KR910001198U - 회로기판 테스터 - Google Patents

회로기판 테스터

Info

Publication number
KR910001198U
KR910001198U KR2019890008445U KR890008445U KR910001198U KR 910001198 U KR910001198 U KR 910001198U KR 2019890008445 U KR2019890008445 U KR 2019890008445U KR 890008445 U KR890008445 U KR 890008445U KR 910001198 U KR910001198 U KR 910001198U
Authority
KR
South Korea
Prior art keywords
circuit board
board tester
tester
circuit
board
Prior art date
Application number
KR2019890008445U
Other languages
English (en)
Other versions
KR920000739Y1 (ko
Inventor
신순철
Original Assignee
신순철
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 신순철 filed Critical 신순철
Priority to KR2019890008445U priority Critical patent/KR920000739Y1/ko
Publication of KR910001198U publication Critical patent/KR910001198U/ko
Application granted granted Critical
Publication of KR920000739Y1 publication Critical patent/KR920000739Y1/ko

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
    • G01R31/2812—Checking for open circuits or shorts, e.g. solder bridges; Testing conductivity, resistivity or impedance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
    • G01R31/2813—Checking the presence, location, orientation or value, e.g. resistance, of components or conductors

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Tests Of Electronic Circuits (AREA)
KR2019890008445U 1989-06-19 1989-06-19 회로기판 테스터 KR920000739Y1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019890008445U KR920000739Y1 (ko) 1989-06-19 1989-06-19 회로기판 테스터

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019890008445U KR920000739Y1 (ko) 1989-06-19 1989-06-19 회로기판 테스터

Publications (2)

Publication Number Publication Date
KR910001198U true KR910001198U (ko) 1991-01-24
KR920000739Y1 KR920000739Y1 (ko) 1992-01-23

Family

ID=19287234

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019890008445U KR920000739Y1 (ko) 1989-06-19 1989-06-19 회로기판 테스터

Country Status (1)

Country Link
KR (1) KR920000739Y1 (ko)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100414302B1 (ko) * 1996-07-11 2004-03-30 주식회사 하이닉스반도체 반도체패키지검사장치의콘택터

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100414302B1 (ko) * 1996-07-11 2004-03-30 주식회사 하이닉스반도체 반도체패키지검사장치의콘택터

Also Published As

Publication number Publication date
KR920000739Y1 (ko) 1992-01-23

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Legal Events

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E902 Notification of reason for refusal
E701 Decision to grant or registration of patent right
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Payment date: 19971229

Year of fee payment: 7

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