KR20150047863A - Photo-curable and thermo-curable resin composition, and dry film solder resist - Google Patents

Photo-curable and thermo-curable resin composition, and dry film solder resist Download PDF

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KR20150047863A
KR20150047863A KR1020130127877A KR20130127877A KR20150047863A KR 20150047863 A KR20150047863 A KR 20150047863A KR 1020130127877 A KR1020130127877 A KR 1020130127877A KR 20130127877 A KR20130127877 A KR 20130127877A KR 20150047863 A KR20150047863 A KR 20150047863A
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South Korea
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resin composition
acid
group
acrylate
compounds
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KR1020130127877A
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Korean (ko)
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정민수
경유진
최병주
정우재
최보윤
이광주
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주식회사 엘지화학
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Publication of KR20150047863A publication Critical patent/KR20150047863A/en

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    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08LCOMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L101/00Compositions of unspecified macromolecular compounds
    • C08L101/02Compositions of unspecified macromolecular compounds characterised by the presence of specified groups, e.g. terminal or pendant functional groups
    • C08L101/06Compositions of unspecified macromolecular compounds characterised by the presence of specified groups, e.g. terminal or pendant functional groups containing oxygen atoms
    • C08L101/08Carboxyl groups
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08LCOMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L79/00Compositions of macromolecular compounds obtained by reactions forming in the main chain of the macromolecule a linkage containing nitrogen with or without oxygen or carbon only, not provided for in groups C08L61/00 - C08L77/00
    • C08L79/04Polycondensates having nitrogen-containing heterocyclic rings in the main chain; Polyhydrazides; Polyamide acids or similar polyimide precursors
    • C08L79/08Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/0042Photosensitive materials with inorganic or organometallic light-sensitive compounds not otherwise provided for, e.g. inorganic resists
    • G03F7/0044Photosensitive materials with inorganic or organometallic light-sensitive compounds not otherwise provided for, e.g. inorganic resists involving an interaction between the metallic and non-metallic component, e.g. photodope systems
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/027Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/027Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
    • G03F7/028Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds with photosensitivity-increasing substances, e.g. photoinitiators
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/027Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
    • G03F7/032Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds with binders
    • G03F7/0325Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds with binders the binders being polysaccharides, e.g. cellulose
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/027Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
    • H01L21/0271Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers
    • H01L21/0273Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers characterised by the treatment of photoresist layers
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/22Secondary treatment of printed circuits
    • H05K3/28Applying non-metallic protective coatings

Abstract

The present invention relates to a photocurable and thermosetting resin composition and a DFSR capable of forming a DFSR having a low-gloss surface having fine irregularities on its surface and having excellent hiding properties without any additional processing steps such as a plasma treatment process. The resin composition having photo-curable properties and thermosetting properties includes a carboxyl group (-COOH), an acid-modified oligomer having a photocurable unsaturated functional group; Polyacrylic acid; A photopolymerizable monomer having at least two photocurable unsaturated functional groups; A thermosetting binder having a thermosetting functional group; And a photoinitiator.

Description

A photo-curable and thermo-curable resin composition, and a dry film solder resist,

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a resin composition having a photo-curable property and a thermosetting property, and a dry film solder resist (DFSR). More specifically, the present invention relates to a photocurable and thermosetting resin composition and DFSR capable of forming a DFSR having a fine unevenness on its surface and having a low-gloss surface with excellent hiding property without any additional processing steps such as a plasma treatment process .

BACKGROUND ART [0002] As electronic devices have become smaller and lighter in weight, photosensitive solder resists capable of forming fine opening patterns have been used in printed circuit boards, semiconductor package substrates, flexible circuit boards and the like.

The solder resist generally requires properties such as developability, high resolution, insulation, solder heat resistance, and gold plating resistance. When such a solder resist is applied to a semiconductor package substrate or the like, fine surface irregularities are formed on a film type solder resist as necessary in order to ensure excellent adhesion with subsequent materials and the like in the course of the process.

However, in order to form such fine surface irregularities, a film-type solder resist, for example, a DFSR is formed through a photo-curing process, a thermal hardening process, or the like, and then a separate surface treatment process such as a plasma process process Respectively. However, there is a disadvantage in that the overall process complexity and non-economical efficiency are significantly caused by the addition of the separate processing steps such as the plasma processing.

On the other hand, since the DFSR exists in a film state on a substrate on which an electronic circuit is formed, it is necessary to have a low-gloss surface so that the circuit can be easily concealed from the outside. However, existing DFSRs typically have a smooth and highly polished surface, making it difficult to meet such needs of the industry.

Therefore, it is continuously required to develop a technique capable of forming fine surface irregularities without adding a plasma treatment process or the like, and capable of forming a DFSR having a low-gloss surface.

The present invention provides a photocurable and thermosetting resin composition capable of forming a DFSR having a fine unevenness on its surface and having a low-gloss surface excellent in wiring hiding ability without a separate processing step such as a plasma treatment process.

The present invention also relates to a dry film solder resist (DFSR) film having a low-gloss surface, which has fine unevenness on the surface thereof without any additional processing step such as a plasma treatment process, .).

The present invention relates to a resin composition comprising a carboxyl group (-COOH) and an acid-modified oligomer having a photocurable unsaturated functional group; Polyacrylic acid; A photopolymerizable monomer having at least two photocurable unsaturated functional groups; A thermosetting binder having a thermosetting functional group; And a photoinitiator. The present invention also provides a resin composition having photo-curable and thermosetting properties.

The present invention also relates to a resin composition comprising a carboxyl group (-COOH) and an acid-modified oligomer having a photocurable unsaturated functional group; A photopolymerizable monomer having at least two photocurable unsaturated functional groups; And a cured product of a thermosetting binder having a thermosetting functional group, wherein fine irregularities having an average roughness (Rz) of 2 to 20 占 퐉 are formed on the surface, and a light reflectance of 60 to 90% (DFSR). ≪ / RTI >

BEST MODE FOR CARRYING OUT THE INVENTION Hereinafter, a resin composition having photo-curable properties and thermosetting properties according to embodiments of the present invention and DFSR will be described in more detail.

According to one embodiment of the present invention, there is provided a resin composition comprising: an acid-modified oligomer having a carboxyl group (-COOH) and a photocurable unsaturated functional group; Polyacrylic acid; A photopolymerizable monomer having at least two photocurable unsaturated functional groups; A thermosetting binder having a thermosetting functional group; And a photoinitiator are provided.

Such a resin composition includes polyacrylic acid together with a predetermined acid-modified oligomer, a photopolymerizable monomer, a photoinitiator and a thermosetting binder.

The resin composition of this embodiment can be used as a composition for forming DFSR through the following process. First, after the resin composition is coated on the substrate, the resin composition at the portion where the DFSR is to be formed is selectively exposed. When such exposure is carried out, the unsaturated functional groups contained in the acid-modified oligomer and the unsaturated functional groups contained in the photopolymerizable monomer can cause photopolymerization to form crosslinking bonds with each other, and as a result, crosslinking structure due to photo- .

