KR101702769B1 - Fuction test apparatus for electric part of area denial munition - Google Patents
Fuction test apparatus for electric part of area denial munition Download PDFInfo
- Publication number
- KR101702769B1 KR101702769B1 KR1020150119639A KR20150119639A KR101702769B1 KR 101702769 B1 KR101702769 B1 KR 101702769B1 KR 1020150119639 A KR1020150119639 A KR 1020150119639A KR 20150119639 A KR20150119639 A KR 20150119639A KR 101702769 B1 KR101702769 B1 KR 101702769B1
- Authority
- KR
- South Korea
- Prior art keywords
- electronic
- ammunition
- inspection terminal
- inspection
- function
- Prior art date
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R13/00—Arrangements for displaying electric variables or waveforms
- G01R13/20—Cathode-ray oscilloscopes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Abstract
The inspection terminal of the circuit portion is opened to the outside in a space opened to the outside on the other side of the circuit portion and the electronic mounting portion formed by electrically connecting and connecting a plurality of circuit elements on one surface of the electronic mounting portion and the electronic mounting portion of the plate- An inspection terminal portion positioned; And an ammunition electronic ammunition function inspection device for local defense.
According to the ammunition functional device for area defense ammunition according to the present invention, it is possible to perform the electronic part function inspection before and after the molding in a short-circuited state of the power source, thereby reducing the manufacturing defect rate and improving the production efficiency, have.
Description
The present invention relates to a local defense ammunition electronic functional inspecting apparatus, and more particularly, to a technique for easily inspecting the function of an ammunition electronic unit by installing a circuit capable of performing an electronic functional test even in a short circuit state of a power source.
The interior of the housing of the ammunition for defense includes various electronic components. Among them, + and - (GND) of the power source are short-circuited as a safety factor in the power supply part in the inactive state. In order to prevent damage due to external environment factors of the electronic parts, the inside of the housing is protected by a resin-based molding liquid, and the electronic part is covered with the molding liquid. It is impossible to check the electronic part function because the +, - (GND) of the power source is short-circuited and the electronic parts are covered with the molding liquid.
Conventionally, after the molding process, in order to inspect the function of the electronic part, a separate lead wire is taken out from the electronic part in the housing before the molding process, the short state of the power source is directly cut off to make the open state, There was difficulty such as inspection. In addition, since the power source can not be reused after inspection, a lot of cost and work time were required for the functional inspection.
The present invention relates to a method of inspecting an ammunition electronic part function test for a local defense, and more particularly, to an ammunition electronic ammunition function inspection device for inspecting an electronic part function in a state where a power supply source of a local defense ammunition is short- The purpose is to provide.
According to an aspect of the present invention, there is provided an apparatus for inspecting an ammunition electronic part function of a local defense system, A circuit part electrically connected to a plurality of circuit elements on one surface of the electronic mounting part; And an inspection terminal portion in which an inspection terminal of the circuit portion is opened to the outside, in a space opened to the outside on the other surface of the electronic installation portion; And the inspection terminal portion is electrically connected to the additional power source via positive and negative electrode leads, and the positive electrode and negative electrode leads are connected through a bridge lead to form an electrically short-circuited state.
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At this time, an external power supply unit for electrically opening the battery is additionally provided in a section where the anode lead and the test terminal unit are connected.
At this time, the function of the ammunition electronic part for local defense is realized through the power drawn through the external power supply part, and the function inspection of the inspection terminal part is performed by using the oscilloscope.
At this time, a terminal cap portion of a silicone material is additionally provided in the inspection terminal portion so as to be drawn into the open space, and the terminal cap portion is provided to abut the other surface of the electronic installation portion to prevent the molding liquid from penetrating into the electronic installation portion during the molding process .
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According to the ammunition functional device for area defense ammunition according to the present invention, it is possible to perform the electronic part function inspection before and after the molding in a short-circuited state of the power source, thereby reducing the manufacturing defect rate and improving the production efficiency, have.
FIG. 1 is a view showing a configuration of a local defense ammunition electronic functional unit according to an embodiment of the present invention.
2 is a circuit diagram of an inspection terminal of an ammunition electronic part functional inspecting apparatus for area defense according to an embodiment of the present invention.
3 is a circuit diagram of an inspection terminal of an ammunition electronic part functional inspecting apparatus for area defense according to an embodiment of the present invention.
4 is a view of a terminal plug installed in an inspection terminal of an ammunition electronic part functional inspecting apparatus for area defense according to an embodiment of the present invention.
The present invention will now be described in detail with reference to the accompanying drawings. Hereinafter, a repeated description, a known function that may obscure the gist of the present invention, and a detailed description of the configuration will be omitted. Embodiments of the present invention are provided to more fully describe the present invention to those skilled in the art. Accordingly, the shapes and sizes of the elements in the drawings and the like can be exaggerated for clarity.
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, a local defense ammunition electronic part function test apparatus according to an embodiment of the present invention will be described.
FIG. 1 is a view showing a configuration of a local defense ammunition electronic functional unit according to an embodiment of the present invention.
