KR101400390B1 - Photoresist composition and method for manufacturing of organic light emitting display device using the same - Google Patents

Photoresist composition and method for manufacturing of organic light emitting display device using the same Download PDF

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KR101400390B1
KR101400390B1 KR1020130014193A KR20130014193A KR101400390B1 KR 101400390 B1 KR101400390 B1 KR 101400390B1 KR 1020130014193 A KR1020130014193 A KR 1020130014193A KR 20130014193 A KR20130014193 A KR 20130014193A KR 101400390 B1 KR101400390 B1 KR 101400390B1
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photoresist composition
light emitting
organic light
photoacid generator
added
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KR1020130014193A
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Korean (ko)
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황도훈
김영미
윤종근
허준영
도의두
이연경
이창희
이진균
임종민
김지훈
정병준
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엘지디스플레이 주식회사
인하대학교 산학협력단
부산대학교 산학협력단
서울시립대학교 산학협력단
서울대학교산학협력단
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    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/0045Photosensitive materials with organic non-macromolecular light-sensitive compounds not otherwise provided for, e.g. dissolution inhibitors
    • CCHEMISTRY; METALLURGY
    • C07ORGANIC CHEMISTRY
    • C07DHETEROCYCLIC COMPOUNDS
    • C07D221/00Heterocyclic compounds containing six-membered rings having one nitrogen atom as the only ring hetero atom, not provided for by groups C07D211/00 - C07D219/00
    • C07D221/02Heterocyclic compounds containing six-membered rings having one nitrogen atom as the only ring hetero atom, not provided for by groups C07D211/00 - C07D219/00 condensed with carbocyclic rings or ring systems
    • C07D221/04Ortho- or peri-condensed ring systems
    • C07D221/06Ring systems of three rings
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/0046Photosensitive materials with perfluoro compounds, e.g. for dry lithography
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/20Exposure; Apparatus therefor
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/20Exposure; Apparatus therefor
    • G03F7/2002Exposure; Apparatus therefor with visible light or UV light, through an original having an opaque pattern on a transparent support, e.g. film printing, projection printing; by reflection of visible or UV light from an original such as a printed image
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K50/00Organic light-emitting devices

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  • Optics & Photonics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Electroluminescent Light Sources (AREA)

Abstract

A photoresist composition according to an embodiment of the present invention comprises a new photoacid generator (PAG); and a perfluoro decyl methacrylate (FDMA) and 2- methyl adamantyl methacrylate (MAMA) copolymer. Accordingly, by introducing the photoresist composition containing the photoacid generator which is selectively dissolved in a perfluorinated solvent, the bad effect from a hydrophilic or hydrophobic solvent can be reduced. Moreover, the photoacid generator shows the lower acidity than the existing ion photoacid generator because of the non-ionic properties (non-ionic PAG) and therefore the acidity of the organic luminous material can be reduced.

Description

포토레지스트 조성물 및 이를 이용한 유기전계발광표시장치의 제조방법 {Photoresist Composition and Method for Manufacturing of Organic Light Emitting Display Device using the same}BACKGROUND OF THE INVENTION 1. Field of the Invention [0001] The present invention relates to a photoresist composition and an organic electroluminescent display device using the same,

본 발명은 포토레지스트 조성물 및 이를 이용한 유기전계발광표시장치의 제조방법에 관한 것으로, 보다 구체적으로는 신규의 광산발생제를 포함하는 포토레지스트 조성물 및 이를 이용한 유기전계발광표시장치의 제조방법에 관한 것이다.
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a photoresist composition and a method of manufacturing an organic electroluminescence display using the same, and more particularly, to a photoresist composition containing a novel photo- .

새로운 평판표시장치 중 하나인 유기전계발광표시장치는 자체발광형으로서, 액정표시장치(LCD)에 비해 시야각, 대조비 등이 우수하며, 별도의 백라이트가 필요하지 않아 경량 박형이 가능하며, 소비전력 측면에서도 유리하다. 또한, 직류저전압 구동이 가능하고, 응답속도가 빠르며, 특히 제조비용 측면에서도 저렴한 장점이 있다. The organic light emitting display, which is one of the new flat panel display devices, is a self-luminous type and has a better viewing angle and contrast ratio than a liquid crystal display (LCD), and can be lightweight and thin because of no need for a separate backlight. . In addition, it is possible to drive the DC low voltage, has a high response speed, and is especially advantageous in terms of manufacturing cost.

유기전계발광표시장치는 전자주입 전극(cathode)과 정공주입 전극(anode)으로부터 각각 전자와 정공을 발광층 내부로 주입시켜, 주입된 전자와 정공이 결합한 엑시톤(exciton)이 여기 상태로부터 기저상태로 떨어질 때 발광하는 유기전계발광소자를 포함한다. 이때, 유기전계발광표시장치는 빛이 방출되는 방향에 따라 상부발광(Top Emission), 하부발광(Bottom Emission) 및 양면발광(Dual Emission) 방식 등이 있으며, 구동방식에 따라 수동매트릭스형(Passive Matrix)과 능동매트릭스형(Active Matrix) 등으로 구분할 수 있다.An organic electroluminescent display device has a structure in which electrons and holes are injected into the light emitting layer from an electron injection electrode (cathode) and a hole injection electrode (anode), respectively, and excitons, And an organic electroluminescent device which emits light when it emits light. In this case, the organic light emitting display device includes a top emission, a bottom emission, and a dual emission according to a direction in which light is emitted. In accordance with a driving method, a passive matrix ) And active matrix (Active Matrix).

이에 따라, 유기전계발광표시장치는 매트릭스 형태로 배치된 다수의 서브 픽셀에 스캔 신호, 데이터 신호 및 전원 등이 공급되면, 선택된 서브 픽셀이 발광을 하게 됨으로써 영상을 표시할 수 있다. 이때, 서브 픽셀은 스위칭 박막트랜지스터, 구동 박막트랜지스터 및 커패시터를 포함하는 박막트랜지스터(TFT)와, 박막트랜지스터에 포함된 구동 트랜지스터에 연결된 제 1 전극, 발광층 및 제 2 전극을 포함한다. Accordingly, when a scan signal, a data signal, a power supply, and the like are supplied to a plurality of subpixels arranged in a matrix form, the organic light emitting display device can display an image by causing the selected subpixel to emit light. At this time, the sub-pixel includes a thin film transistor (TFT) including a switching thin film transistor, a driving thin film transistor and a capacitor, and a first electrode connected to the driving transistor included in the thin film transistor, a light emitting layer and a second electrode.