Thereafter, when development is carried out using an alkali developing solution, the resin composition of the exposed portion where the crosslinked structure is formed is left on the substrate as it is, and the remaining resin composition of the unexposed portion is dissolved in the developer and can be removed.

Then, when the resin composition remaining on the substrate is heat-treated and thermally cured, the carboxyl group contained in the acid-modified oligomer reacts with the thermosetting functional group of the thermosetting binder to form crosslinking, and as a result, The DFSR can be formed on a desired portion of the substrate.

However, when the DFSR thus formed is applied to a semiconductor package substrate or the like, fine surface irregularities need to be formed on the DFSR in order to secure excellent adhesion with subsequent materials and the like during the process. By forming the fine irregularities on the surface of the DFSR, the contact surface area between the DFSR and the subsequent process material applied on the DFSR can be increased, and as a result, excellent adhesion can be ensured.

However, in order to form such fine concavities and convexities, a method of forming a DFSR through the above-described photocuring, thermosetting and the like and then carrying out a separate surface treatment process such as a plasma treatment process has been applied. However, the addition of such a plasma processing process has disadvantages such as causing the overall process complexity.

In contrast, the resin composition of one embodiment includes polyacrylic acid, which can solve this shortcoming. That is, the polyacrylic acid does not exhibit photo-curability, is not well-miscible with the acid-modified oligomer, and can exhibit properties soluble in a developer. Due to the characteristics of the polyacrylic acid, when the development process is carried out on the resin composition after exposure, the resin composition including polyacrylic acid can be substantially completely melted and removed by the development in the unexposed area where light curing does not proceed. On the other hand, in the exposed portion, since polyacrylic acid is incompatible with acid-modified oligomers and the like, it can cause fine phase separation with other components of the resin composition, and as a result, May exist separately. Such a polyacrylic acid can be selectively removed by dissolving it in a developing solution, and only other components such as an acid-modified oligomer having a crosslinked structure can remain in the exposure portion. Therefore, due to the selective removal of such polyacrylic acid, fine irregularities can be formed in the exposed portion.

Therefore, when the DFSR is formed by applying the resin composition of one embodiment, a DFSR having fine irregularities formed on its surface can be formed without any additional plasma processing step or the like. In particular, even if only the development process to be applied for the formation of the original DFSR is carried out, since the DFSR having the micro concavity and convexity formed on the surface can be formed, the process of forming the DFSR can be simplified, Thereby forming a DFSR.

Moreover, it has been confirmed that the DFSR in which fine irregularities are formed on the surface by using such a polyacrylic acid exhibits low reflectance and low glossiness to visible light due to the surface roughness and shape of the fine unevenness. Thus, the DFSR formed from the resin composition of one embodiment can exhibit excellent wiring hiding properties on a circuit board, and can meet the needs of the industry.

Hereinafter, the resin composition according to one embodiment will be described more specifically for each component.

Acid-modified oligomer

The resin composition of one embodiment includes a carboxyl group (-COOH) and an acid-modified oligomer having a photocurable unsaturated functional group. Such an acid-modified oligomer forms a cross-linkage with other components of the resin composition, that is, a photopolymerizable monomer and / or a thermosetting binder by photocuring, thereby enabling the formation of DFSR, and the resin composition including a carboxyl group exhibits alkali developability .

Such an acid-modified oligomer is an oligomer having a carboxyl group and a photo-curable functional group, for example, a curable functional group having an acrylate group or an unsaturated double bond, in the molecule, and includes all components known to be usable in the photo- Can be used without restrictions. For example, the main chain of the acid-modified oligomer may be novolak epoxy or polyurethane, and may be used as an acid-modified oligomer in which a carboxyl group and an acrylate group are introduced into the main chain. The photocurable functional group may be suitably an acrylate group. The acid-modified oligomer may be obtained as an oligomer form by copolymerizing a monomer containing a carboxyl group-containing polymerizable monomer and an acrylate-based compound.

More specifically, specific examples of acid-modified oligomers usable in the resin composition include the following components.

(1) a copolymer obtained by copolymerizing an unsaturated carboxylic acid (a) such as (meth) acrylic acid with a compound (b) having an unsaturated double bond such as styrene,? -Methylstyrene, lower alkyl (meth) acrylate or isobutylene A carboxyl group-containing resin;

(Meth) acryloyl group, an epoxy group, an acid chloride, and the like can be added to a part of the copolymer of the unsaturated carboxylic acid (a) and the unsaturated double bond-containing compound (b) A carboxyl group-containing photosensitive resin obtained by reacting a compound having a reactive group, for example, glycidyl (meth) acrylate, and an ethylenically unsaturated group as a pendant;

(3) To a copolymer of a compound (c) having an epoxy group and an unsaturated double bond such as glycidyl (meth) acrylate or? -Methyl glycidyl (meth) acrylate and a compound (b) having an unsaturated double bond A carboxyl group-containing photosensitive resin obtained by reacting an unsaturated carboxylic acid (a) with a saturated or unsaturated polybasic acid anhydride (d) such as phthalic anhydride, tetrahydrophthalic anhydride or hexahydrophthalic anhydride to the resulting secondary hydroxy group;

(4) To a copolymer of an acid anhydride (e) having an unsaturated double bond such as maleic anhydride and itaconic anhydride and a compound (b) having an unsaturated double bond, one hydroxyl group such as hydroxyalkyl (meth) A carboxyl group-containing photosensitive resin obtained by reacting a compound (f) having at least one ethylenically unsaturated double bond;

(5) an epoxy group of a polyfunctional epoxy resin obtained by further epoxidizing a hydroxyl group of a polyfunctional epoxy compound (g) or a polyfunctional epoxy compound having two or more epoxy groups in the molecule as described below with epichlorohydrin and ) The unsaturated monocarboxylic acid (h) such as acrylic acid or the like is subjected to an esterification reaction (entire esterification or partial esterification, preferably complete esterification), and a saturated or unsaturated polybasic acid anhydride (d) A carboxyl group-containing photosensitive compound;

(6) In the epoxy group of the copolymer of the compound (b) having an unsaturated double bond and glycidyl (meth) acrylate, 1 to 5 carbon atoms are contained in an alkylcarboxylic acid having 2 to 17 carbon atoms and an alkylcarboxylic acid having an aromatic group Containing resin obtained by reacting an organic acid (i) having a carboxyl group and no ethylenic unsaturated bond, and reacting the resulting secondary hydroxyl group with a saturated or unsaturated polybasic acid anhydride (d);

(7) Diisocyanates (j) such as aliphatic diisocyanates, branched aliphatic diisocyanates, alicyclic diisocyanates and aromatic diisocyanates, dialcohol compounds (k) containing carboxyl groups such as dimethylolpropionic acid and dimethylolbutanoic acid, A diol compound such as a polyol-based polyol, a polyether-based polyol, a polyester-based polyol, a polyolefin-based polyol, an acrylic-based polyol, a bisphenol A-based alkylene oxide adduct diol, a phenolic hydroxyl group and a compound having an alcoholic hydroxyl group m) is obtained by a reaction of a carboxyl group-containing urethane resin;

