KR890700220A - 기판상의 필름특성 모니터장치 - Google Patents
기판상의 필름특성 모니터장치Info
- Publication number
- KR890700220A KR890700220A KR1019880700923A KR880700923A KR890700220A KR 890700220 A KR890700220 A KR 890700220A KR 1019880700923 A KR1019880700923 A KR 1019880700923A KR 880700923 A KR880700923 A KR 880700923A KR 890700220 A KR890700220 A KR 890700220A
- Authority
- KR
- South Korea
- Prior art keywords
- monitor device
- film characteristics
- board film
- characteristics monitor
- board
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
- G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
- G01B11/0625—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of absorption or reflection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
- G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/8422—Investigating thin films, e.g. matrix isolation method
- G01N2021/8427—Coatings
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Textile Engineering (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Spectrometry And Color Measurement (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US06/937,741 US4785336A (en) | 1986-12-04 | 1986-12-04 | Device for monitoring characteristics of a film on a substrate |
US937,741 | 1986-12-04 | ||
PCT/US1987/003156 WO1988004402A1 (en) | 1986-12-04 | 1987-12-01 | Device for monitoring characteristics of a film on a substrate |
Publications (2)
Publication Number | Publication Date |
---|---|
KR890700220A true KR890700220A (ko) | 1989-03-10 |
KR960015050B1 KR960015050B1 (ko) | 1996-10-24 |
Family
ID=25470339
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019880700923A KR960015050B1 (ko) | 1986-12-04 | 1987-12-01 | 기판상의 필름특성 모니터장치 |
Country Status (11)
Country | Link |
---|---|
US (1) | US4785336A (ko) |
EP (1) | EP0293446A4 (ko) |
JP (1) | JPH01501505A (ko) |
KR (1) | KR960015050B1 (ko) |
CN (1) | CN87107260A (ko) |
AU (1) | AU598626B2 (ko) |
BR (1) | BR8707575A (ko) |
ES (1) | ES2005961A6 (ko) |
FI (1) | FI883565A0 (ko) |
WO (1) | WO1988004402A1 (ko) |
ZA (1) | ZA879016B (ko) |
Families Citing this family (25)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0781840B2 (ja) * | 1988-06-29 | 1995-09-06 | 富士写真フイルム株式会社 | 光学式膜厚測定装置 |
US5068739A (en) * | 1989-02-10 | 1991-11-26 | Optum Corporation | Method to image transparent media utilizing integrated scanning |
DE4004088A1 (de) * | 1990-02-10 | 1991-08-14 | Basf Ag | Verfahren zur untersuchung physikalischer eigenschaften duenner schichten |
US5148041A (en) * | 1991-02-07 | 1992-09-15 | Brain Power, Inc. | Reflectometer |
US5181080A (en) * | 1991-12-23 | 1993-01-19 | Therma-Wave, Inc. | Method and apparatus for evaluating the thickness of thin films |
DE4201274C2 (de) † | 1992-01-18 | 1995-02-23 | Ver Glaswerke Gmbh | Vorrichtung zum Messen der Reflexionseigenschaften einer mit einer teilreflektierenden Schicht versehenen Glasscheibe |
US5264905A (en) * | 1992-04-27 | 1993-11-23 | Grumman Aerospace Corporation | Electro-optic automated test equipment |
GB9219450D0 (en) * | 1992-09-15 | 1992-10-28 | Glaverbel | Thin film thickness monitoring and control |
US5332904A (en) * | 1992-10-28 | 1994-07-26 | The United States Of America As Represented By The Department Of Energy | Broadband radiometer |
US6630947B1 (en) * | 1996-04-10 | 2003-10-07 | The United States Of America As Represented By The Secretary Of The Navy | Method for examining subsurface environments |
US6762838B2 (en) * | 2001-07-02 | 2004-07-13 | Tevet Process Control Technologies Ltd. | Method and apparatus for production line screening |
US6657714B2 (en) * | 2001-09-24 | 2003-12-02 | Applied Materials, Inc. | Defect detection with enhanced dynamic range |
WO2005062804A2 (en) * | 2003-12-19 | 2005-07-14 | Applied Color Systems, Inc. | Spectrophotometer with digital camera |
CN100494991C (zh) * | 2004-12-23 | 2009-06-03 | 北京源德生物医学工程有限公司 | 用于单光子计数仪的标准光源 |
US8982362B2 (en) * | 2011-10-04 | 2015-03-17 | First Solar, Inc. | System and method for measuring layer thickness and depositing semiconductor layers |