상기 유기전계발광표시장치는 기판 상에 위치하는 제 1 전극 및 제 2 전극 사이에 발광층(EML)을 패터닝 하기 위해 파인메탈 마스크(FMM) 방법, 잉크분사 방법, 레이져 패터닝 방법 등을 이용하였다. 이러한 방법은 대면적 상에서 고해상도를 구현할 수 있는 유기전계발광표시장치를 제조할 수는 있으나, 공정 상의 비용 및 수율 측면에서 효과적이지 못한 단점이 있다. 이에 따라, 효율성 측면을 고려하면서도 고해상도, 대면적화를 구현할 수 있는 포토리소그래피(Photolithography) 공정을 도입하게 되었다. The organic light emitting display uses a fine metal mask (FMM) method, an ink jetting method, a laser patterning method, or the like to pattern an emission layer (EML) between a first electrode and a second electrode on a substrate. Although this method can manufacture an organic light emitting display capable of realizing a high resolution over a large area, it has a disadvantage in terms of cost and yield in terms of process. Accordingly, a photolithography process capable of realizing a high resolution and a large area has been introduced while considering efficiency.

상기 포토리소그래피 공정은 감광 물질을 사용하게 되는데, 포토레지스트 (Photoresist) 및 광산발생제(PAG)에 의한 발광층의 손상을 최소화하는 것이 중요하다. The photolithography process uses a photosensitive material, and it is important to minimize the damage of the light emitting layer by the photoresist and the photoacid generator (PAG).

따라서, 유기전계발광표시장치의 소자 성능에 영향을 최소화할 수 있는 다양한 재료의 개발이 요구되고 있는 실정이다.
Accordingly, there is a need to develop various materials that can minimize the influence on the device performance of an organic light emitting display device.

본 발명은 상술한 문제점을 해결하기 위한 것으로서, 발광층의 손상을 최소화할 수 있는 광산발생제와, 이를 포함하는 포토레지스트 조성물, 및 이를 이용한 유기전계발광표시장치의 제조방법을 제공하는 것을 그 기술적 과제로 한다.
Disclosure of Invention Technical Problem [8] Accordingly, the present invention has been made keeping in mind the above problems occurring in the prior art, and it is an object of the present invention to provide a photo acid generator capable of minimizing damage to a light emitting layer, a photoresist composition containing the same, and a method of manufacturing an organic light emitting display using the same. .

상술한 목적을 달성하기 위한 본 발명의 일 측면에 따른 광산발생제는, 하기 화학식 1 내지 4 중 어느 하나로 표시되는 광산발생제(Photo-Acid Generator, PAG)를 포함한다.The photoacid generator according to one aspect of the present invention includes a photo-acid generator (PAG) represented by any one of the following formulas (1) to (4).

또한, 상술한 목적을 달성하기 위한 본 발명의 다른 측면에 따른 포토레지스트 조성물은 하기 화학식 1 내지 4 중 어느 하나로 표시되는 광산발생제(photoacid generator, PAG); 및 퍼플루오로데실 메타크릴레이트(FDMA) 및 2-메틸아다맨틸 메타크릴레이트(MAMA) 공중합체를 포함한다.According to another aspect of the present invention, there is provided a photoresist composition comprising: a photoacid generator (PAG) represented by any one of Chemical Formulas 1 to 4; And perfluorodecyl methacrylate (FDMA) and 2-methyladamantyl methacrylate (MAMA) copolymers.

[화학식 1][Chemical Formula 1]

Figure 112013011839347-pat00001
Figure 112013011839347-pat00001

[화학식 2](2)

Figure 112013011839347-pat00002
Figure 112013011839347-pat00002

[화학식 3](3)

Figure 112013011839347-pat00003
Figure 112013011839347-pat00003

[화학식 4][Chemical Formula 4]

Figure 112013011839347-pat00004
Figure 112013011839347-pat00004

또한, 상술한 목적을 달성하기 위한 본 발명의 또 다른 측면에 따른 유기전계발광표시장치의 제조방법은 기판 상에 제 1 전극을 형성하는 단계; 상기 제 1 전극 상에 본 발명의 일 실시예에 따른 포토레지스트 조성물을 형성하는 단계; 마스크 패턴을 통해 자외선(UV)을 조사하여 상기 포토레지스트 조성물을 패터닝하는 단계; 상기 패터닝된 포토레지스트 조성물 상에 유기발광층을 형성하는 단계; 및 상기 패터닝된 포토레지스트 조성물과, 이의 상부에 접촉된 상기 유기발광층을 제거하는 단계를 포함한다.
According to another aspect of the present invention, there is provided a method of fabricating an organic light emitting display, including: forming a first electrode on a substrate; Forming a photoresist composition according to an embodiment of the present invention on the first electrode; Patterning the photoresist composition by irradiating ultraviolet rays (UV) through a mask pattern; Forming an organic light emitting layer on the patterned photoresist composition; And removing the patterned photoresist composition and the organic light emitting layer in contact with the top of the patterned photoresist composition.

본 발명에 따르면, 과불소화 용매에 선택적으로 용해시킬 수 있는 광산발생제가 포함된 포토레지스트 조성물을 도입함으로써 친수성 또는 소수성 용매가 주는 악영향을 줄일 수 있다.According to the present invention, by introducing a photoresist composition containing a photoacid generator capable of selectively dissolving in a perfluorinated solvent, adverse effects caused by hydrophilic or hydrophobic solvents can be reduced.

또한, 본 발명의 일 실시예에 따른 광산발생제의 긴 흡수 파장대로 인하여 포토리소그레피 공정 시 발생될 수 있는 소자의 손상을 개선할 수 있다.In addition, due to the long absorption wavelength band of the photoacid generator according to an embodiment of the present invention, damage to the device which may occur during the photolithography process can be improved.

