KR20180085015A - 메트롤로지 타겟, 방법 및 장치, 컴퓨터 프로그램 및 리소그래피 시스템 - Google Patents
메트롤로지 타겟, 방법 및 장치, 컴퓨터 프로그램 및 리소그래피 시스템 Download PDFInfo
- Publication number
- KR20180085015A KR20180085015A KR1020187018148A KR20187018148A KR20180085015A KR 20180085015 A KR20180085015 A KR 20180085015A KR 1020187018148 A KR1020187018148 A KR 1020187018148A KR 20187018148 A KR20187018148 A KR 20187018148A KR 20180085015 A KR20180085015 A KR 20180085015A
- Authority
- KR
- South Korea
- Prior art keywords
- computer program
- lithography system
- metrology target
- metrology
- target
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70483—Information management; Active and passive control; Testing; Wafer monitoring, e.g. pattern monitoring
- G03F7/70605—Workpiece metrology
- G03F7/70616—Monitoring the printed patterns
- G03F7/70633—Overlay, i.e. relative alignment between patterns printed by separate exposures in different layers, or in the same layer in multiple exposures or stitching
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70483—Information management; Active and passive control; Testing; Wafer monitoring, e.g. pattern monitoring
- G03F7/70605—Workpiece metrology
- G03F7/70616—Monitoring the printed patterns
- G03F7/70625—Dimensions, e.g. line width, critical dimension [CD], profile, sidewall angle or edge roughness
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70483—Information management; Active and passive control; Testing; Wafer monitoring, e.g. pattern monitoring
- G03F7/70605—Workpiece metrology
- G03F7/70616—Monitoring the printed patterns
- G03F7/70641—Focus
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70483—Information management; Active and passive control; Testing; Wafer monitoring, e.g. pattern monitoring
- G03F7/70605—Workpiece metrology
- G03F7/70681—Metrology strategies
- G03F7/70683—Mark designs
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F9/00—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
- G03F9/70—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography
- G03F9/7003—Alignment type or strategy, e.g. leveling, global alignment
- G03F9/7023—Aligning or positioning in direction perpendicular to substrate surface
- G03F9/7026—Focusing
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP15196854.2 | 2015-11-27 | ||
EP15196854 | 2015-11-27 | ||
PCT/EP2016/076835 WO2017089105A1 (en) | 2015-11-27 | 2016-11-07 | Metrology target, method and apparatus, computer program and lithographic system |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20180085015A true KR20180085015A (ko) | 2018-07-25 |
KR102170137B1 KR102170137B1 (ko) | 2020-10-27 |
Family
ID=54705532
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020187018148A KR102170137B1 (ko) | 2015-11-27 | 2016-11-07 | 메트롤로지 타겟, 방법 및 장치, 컴퓨터 프로그램 및 리소그래피 시스템 |
Country Status (7)
Country | Link |
---|---|
US (1) | US9977344B2 (ko) |
KR (1) | KR102170137B1 (ko) |
CN (1) | CN108292108B (ko) |
IL (1) | IL259564B (ko) |
NL (1) | NL2017739A (ko) |
TW (1) | TWI620978B (ko) |
WO (1) | WO2017089105A1 (ko) |
Families Citing this family (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR102217214B1 (ko) * | 2016-07-11 | 2021-02-19 | 에이에스엠엘 네델란즈 비.브이. | 성능 파라미터의 핑거프린트를 결정하는 장치 및 방법 |
