KR101577396B1

KR101577396B1 - Contact Pin for testing electric terminal

Info

Publication number: KR101577396B1
Application number: KR1020150140365A
Authority: KR
Inventors: 장용일
Original assignee: 넥슨전자주식회사
Priority date: 2015-10-06
Filing date: 2015-10-06
Publication date: 2015-12-14
Also published as: WO2017061651A1

Abstract

The present invention relates to a contact pin for testing an electric terminal. The contact pin according to an embodiment of the present invention comprises: an inner body, or a first columnar body; an upper contact terminal, or a second columnar body having an inner surface which wraps the circumferential surface of one end of the inner body; a lower contact terminal, or a third columnar body having an inner surface which surrounds the circumferential surface of the other end of the inner body; a spring member integrally connecting the upper and the lower contact terminals; and one or more connection members integrally connecting the inner surface of the second columnar body and the surface of one end of the inner body.

Description

[0001] The present invention relates to a contact pin for testing electric terminals,

The present invention relates to an electrical terminal test contact pin, and more particularly to an electrical terminal test contact pin for testing an electrical terminal provided on a PCB substrate or the like.

The so-called Pogo Pin, also referred to as the spring pin, is used for testing semiconductor and IT applications. Pogo pins are probes used in testing semiconductor wafers, LCD modules, camera modules, image sensors, and semiconductor packages.

1, a conventional pogo pin includes a spring 14 for applying an elastic force to the upper probe 12, the lower probe 13, the upper probe 12 and the lower probe 13, 12, a lower end of the lower probe 13, and a spring 14.

One end of the upper probe 12 and the lower probe 13 are caught by the cylindrical body 11 and prevented from escaping from the cylindrical body 11 to the outside and between the upper probe 12 and the lower probe 13 And is subjected to an elastic force by a spring 14 installed.

2 is a cross-sectional view showing a plurality of pogo pins housed in one insulative body, illustrating a socket for inspecting a semiconductor package. The semiconductor package inspection socket 20 includes a plurality of pogo pins 6 and an insulating main body 1 that accommodates a plurality of pogo pins at predetermined intervals. The plurality of pogo pins 6 are arranged such that the upper probes 12 protrude from the upper surface of the insulating main body 1 and the lower probes 13 protrude from the bottom surface of the insulating main body 1, (5a) of the test board (5) which is in contact with the lower probe (13) and is spaced apart from the external terminal (3a) of the semiconductor package (3) 1).

The external terminals 3a of the semiconductor package are brought into contact with the upper probe 12 of the pogo pin 6 and the lower probe 13 is brought into contact with the test board 5 when the semiconductor package 3 is pressed to inspect the semiconductor package. The upper probe 12 and the lower probe 13 are resiliently supported by the spring 14 inside the pogo pin 6 so that the semiconductor package 3 and the test board 5 ) Can be electrically connected to accurately inspect the semiconductor package.

Conventional pogo pins are fabricated through an assembling operation in which components are manufactured by cylindrical machining and then assembled. That is, the cylindrical body, the upper probe, the lower probe, and the spring are separately manufactured through a cylindrical process such as a lathe milling machine, and these are assembled with the cylindrical body, the upper probe, the lower probe, Production is completed.

However, due to the nature of cylindrical machining, there are limitations in the production of various types of bodies, upper probes, lower probes, and springs. Also, there is a lot of work to reassemble these parts after each machining.

Korean Patent Publication No. 10-2014-0076134

SUMMARY OF THE INVENTION The present invention provides a contact pin for testing an electrical terminal provided on a PCB substrate. It is also an object of the present invention to provide a contact pin for an integrated electrical terminal test, in which the components are not completed as individual assemblies or standard assemblies.

A contact pin for an electric terminal test according to an embodiment of the present invention includes an inner body that is provided with a contact end and a spring on an outer surface thereof and is capable of supporting the contact end and the spring, May be integrally formed.