(8) A resin composition comprising a diisocyanate (j), a bisphenol A type epoxy resin, a hydrogenated bisphenol A type epoxy resin, a brominated bisphenol A type epoxy resin, a bisphenol F type epoxy resin, a bisphenol S type epoxy resin, (Meth) acrylate or its partial acid anhydride modification (n) of a bifunctional epoxy resin such as phenol type epoxy resin, carboxyl group-containing dialcohol compound (k), and diol compound (m) A urethane resin containing a carboxyl group;

(9) A compound (f) having one hydroxyl group such as hydroxyalkyl (meth) acrylate and at least one ethylenically unsaturated double bond in the synthesis of the resin of the above (7) or (8) A carboxyl group-containing urethane resin into which a double bond is introduced;

(10) A process for producing a compound represented by the above formula (7) or (8), wherein a compound having one isocyanate group and at least one (meth) acryloyl group in the molecule such as a molar reaction product of isophorone diisocyanate and pentaerythritol triacrylate (Meth) acrylated urethane resin containing a carboxyl group;

(11) A process for producing a modified oxetane compound, which comprises reacting an unsaturated monocarboxylic acid (h) with a multifunctional oxetane compound having two or more oxetane rings in a molecule as described below to give a saturated or unsaturated polybasic acid anhydride (d);

(12) a photosensitive resin containing a carboxyl group obtained by introducing an unsaturated double bond into a reaction product of a bis-epoxy compound and a bisphenol and subsequently reacting a saturated or unsaturated polybasic acid anhydride (d);

(13) A process for producing a novolac-type phenol resin, which comprises reacting a novolak-type phenol resin with an alkylene oxide and / or an ethylene carbonate such as ethylene oxide, propylene oxide, butylene oxide, trimethylene oxide, tetrahydrofuran, tetrahydropyrane, Unsaturated monocarboxylic acid (h) is reacted with a cyclic carbonate such as ethylene carbonate, propylene carbonate, propylene carbonate, propylene carbonate, propylene carbonate, propylene carbonate, A carboxyl group-containing photosensitive resin obtained by reacting an anhydride (d);

Among the above-mentioned components, the case where the isocyanate group-containing compound used in the resin synthesis in (7) to (10) is a diisocyanate not containing a benzene ring and the case where in the above (5) When the polyfunctional and bifunctional epoxy resin used in the synthesis is a compound having a linear structure with a bisphenol A skeleton, a bisphenol F skeleton, a biphenyl skeleton, or a bicyclensol skeleton or a hydrogenated compound thereof, the flexibility and the like of the DFSR A component which can be preferably used as an acid-modified oligomer can be obtained. In addition, in another aspect, the modified products of the resins (7) to (10) include a urethane bond in the main chain and are preferable for bending.

Commercially available components may be used as the above-mentioned acid-modified oligomers. Specific examples of such components include ZAR-2000, ZFR-1031, ZFR-1121 and ZFR-1122 manufactured by Nippon Yakushi Kasei.

On the other hand, the above-mentioned acid-modified oligomer may be contained in an amount of about 15 to 75% by weight, or about 20 to 50% by weight, or about 25 to 45% by weight based on the total weight of the resin composition of one embodiment. When the content of the acid-modified oligomer is too small, the developability of the resin composition is deteriorated and the strength of the DFSR may be lowered. On the other hand, if the content of the acid-modified oligomer is excessively high, the resin composition may not only be excessively developed, but also may be uneven in coating.

The acid value of the acid-modified oligomer may be about 40 to 120 mgKOH / g, or about 50 to 110 mgKOH / g, or 60 to 90 mgKOH / g. When the acid value is too low, the alkali developability may be lowered. On the other hand, if the acid value is excessively high, the photo-curing portion, for example, the exposure portion may be dissolved by the developer, so that the normal pattern formation of the DFSR may become difficult.

Photopolymerizable monomer

On the other hand, the resin composition of one embodiment includes a photopolymerizable monomer. Such a photopolymerizable monomer may be a compound having a photocurable unsaturated functional group such as, for example, two or more polyfunctional vinyl groups, and may form a crosslinked bond with an unsaturated functional group of the above-mentioned acid-modified oligomer, Can form a crosslinked structure. Thereby, the resin composition of the exposed portion corresponding to the portion where the DFSR is to be formed can be left on the substrate without alkali development.

Such a photopolymerizable monomer may be a liquid at room temperature, and accordingly, the viscosity of the resin composition of one embodiment may be adjusted according to the application method, and the alkali developability of the unexposed portion may be further improved.

As the photopolymerizable monomer, a (meth) acrylate compound having two or more, or three or more, or three to six photo-curable unsaturated functional groups in the molecule may be used. As a more specific example, pentaerythritol A polyfunctional acrylate-based compound having a hydroxyl group such as triacrylate or dipentaerythritol pentaacrylate; Water-soluble polyfunctional acrylate-based compounds such as polyethylene glycol diacrylate, and polypropylene glycol diacrylate; Polyfunctional polyester acrylate-based compounds of polyhydric alcohols such as trimethylolpropane triacrylate, pentaerythritol tetraacrylate, and dipentaerythritol hexaacrylate; Acrylate compounds of ethylene oxide adducts and / or propylene oxide adducts of polyhydric alcohols such as trimethylol propane or hydrogenated bisphenol A or polyhydric phenols such as bisphenol A and biphenol; A polyfunctional or monofunctional polyurethane acrylate-based compound which is an isocyanate-modified product of the hydroxy group-containing polyfunctional acrylate-based compound; An epoxy acrylate-based compound which is a (meth) acrylic acid adduct of bisphenol A diglycidyl ether, hydrogenated bisphenol A diglycidyl ether or phenol novolac epoxy resin; Caprolactone-modified acrylate compounds such as caprolactone-modified ditrimethylolpropane tetraacrylate, acrylate of? -Caprolactone-modified dipentaerythritol, or caprolactone-modified hydroxypivalic acid neopentyl glycol ester diacrylate, And a photosensitive (meth) acrylate compound such as a (meth) acrylate compound corresponding to the acrylate compound described above. These compounds may be used singly or in combination of two or more. It can also be used.

Among these, as the photopolymerizable monomer, a polyfunctional (meth) acrylate compound having two or more, or three or more, or three to six (meth) acryloyl groups in one molecule can be preferably used , In particular, pentaerythritol triacrylate, trimethylolpropane triacrylate, dipentaerythritol hexaacrylate, or caprolactone-modified ditrimethylolpropane tetraacrylate can be suitably used. Examples of commercially available photopolymerizable monomers include DPEA-12 of Kayarad and the like.

The content of the photopolymerizable monomer may be about 5 to 30% by weight, or about 7 to 20% by weight, or about 7 to 15% by weight based on the total weight of the resin composition. If the content of the photopolymerizable monomer is too small, the photocuring may become insufficient. If the content of the photopolymerizable monomer is excessively large, the dryness of the DFSR may deteriorate and the physical properties may deteriorate.

