KR101883199B1 - Binary multiple resistance using the increased resistance and measurement devices and measurement calibration device and resistance using the calibration methods - Google Patents
Binary multiple resistance using the increased resistance and measurement devices and measurement calibration device and resistance using the calibration methods Download PDFInfo
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- KR101883199B1 KR101883199B1 KR1020160178906A KR20160178906A KR101883199B1 KR 101883199 B1 KR101883199 B1 KR 101883199B1 KR 1020160178906 A KR1020160178906 A KR 1020160178906A KR 20160178906 A KR20160178906 A KR 20160178906A KR 101883199 B1 KR101883199 B1 KR 101883199B1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
- G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/20—Modifications of basic electric elements for use in electric measuring instruments; Structural combinations of such elements with such instruments
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/20—Modifications of basic electric elements for use in electric measuring instruments; Structural combinations of such elements with such instruments
- G01R1/203—Resistors used for electric measuring, e.g. decade resistors standards, resistors for comparators, series resistors, shunts
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R17/00—Measuring arrangements involving comparison with a reference value, e.g. bridge
- G01R17/10—AC or DC measuring bridges
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R17/00—Measuring arrangements involving comparison with a reference value, e.g. bridge
- G01R17/10—AC or DC measuring bridges
- G01R17/12—AC or DC measuring bridges using comparison of currents, e.g. bridges with differential current output
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
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- General Physics & Mathematics (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Abstract
The present invention relates to a resistance value measuring method and a resistance value measuring method for measuring a resistance value of a target resistance by adjusting a resistance value error of a target resistance through a resistance value of a reference resistance and adjusting an error of a resistance measurement function of the measurement part, The present invention relates to a calibration device for a resistance measuring function of a measuring device and a resistance calibration method using the same, the reference resistance having a reference value as a reference; A pair of target resistors having resistance values corresponding to the reference resistances, gradually increasing and having the same resistance value; A measuring unit connected to both ends of the reference resistor and the target resistor to measure a resistance value of the reference resistor and the target resistor; A comparison unit connected to the measurement unit for comparing the measured value of the reference resistance with the measured value of the reference resistance; A display unit for displaying the reference resistance measurement value and the target resistance measurement value to be compared in the comparison unit, and a storage unit for storing the reference resistance measurement value and the target resistance measurement value displayed on the display unit.
Description
[0001] The present invention relates to a resistance value measuring apparatus and a resistance calibration method using the resistance value measuring apparatus, and more particularly, The present invention relates to a resistance value measuring apparatus and a resistance calibration method using the resistance value measuring apparatus, and a resistance calibration method using the same.
In general, the resistance measuring method is a method of comparing two resistances with each other, a bridge method, a potential difference method, and an ohmmeter method which directly measures a resistance are used as a measurement principle. The former two methods are widely known as a more accurate measurement method . The potential difference method requires a stable current source and requires a potentiometer or a digital voltmeter to measure a very low voltage.
For that reason, this method is mainly used in the range of about 1 Ω to 100 kΩ. The resistance bridges are widely used such as Wheatstone bridges, Kelvin bridges, and DC current comparator bridges (dcc bridges). Since the two bridges use a standard resistor of several kΩ as a comparator arm Their accuracy depends on various environmental factors and stability of arm resistance.
Therefore, the most accurate one among commercial resistance bridges is a DC current comparator bridge, which is composed of the disadvantages of the above-mentioned potential difference method and the weak points of the commercial resistance bridge. That is, as shown in FIG. 1, the direct current comparator bridge (dcc bridge) is constructed such that the ampere turn balance and the voltage balance are automatically performed in principle and the resulting resistance The ratio is given as the ratio of the two windings of the primary and secondary windings, so it can be used semi-permanently without any change in time unless it is very humid.
With such advantages, the accuracy of the DC current comparator bridge is usually used below sub-ppm. In particular, some recent equipment makers have developed DC current comparator bridges with measurement accuracy of 0.01 ppm (parts per million).
There are two main methods for correcting the ratio of the DC current comparator bridge having such a high accuracy. The first is a direct calibration method using a higher level instrument such as a Cryogenic Current Comparator bridge (CCC Bridge), where two standard resistors with good stability are measured using the instrument The ratio error of the DC current comparator bridge is determined by calculating the difference between the measured value and the measured value using the DC current comparator bridge.
Second, the ratio error is determined by calculating the difference between the ratio transmission standard (Hamon, divider, etc.) that already knows the ratio value and the two values measured by the DC current comparator bridge.
However, in the latter method, the Hamon-type commercial apparatus is not accurate to 0.05 ppm or more, and it is difficult to maintain the accuracy.