EP3447580A1 (en) * | 2017-08-21 | 2019-02-27 | ASML Netherlands B.V. | Method of calibrating focus measurements, measurement method and metrology apparatus, lithographic system and device manufacturing method |
EP3451061A1 (en) | 2017-09-04 | 2019-03-06 | ASML Netherlands B.V. | Method for monitoring a manufacturing process |
WO2019063245A1 (en) * | 2017-09-28 | 2019-04-04 | Asml Netherlands B.V. | LITHOGRAPHIC METHOD |
US10483214B2 (en) | 2018-01-03 | 2019-11-19 | Globalfoundries Inc. | Overlay structures |
EP3637187A1 (en) * | 2018-10-12 | 2020-04-15 | ASML Netherlands B.V. | Method for measuring focus performance of a lithographic apparatus |
WO2020126266A1 (en) * | 2018-12-18 | 2020-06-25 | Asml Netherlands B.V. | Method of measuring a parameter of a patterning process, metrology apparatus, target |
EP3671346A1 (en) * | 2018-12-18 | 2020-06-24 | ASML Netherlands B.V. | Method of measuring a parameter of a patterning process, metrology apparatus, target |
US11914290B2 (en) | 2019-07-24 | 2024-02-27 | Kla Corporation | Overlay measurement targets design |
CN110824865B (zh) * | 2019-11-29 | 2021-06-18 | 中国科学院微电子研究所 | 对准误差测量方法及装置 |
US11809090B2 (en) | 2020-01-30 | 2023-11-07 | Kla Corporation | Composite overlay metrology target |
EP4338010A1 (en) * | 2021-11-27 | 2024-03-20 | KLA Corporation | Improved targets for diffraction-based overlay error metrology |
WO2023113850A1 (en) * | 2021-12-17 | 2023-06-22 | Kla Corporation | Overlay target design for improved target placement accuracy |
CN118131580B (zh) * | 2024-05-06 | 2024-07-09 | 南京航空航天大学 | 衍射型套刻标记多缺陷特征的全局灵敏度分析方法 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6536130B1 (en) * | 2001-11-07 | 2003-03-25 | United Microelectronics Corp. | Overlay mark for concurrently monitoring alignment accuracy, focus, leveling and astigmatism and method of application thereof |
KR20040025868A (ko) * | 2002-09-20 | 2004-03-26 | 에이에스엠엘 네델란즈 비.브이. | 디바이스 검사방법 및 장치 |
KR20150023502A (ko) * | 2012-05-29 | 2015-03-05 | 에이에스엠엘 네델란즈 비.브이. | 메트롤로지 방법 및 장치, 기판, 리소그래피 시스템 및 디바이스 제조 방법 |
WO2015078669A1 (en) * | 2013-11-26 | 2015-06-04 | Asml Netherlands B.V. | Method, apparatus and substrates for lithographic metrology |
Family Cites Families (19)
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CN1203524C (zh) * | 2001-11-30 | 2005-05-25 | 联华电子股份有限公司 | 叠合标记及其应用方法 |
EP1400855A3 (en) * | 2002-09-20 | 2009-04-08 | ASML Netherlands B.V. | Device inspection |
US7678516B2 (en) | 2004-07-22 | 2010-03-16 | Kla-Tencor Technologies Corp. | Test structures and methods for monitoring or controlling a semiconductor fabrication process |
US7277172B2 (en) * | 2005-06-06 | 2007-10-02 | Kla-Tencor Technologies, Corporation | Measuring overlay and profile asymmetry using symmetric and anti-symmetric scatterometry signals |
US7619737B2 (en) * | 2007-01-22 | 2009-11-17 | Asml Netherlands B.V | Method of measurement, an inspection apparatus and a lithographic apparatus |
NL1036245A1 (nl) | 2007-12-17 | 2009-06-18 | Asml Netherlands Bv | Diffraction based overlay metrology tool and method of diffraction based overlay metrology. |
NL1036597A1 (nl) | 2008-02-29 | 2009-09-01 | Asml Netherlands Bv | Metrology method and apparatus, lithographic apparatus, and device manufacturing method. |