또한, 본 발명의 일 실시예에 따른 광산발생제는 비이온성(Non-ionic PAG)의특징을 가지므로, 기존의 이온성 광산발생제보다 약한 산성도를 나타내게 되며, 결과적으로 유기 발광재료의 산성도를 줄일 수 있다.In addition, since the photoacid generator according to an embodiment of the present invention has a non-ionic PAG characteristic, it exhibits weaker acidity than conventional ionic photoacid generators. As a result, Can be reduced.

따라서, 본 발명은 불소화도를 높일 수 있는 포토레지스트 조성물을 통해 고효율, 고해상도 및 대면적화가 가능한 유기전계발광표시장치를 제공할 수 있다.
Accordingly, the present invention can provide an organic electroluminescent display device capable of achieving high efficiency, high resolution, and large area through a photoresist composition capable of increasing the degree of fluorination.

도 1 내지 도 5는 본 발명의 일 실시예에 따른 유기전계발광표시장치를 제조하는 과정을 도시한 단면도들; 및
도 6 및 도 7은 패터닝된 포토레지스트 조성물 및 패터닝된 유기발광층을 도시한 단면.
1 to 5 are cross-sectional views illustrating a process of manufacturing an organic light emitting display according to an exemplary embodiment of the present invention; And
Figures 6 and 7 are cross-sections illustrating a patterned photoresist composition and a patterned organic light emitting layer.

하기 첨부되는 도면들을 참고하여 본 발명의 실시예들에 대해 상세히 설명하고자 한다. 명세서 전체에 걸쳐서 동일한 참조 번호들은 실질적으로 동일한 구성 요소들을 의미한다. 이하의 설명에서, 본 발명과 관련된 공지된 내용 혹은 구성에 대한 구체적인 설명이 본 발명의 요지를 불필요하게 흐릴 수 있다고 판단되는 경우, 그 상세한 설명을 생략한다.Embodiments of the present invention will now be described in detail with reference to the accompanying drawings. Like reference numerals throughout the specification denote substantially identical components. In the following description, well-known functions or constructions are not described in detail to avoid unnecessarily obscuring the subject matter of the present invention.

본 발명의 일 실시예에 따른 포토레지스트 조성물은 퍼플루오로데실 메타크릴레이트(FDMA) 및 2-메틸아다맨틸 메타크릴레이트(MAMA) 공중합체와, 광산발생제(photoacid generator, PAG)를 포함한다.
The photoresist composition according to an embodiment of the present invention includes perfluorodecyl methacrylate (FDMA) and 2-methyladamantyl methacrylate (MAMA) copolymer and a photoacid generator (PAG) .

일 실시예에 있어서, 광산발생제(PAG, Photo-acid generator)는 하기 화학식 1 내지 4 중 어느 하나로 표시될 수 있다.In one embodiment, the photo-acid generator (PAG) may be represented by any one of the following formulas (1) to (4).

화학식 1의 광산발생제 (FMSFDD-NI)는 하기와 같이 표시될 수 있다. The photoacid generator (FMSFDD-NI) of the formula (1) can be represented as follows.

[화학식 1][Chemical Formula 1]

Figure 112013011839347-pat00005
Figure 112013011839347-pat00005

화학식 2의 광산발생제 (FBSFDD-NI)는 하기와 같이 표시될 수 있다.The photoacid generator (FBSFDD-NI) of formula (2) can be represented as follows.

[화학식 2](2)

Figure 112013011839347-pat00006
Figure 112013011839347-pat00006

화학식 3의 광산발생제 (FMSBFDD-BI)는 하기와 같이 표시될 수 있다.The photoacid generator (FMSBFDD-BI) of formula (3) can be represented as follows.

[화학식 3](3)

Figure 112013011839347-pat00007
Figure 112013011839347-pat00007

화학식 4의 광산발생제 (FBSBFDD-BI)는 하기와 같이 표시될 수 있다. The photoacid generator (FBSBFDD-BI) of formula (4) can be represented as follows.

[화학식 4][Chemical Formula 4]

Figure 112013011839347-pat00008
Figure 112013011839347-pat00008

상기와 같이, 화학식 1 및 2로 표시되는 광산발생제는 365 nm에서 흡수되는 것이 특징이며, 과불소화 알킬 사슬을 도입하여 불소계 용매에 높은 용해도를 가진다. 또한, 화학식 3 및 4로 표시되는 광산발생제는 254 nm에서 흡수되는 것이 특징이며, 과불소화 알킬 사슬을 도입함으로써 불소계 용매에 높은 용해도를 가진다.As described above, the photoacid generators represented by formulas (1) and (2) are characterized by being absorbed at 365 nm, and have high solubility in fluorinated solvents by introducing perfluorinated alkyl chains. The photoacid generators represented by formulas (3) and (4) are characterized by being absorbed at 254 nm, and have high solubility in the fluorinated solvent by introducing the perfluorinated alkyl chain.

또한, 본 발명의 일 실시예에 따른 광산발생제의 긴 흡수 파장대로 인하여 포토리소그레피 공정 시 발생될 수 있는 소자의 손상을 방지할 수 있다.In addition, due to the long absorption wavelength band of the photoacid generator according to the embodiment of the present invention, it is possible to prevent damage to the device that may occur during the photolithography process.

또한, 비이온성(Non-ionic PAG)의 특징을 가지므로, 기존의 이온성 광산발생제보다 약한 산성도를 나타내게 되며, 결과적으로 유기 발광재료의 산성도를 줄일 수 있다.
In addition, since it has a non-ionic PAG characteristic, it exhibits weaker acidity than conventional ionic photoacid generators, and as a result, the acidity of the organic light emitting material can be reduced.

일 실시예에 있어서, 퍼플루오로데실 메타크릴레이트(FDMA) 및 2-메틸아다맨틸 메타크릴레이트(MAMA) 공중합체는 하기 화학식 5로 표시될 수 있다.In one embodiment, perfluorodecyl methacrylate (FDMA) and 2-methyladamantyl methacrylate (MAMA) copolymers may be represented by the following formula (5).

[화학식 5][Chemical Formula 5]

Figure 112013011839347-pat00009
Figure 112013011839347-pat00009

이때, 상기 화학식 5로 표시되는 공중합체는 x : y = 0.1 ~ 1 : 4의 비율을 가질 수 있으며, 바람직하게는 x : y = 0.75 : 4 를 만족할 수 있다.At this time, the copolymer represented by the formula (5) may have a ratio of x: y = 0.1 to 1: 4, preferably x: y = 0.75: 4.