Polyacrylic acid

On the other hand, the resin composition of one embodiment includes polyacrylic acid. Such a polyacrylic acid does not exhibit photo-curability and does not react or react with the acid-modified oligomer and the photopolymerizable monomer, and can exhibit properties soluble in a developer. Due to the characteristics of the polyacrylic acid, when the development process is carried out after the exposure to the resin composition of one embodiment, only the polyacrylic acid which does not have photo-curability in the photo-cured exposure portion can be selectively dissolved in the developer , And an acid-modified oligomer having a crosslinked structure formed by the remaining photo-curing may remain. This is because the polyacrylic acid shows incompatibility with the acid-modified oligomer or the like and is non-reactive. Therefore, it can be considered that microcrystallization occurs after photo-curing. As a result, only polyacrylic acid is selectively removed in the exposed portion, Fine irregularities may be formed on the surface of the DFSR.

That is, when the DFSR is formed by applying the resin composition of one embodiment by the action of the polyacrylic acid, a DFSR having fine irregularities formed on its surface can be formed without adding a separate plasma processing step or the like. In particular, even if only a development process to be applied for the formation of the DFSR is carried out, it is possible to form the DFSR in which the fine concavities and convexities are formed on the surface, so that the DFSR exhibiting excellent adhesion with the subsequent process materials and the like can be formed by a simplified process do.

In addition, due to the shape and surface roughness due to the fine unevenness, it is possible to form a DFSR having low-gloss characteristics, thereby making it possible to provide a DFSR having excellent circuit concealability.

As such a polyacrylic acid, any polyacrylic acid which exhibits non-reactivity and immiscibility with an acid-modified oligomer and the like, solubility in a developer, and the like can be used. For example, the polyacrylic acid may have a weight average molecular weight of about 1000 to 200000, or about 3000 to 100000, or about 4000 to 60000, in view of the above-described characteristics and the like. It is needless to say that such polyacrylic acid may be directly synthesized by a method known to those skilled in the art, or may be obtained by using commercially available polyacrylic acid.

The content of the polyacrylic acid may be about 1 to 30% by weight, or about 5 to 27% by weight, or about 10 to 25% by weight based on the total weight of the resin composition. If the content of the polyacrylic acid is too small, fine concavities and convexities are not formed on the finally formed DFSR, sufficient adhesion with subsequent process materials can not be secured, DFSR having a low-gloss surface may not be formed properly, An excessive amount of polyacrylic acid may be removed from the exposed portion where the DFSR is to be formed, so that a DFSR having a desired pattern may not be properly formed.

Photoinitiator

The resin composition of one embodiment includes a photoinitiator. Such a photoinitiator serves to initiate radical photocuring in the exposed portion of the resin composition, for example.

As the photoinitiator, known ones can be used, and benzoin compounds based on benzoin such as benzoin, benzoin methyl ether, benzoin ethyl ether and the like and alkyl ethers thereof; Acetophenone compounds such as acetophenone, 2,2-dimethoxy-2-phenylacetophenone, 1,1-dichloroacetophenone and 4- (1-t-butyldioxy-1-methylethyl) acetophenone; Anthraquinone compounds such as 2-methyl anthraquinone, 2-amylanthraquinone, 2-t-butyl anthraquinone and 1-chloro anthraquinone; Thioxanthone compounds such as 2,4-dimethylthioxanthone, 2,4-diisopropylthioxanthone and 2-chlorothioxanthone; Ketal compounds such as acetophenone dimethyl ketal and benzyl dimethyl ketal; Benzophenones such as benzophenone, 4- (1-t-butyldioxy-1-methylethyl) benzophenone and 3,3 ', 4,4'-tetrakis (t-butyldioxycarbonyl) A compound or the like can be used.

Further, it is also possible to use 2-methyl-1- [4- (methylthio) phenyl] -2-morpholinopropanone- -One, 2- (dimethylamino) -2 - [(4-methylphenyl) methyl] -1- [4- (4-morpholinyl) phenyl] -1-butanone, N, N-dimethylaminoacetophenone Examples of commercially available products include α-amino acetophenone compounds such as Irgacure (registered trademark) 907, Irgacure 369, Irgacure 379, etc., manufactured by Chiba Specialty Chemicals (now Ciba Specialty Chemicals); Trimethylbenzoyldiphenylphosphine oxide, bis (2,4,6-trimethylbenzoyl) -phenylphosphine oxide, bis (2,6-dimethoxybenzoyl) -2,4,4- Acylphosphine oxide compounds such as pentylphosphine oxide (commercially available products such as Lucylin (registered trademark) TPO from BASF, and IRGACURE 819 from Ciba Specialty Chemicals) may also be mentioned as suitable photoinitiators.

Other suitable photoinitiators include oxime ester compounds. Specific examples of oxime ester compounds include 2- (acetyloxyiminomethyl) thioxanthien-9-one, (1,2-octanedione, 1- [4- (phenylthio) phenyl] ), (Ethanone, 1- [9-ethyl-6- (2-methylbenzoyl) -9H-carbazol-3-yl] - and 1- (O-acetyloxime). Examples of commercially available products include GGI-325, Irgacure OXE01, Irugacure OXE02, ADEKA N-1919, and Ciba Specialty Chemicals Darocur TPO, all of which are commercially available products. In addition, a nonimidazole-based compound or a triazine-based compound can also be used as an appropriate photoinitiator.

The content of the photoinitiator may be about 0.5 to 20% by weight, or about 1 to 10% by weight, or about 1 to 5% by weight based on the total weight of the resin composition. If the content of the photoinitiator is too small, the photo-curing may not occur properly. On the other hand, if the content is excessively large, the resolution of the resin composition may be lowered and the reliability of the DFSR may not be sufficient.

Thermosetting binder

The resin composition of one embodiment also includes a thermosetting binder having at least one selected from a thermosetting functional group, for example, an epoxy group, an oxetanyl group, a cyclic ether group, and a cyclic thioether group. These thermosetting binders can form cross-links with acid-modified oligomers and the like by thermal curing to ensure the heat resistance or mechanical properties of DFSR.

The thermosetting binder may have a softening point of about 70 to 100 캜, thereby reducing irregularities during lamination. If the softening point is low, the tackiness of the DFSR increases, and if it is high, the flowability may deteriorate.

As the thermosetting binder, a resin having two or more cyclic ether groups and / or cyclic thioether groups (hereinafter referred to as a cyclic (thio) ether group) in the molecule can be used, and a bifunctional epoxy resin can be used have. Other diisocyanates or their bifunctional block isocyanates may also be used.

The thermosetting binder having at least two cyclic (thio) ether groups in the molecule may be a compound having at least two, three or four or five membered cyclic ether groups or cyclic thioether groups in the molecule have. The thermosetting binder may be a polyfunctional epoxy compound having at least two epoxy groups in the molecule, a polyfunctional oxetane compound having at least two oxetanyl groups in the molecule, or an episulfide resin having two or more thioether groups in the molecule Or the like.

