KR102373241B9 - 방사선 디텍터 및 이를 포함하는 방사선 검사장치 - Google Patents

방사선 디텍터 및 이를 포함하는 방사선 검사장치

Info

Publication number
KR102373241B9
KR102373241B9 KR1020210119955A KR20210119955A KR102373241B9 KR 102373241 B9 KR102373241 B9 KR 102373241B9 KR 1020210119955 A KR1020210119955 A KR 1020210119955A KR 20210119955 A KR20210119955 A KR 20210119955A KR 102373241 B9 KR102373241 B9 KR 102373241B9
Authority
KR
South Korea
Prior art keywords
radiation
same
inspection apparatus
detector
radiation detector
Prior art date
Application number
KR1020210119955A
Other languages
English (en)
Other versions
KR102373241B1 (ko
Inventor
문범진
김형식
김남원
길용철
Original Assignee
주식회사 디알텍
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 주식회사 디알텍 filed Critical 주식회사 디알텍
Application granted granted Critical
Publication of KR102373241B1 publication Critical patent/KR102373241B1/ko
Priority to PCT/KR2022/006353 priority Critical patent/WO2022265225A1/ko
Priority to US18/011,523 priority patent/US20240230933A9/en
Priority to JP2022576073A priority patent/JP7454709B2/ja
Priority to CA3221712A priority patent/CA3221712A1/en
Priority to EP22821835.0A priority patent/EP4357819A1/en
Priority to CN202280005281.2A priority patent/CN115868028A/zh
Publication of KR102373241B9 publication Critical patent/KR102373241B9/ko

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16Measuring radiation intensity
    • G01T1/24Measuring radiation intensity with semiconductor detectors
    • G01T1/244Auxiliary details, e.g. casings, cooling, damping or insulation against damage by, e.g. heat, pressure or the like
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144Devices controlled by radiation
    • H01L27/146Imager structures
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/18Investigating the presence of flaws defects or foreign matter
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01VGEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16Measuring radiation intensity
    • G01T1/20Measuring radiation intensity with scintillation detectors
    • G01T1/2018Scintillation-photodiode combinations
    • G01T1/20188Auxiliary details, e.g. casings or cooling

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Chemical & Material Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Power Engineering (AREA)
  • Engineering & Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Molecular Biology (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Electromagnetism (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Geophysics (AREA)
  • Measurement Of Radiation (AREA)
  • Toxicology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
KR1020210119955A 2021-06-15 2021-09-08 방사선 디텍터 및 이를 포함하는 방사선 검사장치 KR102373241B1 (ko)

Priority Applications (6)

Application Number Priority Date Filing Date Title
PCT/KR2022/006353 WO2022265225A1 (ko) 2021-06-15 2022-05-03 방사선 디텍터 및 이를 포함하는 방사선 검사장치
US18/011,523 US20240230933A9 (en) 2021-06-15 2022-05-03 Radiation detector and radiation inspection apparatus including same
JP2022576073A JP7454709B2 (ja) 2021-06-15 2022-05-03 放射線デテクター及びこれを備える放射線検査装置
CA3221712A CA3221712A1 (en) 2021-06-15 2022-05-03 Radiation detector and radiation inspection device including same
EP22821835.0A EP4357819A1 (en) 2021-06-15 2022-05-03 Radiation detector and radiation inspection device including same
CN202280005281.2A CN115868028A (zh) 2021-06-15 2022-05-03 辐射探测器及包括所述辐射探测器的辐射检验装置

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR20210077592 2021-06-15
KR1020210077592 2021-06-15

Publications (2)

Publication Number Publication Date
KR102373241B1 KR102373241B1 (ko) 2022-03-15
KR102373241B9 true KR102373241B9 (ko) 2024-04-16

Family

ID=80816715

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020210119955A KR102373241B1 (ko) 2021-06-15 2021-09-08 방사선 디텍터 및 이를 포함하는 방사선 검사장치

Country Status (6)

Country Link
EP (1) EP4357819A1 (ko)
JP (1) JP7454709B2 (ko)
KR (1) KR102373241B1 (ko)
CN (1) CN115868028A (ko)
CA (1) CA3221712A1 (ko)
WO (1) WO2022265225A1 (ko)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102373241B1 (ko) * 2021-06-15 2022-03-15 주식회사 디알텍 방사선 디텍터 및 이를 포함하는 방사선 검사장치
WO2024080701A1 (ko) * 2022-10-13 2024-04-18 주식회사 디알텍 양방향으로 휘어질 수 있는 방사선 디텍터
KR102665024B1 (ko) * 2023-08-07 2024-05-14 한동국 벤더블 엑스선 디텍터

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3656566B2 (ja) 2001-04-17 2005-06-08 株式会社島津製作所 放射線検査装置
JP4346865B2 (ja) * 2001-05-10 2009-10-21 キヤノン株式会社 画像入力装置及びその製造方法並びに画像入力装置を用いた放射線撮像システム
US8859974B2 (en) 2010-12-16 2014-10-14 General Electric Company Adjustable spect detector
JP2012173128A (ja) * 2011-02-21 2012-09-10 Fujifilm Corp 放射線画像検出装置及び放射線撮影装置
WO2013120200A1 (en) 2012-02-14 2013-08-22 Cubresa Inc. Flexible gamma camera system
DE102012208305B4 (de) 2012-05-16 2022-10-20 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Röntgendetektor und Röntgensystem
JP5947155B2 (ja) 2012-08-29 2016-07-06 浜松ホトニクス株式会社 放射線像変換パネル
KR102322377B1 (ko) * 2014-12-31 2021-11-05 엘지디스플레이 주식회사 접이식 디스플레이 장치
KR102051957B1 (ko) * 2017-11-13 2019-12-04 주식회사 토비스 곡면 디텍터의 제조방법
KR102373241B1 (ko) * 2021-06-15 2022-03-15 주식회사 디알텍 방사선 디텍터 및 이를 포함하는 방사선 검사장치

Also Published As

Publication number Publication date
JP7454709B2 (ja) 2024-03-22
EP4357819A1 (en) 2024-04-24
WO2022265225A1 (ko) 2022-12-22
KR102373241B1 (ko) 2022-03-15
CN115868028A (zh) 2023-03-28
JP2023535259A (ja) 2023-08-17
US20240134072A1 (en) 2024-04-25
CA3221712A1 (en) 2022-12-22

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Legal Events

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E701 Decision to grant or registration of patent right
GRNT Written decision to grant
Z072 Maintenance of patent after cancellation proceedings: certified copy of decision transmitted [new post grant opposition system as of 20170301]
Z131 Decision taken on request for patent cancellation [new post grant opposition system as of 20170301]