11038125

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019890015431A KR910008376A (ko) 1988-10-25 1989-10-25 렌즈의 표면질 측정방법

Country Status (7)

Country Link
EP (1) EP0366352A1 (ko)
KR (1) KR910008376A (ko)
CN (1) CN1042777A (ko)
AU (1) AU622939B2 (ko)
BR (1) BR8905383A (ko)
CA (1) CA2001284A1 (ko)
IE (1) IE883229L (ko)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5258257A (en) * 1991-09-23 1993-11-02 Shipley Company Inc. Radiation sensitive compositions comprising polymer having acid labile groups
FR2784018B1 (fr) * 1998-10-06 2000-12-08 Serobiologiques Lab Sa Procede de mesure des proprietes de reflexion d'une surface et dispositif pour sa mise en oeuvre
FR2932566B1 (fr) * 2008-06-12 2010-11-19 Essilor Int Dispositif de demonstration et de test des qualites cosmetiques d'une lentille ophtalmique
US10194788B2 (en) * 2013-06-19 2019-02-05 Optiscan Pty Ltd. Optical scanner and scanned lens optical probe
CN114345747A (zh) * 2022-01-10 2022-04-15 海安县巨力磁材有限责任公司 一种用于判断磁环伤痕质量的分拣装置

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR986060A (fr) * 1949-03-01 1951-07-26 Appareil pour le contrôle des surfaces polies
US3771880A (en) * 1971-09-29 1973-11-13 Us Navy Roughness analyzer
US3988068A (en) * 1974-05-09 1976-10-26 Itek Corporation Method and apparatus for detecting cosmetic defects in opthalmic lenses
FR2428238A1 (fr) * 1978-06-07 1980-01-04 Cilas Dispositif pour determiner la qualite du poli des surfaces optiques
DE3207274C1 (de) * 1982-03-01 1983-04-07 Achthal-Maschinenbau-GmbH, 8012 Ottobrunn Verfahren zum Polieren von vorgeschliffenen Oberflaechen an Werkstuecken aus Glas
US4624573A (en) * 1984-05-14 1986-11-25 Rahn John P Total optical loss measurement device

Also Published As

Publication number Publication date
CN1042777A (zh) 1990-06-06
BR8905383A (pt) 1990-05-22
IE883229L (en) 1990-04-25
EP0366352A1 (en) 1990-05-02
AU622939B2 (en) 1992-04-30
CA2001284A1 (en) 1990-04-25
AU4378289A (en) 1990-05-03

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