Specific examples of the polyfunctional epoxy compound include bisphenol A type epoxy resin, hydrogenated bisphenol A type epoxy resin, brominated bisphenol A type epoxy resin, bisphenol F type epoxy resin, bisphenol S type epoxy resin, novolak type epoxy resin , Phenol novolak type epoxy resin, cresol novolak type epoxy resin, N-glycidyl type epoxy resin, bisphenol A novolak type epoxy resin, biquilene type epoxy resin, biphenol type epoxy resin, chelate type epoxy resin, Epoxy-containing epoxy resins, epoxy-modified epoxy resins, dicyclopentadiene-phenolic epoxy resins, diglycidyl phthalate resins, heterocyclic epoxy resins, tetraglycidylsilaneoyl ethane resins, silicone modified epoxy resins ,? -caprolactone-modified epoxy resin, and the like. Further, in order to impart flame retardancy, a phosphorus or other atom introduced into the structure may be used. These epoxy resins improve the properties such as adhesiveness of the cured film, solder heat resistance, and electroless plating resistance by thermosetting.

Examples of the polyfunctional oxetane compound include bis [(3-methyl-3-oxetanylmethoxy) methyl] ether, bis [ Methyl-3-oxetanylmethoxy) methyl] benzene, 1,4-bis [(3-ethyl-3-oxetanylmethoxy) (3-ethyl-3-oxetanyl) methyl acrylate, (3-methyl-3-oxetanyl) methyl methacrylate, (P-hydroxystyrene), cardo-type bisphenols, caries alenes, caries-threzine isomers, or silsesquioxanes such as novolac resins, poly And ether of a resin having a hydroxy group such as quinoxane. Other examples include copolymers of an unsaturated monomer having an oxetane ring and an alkyl (meth) acrylate.

Examples of the compound having two or more cyclic thioether groups in the molecule include a bisphenol A type episulfide resin YL7000 manufactured by Japan Epoxy Resin Co., An episulfide resin in which the oxygen atom of the epoxy group of the novolac epoxy resin is replaced with a sulfur atom can also be used.

As a commercially available product, YDCN-500-80P manufactured by Kukdo Chemical Co., Ltd. can be used.

The thermosetting binder may be contained in an amount corresponding to 0.8 to 2.0 equivalents based on 1 equivalent of the carboxyl group of the acid-modified oligomer. If the content of the thermosetting binder becomes too small, a carboxyl group may remain in the DFSR after curing, resulting in deterioration of heat resistance, alkali resistance, electrical insulation and the like. On the other hand, if the content is excessively large, a thermosetting binder having a low molecular weight remains in the dried coating film, and the strength or the like of the coating film is lowered.

In addition to the components described above, the resin composition of one embodiment includes a solvent; And a thermosetting binder catalyst (thermosetting catalyst) described later, fillers, pigments, and additives.

Thermosetting binder catalyst (thermosetting catalyst)

The thermosetting binder catalyst serves to promote thermosetting of the thermosetting binder.

Examples of such thermosetting binder catalysts include imidazole, 2-methylimidazole, 2-ethylimidazole, 2-ethyl-4-methylimidazole, 2- phenylimidazole, Imidazole derivatives such as 1-cyanoethyl-2-phenylimidazole and 1- (2-cyanoethyl) -2-ethyl-4-methylimidazole; Amines such as dicyandiamide, benzyldimethylamine, 4- (dimethylamino) -N, N-dimethylbenzylamine, 4-methoxy-N, N-dimethylbenzylamine and 4- compound; Hydrazine compounds such as adipic acid dihydrazide and sebacic acid dihydrazide; And phosphorus compounds such as triphenylphosphine. 2MZ-A, 2MZ-OK, 2PHZ, 2P4BHZ, 2P4MHZ (all trade names of imidazole-based compounds) manufactured by Shikoku Chemical Industry Co., Ltd., U-CAT 3503N and UCAT3502T DBU, DBN, U-CATSA102, and U-CAT5002 (all of bicyclic amidine compounds and salts thereof), and the like. The present invention is not limited thereto and may be a thermal curing catalyst for an epoxy resin or an oxetane compound or a catalyst for accelerating a reaction between an epoxy group and / or an oxetanyl group and a carboxyl group, or they may be used alone or in combination of two or more . Further, it is also possible to use one or more compounds selected from the group consisting of guanamine, acetoguanamine, benzoguanamine, melamine, 2,4-diamino-6-methacryloyloxyethyl-S-triazine, Azine, 2-vinyl-4,6-diamino-S-triazine isocyanuric acid adduct, 2,4-diamino-6-methacryloyloxyethyl-S-triazine isocyanuric acid Triazine derivatives such as adducts may be used, and preferably compounds that also function as adhesion promoters may be used in combination with the thermosetting binder catalyst.

The content of the thermosetting binder catalyst may be about 0.3 to 15% by weight based on the total weight of the resin composition in view of adequate thermosetting property.

filler

The filler improves thermal stability, dimensional stability by heat, and resin adhesion. It also acts as an extender pigment by enhancing the color.

As the filler, an inorganic or organic filler can be used, for example, barium sulfate, barium titanate, amorphous silica, crystalline silica, fused silica, spherical silica, talc, clay, magnesium carbonate, calcium carbonate, aluminum oxide Aluminum hydroxide, mica, or the like can be used.

The content of the filler is preferably about 5 to 50% by weight based on the total weight of the composition. When it is used in an amount of more than 50% by weight, the viscosity of the composition is increased and the coating property is lowered or the curing degree is lowered.

Pigment

The pigment exhibits visibility and hiding power, and serves to hide defects such as scratches on circuit lines.

As the pigment, red, blue, green, yellow, black pigment and the like can be used. As blue pigments, phthalocyanine blue, Pigment Blue 15: 1, Pigment Blue 15: 2, Pigment Blue 15: 3, Pigment Blue 15: 4, Pigment Blue 15: 6, Pigment Blue 60, have. Green pigments include Pigment Green 7, Pigment Green 36, Solvent Green 3, Solvent Green 5, Solvent Green 20, Solvent Green 28, and the like. Examples of the yellow pigment include anthraquinone type, isoindolinone type, condensed azo type, and benzimidazolone type. Examples thereof include Pigment Yellow 108, Pigment Yellow 147, Pigment Yellow 151, Pigment Yellow 166, Mention Yellow 181, Pigment Yellow 193, and the like.

The content of the pigment is preferably about 0.5 to 3% by weight based on the total weight of the resin composition. If it is used in an amount less than 0.5% by weight, visibility and hiding power will be lowered, and if it is used in an amount exceeding 3% by weight, heat resistance will be deteriorated.

additive

The additive may be added to remove the bubbles of the resin composition, to remove popping or craters on the surface of the resin composition during film coating, to impart flame retardant properties, to control viscosity, and to provide a catalyst.

Specifically, known thickeners such as fine silica, organic bentonite, and montmorillonite; Defoaming agents and / or leveling agents such as silicone, fluorine, and high molecular weight; Silane coupling agents such as imidazole, thiazole and triazole; Flame retardants such as phosphorus flame retardants and antimony flame retardants, and the like.

For example, BYK-380N, BYK-307, BYK-378, and BYK-350 of BYK-Chemie GmbH can be used as the leveling agent in removing the popping or craters on the surface during film coating.

The content of the additive is preferably about 0.01 to 10% by weight based on the total weight of the resin composition.

solvent

One or more solvents may be used in combination to dissolve the resin composition or to impart an appropriate viscosity.