The contact pin for testing an electric terminal includes: an inner body as a first column; A second column having an upper contact end with an inner surface of the second column surrounding a peripheral surface of one end of the inner body; A third contact member having an inner surface of the third column surrounding a peripheral surface of the other end of the inner body; A spring member integrally connected between the upper contact stage and the lower contact stage; And at least one connecting member integrally connecting the inner surface of the second column and the surface of the one end of the inner body.

And a contact pin formed by pressing a plate material of a single material into an integral shape.

The inner body, the upper contact end, the lower contact end, the spring member, and the connecting member are integrally formed and made of the same single material.

The single material constituting the electric contact test pin may include a BeCu material.

According to the embodiment of the present invention, various types of contact pins can be manufactured by manufacturing the inner body, the upper contact end, the lower contact end, the connecting member, and the spring member with one integral material. In addition, unlike conventional cylindrical machining, a separate assembly process is not required, which simplifies the manufacturing process.

Further, according to the embodiment of the present invention, it is possible to support through the inner body and have a structure in which an upper contact end, a lower contact end, a connecting member, and a spring member exist in the outer body, have.

1 is a cross-sectional view of a conventional pogo pin.
2 is a sectional view of a socket for testing a semiconductor package using a conventional pogo pin.
3 is a schematic conceptual view illustrating a process of manufacturing a contact pin for testing an electric terminal according to an embodiment of the present invention.
4 is a conceptual diagram showing an example in which an electric terminal test contact pin is manufactured through press working in a plate according to an embodiment of the present invention.
5 is a front perspective view of an electrical terminal test contact pin according to an embodiment of the present invention;
6 is a side perspective view of a contact pin for testing an electrical terminal according to an embodiment of the present invention,
7 is a cross-sectional view taken along the A direction of the upper contact end of the contact pin for electrical terminal testing according to the embodiment of the present invention.
8 is a cross-sectional view taken along the A direction of another contact terminal of another type of contact pin for testing an electric terminal according to the embodiment of the present invention.
9 is a cross-sectional view of the holder portion of the contact pin for electrical terminal testing in the direction B in the embodiment of the present invention.
10 is a perspective view of a contact pin for testing an electric terminal manufactured with different spacings in a spring according to an embodiment of the present invention.
Figure 11 illustrates various types of bottom contact stages in accordance with an embodiment of the present invention.
Figure 12 is a diagram illustrating various spring lengths in accordance with an embodiment of the present invention;
13 is a view showing the positions of various carrier members according to an embodiment of the present invention.

BRIEF DESCRIPTION OF THE DRAWINGS The advantages and features of the present invention, and how to achieve them, will be apparent from the following detailed description of embodiments thereof taken in conjunction with the accompanying drawings. The present invention may, however, be embodied in many different forms and should not be construed as being limited to the exemplary embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete and will fully convey the concept of the invention to those skilled in the art. And the present invention is only defined by the scope of the claims. In the following description, well-known functions or constructions are not described in detail since they would obscure the invention in unnecessary detail. In addition, the present invention is not limited to the embodiments described below but may be embodied in various forms, and the same reference numerals denote the same elements in the drawings.

FIG. 3 is a schematic conceptual view illustrating a process of fabricating an electrical terminal test contact pin according to an embodiment of the present invention. FIG. 4 is a cross- Fig.

The contact pin 10 for testing an electric terminal such as a conventional pogo pin can be manufactured by separately forming the inner body 100, the upper and lower contact ends 300 and the spring member 400 through a primary machining operation such as a lathe milling machine, And there is a need for a secondary operation for assembling it. The inner body 100, the upper and lower contact ends 300, and the spring member 400 can not be manufactured because of the nature of the primary machining operation.

Accordingly, the contact pin 10 for testing an electric terminal of the present invention is provided with a contact end and a spring on an outer surface thereof, and has an inner body that can support the contact end and the spring therein. (Hereinafter referred to as a "plate material") of a single material is pressed so that the contact end, the spring, and the inner body are integrally formed. Various types of contact pins can be manufactured by being manufactured in one piece. In addition, unlike conventional cylindrical machining, a separate assembly process is not required, which simplifies the manufacturing process.