US9157729B1 (en) * | 2013-01-10 | 2015-10-13 | DST Output West, LLC | Light sensor facilitated insert thickness detection system |
CN104807495B (zh) * | 2014-01-24 | 2017-12-01 | 北京智朗芯光科技有限公司 | 一种监测晶片生长薄膜特性的装置及其用途 |
JP6564848B2 (ja) * | 2015-03-17 | 2019-08-21 | 東レエンジニアリング株式会社 | 膜厚測定装置および膜厚測定方法 |
CN104949770A (zh) * | 2015-07-13 | 2015-09-30 | 天津津航技术物理研究所 | 一种tdlas气体测温检测装置 |
CN105043589A (zh) * | 2015-07-13 | 2015-11-11 | 天津津航技术物理研究所 | 基于扩束聚焦***的tdlas气体测温检测方法 |
CN104949771A (zh) * | 2015-07-13 | 2015-09-30 | 天津津航技术物理研究所 | 一种tdlas气体测温检测方法 |
CN106353282B (zh) * | 2016-08-31 | 2020-04-28 | 电子科技大学 | 微区反射率测试***及其测试方法 |
CN106441126A (zh) * | 2016-10-26 | 2017-02-22 | 电子科技大学 | 一种基于反射率光谱测量光学薄膜厚度的方法及*** |
CN107421909A (zh) * | 2017-05-17 | 2017-12-01 | 上海理工大学 | 非透射固体表面尿素水溶液液膜多参数的测量装置及方法 |
CN109084693B (zh) * | 2018-07-20 | 2020-03-31 | 东莞富亚电子有限公司 | 彩色图像测膜厚法 |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2655073A (en) * | 1950-09-23 | 1953-10-13 | Celanese Corp | Optical thickness gauge |
FI45797C (fi) * | 1970-04-20 | 1972-09-11 | Nokia Oy Ab | Materiaalirainojen säteilymittauslaite. |
US3737237A (en) * | 1971-11-18 | 1973-06-05 | Nasa | Monitoring deposition of films |
US3892490A (en) * | 1974-03-06 | 1975-07-01 | Minolta Camera Kk | Monitoring system for coating a substrate |
US3936189A (en) * | 1974-03-13 | 1976-02-03 | Sentrol Systems Ltd. | On-line system for monitoring the color, opacity and brightness of a moving web |
AU8181375A (en) * | 1974-06-07 | 1976-12-09 | Decca Ltd | Determination of thickness of uniform films |
US4012144A (en) * | 1975-08-07 | 1977-03-15 | Varian Associates | Spectrosorptance measuring system and method |
US4003660A (en) * | 1975-12-03 | 1977-01-18 | Hunter Associates Laboratory, Inc. | Sensing head assembly for multi-color printing press on-line densitometer |
US4395126A (en) * | 1981-03-12 | 1983-07-26 | Miles Laboratories, Inc. | Apparatus for reflectance measurement of fluorescent radiation and composite useful therein |
US4479718A (en) * | 1982-06-17 | 1984-10-30 | E. I. Du Pont De Nemours And Company | Three direction measurements for characterization of a surface containing metallic particles |
JPS6052706A (ja) * | 1983-08-31 | 1985-03-26 | Nippon Kokan Kk <Nkk> | 膜厚測定装置 |
US4654794A (en) * | 1984-02-18 | 1987-03-31 | Colorgen, Inc. | Methods for determining the proper coloring for a tooth replica |
-
1986
- 1986-12-04 US US06/937,741 patent/US4785336A/en not_active Expired - Fee Related
-
1987
- 1987-12-01 KR KR1019880700923A patent/KR960015050B1/ko not_active IP Right Cessation
- 1987-12-01 BR BR8707575A patent/BR8707575A/pt unknown
- 1987-12-01 ZA ZA879016A patent/ZA879016B/xx unknown
- 1987-12-01 EP EP19880900307 patent/EP0293446A4/en not_active Withdrawn
- 1987-12-01 WO PCT/US1987/003156 patent/WO1988004402A1/en not_active Application Discontinuation
- 1987-12-01 JP JP88500680A patent/JPH01501505A/ja active Pending
- 1987-12-01 AU AU10530/88A patent/AU598626B2/en not_active Ceased
- 1987-12-03 CN CN198787107260A patent/CN87107260A/zh active Pending
- 1987-12-03 ES ES878703466A patent/ES2005961A6/es not_active Expired
-
1988
- 1988-07-29 FI FI883565A patent/FI883565A0/fi not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
JPH01501505A (ja) | 1989-05-25 |
CN87107260A (zh) | 1988-08-10 |
EP0293446A4 (en) | 1990-04-10 |
BR8707575A (pt) | 1989-03-14 |
KR960015050B1 (ko) | 1996-10-24 |
AU598626B2 (en) | 1990-06-28 |
EP0293446A1 (en) | 1988-12-07 |
US4785336A (en) | 1988-11-15 |
WO1988004402A1 (en) | 1988-06-16 |
FI883565A (fi) | 1988-07-29 |
FI883565A0 (fi) | 1988-07-29 |
ES2005961A6 (es) | 1989-04-01 |
AU1053088A (en) | 1988-06-30 |
ZA879016B (en) | 1988-05-27 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
E902 | Notification of reason for refusal | ||
G160 | Decision to publish patent application | ||
E701 | Decision to grant or registration of patent right | ||
GRNT | Written decision to grant | ||
LAPS | Lapse due to unpaid annual fee |