On the other hand, using the former method can determine the rate error very accurately, but very professional measurement techniques are needed to the extent that the National Metrology Institute (NMI), which has its CCC bridge globally, Since it operates using a SQUID, it is very sensitive to ambient noise, and operates in a liquid helium state, which is not economical.
In the prior art, a ratio is calculated by comparing a plurality of resistances in a binary manner with a standard resistor in a ratio of 1: 1, and compared with a ratio value obtained by a ratio meter such as a DC current comparator bridge to obtain a ratio error However, since the prior art requires a complicated structure measuring device and the size of the measuring device is large, there is a problem that it can be measured only at a designated place. There is a problem that the size of the equipment is large and the structure is complicated and the price is high.
The present invention relates to a resistance value measuring method and a resistance value measuring method for measuring a resistance value of a target resistance by adjusting a resistance value error of a target resistance through a resistance value of a reference resistance and adjusting an error of a resistance measurement function of the measurement part, And a resistance calibration method using the same.
According to another aspect of the present invention, there is provided a resistance value measuring apparatus and a resistance value measuring apparatus using the resistance value measuring apparatus, the resistance value measuring apparatus comprising: a reference resistor having a reference set value; A pair of target resistors having resistance values corresponding to the reference resistances, gradually increasing and having the same resistance value; A measuring unit connected to both ends of the reference resistor and the target resistor to measure a resistance value of the reference resistor and the target resistor; A comparison unit connected to the measurement unit for comparing the measured value of the reference resistance with the measured value of the reference resistance; A display unit for displaying the reference resistance measurement value and the target resistance measurement value to be compared in the comparison unit, and a storage unit for storing the reference resistance measurement value and the target resistance measurement value displayed on the display unit.
Specifically, the object resistors are made up of a pair, and each resistance value can be measured at both ends of each resistance, and each resistance is increased by a multiple of the reference resistance, and the resistance can be changed to a target resistance to be calibrated. do.
An error between the reference resistance and the target resistance is displayed on the display unit by comparing the measured resistance value of the reference resistance with the measured resistance value of the target resistance, and the error of the target resistance is adjusted so as to be similar to the resistance value of the reference resistance .
The measuring unit digitizes and displays the measured resistance value, and is capable of simultaneously or separately measuring the reference resistance and the target resistance.
According to another aspect of the present invention, there is provided a resistance value measuring apparatus for measuring a resistance value of a resistance value measuring apparatus and a resistance calibration method using the resistance value measuring apparatus. The resistance value measuring apparatus includes: Measuring a resistance value of a reference resistor connected to the measurement unit and connected to the measurement unit; Measuring a resistance value of a target resistance through a measurement unit by arranging in series a target resistance to be compared with a reference resistance measurement value measured through a step of measuring a resistance value of the reference resistance; Comparing a reference resistance measurement value and a target resistance measurement value measured by the measurement unit in a step of measuring a resistance value of the reference resistance and a resistance value of the target resistance in a comparison unit; The comparison unit compares the reference resistance measurement value, the target resistance measurement value, the reference resistance measurement value, and the target resistance measurement value, and displays the error value on the display unit. Based on the error value of the target resistance, Adjusting a resistance value; Storing the reference resistance measurement value, the target resistance measurement value, the reference resistance measurement value, and the error value for the target resistance measurement value displayed through the step of adjusting the resistance value according to the error value in a storage unit; A step of measuring a resistance value of a target resistance by changing a target resistance, a step of comparing in a comparing section, a step of adjusting a resistance value, and a step of storing in a storing section are repeatedly performed so that the resistance value of the target resistance is matched with the reference resistance And repeatedly calibrating.
The comparing unit compares the reference resistance measurement value with the target resistance measurement value to calculate an error value for the target resistance measurement value according to the reference resistance measurement value and transmits the calculated error value to the display unit for display .
Wherein the step of adjusting the resistance value comprises comparing the resistance value of the reference resistance with the resistance value of the target resistance by comparing the resistance value of the target resistance with the resistance value of the target resistance, To be close to each other.
The measuring unit measuring the resistance value of the reference resistance and measuring the resistance value of the target resistance may check whether the measured value of the measuring unit itself is normal through the resistance value of the reference resistance which is confirmed in advance So that the measurement error of the measuring unit can be adjusted.
According to the present invention, the resistance value of the target resistance can be adjusted through the reference resistance resistance value measured through the measurement unit, and the resistance measurement function of the measurement unit can be checked and adjusted through the reference resistance.
In addition, since the measuring unit can be replaced with a low-cost measuring instrument, the object resistance can be calibrated at low cost.
BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a diagram showing the entire configuration of a resistance value measuring apparatus and resistance measuring function correcting apparatus using a binary drain resistance increase according to an embodiment of the present invention. FIG.
FIG. 2 is a view showing a procedure of a resistance value measuring method using a resistance increase measuring device according to the present invention and a resistance calibration method using the resistance measuring function correcting device.