상기와 같이, 화학식 5로 표시되는 공중합체는 불소계 용매에 잘 용해되는 성질을 가진다. 이때, 불소계 용매와 광산발생제는 서로 상호작용이 적절해야만 패터닝 공정을 효율적으로 진행할 수 있다.
As described above, the copolymer represented by the general formula (5) has a property of being dissolved well in a fluorine-based solvent. At this time, the fluorinating solvent and the photoacid generator can efficiently perform the patterning process only when the mutual action is appropriate.

따라서, 본 발명에서는 비온성의 광산발생제(PAG)와, 공중합체를 포함하는 포토레지스트 조성물을 통하여 불소계 용매에 대한 높은 용해도를 가질 수 있으며, 산성도를 줄일 수 있어 유기발광층의 손상을 방지할 수 있다.
Accordingly, in the present invention, it is possible to have a high solubility in a fluorine-based solvent through a photoresist composition containing an amphoteric photoacid generator (PAG) and a copolymer, reduce the acidity and prevent damage to the organic luminescent layer .

이하, 본 발명의 일 실시예에 따른 광산발생제(PAG)의 합성예 및 포토레지스트 조성물의 제조예에 관하여 하기에 자세히 설명하기로 한다. 다만, 하기의 합성예 및 제조예는 본 발명을 예시하는 것일 뿐 본 발명은 하기에 제한되지 아니한다.
Hereinafter, a synthesis example of a photoacid generator (PAG) and a production example of a photoresist composition according to an embodiment of the present invention will be described in detail. However, the following Synthesis Examples and Preparation Examples are illustrative of the present invention, but the present invention is not limited thereto.

합성예Synthetic example

1) 나프탈이미드 계열 광산발생제(Naphthalimide PAG)의 제조1) Preparation of naphthalimide-based photoacid generator (Naphthalimide PAG)

<물질 I>&Lt; Substance I &

Figure 112013011839347-pat00010
Figure 112013011839347-pat00010

가지달린 둥근 플라스크에 3-hydroxy-1,8-naphthalic anhydride (0.26g, 1.2 mmol)을 넣고, N,N-dimethylformamide(DMF) (3ml)에 녹인다. 이후 sodium hydride (0.06g, 2.5 mmol)을 소량의 DMF에 넣고, 100℃에서 20분간 교반하였다.3-hydroxy-1,8-naphthalic anhydride (0.26 g, 1.2 mmol) is added to a round flask equipped with a stirrer, and dissolved in N, N-dimethylformamide (DMF) (3 ml). Then sodium hydride (0.06 g, 2.5 mmol) was added to a small amount of DMF and stirred at 100 ° C for 20 minutes.

또한, 1,1,1,2,2,3,3,4,4,5,5,6,6,7,7,8,8-heptadecafluoro-12-iodododecane (1.1g, 1.8 mmol)을 소량의 DMF에 녹여 천천히 첨가한 후 5시간 교반하였다.Further, 1,1,1,2,2,3,3,4,4,5,5,6,6,7,7,8,8-heptadecafluoro-12-iodododecane (1.1 g, 1.8 mmol) Of DMF, and the mixture was stirred for 5 hours.

이어서, 상온에서 온도를 식힌 후 아세트산(Acetic acid)와 물을 1:5 의 부피비로 섞어 천천히 첨가하여 반응을 종료시켰다.Then, the mixture was cooled at room temperature, and then acetic acid and water were mixed at a volume ratio of 1: 5 and slowly added to terminate the reaction.

마지막으로, 침전을 감압 여과시킨 후 물과 메탄올로 여러 번 씻어내어 건조시킴으로써 물질 I를 수득하였다.Finally, the precipitate was filtered off under reduced pressure, washed several times with water and methanol and dried to give material I.

<물질 II><Substance II>

Figure 112013011839347-pat00011
Figure 112013011839347-pat00011

가지달린 둥근 플라스크에 물질 I (1.2g, 1.7 mmol)과 hydroxyamine hydrochloride (0.18g, 2.6 mmol)을 넣은 후, pyridine을 5 ml 첨가하여 100℃에서 20분간 교반하였다.Substance I (1.2 g, 1.7 mmol) and hydroxyamine hydrochloride (0.18 g, 2.6 mmol) were added to a round flask equipped with a stirrer, then 5 ml of pyridine was added and the mixture was stirred at 100 ° C for 20 minutes.

이어서, 상온에서 온도를 식힌 후 2 M HCl 수용액을 50 ml 첨가하여 반응을 종료 시켰다.Subsequently, the reaction solution was cooled at room temperature, and 50 ml of a 2 M HCl aqueous solution was added to terminate the reaction.

마지막으로, 여과하여 남아있는 고체를 chloroform 을 녹인 후 과량의 메탄올을 첨가하여 재침전시킴으로써 진한 노란색의 물질 II를 수득하였다.Finally, the remaining solid was dissolved in chloroform and then re-precipitated by addition of excess methanol to give a dark yellow substance II.

<FMSFDD-NI><FMSFDD-NI>

Figure 112013011839347-pat00012
Figure 112013011839347-pat00012

가지달린 둥근 플라스크에 물질 II (0.5g, 0.7 mmol)을 Trifluorotoluene (7.5 ml)을 넣고, 완전히 용해시킨 후 온도를 100℃ 까지 가열하였다.Trifluorotoluene (7.5 ml) was added to a round-bottomed flask equipped with a stirrer, a thermometer and a reflux condenser, and the mixture was heated to 100 ° C.

이어서, Trifluoromethane sulfonic anhydride (0.12 ml, 0.7 mmol)을 넣고, 한시간 동안 교반하였다. 이후, 상온에서 온도를 식힌 후 chloroform (17.5 ml)을 첨가하고, sodium carbonate 수용액 (15 w/v%, 35 ml)을 첨가한 다음 20분 정도 빠르게 교반하였다.Then, trifluoromethane sulfonic anhydride (0.12 ml, 0.7 mmol) was added thereto, followed by stirring for one hour. After cooling at room temperature, chloroform (17.5 ml) was added, sodium carbonate aqueous solution (15 w / v%, 35 ml) was added, and stirred rapidly for 20 minutes.