The apparatus for inspecting an ammunition electronic part function area according to an embodiment of the present invention includes a
1, an empty space (hole) is formed on the other surface of the
2 and 3 are circuit diagrams of an inspection terminal portion of an ammunition electronic part functional inspecting apparatus for area defense according to an embodiment of the present invention.
The
At this time, the
The
As shown in FIG. 2, in the short state, separate power supply is not possible. However, even if + and - (GND) of the power source are shorted in the open state as shown in FIG. 3, Power can be supplied through the
Now, a method of performing a function test by supplying a separate power source through the external
On the other hand, in the
Here, when the power is supplied to the
At this time, one or more test terminals may be connected to a measuring instrument including an oscilloscope in order to check each output signal through each test terminal of the
4 is a view of a terminal plug installed in an inspection terminal of an ammunition electronic part functional inspecting apparatus for area defense according to an embodiment of the present invention.
If the
4, before the molding, a
After the molding process, the
In other words, by introducing a
In addition, since the
As a result, the inventive ammunition electronic ammunition functional testing apparatus proposed by the present invention leads to innovative results that can be performed at any time before and after molding.
According to the present invention, it is possible to reduce the manufacturing defect rate and improve the production efficiency by carrying out the electronic part function test before and after the molding process, and it is possible to induce cost reduction. Also, in case of a power supply short- It is possible to perform the functional test of the product even when the electronic mounting portion is covered with the molding liquid by the molding process.
As described above, an optimal embodiment has been disclosed in the drawings and specification. Although specific terms have been employed herein, they are used for purposes of illustration only and are not intended to limit the scope of the invention as defined in the claims or the claims. Therefore, those skilled in the art will appreciate that various modifications and equivalent embodiments are possible without departing from the scope of the present invention. Accordingly, the true scope of the present invention should be determined by the technical idea of the appended claims.
100: circuit part 110: power source
120: external power supply unit 200: electronic installation unit
300: inspection terminal part 310: terminal cap part
Claims (6)
A circuit part electrically connected to a plurality of circuit elements on one surface of the electronic mounting part; And
An inspection terminal portion in which an inspection terminal of the circuit portion is opened to the outside, in a space opened to the outside on the other surface of the electronic installation portion; Lt; / RTI >
The inspection terminal portion is electrically connected to the additional power source via positive and negative electrode leads,
The anode and cathode conductors are connected through bridge conductors to electrically short circuit states.
And an external power supply unit which forms an electrically opened state is additionally provided in a section where the anode lead and the inspection terminal unit are connected.
An ammunition function inspection device for a local defense ammunition which realizes the function of the ammunition electronic part of the area defense through the power supplied through the external power supply part and performs the function inspection of the inspection terminal part by using the oscilloscope.
The inspection terminal portion is further provided with a terminal cap portion of silicone material to be drawn into the open space,
The terminal cap portion is installed in contact with the other surface of the electronic mounting portion so as to prevent the molding liquid from penetrating into the electronic mounting portion during the molding process.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020150119639A KR101702769B1 (en) | 2015-08-25 | 2015-08-25 | Fuction test apparatus for electric part of area denial munition |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020150119639A KR101702769B1 (en) | 2015-08-25 | 2015-08-25 | Fuction test apparatus for electric part of area denial munition |
Publications (1)
Publication Number | Publication Date |
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KR101702769B1 true KR101702769B1 (en) | 2017-02-03 |
Family
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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KR1020150119639A KR101702769B1 (en) | 2015-08-25 | 2015-08-25 | Fuction test apparatus for electric part of area denial munition |
Country Status (1)
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KR (1) | KR101702769B1 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110857957A (en) * | 2018-08-23 | 2020-03-03 | 深圳光峰科技股份有限公司 | Multifunctional electric resistance strength testing device and electric resistance strength testing method |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3312740B2 (en) * | 1991-10-11 | 2002-08-12 | 旭化成株式会社 | Electric detonator continuity checker |
KR100971668B1 (en) | 2008-03-25 | 2010-07-22 | 주식회사 테크웍스플러스 | The structure connection of cable connector for communication equipment and semiconductor inspection device |
JP4583850B2 (en) * | 2004-09-16 | 2010-11-17 | 富士通セミコンダクター株式会社 | Semiconductor device and manufacturing method thereof |
-
2015
- 2015-08-25 KR KR1020150119639A patent/KR101702769B1/en active Search and Examination
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3312740B2 (en) * | 1991-10-11 | 2002-08-12 | 旭化成株式会社 | Electric detonator continuity checker |
JP4583850B2 (en) * | 2004-09-16 | 2010-11-17 | 富士通セミコンダクター株式会社 | Semiconductor device and manufacturing method thereof |
KR100971668B1 (en) | 2008-03-25 | 2010-07-22 | 주식회사 테크웍스플러스 | The structure connection of cable connector for communication equipment and semiconductor inspection device |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110857957A (en) * | 2018-08-23 | 2020-03-03 | 深圳光峰科技股份有限公司 | Multifunctional electric resistance strength testing device and electric resistance strength testing method |
CN110857957B (en) * | 2018-08-23 | 2021-12-07 | 深圳光峰科技股份有限公司 | Multifunctional electric resistance strength testing device and electric resistance strength testing method |
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