Examples of the solvent include ketones such as methyl ethyl ketone and cyclohexanone; Aromatic hydrocarbons such as toluene, xylene, and tetramethylbenzene; Ethylene glycol monoethyl ether, ethylene glycol monomethyl ether, ethylene glycol monobutyl ether, diethylene glycol monoethyl ether, diethylene glycol monomethyl ether, diethylene glycol monobutyl ether, propylene glycol monomethyl ether, propylene glycol monoethyl ether , Glycol ethers (cellosolve) such as dipropylene glycol diethyl ether and triethylene glycol monoethyl ether; But are not limited to, ethyl acetate, butyl acetate, ethylene glycol monoethyl ether acetate, ethylene glycol monobutyl ether acetate, diethylene glycol monoethyl ether acetate, diethylene glycol monobutyl ether acetate, propylene glycol monomethyl ether acetate, dipropylene glycol monomethyl ether acetate And the like; Alcohols such as ethanol, propanol, ethylene glycol, propylene glycol and carbitol; Aliphatic hydrocarbons such as octane and decane; Petroleum solvents such as petroleum ether, petroleum naphtha, hydrogenated petroleum naphtha and solvent naphtha; Amides such as dimethylacetamide and dimethylformamide (DMF), and the like. These solvents may be used alone or as a mixture of two or more thereof.

The content of the solvent may be about 10 to 50% by weight based on the total weight of the resin composition. When the content is less than 10% by weight, the coating property is low due to the high viscosity, and when the content is more than 50% by weight, the coating is not dried well and the stickiness is increased.

Dry film solder resist

According to another embodiment of the present invention, there is provided a DFSR formed using a resin composition having photo-curable and thermosetting properties of the above-described embodiment. Such DFSRs include a carboxyl group (-COOH), an acid-modified oligomer having a photocurable unsaturated functional group; Polyacrylic acid; A photopolymerizable monomer having at least two photocurable unsaturated functional groups; And a cured product of a thermosetting binder having a thermosetting functional group, and fine irregularities having an average roughness Rz of about 2 to 20 mu m, about 3 to 10 mu m, or about 4 to 8 mu m are formed on the surface And may exhibit a light reflectance of about 60 to 90%, or about 70 to 88%, or about 80 to 87%, with respect to visible light at the surface. In such a DFSR, the fine irregularities may have an average roughness (Ra) of about 55 nm to 5 μm, or about 100 nm to 3 μm, or about 200 nm to 2 μm.

First, the process of forming the DFSR is as follows.

The resin composition of the embodiment may be applied as a photosensitive coating material to a carrier film using a comma coater, a blade coater, a lip coater, a rod coater, a squeeze coater, a reverse coater, a transfer roll coater, a gravure coater, And then dried in an oven at a temperature of 50 to 130 캜 for 1 to 30 minutes and then laminated with a release film to form a carrier film, a photosensitive film and a release film from below Can be produced. The thickness of the photosensitive film may be about 5 to 100 mu m. As the carrier film, a plastic film such as polyethylene terephthalate (PET), a polyester film, a polyimide film, a polyamideimide film, a polypropylene film, and a polystyrene film can be used. As the release film, polyethylene (PE) A polytetrafluoroethylene film, a polypropylene film, a surface-treated paper, or the like can be used. When the release film is peeled off, it is preferable that the adhesive force between the photosensitive film and the release film is lower than the adhesive force between the photosensitive film and the carrier film.

Next, the release film is peeled off, and then the photosensitive film layer is bonded to the substrate on which the circuit is formed by using a vacuum laminator, a hot roll laminator, a vacuum press, or the like.

Next, the substrate is exposed by a light beam (UV or the like) having a certain wavelength band. The exposure may be selectively exposed by a photomask, or may be directly pattern-exposed by a laser direct exposure apparatus. The carrier film peels off after exposure. The exposure dose varies depending on the coating film thickness, but is preferably about 0 to 1,000 mJ / cm 2. When the above exposure is performed, for example, light curing occurs in the exposed portion, and cross-linking of the acid-modified oligomer with the photopolymerizable monomer or the like can be formed, and as a result, the state can not be removed by the subsequent phenomenon. On the other hand, in the unexposed area, the carboxyl group can be maintained as it is and the alkali development can be made.

Next, development is performed using an alkali solution or the like. The alkali solution may be an aqueous alkali solution such as potassium hydroxide, sodium hydroxide, sodium carbonate, potassium carbonate, sodium phosphate, sodium silicate, ammonia, amines and the like. By such a phenomenon, the acid-modified oligomer and the photopolymerizable monomer of the unexposed area can be dissolved and removed in the developer.

Incidentally, the resin composition of one embodiment includes the above-mentioned polyacrylic acid. Accordingly, the polyacrylic acid in the exposed portion as well as the resin composition in the non-visible portion can be selectively removed by the above-described development process. Therefore, as described above, fine irregularities can be formed on the exposed portion and the finally formed DFSR.

As a result, when the development process is performed, a film having fine irregularities on the surface can be formed.

Finally, the DFSR formed from the photosensitive film can be finally formed by heat curing (Post Cure). A heat curing temperature of 100 ° C or higher is suitable. By such heating and curing, the thermosetting functional group of the thermosetting binder and the carboxyl group of the acid-modified oligomer can be crosslinked to form a crosslinked structure. Further, as a result of the hardening until such heating and hardening, fine irregularities formed on the surface due to polyacrylic acid are reflected after the above-mentioned development step, so that the surface has an average of about 2 to 20 占 퐉, about 3 to 10 占 퐉, The roughness Rz or the roughness Ra of about 50 nm to 5 占 퐉, or about 50 nm to 5 占 퐉, or about 100 nm to 3 占 퐉, or about 200 nm to 2 占 퐉 may be finally formed have.

Particularly, such DFSR reflects the surface roughness and fine irregularities formed by the fine irregularities, so that the surface of the DFSR is reduced to about 60 to 90%, or about 70 to 88%, or about 80 to 87% Reflectance can be expressed. Thus, the DFSR can be formed on a circuit board to exhibit excellent circuit concealability and meet the related art needs.

The DFSR and the printed circuit board including the DFSR, for example, a package substrate of a semiconductor element, for example, may be provided through the above-described method and the like. The surface area is increased and excellent adhesion can be exhibited. In addition, it exhibits low reflectance and gloss of the surface and exhibits excellent characteristics of circuit concealment. Further, as the DFSR is subjected to photo-curing and thermal curing, the above-mentioned acid-modified oligomer; Photopolymerizable monomer; And a cured product of a thermosetting binder having a thermosetting functional group.

More specifically, in the cured product, the carboxyl group of the acid-modified oligomer can be crosslinked with a thermosetting functional group of the thermosetting reactor by thermal curing, and the photo-curable unsaturated functional group of the acid-modified oligomer is photo- Linking structure with an unsaturated functional group contained in the photopolymerizable monomer to form a crosslinked structure. As described above, the above-mentioned fine irregularities can be formed on the surface of the DFSR as the polyacrylic acid is removed during the DFSR formation process.