마지막으로, chloroform (50 ml)과 증류수 (50 ml)를 첨가하여 추출한 후 남은 고체에 methylene chloride를 소량 첨가하고, 재결정하여 최종적으로 FMSFDD-NI 를 수득하였다.Finally, chloroform (50 ml) and distilled water (50 ml) were added to extract, and a small amount of methylene chloride was added to the remaining solid. After recrystallization, FMSFDD-NI was finally obtained.

<FBSFDD-NI><FBSFDD-NI>

Figure 112013011839347-pat00013

Figure 112013011839347-pat00013

가지달린 둥근 플라스크에 물질 II (0.5g, 0.7 mmol)을 Trifluorotoluene (7.5 ml)을 넣고, 완전히 용해시킨 후 온도를 100℃ 까지 가열하였다.Trifluorotoluene (7.5 ml) was added to a round-bottomed flask equipped with a stirrer, a thermometer and a reflux condenser, and the mixture was heated to 100 ° C.

이어서, Nonafluorobutane sulfonic anhydride (0.25 ml, 0.7 mmol)을 넣고, 한시간 동안 교반한 다음, 상온에서 온도를 식힌 후 chloroform (17.5 ml)을 첨가하고, sodium carbonate 수용액 (15 w/v%, 35 ml)을 첨가하여 20분 정도 빠르게 교반하였다.Then, nonafluorobutane sulfonic anhydride (0.25 ml, 0.7 mmol) was added and stirred for 1 hour. After cooling at room temperature, chloroform (17.5 ml) was added and aqueous sodium carbonate solution (15 w / v%, 35 ml) And the mixture was rapidly stirred for about 20 minutes.

마지막으로, chloroform (50 ml)과 증류수 (50 ml)를 첨가하여 추출한 후 남은 고체에 methylene chloride를 소량 첨가하고, 재결정하여 최종적으로 FBSFDD-NI 를 수득하였다.
Finally, chloroform (50 ml) and distilled water (50 ml) were added to extract, and a small amount of methylene chloride was added to the remaining solid, and finally FBSFDD-NI was obtained by recrystallization.

2) 벤조페논아민 계열 광산발생제 (Benzophenonimine PAG) 의 제조2) Preparation of Benzophenonimine PAG (Benzophenonimine PAG)

<물질 I>&Lt; Substance I &

Figure 112013011839347-pat00014
Figure 112013011839347-pat00014

가지달린 둥근 플라스크에 bis(4-hydroxyphenyl) methanone (0.4g, 1.9 mmol)을 넣고, N,N-dimethylformamide(DMF) (3ml)에 녹인 다음 sodium hydride (0.11 g, 4.4 mmol)을 소량의 DMF에 넣고, 100℃에서 20분간 교반하였다.Sodium hydride (0.11 g, 4.4 mmol) was dissolved in a small amount of DMF and the resulting mixture was stirred at room temperature for 1 hour. And the mixture was stirred at 100 ° C for 20 minutes.

다음, 1,1,1,2,2,3,3,4,4,5,5,6,6,7,7,8,8-heptadecafluoro-12-iodododecane (2.5g, 4.1 mmol)을 소량의 DMF에 녹여 천천히 첨가한 후 5시간 교반하였다. Then, 1,1,1,2,2,3,3,4,4,5,5,6,6,7,7,8,8-heptadecafluoro-12-iodododecane (2.5 g, 4.1 mmol) was added in small portions Of DMF, and the mixture was stirred for 5 hours.

이어서, 상온에서 온도를 식힌 후 아세트산(Acetic acid)와 물을 1:5 의 부피비로 섞어 천천히 첨가하여 반응을 종료시켰다.Then, the mixture was cooled at room temperature, and then acetic acid and water were mixed at a volume ratio of 1: 5 and slowly added to terminate the reaction.

마지막으로, 침전을 감압 여과시킨 후 물과 메탄올로 여러 번 씻어내어 건조시킴으로써 물질 I를 수득하였다.Finally, the precipitate was filtered off under reduced pressure, washed several times with water and methanol and dried to give material I.

<물질 II><Substance II>

Figure 112013011839347-pat00015
Figure 112013011839347-pat00015

가지달린 둥근 플라스크에 물질 I (0.7g, 0.6 mmol)과 hydroxyamine hydrochloride (0.06 g, 0.9 mmol)을 넣은 후, pyridine을 3 ml 첨가하여 100℃에서 3시간 교반하였다.Subsequently, substance I (0.7 g, 0.6 mmol) and hydroxyamine hydrochloride (0.06 g, 0.9 mmol) were added to a round flask equipped with a stirrer, and then pyridine was added thereto and stirred at 100 ° C for 3 hours.

이어서, 상온에서 온도를 식힌 후 2 M HCl 수용액을 25 ml 첨가하여 반응을 종료 시켰다.Then, the reaction solution was cooled at room temperature, and 25 ml of 2 M HCl aqueous solution was added to terminate the reaction.

마지막으로, 여과하여 남아있는 고체를 chloroform 을 녹인 후 과량의 메탄올을 첨가하여 재침전시킴으로써 진한 노란색의 물질 II를 수득하였다.Finally, the remaining solid was dissolved in chloroform and then re-precipitated by addition of excess methanol to give a dark yellow substance II.

<FMSBFDD-BI><FMSBFDD-BI>

Figure 112013011839347-pat00016
Figure 112013011839347-pat00016

가지달린 둥근 플라스크에 물질 II (0.4g, 0.3 mmol)을 Trifluorotoluene (6 ml)을 넣고, 완전히 용해시킨 후 온도를 100℃ 까지 가열하였다.Trifluorotoluene (6 ml) was added to a round flask with a mass of material II (0.4 g, 0.3 mmol) and completely dissolved, followed by heating to 100 ° C.

이어서, Trifluoromethane sulfonic anhydride (0.15 ml, 0.4 mmol)을 넣고, 한시간 동안 교반하였다. 이후, 상온에서 온도를 식힌 후 chloroform (15 ml)을 첨가하고, sodium carbonate 수용액 (15 w/v%, 20 ml)을 첨가한 다음 20분 정도 빠르게 교반하였다.Trifluoromethane sulfonic anhydride (0.15 ml, 0.4 mmol) was then added and stirred for one hour. After cooling at room temperature, chloroform (15 ml) was added, aqueous sodium carbonate solution (15 w / v%, 20 ml) was added, and then stirred rapidly for 20 minutes.