Hereinafter, embodiments of the present invention will be described with reference to the drawings. It is to be understood that both the foregoing general description and the following detailed description are exemplary and explanatory and are not intended to limit the invention to the particular forms disclosed. And shall not interpret it.
BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a block diagram showing the entire configuration of a resistance value measuring apparatus resistance measuring function correcting apparatus using a binary drain resistance increase according to an embodiment of the present invention, which includes a
The
The
The
A pair of the
The
The
The
The
The
The
The
The resistance value of the
The
The error of the resistance values of the
The user can adjust the error value of the
The
The
At this time, the
The
A method for calibrating the resistance measurement function of the
Measuring a resistance value of the reference resistor 10 connected to the measuring unit 30 by selecting the reference resistor 10 corresponding to the resistance value of the target resistor 20 to be calibrated and connecting the measuring resistor 30 to the measuring unit 30, The target resistors 20 to be calibrated to be compared with the measured value of the reference resistor 10 measured through the step of measuring the resistance value of the reference resistor 10 are arranged in series and the measurement unit 30 A step S20 of measuring the resistance value of the target resistor 20 through the step S20 of measuring the resistance value of the target resistor 20 and a step S20 of measuring the resistance value of the target resistor 20, (S30) of comparing the measured value of the reference resistance 10 measured by the measuring unit 30 with the measured value of the target resistance 20 at the comparator 40 at the comparator 40, The measured value of the reference resistance 10 and the measured value of the reference resistance 10 and the measured value of the target resistance 20 are displayed on the display unit 50 (Step S40) of adjusting the resistance value in accordance with the error value of the target resistance 20 and comparing the measured value of the reference resistance 10 and the measured value of the target resistance 20 displayed through the step of displaying on the display unit 50 A step S50 of storing the measured value of the reference resistance 10 and an error value of the measured value of the target resistance 20 in the storage unit 60 and a step of changing the target resistance 20 to be corrected, The resistance value is measured (S20), the comparison unit 40 performs a comparison (S30), the resistance value is adjusted (S40), and the storage unit 60 stores (S50) And repeatedly calibrating the resistance value of the resistor 20 to fit the reference resistor 10 (S60).
The step S10 of measuring the resistance value of the
In this case, the resistance value of the
When the
The resistance value of the
When comparing the
If the error of the resistance values of the
When the resistance value of the
When the
If the error value is adjusted through the step S40 of adjusting the resistance value according to the error value, the
The measured resistance values of the
According to the present invention configured as described above, the resistance value of the target resistance can be adjusted through the reference resistance value measured through the measurement unit, and the resistance measurement function of the measurement unit can be checked and adjusted through the reference resistance.
In addition, since the measuring unit can be replaced with a low-cost measuring instrument, the object resistance can be calibrated at low cost.
The resistance value and the resistance value measuring device resistance measuring function using the above-described resistance increase and the resistance of the drain resistance are not limited to the configuration and the operation manner of the embodiments described above. The embodiments may be configured so that all or some of the embodiments may be selectively combined so that various modifications may be made.
10: Reference resistance 20: Target resistance
30: measuring section 40: comparing section
50: display section 60: storage section
Claims (8)
Measuring a resistance value of the reference resistor 10 connected to the measuring unit 30 by selecting the reference resistor 10 corresponding to the resistance value of the target resistor 20 to be calibrated and connecting the measuring resistor 30 to the measuring unit 30, (S10);
The target resistors 20 to be calibrated to be compared with the measured values of the reference resistors 10 measured through the step of measuring the resistance value of the reference resistor 10 are arranged in series and are connected to the measuring unit 30 Measuring a resistance value of the target resistor 20 (S20);
The measured value of the reference resistor 10 measured through the measuring unit 30 in step S 10 of measuring the resistance value of the reference resistor 10 and measuring the resistance value of the target resistor 20 Comparing the measurement values of the target resistance 20 in the comparison unit 40 (S30);
The comparator 40 compares the measured value of the reference resistor 10 with the measured value of the target resistor 20 and the measured value of the reference resistor 10 and the measured value of the target resistor 20 through the comparison step S30 (S40) of displaying the calculated error value on the display unit (50) and adjusting the resistance value according to the error value of the target resistance (20);
The measured value of the reference resistor 10, the measured value of the target resistor 20, the measured value of the reference resistor 10, and the measured value of the target resistor 20, which are displayed through the step of adjusting the resistance value according to the error value, (S50) of storing the error value in the storage unit 60 and
A step S30 of comparing and comparing the resistance value of the target resistance 20 with a comparison of the target resistance 20 to be calibrated, a step S40 of adjusting the resistance value, And a step (S50) of storing the resistance value of the target resistance (20) in the storage unit (60), so as to repeatedly calibrate the resistance value of the target resistance (20)
The comparison step S30 in the comparison unit 40 compares the measurement value of the reference resistance 10 with the measurement value of the target resistance 20 and compares the measured value of the target resistance 20 with the measurement value of the reference resistance 10, Calculates the error value, transmits the calculated error value to the display unit 50 and displays it,
The step of adjusting the resistance value S40 may include comparing the resistance value of the reference resistor 10 with the resistance value of the target resistor 20 and comparing the resistance value of the target resistor 20 with the resistance value of the reference resistor 10, The resistance value of the target resistor 20 is adjusted to be close to the resistance value of the reference resistor 10,
The measuring unit 30 for measuring the resistance value in the step of measuring the resistance value of the reference resistor 10 and the step of measuring the resistance value of the target resistor 20 may be performed by using a reference resistor The resistance value of the measuring unit 30 can be adjusted by checking whether the measured value of the measuring unit 30 itself is normal or not by using the resistance value of the measuring unit 30, Resistance calibration method using resistance measuring function calibration device.
