KR850700185A - Semiconductor integrated circuit - Google Patents

Semiconductor integrated circuit

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Publication number
KR850700185A
KR850700185A KR1019850700157A KR850700157A KR850700185A KR 850700185 A KR850700185 A KR 850700185A KR 1019850700157 A KR1019850700157 A KR 1019850700157A KR 850700157 A KR850700157 A KR 850700157A KR 850700185 A KR850700185 A KR 850700185A
Authority
KR
South Korea
Prior art keywords
semiconductor
region
integrated circuit
insulating
pillar
Prior art date
Application number
KR1019850700157A
Other languages
Korean (ko)
Other versions
KR920010435B1 (en
Inventor
히테오 스나미
Original Assignee
미쓰다 가쓰시게
가부시기가이샤 히다찌 세이사꾸쇼
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 미쓰다 가쓰시게, 가부시기가이샤 히다찌 세이사꾸쇼 filed Critical 미쓰다 가쓰시게
Priority claimed from PCT/JP1984/000597 external-priority patent/WO1985002716A1/en
Publication of KR850700185A publication Critical patent/KR850700185A/en
Application granted granted Critical
Publication of KR920010435B1 publication Critical patent/KR920010435B1/en

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Landscapes

  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
  • Element Separation (AREA)
  • Thin Film Transistor (AREA)

Abstract

내용 없음No content

Description

반도체 집적 회로Semiconductor integrated circuit

본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음As this is a public information case, the full text was not included.

제11도는 본 발명의 제3실시예의 단면도11 is a cross-sectional view of a third embodiment of the present invention.

Claims (4)

적어도 그의 제1의 주표면에 반도체층이 있는 기판과, 상기 반도체 층안에 형성된 제1도전형의 제1의 영역과, 상기 반도체 층안에 형성된 제2도전형의 제2영역과, 상기 제1의 영역과 적어도 그의 일부에서 접속하도록 형성된 제2도전형의 제1의 반도체 기둥과, 상기 제2의 영역과 적어도 그의 일부에서 접촉하도록 형성된 제1도전형의 제2반도체 기둥과, 상기 제1의 반도체 기둥에 형성된 제1도전형의 3영역과, 상기 제2의 반도체 기둥에 형성된 제2도전형의 제4반도체 영역과, 상기 제1의 반도체 기둥과 제1의 절연막을 사이에 두고 형성된 제1의 게이트 전극과, 상기 제2의 반도체 기둥과 제2절연막을 사이에 두고 형성된 제2의 게이트 전극을 가지며, 상기 제1의 반도체 기둥과 상기 제2의 반도체 기둥과의 사이에는 제1의 절연영역이 형성되어서 이루어진 것을 특징으로 하는 반도체 집적회로.A substrate having a semiconductor layer on at least a first major surface thereof, a first region of a first conductivity type formed in the semiconductor layer, a second region of a second conductivity type formed in the semiconductor layer, and the first A first semiconductor pillar of the second conductive type formed to be connected to at least a portion of the region, a second semiconductor pillar of the first conductive type formed to be in contact with at least a portion of the second region, and the first semiconductor A first region formed with three regions of the first conductive type formed in the pillar, a fourth semiconductor region of the second conductive type formed in the second semiconductor pillar, and a first insulating layer interposed between the first semiconductor pillar and the first insulating film And a gate electrode, and a second gate electrode formed between the second semiconductor pillar and the second insulating layer, wherein a first insulating region is formed between the first semiconductor pillar and the second semiconductor pillar. Formed and made A semiconductor integrated circuit characterized by. 특허청구의 범위 제1항 기재의 반도체 집적회로에 있어서, 상기 기판은 절연물이고, 상기 제1의 절연영역은 상기 기판과 접촉하고 있는 것을 특징으로 하고 있는 반도체 집적회로.The semiconductor integrated circuit according to claim 1, wherein the substrate is an insulator and the first insulating region is in contact with the substrate. 특허청구의 범위 제1항 기재의 반도체 집적회로에 있어서, 상기 기판은 반도체 기체위에다 제3의 절연막을 사이에 둔 반도체 층을 갖는 기판이며, 상기 제1의 절연영역은 상기의 제3의 절연막과 접촉하고 있는 것을 특징으로 하는 반도체 집적회로.In the semiconductor integrated circuit according to claim 1, the substrate is a substrate having a semiconductor layer over a semiconductor substrate with a third insulating film interposed therebetween, wherein the first insulating region is formed with the third insulating film. In contact with the semiconductor integrated circuit. 특허청구의 범위 제1항 기재의 반도체 집적회로에 있어서, 상기 제1의 절연영역은, 제1의 절연막과 제2의 절연막에 둘러싸인 제3의 게이트 전극으로 이루어진 것을 특징으로 하는 반도체 집적회로.The semiconductor integrated circuit according to claim 1, wherein the first insulating region comprises a third gate electrode surrounded by a first insulating film and a second insulating film. ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.※ Note: The disclosure is based on the initial application.
KR1019850700157A 1983-12-16 1984-12-14 Semiconductor integrated circuit KR920010435B1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP58-236160 1983-12-16
JP23616058 1983-12-16
PCT/JP1984/000597 WO1985002716A1 (en) 1983-12-16 1984-12-14 Semiconductor integrated circuit

Publications (2)

Publication Number Publication Date
KR850700185A true KR850700185A (en) 1985-10-25
KR920010435B1 KR920010435B1 (en) 1992-11-27

Family

ID=69104160

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019850700157A KR920010435B1 (en) 1983-12-16 1984-12-14 Semiconductor integrated circuit

Country Status (1)

Country Link
KR (1) KR920010435B1 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5356970B2 (en) * 2009-10-01 2013-12-04 ユニサンティス エレクトロニクス シンガポール プライベート リミテッド Semiconductor device

Also Published As

Publication number Publication date
KR920010435B1 (en) 1992-11-27

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