마지막으로, chloroform (50 ml)과 증류수 (50 ml)를 첨가하여 추출한 후 남은 고체에 methylene chloride를 소량 첨가하고, 재결정하여 최종적으로 FMSBFDD-BI 를 수득하였다.Finally, chloroform (50 ml) and distilled water (50 ml) were added to extract the residue, and a small amount of methylene chloride was added to the remaining solid. After recrystallization, FMSBFDD-BI was finally obtained.

<FBSBFDD-BI><FBSBFDD-BI>

Figure 112013011839347-pat00017
Figure 112013011839347-pat00017

가지달린 둥근 플라스크에 물질 II (0.4g, 0.3 mmol)을 Trifluorotoluene (6 ml)을 넣고, 완전히 용해시킨 후 온도를 100℃ 까지 가열하였다.Trifluorotoluene (6 ml) was added to a round flask with a mass of material II (0.4 g, 0.3 mmol) and completely dissolved, followed by heating to 100 ° C.

이어서, Nonafluorobutane sulfonic anhydride (0.07 ml, 0.4 mmol)을 넣고, 한시간 동안 교반하였다. 이후, 상온에서 온도를 식힌 후 chloroform (15 ml)을 첨가하고, sodium carbonate 수용액 (15 w/v%, 20 ml)을 첨가한 다음 20분 정도 빠르게 교반하였다.Then, nonafluorobutane sulfonic anhydride (0.07 ml, 0.4 mmol) was added thereto, followed by stirring for one hour. After cooling at room temperature, chloroform (15 ml) was added, aqueous sodium carbonate solution (15 w / v%, 20 ml) was added, and then stirred rapidly for 20 minutes.

마지막으로, chloroform (50 ml)과 증류수 (50 ml)를 첨가하여 추출한 후 남은 고체에 methylene chloride를 소량 첨가하고, 재결정하여 최종적으로 FBSBFDD-NI 를 수득하였다.
Finally, chloroform (50 ml) and distilled water (50 ml) were added to extract, and a small amount of methylene chloride was added to the remaining solid, and finally FBSBFDD-NI was obtained by recrystallization.

제조예Manufacturing example

<포토레지스트 조성물> & Lt; Photoresist composition & gt ;

퍼플루오로데실 메타크릴레이트(FDMA) : 2-메틸아다맨틸 메타크릴레이트(MAMA) = 4 : 0.75를 만족하는 본 발명의 일 실시예에 따른 공중합체 0.25 g에 본 발명의 일 실시예에 따른 광산발생제 0.0125 g을 첨가하였다.
According to one embodiment of the present invention, 0.25 g of a copolymer according to an embodiment of the present invention satisfying perfluorodecyl methacrylate (FDMA): 2-methyladamantyl methacrylate (MAMA) = 4: 0.75 0.0125 g of photoacid generator was added.

한편, 도 1 내지 도 5는 본 발명의 일 실시예에 따른 유기전계발광표시장치를 제조하는 과정을 도시한 단면도들이다. 또한, 도 6 및 도 7은 패터닝된 포토레지스트 조성물 및 패터닝된 유기발광층을 도시한 단면이다.
1 to 5 are cross-sectional views illustrating a process of fabricating an organic light emitting display according to an exemplary embodiment of the present invention. 6 and 7 are cross-sectional views showing a patterned photoresist composition and a patterned organic light emitting layer.

도 1에 도시한 바와 같이, 기판(10) 상에 제 1 전극(20)을 형성한 다음, 상기 제 1 전극(20) 상에 본 발명의 일 실시예에 따른 포토레지스트 조성물(30)을 형성한다. 1, a first electrode 20 is formed on a substrate 10 and then a photoresist composition 30 according to an embodiment of the present invention is formed on the first electrode 20 do.

구체적으로, 유리재질의 기판(10) 상에 TCTA로 제 1 전극(20)을 형성하고, 광산발생제를 포함하는 포토레지스트 조성물(30)을 스핀 코팅하여 형성하였다Specifically, a first electrode 20 is formed of TCTA on a glass substrate 10, and a photoresist composition 30 containing a photoacid generator is formed by spin coating

도 2 에 도시한 바와 같이, 마스크를 배치한 후 자외선(UV)을 조사하여 상기 포토레지스트 조성물을 패터닝한다.As shown in FIG. 2, the photoresist composition is patterned by irradiating ultraviolet rays (UV) after disposing a mask.

원하는 패턴을 갖는 마스크(MA)를 배치하고, 365 nm 파장을 가지는 자외선을 조사하여 노광 공정을 수행하였다. 이에 따라, 상기 마스크(MA) 패턴에 따라 포토레지스트 조성물의 일부만 자외선에 노출되고, 자외선에 노출되지 않은 부분은 영향을 받지 않는다. 즉, 상기 자외선에 노출된 부분은 불용성 포토레지스트 조성물(IPR)로 변하는 반면, 자외선에 노출되지 않은 부분은 가용성 포토레지스트 조성물(SPR) 그대로 유지된다.A mask MA having a desired pattern was disposed and an exposure process was performed by irradiating ultraviolet rays having a wavelength of 365 nm. Accordingly, only a part of the photoresist composition is exposed to the ultraviolet rays according to the pattern of the mask MA, and the portions not exposed to the ultraviolet rays are not affected. That is, the portion exposed to the ultraviolet ray changes into the insoluble photoresist composition (IPR), while the portion not exposed to the ultraviolet ray remains the soluble photoresist composition (SPR).

도 3에 도시한 바와 같이, 제 1 전극(20) 상에 패터닝된 포토레지스트 조성물이 형성된다.As shown in FIG. 3, a patterned photoresist composition is formed on the first electrode 20.

구체적으로, 자외선(UV)이 조사된 포토레지스트 조성물을 과불소계 용매가 포함된 현상액에 노출시키면, 가용성 포토레지스트 조성물(SPR)이 제거되고, 불용성 포토레지스트 조성물(IPR)는 제 1 전극(20) 상에 남도록 형성시킬 수 있다. 이에 따라, 제 1 전극(20) 상에 포토레지스트 조성물이 패터닝된 모습(도 6 참고)을 확인하였다.Specifically, the exposed photoresist composition (SPR) is removed, and the insoluble photoresist composition (IPR) is removed from the first electrode 20 by exposing the ultraviolet (UV) irradiated photoresist composition to a developing solution containing a perfluorinated solvent. As shown in FIG. Thus, a pattern (see FIG. 6) in which the photoresist composition was patterned on the first electrode 20 was confirmed.