The resistance value measuring device resistance measuring function correcting device comprises:
A reference resistor (10) having a reference set value;
A pair of target resistors 20 having a resistance value corresponding to the reference resistance 10, gradually increasing and having the same resistance value;
A measuring unit 30 connected to both ends of the reference resistor 10 and the target resistor 20 to measure resistance values of the reference resistor 10 and the target resistor 20;
A comparing unit 40 connected to the measuring unit 30 for comparing the measurement value of the reference resistance 10 measured with the reference resistance 10 and the measured value of the target resistance 20;
A display unit 50 for displaying the measured value of the reference resistance 10 and the measured value of the target resistance 20 compared by the comparator 40,
And a storage unit (60) for storing a measured value of the reference resistance (10) and a measured value of the target resistance (20) displayed on the display unit (50)
The target resistors 20 are formed of a pair, and each resistance value can be measured at both ends of each resistance, and each resistance is increased by a multiple of the reference resistance 10, Changeable,
An error between the reference resistor 10 and the target resistor 20 is displayed through the display unit 50 by comparing the measured resistance value of the reference resistor 10 with the measured resistance value of the target resistor 20, Adjusts the error of the reference resistor (20) so as to be similar to the resistance of the reference resistor (10)
The measurement unit 30 digitizes and displays the measured resistance value and can measure the reference resistance 10 and the target resistance 20 simultaneously or individually,
The target resistor 20, the reference resistor 10, the comparator 40, the display unit 50, and the storage unit 60 may be formed of a single module, Wherein the reference resistor is formed to be replaceable and the measuring unit is separately formed so as to be detachably coupled with the resistor. Resistance calibration method using calibration device.
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KR1020160178906A KR101883199B1 (en) | 2016-12-26 | 2016-12-26 | Binary multiple resistance using the increased resistance and measurement devices and measurement calibration device and resistance using the calibration methods |
PCT/KR2016/015303 WO2018124316A1 (en) | 2016-12-26 | 2016-12-27 | Calibration device for resistance value and measurement device resistance measuring function using binary-multiple resistance increase, and resistance calibration method using same |
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KR1020160178906A KR101883199B1 (en) | 2016-12-26 | 2016-12-26 | Binary multiple resistance using the increased resistance and measurement devices and measurement calibration device and resistance using the calibration methods |
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CN109975737A (en) * | 2019-03-05 | 2019-07-05 | 国网浙江省电力有限公司电力科学研究院 | Direct current calibrating installation based on the high steady power source of measuring resistance method adjustment |
CN116125183B (en) * | 2023-04-20 | 2023-06-30 | 南京先正科技有限公司 | Resistor on-line fault diagnosis method and system based on safe production |
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JP2015509605A (en) * | 2012-03-27 | 2015-03-30 | エルジー・ケム・リミテッド | Insulation resistance measuring device with self-fault diagnostic function and self-fault diagnostic method using the same |
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US6466003B1 (en) * | 1998-06-30 | 2002-10-15 | Fluke Corporation | Microamp measurement for two-terminal digital meter |
KR100862094B1 (en) * | 2006-10-11 | 2008-10-09 | 한국표준과학연구원 | Rate error measurement a method and rate error measurement a equipment for binary scale rate increase |
CN102955070A (en) * | 2011-08-17 | 2013-03-06 | 鸿富锦精密工业(深圳)有限公司 | Resistance measuring circuit |
KR101363453B1 (en) * | 2012-12-27 | 2014-02-17 | 주식회사 루셈 | Apparatus and method for measuring r-on resistance |
EP2966454B1 (en) * | 2014-07-07 | 2017-08-30 | EM Microelectronic-Marin SA | Method for measuring a physical parameter, and electronic circuit for implementing same |
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