CN102272678A (zh) * | 2008-12-30 | 2011-12-07 | Asml荷兰有限公司 | 检验方法和设备、光刻设备、光刻处理单元和器件制造方法 |
CN102498441B (zh) | 2009-07-31 | 2015-09-16 | Asml荷兰有限公司 | 量测方法和设备、光刻***以及光刻处理单元 |
SG178368A1 (en) | 2009-08-24 | 2012-04-27 | Asml Netherlands Bv | Metrology method and apparatus, lithographic apparatus, lithographic processing cell and substrate comprising metrology targets |
NL2007425A (en) | 2010-11-12 | 2012-05-15 | Asml Netherlands Bv | Metrology method and apparatus, and device manufacturing method. |
NL2009294A (en) * | 2011-08-30 | 2013-03-04 | Asml Netherlands Bv | Method and apparatus for determining an overlay error. |
US10107621B2 (en) * | 2012-02-15 | 2018-10-23 | Nanometrics Incorporated | Image based overlay measurement with finite gratings |
NL2010905A (en) * | 2012-06-22 | 2013-12-24 | Asml Netherlands Bv | Method of determining focus, inspection apparatus, patterning device, substrate and device manufacturing method. |
WO2014005828A1 (en) * | 2012-07-05 | 2014-01-09 | Asml Netherlands B.V. | Metrology for lithography |
EP2873008A4 (en) | 2012-07-16 | 2016-06-29 | Pneuron Corp | METHOD AND PROCESS FOR ACTIVATING THE DISTRIBUTION OF CACHE DATA SOURCES FOR QUERY PROCESSING AND DISTRIBUTING PLATE INTERMEDIATE STORAGE OF GREAT DATA AND ANALYSIS REQUESTS |
US9411249B2 (en) | 2013-09-23 | 2016-08-09 | Globalfoundries Inc. | Differential dose and focus monitor |
NL2013838A (en) | 2013-12-17 | 2015-06-18 | Asml Netherlands Bv | Inspection method, lithographic apparatus, mask and substrate. |
KR102359050B1 (ko) | 2014-02-12 | 2022-02-08 | 에이에스엠엘 네델란즈 비.브이. | 프로세스 윈도우를 최적화하는 방법 |
-
2016
- 2016-11-07 CN CN201680069224.5A patent/CN108292108B/zh active Active
- 2016-11-07 KR KR1020187018148A patent/KR102170137B1/ko active IP Right Grant
- 2016-11-07 WO PCT/EP2016/076835 patent/WO2017089105A1/en active Application Filing
- 2016-11-07 NL NL2017739A patent/NL2017739A/en unknown
- 2016-11-22 US US15/358,321 patent/US9977344B2/en active Active
- 2016-11-24 TW TW105138642A patent/TWI620978B/zh active
-
2018
- 2018-05-23 IL IL259564A patent/IL259564B/en unknown
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6536130B1 (en) * | 2001-11-07 | 2003-03-25 | United Microelectronics Corp. | Overlay mark for concurrently monitoring alignment accuracy, focus, leveling and astigmatism and method of application thereof |
KR20040025868A (ko) * | 2002-09-20 | 2004-03-26 | 에이에스엠엘 네델란즈 비.브이. | 디바이스 검사방법 및 장치 |
KR20150023502A (ko) * | 2012-05-29 | 2015-03-05 | 에이에스엠엘 네델란즈 비.브이. | 메트롤로지 방법 및 장치, 기판, 리소그래피 시스템 및 디바이스 제조 방법 |
WO2015078669A1 (en) * | 2013-11-26 | 2015-06-04 | Asml Netherlands B.V. | Method, apparatus and substrates for lithographic metrology |
Also Published As
Publication number | Publication date |
---|---|
TW201728991A (zh) | 2017-08-16 |
WO2017089105A1 (en) | 2017-06-01 |
CN108292108A (zh) | 2018-07-17 |
TWI620978B (zh) | 2018-04-11 |
IL259564B (en) | 2022-05-01 |
US9977344B2 (en) | 2018-05-22 |
CN108292108B (zh) | 2020-06-26 |
IL259564A (en) | 2018-07-31 |
KR102170137B1 (ko) | 2020-10-27 |
NL2017739A (en) | 2017-06-07 |
US20170153558A1 (en) | 2017-06-01 |
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E701 | Decision to grant or registration of patent right | ||
GRNT | Written decision to grant |