도 4에 도시한 바와 같이, 패터닝된 포토레지스트 조성물 상에 유기발광층(40)을 형성한다.As shown in FIG. 4, an organic light emitting layer 40 is formed on the patterned photoresist composition.

구체적으로, 패터닝된 포토레지스트 조성물 상에 유기발광층(40)을 형성하면, 패터닝된 포토레지스트 조성물을 마스크로 하여 유기발광층을 형성시킬 수 있다. 이에 따라, 원하는 패턴을 갖는 유기발광층(40)을 형성한 모습(도 7 참고)을 확인하였다.Specifically, when the organic light emitting layer 40 is formed on the patterned photoresist composition, the organic light emitting layer can be formed using the patterned photoresist composition as a mask. Thus, the organic luminescent layer 40 having a desired pattern was formed (see Fig. 7).

도 5에 도시한 바와 같이, 상기 패터닝된 포토레지스트 조성물과, 이의 상부에 접촉된 상기 유기발광층(40)을 제거한다.As shown in Fig. 5, the patterned photoresist composition and the organic luminescent layer 40, which is in contact with the top of the photoresist composition, are removed.

구체적으로, 과불소계 용매가 포함된 박리액에 노출시키면, 남아 있는 패터닝된 포토레지스트 조성물과, 이의 상부에 접촉된 유기발광층이 함께 제거되며, 이에 따라, 제 1 전극 상에 원하는 패턴을 갖는 유기발광층(40)이 형성된다.
Specifically, when exposed to a peeling liquid containing a perfluorinated solvent, the remaining patterned photoresist composition and the organic luminescent layer that is in contact with the top of the photoresist composition are removed together, thereby forming an organic luminescent layer (40) is formed.

이상 살펴본 바와 같이, 본 발명의 일 실시예에 따른 광산발생제를 포함하는 포토레지스트 조성물을 이용하여 유기발광층을 패턴하는 과정을 설명하였다. As described above, a process of patterning an organic light emitting layer using a photoresist composition containing a photoacid generator according to an embodiment of the present invention has been described.

여기서, 유기발광층은 적색, 녹색, 청색을 각각 발광하는 유기발광물질, 또는 백색광을 발광하는 유기발광물질로 형성할 수 있다. 특히, 백색광을 발산하는 유기발광물질의 경우, 유기발광물질 위에 컬러 필터를 도포하고, 컬러 필터를 패턴할 때에도 본 발명의 일 실시예에 따른 포토레지스트 조성물을 이용할 수 있다.Here, the organic light emitting layer may be formed of an organic light emitting material that emits red, green, or blue light, or an organic light emitting material that emits white light. In particular, in the case of an organic luminescent material that emits white light, a photoresist composition according to an embodiment of the present invention may be used to apply a color filter on an organic luminescent material and to pattern a color filter.

이와 같이, 본 발명의 일 실시예에 따른 포토레지스트 조성물은 유기발광물질 자체를 패턴할 때 뿐만 아니라, 유기발광물질과 접촉하는 다른 물질을 패턴할 때 사용함으로써, 유기발광물질에 손상을 방지할 수 있다.
As described above, the photoresist composition according to an embodiment of the present invention can be used not only for patterning the organic luminescent material itself, but also for patterning other materials in contact with the organic luminescent material, have.

본 발명이 속하는 기술분야의 당업자는 상술한 본 발명이 그 기술적 사상이나 필수적 특징을 변경하지 않고서 다른 구체적인 형태로 실시될 수 있다는 것을 이해할 수 있을 것이다.It will be understood by those skilled in the art that the present invention may be embodied in other specific forms without departing from the spirit or essential characteristics thereof.

그러므로, 이상에서 기술한 실시예들은 모든 면에서 예시적인 것이며 한정적인 것이 아닌 것으로 이해해야만 한다. 본 발명의 범위는 상기 상세한 설명보다는 후술하는 특허청구범위에 의하여 나타내어지며, 특허청구범위의 의미 및 범위 그리고 그 등가 개념으로부터 도출되는 모든 변경 또는 변형된 형태가 본 발명의 범위에 포함되는 것으로 해석되어야 한다.
It is therefore to be understood that the above-described embodiments are illustrative in all aspects and not restrictive. The scope of the present invention is defined by the appended claims rather than the detailed description and all changes or modifications derived from the meaning and scope of the claims and their equivalents are to be construed as being included within the scope of the present invention do.

10: 기판 20: 제 1 전극
30: 포토레지스트 조성물 40: 유기발광층
MA: 마스크 SPR: 가용성 포토레지스트 조성물
IPR: 불용성 포토레지스트 조성물
10: substrate 20: first electrode
30: Photoresist composition 40: Organic light-emitting layer
MA: mask SPR: soluble photoresist composition
IPR: insoluble photoresist composition

Claims (9)

하기 화학식 1 내지 4 중 어느 하나로 표시되는 광산발생제(Photo-Acid Generator, PAG).
[화학식 1]
Figure 112013011839347-pat00018

[화학식 2]
Figure 112013011839347-pat00019

[화학식 3]
Figure 112013011839347-pat00020

[화학식 4]
Figure 112013011839347-pat00021

A photo-acid generator (PAG) represented by any one of the following formulas (1) to (4).
[Chemical Formula 1]
Figure 112013011839347-pat00018

(2)
Figure 112013011839347-pat00019

(3)
Figure 112013011839347-pat00020

[Chemical Formula 4]
Figure 112013011839347-pat00021

하기 화학식 1 내지 4 중 어느 하나로 표시되는 광산발생제(photoacid generator, PAG); 및
퍼플루오로데실 메타크릴레이트(FDMA) 및 2-메틸아다맨틸 메타크릴레이트(MAMA) 공중합체를 포함하는 것을 특징으로 하는, 포토레지스트 조성물.
[화학식 1]
Figure 112013011839347-pat00022