To this end, as shown in Fig. 3, a plate material, which is a flat and circular material, is pressed to manufacture the contact pin 10 for an electric terminal test. Here, press processing refers to a method of cutting and bending a plate material. 4, the inner member to be the inner body 100 and the upper contact end 200, the lower contact end 300, and the spring member 400 After the inner member 100 is formed by rolling the inner member after the outer member to be joined and the connecting member 250 are formed, the outer member is sequentially cut and processed to form the upper contact stage 200, The lower contact stage 300 and the spring member 400 can be manufactured to finally fabricate the contact pin 10 for testing an electric terminal.

Accordingly, the inner body 100, the upper contact stage 200, the lower contact stage 300, the spring member 400, and the connecting member 250, which constitute the final contact pin 10 for testing an electric terminal, And made of the same single material.

When making the inner body 100 in the shape of a cylinder by using the inner member, it is possible to use a variety of shapes such as a shape that is rounded according to the outer diameter, folded or cut in a " C " shape, So that various types of inner bodies 100 can be manufactured. It will also be appreciated that the shapes of the upper contact stage 200 and the lower contact stage 300 may also have various types of contact stages.

Various materials having conductivity may be used as the base material. For example, the base material may be made of beryllium cooper (BeCu) material having conductivity and elasticity. However, various conductive materials may be used, not limited to beryllium cooper (BeCu) materials.

In the following description, a contact pin refers to not only a pogo pin for inspection of a semiconductor wafer, an LCD module, a camera module, an image sensor, and a semiconductor package, but also various connection pins such as various sockets, And may include any electrically conductive pin that may be used in the < Desc / Clms Page number 7 >

In the following description, the inner body 100 is referred to as an inner part, and the upper contact end 200, the lower contact end 300, and the spring member 400 are collectively referred to as an "outter part" .

6 is a side perspective view of a contact pin for testing an electric terminal according to an embodiment of the present invention, and FIG. 7 is a cross-sectional view of the contact pin according to the embodiment of the present invention 8 is a cross-sectional view in the A direction of another type of upper contact end of the contact pin for testing an electric terminal according to the embodiment of the present invention, and Fig. 9 is a cross- Sectional view of a holder portion of an electrical terminal test contact pin according to an embodiment of the present invention in a direction B;

The contact pin for testing an electric terminal of the present invention may include an inner body 100, an upper contact end 200, a lower contact end 300, a spring member 400, and a connecting member 250. The inner body 100 may have a column shape (hereinafter, referred to as a "first column shape"), and the column shape may have a columnar structure having a central through hole or a through hole, .

Since the inner body 100 is manufactured by press working, it can be manufactured in various forms. For example, as shown in FIG. 8 (a), the end face of the columnar body of the inner body 100 may have a branch line shape, or may have a rectangular shape as shown in FIG. 8 (b).

The upper contact terminal 200 is wrapped around the inner surface of one end of the inner body 100 and the lower contact end 300 is wrapped around the other end surface of the inner body 100.

The upper contact stage 200 is a column (hereinafter, referred to as a "second column"), and the inner surface of the second column is surrounded by the peripheral surface of one end of the inner body 100. The upper contact stage 200 is integrally connected to the inner body 100 by the connecting member 250.

The lower contact terminal 300 is a column (hereinafter, referred to as a "third column", and the inner surface of the third column is surrounded by the peripheral surface of the other end of the inner body 100).

Thus, the lower contact stage 300 contacts the electrical terminal of the test object and transmits the signal of the electrical terminal to the test diagnostic device through the upper contact stage 200. [ And can be used in reverse as the case may be.

In the above description, 'wrapped' means that they are in contact with each other, and functions as an energizing path due to contact between the inner surface and the surface. The same applies to the following.