As described above, since it is possible to form a DFSR having fine irregularities on its surface while omitting a separate plasma treatment or the like, it is possible to provide a DFSR exhibiting excellent adhesion with a subsequent process material when applied to a semiconductor package substrate or the like, It is possible to provide a DFSR that suppresses deterioration of physical properties of DFSR due to plasma treatment or the like to manifest and maintain excellent physical properties. In addition, it becomes possible to provide a DFSR exhibiting better circuit concealability.

In addition, the DFSR may further include a small amount of a photoinitiator remaining in the cured state to participate in the photo-curing.

According to the present invention, there can be provided a photocurable and thermosetting resin composition and a DFSR capable of forming a DFSR having fine irregularities on the surface thereof without a separate processing step such as a plasma treatment process. When such a DFSR is applied to a semiconductor package substrate or the like, it can exhibit excellent adhesion with a subsequent process material due to fine unevenness, and can be formed in a simpler and more economical process by omitting a separate process step such as a plasma treatment process . In addition, such DFSR is capable of suppressing deterioration of physical properties due to plasma treatment and the like, and exhibiting excellent physical properties.

In addition, it has been confirmed that the DFSR exhibits a low reflectance and gloss on the surface, so that it can be formed on a circuit board to exhibit excellent circuit concealability.

Figures 1 and 2 are FE-SEM photographs of the surface states of the DFSR formed in Examples 1 and 2.

Best Mode for Carrying Out the Invention Hereinafter, the function and effect of the present invention will be described in more detail through specific examples of the present invention. It is to be understood, however, that these embodiments are merely illustrative of the invention and are not intended to limit the scope of the invention.

<Examples>

Example 1

(1) Production of dry film solder resist

10 weight% of polyacrylic acid with Mw of 5000, 32 weight% of ZFR-1122 of Japanese explosive as acid-modified oligomer, 10 weight% of polyfunctional epoxy acrylate (DPEA-12 of Japanese explosive) as photopolymerizable monomer, 10 weight% of Darocur TPO 3% by weight of 2-phenylimidazole as a thermosetting catalyst, 3% by weight of a thermosetting binder such as YDCN-500-80P (National Chemical Industries, Ltd.) 15 wt% of BYK-333 manufactured by BYK as an additive, and 12.5 wt% of DMF as a solvent were mixed and stirred, and the filler was dispersed with a 3-roll mill equipment to obtain photo-curing property and thermosetting property Was prepared.

The resin composition thus prepared was applied to PET used as a carrier film using a comma coater and then passed through an oven at 75 DEG C for 8 minutes to dry the laminate. Then, PE was laminated as a release film to form a carrier film, a photosensitive film, A dry film composed of a release film was produced.

(2) Manufacturing of printed circuit boards

After releasing the release film of the dry film, the photosensitive film layer was vacuum-laminated on a circuit-formed substrate with a vacuum laminator (MV LP-500, manufactured by Meiki Seisakusho Co., Ltd.) and irradiated with ultraviolet light having a wavelength of 400 mJ / cm &lt; 2 & gt ;, and then the PET film was removed. The resulting product was immersed in a stirred solution of 1% Na 2 CO 3 in 1% of alkali for 60 seconds, developed and cured at 150 ° C for 1 hour to obtain a printed circuit board including a dry film solder resist (DFSR) Completed.

On the other hand, the substrate on which the circuit was formed was cut into a substrate of LG-T-500GA having a thickness of 0.1 mm and a copper foil thickness of 12 탆 by a substrate having a width of 5 cm and a length of 5 cm and forming a micro roughness on the surface of the copper foil by chemical etching Were used.

Example 2

(One) Manufacture of dry film solder resist

A resin composition having photo-curability and thermosetting properties was prepared in the same manner as in Example 1, except that 5 wt% of polyacrylic acid was used and 39 wt% of ZAR-2000 manufactured by Nippon Bunko Co., Ltd. was used as the acid-modified oligomer.

The resin composition thus prepared was applied to PET used as a carrier film by using a comma coater, followed by drying in an oven at 75 캜 for 8 minutes and then PE was laminated as a release film to form a carrier film, a photosensitive film , A dry film composed of a release film was prepared

(2) Manufacturing of printed circuit boards

A printed circuit board including the DFSR was completed in the same manner as in Example 1, except that the dry film prepared above was used.

<Comparative Example>

Comparative Example 1

A printed circuit board including DFSR was completed in the same manner as in Example 1 except that 42 wt% of ZFR-1122 as an acid-modified oligomer was used instead of polyacrylic acid in Example 1

<Test Example: Evaluation of Physical Properties of Protective Film for Printed Circuit Board>

The dry film solder resist for printed circuit boards prepared in Examples 1 and 2 and Comparative Example 1 was evaluated for surface roughness, developability and heat resistance reliability as described below.

Experimental Example 1: Surface roughness

The release film of the DFSR obtained in Example 1 and Comparative Example 1 was peeled off, placed on the copper clad laminate, vacuum-treated for 20 seconds with a vacuum laminator, and laminated at a temperature of 65 DEG C and a pressure of 0.7 MPa for 40 seconds.

And, on the lamination DFSR drawn by negative-quartz (quartz), position the photomask 400mJ / ㎠ of UV (i band) after, Na 2 CO 3 for removing the PET film used as the carrier film, and 30 ℃ exposure to After developing for 60 seconds in an alkali solution of 1%, it was washed with water and dried.

The surface state of the dried sample was observed using FE-SEM (Hitachi S-4800). In the case of Example 1 and Comparative Example 1, OP (optical profiler, nanoview) The surface roughness values Rz and Ra were compared and measured. The FE-SEM photographs of the surface states of Examples 1 and 2 are as shown in Figs. 1 and 2, and the images measured with OP for Example 1 and Comparative Example 1, and Rz and Ra values are shown in the following Table 1, respectively.

Experimental Example 2: Developability Evaluation

The release films of the DFSR obtained in Examples 1 and 2 and Comparative Example 1 were peeled off, placed on the copper clad laminate, vacuum-treated for 20 seconds by a vacuum laminator, and laminated at a temperature of 65 DEG C and a pressure of 0.7 MPa for 40 seconds .

And, on the lamination DFSR drawn by negative-quartz (quartz), position the photomask 400mJ / ㎠ of UV (i band) after, Na 2 CO 3 for removing the PET film used as the carrier film, and 30 ℃ exposure to After developing for 60 seconds in an alkali solution of 1%, it was washed with water and dried.

These developability evaluation criteria and results are summarized in Table 2 below.

Experimental Example 3: Method of measuring heat resistance reliability

The protective film for the printed board was laminated to the CCL and photocured, thermally cured and back-cured, and then cut into 150 mm * 130 mm. A temperature of 288 ° C was set in the lead wire (electrically heated and temperature adjustable, with at least 2.25 kg lead in the lead furnace) and the test specimen was placed on top of the film with the film on top. Test specimens were visually inspected for peeling or deformation of the film.

These heat resistance reliability evaluation standards and results are summarized in Table 2 below.