[화학식 2]
Figure 112013011839347-pat00023

[화학식 3]
Figure 112013011839347-pat00024

[화학식 4]
Figure 112013011839347-pat00025

A photoacid generator (PAG) represented by any one of Chemical Formulas 1 to 4 below; And
(FDMA), and 2-methyladamantyl methacrylate (MAMA) copolymer. &Lt; Desc / Clms Page number 13 &gt;
[Chemical Formula 1]
Figure 112013011839347-pat00022

(2)
Figure 112013011839347-pat00023

(3)
Figure 112013011839347-pat00024

[Chemical Formula 4]
Figure 112013011839347-pat00025

제 2 항에 있어서,
상기 퍼플루오로데실 메타크릴레이트(FDMA) 및 2-메틸아다맨틸 메타크릴레이트(MAMA) 공중합체는,
하기 화학식 5로 표시되는 공중합체이며, x : y = 0.1 ~ 1 : 4의 비율을 가지는 것을 특징으로 하는, 포토레지스트 조성물.
[화학식 5]
Figure 112014038531335-pat00026

3. The method of claim 2,
The perfluorodecyl methacrylate (FDMA) and 2-methyladamantyl methacrylate (MAMA)
Is a copolymer represented by the following formula (5), and has a ratio of x: y = 0.1 to 1: 4.
[Chemical Formula 5]
Figure 112014038531335-pat00026

제 3 항에 있어서,
상기 화학식 5로 표시되는 공중합체는,
x : y = 1 : 4 인 것을 특징으로 하는, 포토레지스트 조성물.
The method of claim 3,
The copolymer represented by the general formula (5)
x: y = 1: 4.
제 2 항에 있어서,
상기 광산발생제는,
상기 공중합체가 1 일때 0.05 ~ 0.1의 질량%를 가지는 것을 특징으로 하는, 포토레지스트 조성물.
3. The method of claim 2,
The photo-
Wherein the copolymer has a mass percentage of 0.05 to 0.1 at one time.
기판 상에 제 1 전극을 형성하는 단계;
상기 제 1 전극 상에 상기 제 2항의 포토레지스트 조성물을 형성하는 단계;
마스크 패턴을 통해 자외선(UV)을 조사하여 상기 포토레지스트 조성물을 패터닝하는 단계;
상기 패터닝된 포토레지스트 조성물 상에 유기발광층을 형성하는 단계; 및
상기 패터닝된 포토레지스트 조성물과, 이의 상부에 접촉된 상기 유기발광층을 제거하는 단계를 포함하는 것을 특징으로 하는, 유기전계발광표시장치의 제조방법.
Forming a first electrode on the substrate;
Forming the photoresist composition of claim 2 on the first electrode;
Patterning the photoresist composition by irradiating ultraviolet rays (UV) through a mask pattern;
Forming an organic light emitting layer on the patterned photoresist composition; And
And removing the patterned photoresist composition and the organic light emitting layer in contact with the top of the patterned photoresist composition.
제 6 항에 있어서,
상기 패턴된 포토레지스트 조성물과, 이의 상부에 접촉된 상기 유기발광층을 제거하는 단계는, 과불소계 용매를 사용하는 것을 특징으로 하는, 유기전계발광표시장치의 제조방법.
The method according to claim 6,
Wherein the step of removing the patterned photoresist composition and the organic luminescent layer brought into contact with the top of the patterned photoresist composition uses a perfluorinated solvent.
제 6 항에 있어서,
상기 자외선은,
365 nm 파장인 것을 특징으로 하는, 유기전계발광표시장치의 제조방법.
The method according to claim 6,
The ultraviolet rays,
Wherein the organic electroluminescent display device has a wavelength of 365 nm.
제 6 항에 있어서,
상기 기판 상에 제 1 전극을 형성하는 단계 이후에,
정공 수송층 또는 정공 주입층을 형성하는 단계를 더 포함하는 것을 특징으로 하는, 유기전계발광표시장치의 제조방법.
The method according to claim 6,
After forming the first electrode on the substrate,
Forming a hole transporting layer or a hole injecting layer on the organic light emitting display device.
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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2015001804A1 (en) * 2013-07-05 2015-01-08 サンアプロ株式会社 Photoacid generator, and resin composition for photolithography
KR20160000562A (en) * 2014-06-24 2016-01-05 인하대학교 산학협력단 Method for fabrication pattern of nano material
KR20160000563A (en) * 2014-06-24 2016-01-05 인하대학교 산학협력단 Method for fabrication pattern of nano material

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20060044338A (en) * 2004-03-18 2006-05-16 후지 샤신 필름 가부시기가이샤 Positive resist composition for immersion exposure and pattern forming method using the same
KR20100028101A (en) * 2007-07-13 2010-03-11 후지필름 가부시키가이샤 Positive-working resist composition and method for pattern formation using the positive-working resist composition
US20120289697A1 (en) 2010-01-13 2012-11-15 Toshihiko Murai Novel sulfonic acid derivative compound and novel naphthalic acid derivative compound

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20060044338A (en) * 2004-03-18 2006-05-16 후지 샤신 필름 가부시기가이샤 Positive resist composition for immersion exposure and pattern forming method using the same
KR20100028101A (en) * 2007-07-13 2010-03-11 후지필름 가부시키가이샤 Positive-working resist composition and method for pattern formation using the positive-working resist composition
US20120289697A1 (en) 2010-01-13 2012-11-15 Toshihiko Murai Novel sulfonic acid derivative compound and novel naphthalic acid derivative compound

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2015001804A1 (en) * 2013-07-05 2015-01-08 サンアプロ株式会社 Photoacid generator, and resin composition for photolithography
JPWO2015001804A1 (en) * 2013-07-05 2017-02-23 サンアプロ株式会社 Photoacid generator and resin composition for photolithography
KR20160000562A (en) * 2014-06-24 2016-01-05 인하대학교 산학협력단 Method for fabrication pattern of nano material
KR20160000563A (en) * 2014-06-24 2016-01-05 인하대학교 산학협력단 Method for fabrication pattern of nano material
KR101588287B1 (en) * 2014-06-24 2016-01-26 인하대학교 산학협력단 Method for fabrication pattern of nano material
KR101588290B1 (en) * 2014-06-24 2016-01-26 인하대학교 산학협력단 Method for fabrication pattern of nano material

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