The spring member 400 is a member including a spiral shape integrally connected between the upper contact end 200 and the lower contact end 300.

The spring member 400 includes a spiral upper spring 410 connected to the upper contact stage 200 and a spiral lower spring 430 connected to the lower contact stage 300. The upper spring 410 and the lower spring 430 And a holder member 420 in the form of a cylinder for connecting the holder member 420 and the holder member 420. The spiral shape of the upper spring 410 and the lower spring 430 can be manufactured by press working. And a carrier member 440, which is a protruding member coupled to the holder member 420. The carrier member 440 is a member that allows the holder member 420 to be easily gripped from the outside.

Further, the holder member 420 can be formed in various forms because it is manufactured by press working. For example, as shown in Fig. 9 (a), the end face of the columnar body of the inner body 100 may have a rectangular shape, or may have a cylindrical shape as shown in Fig. 9 (b).

The connecting member 250 is a member manufactured by press working in which the inner surface of the second column and the surface of one end of the inner body 100 are integrally connected. The inner member 100 as an inner member and the outer member (the upper contact end 200, the lower contact end 300, and the spring member 400) can be integrally connected through the connecting member 250. One or more of the connecting members 250 may be provided to connect the inner surface of the second column to the surface of the one end of the inner body 100.

As a result, the inner body 100, the upper contact end 200, the lower contact end 300, the connecting member 250, and the spring member 400 are formed into a single integral material by press working, as described above. The shape of the inner body 100 can be variously formed as shown in FIG. 8, and the shape of the holder member 420 can be variously formed as shown in FIG. In addition, unlike conventional cylindrical machining, a separate assembly process is not required, which simplifies the manufacturing process.

In addition, various types of contact pins 10 for testing electrical terminals can be easily manufactured. The shapes of the springs can be varied, and the intervals in the springs can be made different as shown in FIG.

In addition, as shown in FIG. 11, the structure of the lower contact stage 300 can be variously formed. In the conventional cylindrical machining, it is difficult to process the linear lower contact stage 300. However, the structure of the lower contact stage 300 can be formed in various shapes through press working as in the present invention.

As shown in FIG. 12, the length of the spring can be varied, and can be made longer or shorter than the spring length of FIG. 12 (a) described in the embodiment of the present invention. For example, as shown in Fig. 12 (b), the length of the spring can be made longer.

13 (b) and 3 (c), at the position of the carrier member 440 shown in Fig. 13 (a) described in the embodiment of the present invention, it is possible to manufacture the carrier member 440 at various positions. The carrier 300 can be omitted and the carrier member 440 can be positioned at another position.

The embodiments of the present invention described above are selected and presented in order to facilitate the understanding of those skilled in the art from a variety of possible examples. The technical idea of the present invention is not necessarily limited to or limited to these embodiments Various changes, modifications, and other equivalent embodiments are possible without departing from the spirit of the present invention.

100: inner body
200: upper contact stage
250:
300:
400: spring member

Claims

A contact pin, a spring, and an internal body capable of supporting the contact and the spring, wherein the contact pin, the spring, and the internal body are integrally formed,
Wherein the electrical contact test pin comprises:
A first column inner body;
A second column having an upper contact end with an inner surface of the second column surrounding a peripheral surface of one end of the inner body;
A third contact member having an inner surface of the third column surrounding a peripheral surface of the other end of the inner body;
A spring member integrally connected between the upper contact stage and the lower contact stage; And
At least one connecting member integrally connecting the inner surface of the second column and the surface of the one end of the inner body;
And a contact pin for testing the electrical terminal.

delete

The method according to claim 1,
Wherein the contact pin is formed as a single piece by press-working a plate material, which is a flat single-material plate.

The method of claim 3,
Wherein the inner body, the upper contact end, the lower contact end, the spring member, and the connecting member are integrally formed and made of the same single material.

The method of claim 4,
Wherein the single material constituting the electric contact test contact pin includes a BeCu material.