Experimental Example  4: How to measure gloss

The protective film for the printed board was laminated to the CCL and photocured, thermally cured and back-cured, and then cut into 150 mm * 130 mm. The reflectance of the protective film against the visible light of the DFSR surface was measured using a micro-gloss meter manufactured by BYK (using a product having a measurement angle of 85 degrees). These reflectance measurement sheets are summarized in Table 3 below, and the DFSR surface gloss was determined therefrom. For reference, the lower the reflectance value is, the lower the gloss is.

Rz and Ra measurement results of Experimental Example 1 OP measurement image Rz Ra Example 1

Figure pat00001
4.46 μm 305.73 nm Comparative Example 1
Figure pat00002
1.03um 52.13 nm

Referring to Table 1, it was confirmed that since the DFSR of Example 1 was formed from a resin composition containing polyacrylic acid, fine irregularities having a relatively large surface roughness were formed on the surface.

On the other hand, it was confirmed that the DFSR of Comparative Example 1 had only fine irregularities on its surface without additional processing such as a plasma treatment, and only had an average roughness (Rz) of about 1.03 μm and an average roughness (Ra) of about 52.13 nm .

Measurement results of Experimental Examples 2 and 3 Heat Resistance Reliability Developability Example 1 OK OK Example 2 OK OK Comparative Example 1 OK OK 1. Evaluation Criteria for Heat Resistance Reliability
(1) OK: 288 ℃, solder floating
(2) NG: 288 ° C, bursting from solder floating

2. Developability
Observation of the Fe-SEM revealed that the developed hole having a mask size of 100 mu was 90 mu m or more in size and evaluated as OK

Referring to Table 2, it was confirmed that the DFSR of the examples exhibited excellent heat resistance reliability and developability similar to those of Comparative Examples in which fine concavities and convexities were formed on the surface and no fine irregularities were formed. Therefore, the DFSR of the embodiment can exhibit excellent adhesive force and exhibit excellent physical properties as a DFSR.

Measurement results of Experimental Example 4 reflectivity(%) Example 1 81.4% Example 2 84.5% Comparative Example 1 97.3%

Referring to Table 3, it was confirmed that the DFSR formed from the resin composition of the Example exhibited a low reflectance against visible light, exhibited a low-gloss surface, and was thus excellent in wire clogging. On the other hand, in the case of the DFSR formed in the comparative example, it was confirmed that it exhibited a high reflectance and a high-gloss surface to exhibit poor wiring hiding ability.

Claims (20)

An acid-modified oligomer having a carboxyl group (-COOH) and a photocurable unsaturated functional group;
Polyacrylic acid;
A photopolymerizable monomer having at least two photocurable unsaturated functional groups;
A thermosetting binder having a thermosetting functional group; And
A resin composition having photo-curable and thermosetting properties, which comprises a photoinitiator.
The resin composition according to claim 1, wherein the photocurable functional group of the acid-modified oligomer is an acrylate group.
The resin composition according to claim 1, wherein the acid-modified oligomer comprises a copolymer of a polymerizable monomer having a carboxyl group and a monomer containing an acrylate-based compound.
The resin composition according to claim 1, wherein the acid-modified oligomer is contained in an amount of 15 to 75% by weight based on the total weight of the resin composition.
The resin composition according to claim 1, wherein the acid-modified oligomer has an acid value of 40 to 120 mgKOH / g.
The resin composition according to claim 1, wherein the polyacrylic acid has a weight average molecular weight of 1,000 to 200,000.
The resin composition according to claim 1, wherein the polyacrylic acid is contained in an amount of 1 to 30% by weight based on the total weight of the resin composition.
The resin composition according to claim 1, wherein the photopolymerizable monomer comprises a polyfunctional (meth) acrylate compound having two or more (meth) acryloyl groups in the molecule.
The photopolymerizable monomer according to claim 1, wherein the photopolymerizable monomer is at least one selected from the group consisting of a hydroxy functional group-containing polyfunctional acrylate compound; Soluble polyfunctional acrylate-based compounds; Polyfunctional polyester acrylate compounds of polyhydric alcohols; Acrylate compounds of ethylene oxide adducts of polyfunctional alcohols or polyhydric phenols; Acrylate compounds of propylene oxide adducts of polyfunctional alcohols or polyhydric phenols; Polyfunctional or monofunctional polyurethane acrylate-based compounds; Epoxy acrylate compounds; (Meth) acrylate-based compound selected from the group consisting of an acrylate-based compound that is caprolactone-modified and a photosensitive (meth) acrylate-based compound.
The resin composition according to claim 1, wherein the photopolymerizable monomer is contained in an amount of 5 to 30% by weight based on the total weight of the resin composition.
The method of claim 1, wherein the photoinitiator is selected from the group consisting of benzoin compounds, acetophenone compounds, anthraquinone compounds, thioxanthone compounds, ketal compounds, benzophenone compounds,? -Amino acetophenone compounds, acylphosphine oxide compounds, An ester compound, a nonimidazole compound, and a triazine compound.
The resin composition according to claim 1, wherein the photoinitiator is contained in an amount of 0.5 to 20% by weight based on the total weight of the resin composition.
The resin composition according to claim 1, wherein the thermosetting functional group is at least one selected from the group consisting of an epoxy group, an oxetanyl group, a cyclic ether group and a cyclic thioether group.
The resin composition according to claim 1, wherein the thermosetting binder is contained in an amount corresponding to 0.8 to 2.0 equivalents based on 1 equivalent of the carboxyl group of the acid-modified oligomer.
The method of claim 1, further comprising: a solvent; And at least one member selected from the group consisting of thermosetting binder catalysts, fillers, pigments, and additives.
An acid-modified oligomer having a carboxyl group (-COOH) and a photocurable unsaturated functional group;
A photopolymerizable monomer having at least two photocurable unsaturated functional groups; And
A cured product of a thermosetting binder having a thermosetting functional group,
Fine irregularities having an average roughness (Rz) of 2 to 20 mu m are formed on the surface,
A dry film solder resist exhibiting a light reflectance of 60 to 90% with respect to visible light on the surface.
The cured product according to claim 16, wherein the cured product has a crosslinked structure in which the carboxyl group of the acid-modified oligomer and the thermosetting functional group are crosslinked; And
Wherein the acid-modified oligomer and the photopolymerizable monomer have a cross-linked structure in which unsaturated functional groups of the photopolymerizable monomer are crosslinked with each other.
The dry film solder resist according to claim 16, further comprising a photoinitiator dispersed in the cured product.
The dry film solder resist according to claim 16, wherein the fine irregularities have an average roughness (Ra) of 55 nm to 5 占 퐉.
The dry film solder resist according to claim 16, which is used for manufacturing a package substrate of a semiconductor element.
KR1020130127877A 2013-10-25 2013-10-25 Photo-curable and thermo-curable resin composition, and dry film solder resist KR20150047863A (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR200490675Y1 (en) * 2017-01-26 2019-12-16 이터널 머티리얼스 씨오., 엘티디. Photosensitive dry film

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR200490675Y1 (en) * 2017-01-26 2019-12-16 이터널 머티리얼스 씨오., 엘티디. Photosensitive dry film

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