KR100974954B1 - 플래시 메모리를 이용한 저장장치에서의 읽기 웨어 레벨링방법 - Google Patents
플래시 메모리를 이용한 저장장치에서의 읽기 웨어 레벨링방법 Download PDFInfo
- Publication number
- KR100974954B1 KR100974954B1 KR1020080061220A KR20080061220A KR100974954B1 KR 100974954 B1 KR100974954 B1 KR 100974954B1 KR 1020080061220 A KR1020080061220 A KR 1020080061220A KR 20080061220 A KR20080061220 A KR 20080061220A KR 100974954 B1 KR100974954 B1 KR 100974954B1
- Authority
- KR
- South Korea
- Prior art keywords
- memory
- read
- block
- memory block
- wear
- Prior art date
Links
- 238000000034 method Methods 0.000 title abstract description 25
- 230000015654 memory Effects 0.000 claims abstract description 100
- 230000003252 repetitive effect Effects 0.000 abstract description 2
- 230000000694 effects Effects 0.000 description 2
- 238000013500 data storage Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000013507 mapping Methods 0.000 description 1
- 230000005055 memory storage Effects 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
- G11C16/349—Arrangements for evaluating degradation, retention or wearout, e.g. by counting erase cycles
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F12/00—Accessing, addressing or allocating within memory systems or architectures
- G06F12/02—Addressing or allocation; Relocation
- G06F12/0223—User address space allocation, e.g. contiguous or non contiguous base addressing
- G06F12/023—Free address space management
- G06F12/0238—Memory management in non-volatile memory, e.g. resistive RAM or ferroelectric memory
- G06F12/0246—Memory management in non-volatile memory, e.g. resistive RAM or ferroelectric memory in block erasable memory, e.g. flash memory
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F2212/00—Indexing scheme relating to accessing, addressing or allocation within memory systems or architectures
- G06F2212/10—Providing a specific technical effect
- G06F2212/1032—Reliability improvement, data loss prevention, degraded operation etc
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F2212/00—Indexing scheme relating to accessing, addressing or allocation within memory systems or architectures
- G06F2212/72—Details relating to flash memory management
- G06F2212/7211—Wear leveling
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- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
Abstract
Description
Claims (4)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020080061220A KR100974954B1 (ko) | 2008-06-26 | 2008-06-26 | 플래시 메모리를 이용한 저장장치에서의 읽기 웨어 레벨링방법 |
US12/492,696 US20090323419A1 (en) | 2008-06-26 | 2009-06-26 | Read-time wear-leveling method in storage system using flash memory device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020080061220A KR100974954B1 (ko) | 2008-06-26 | 2008-06-26 | 플래시 메모리를 이용한 저장장치에서의 읽기 웨어 레벨링방법 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20100001355A KR20100001355A (ko) | 2010-01-06 |
KR100974954B1 true KR100974954B1 (ko) | 2010-08-10 |
Family
ID=41447216
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020080061220A KR100974954B1 (ko) | 2008-06-26 | 2008-06-26 | 플래시 메모리를 이용한 저장장치에서의 읽기 웨어 레벨링방법 |
Country Status (2)
Country | Link |
---|---|
US (1) | US20090323419A1 (ko) |
KR (1) | KR100974954B1 (ko) |
Cited By (2)
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KR20180090414A (ko) * | 2017-02-02 | 2018-08-13 | 한밭대학교 산학협력단 | Ldpc 복호 반복 횟수 기록 및 모니터링을 통한 웨어-레벨링 신뢰도 향상 시스템 및 방법 |
US10388387B2 (en) | 2017-08-11 | 2019-08-20 | SK Hynix Inc. | Memory system and operating method of memory system |
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KR20120128014A (ko) | 2011-05-16 | 2012-11-26 | 삼성전자주식회사 | 불휘발성 메모리 장치의 동작 방법 및 불휘발성 메모리 장치를 포함하는 메모리 시스템의 동작 방법 |
US9098399B2 (en) * | 2011-08-31 | 2015-08-04 | SMART Storage Systems, Inc. | Electronic system with storage management mechanism and method of operation thereof |
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US8949689B2 (en) | 2012-06-11 | 2015-02-03 | SMART Storage Systems, Inc. | Storage control system with data management mechanism and method of operation thereof |
KR101949671B1 (ko) | 2012-06-28 | 2019-04-25 | 삼성전자 주식회사 | 라이프 싸이클을 증가시킬 수 있는 저장 장치 및 그 동작 방법 |
US9671962B2 (en) | 2012-11-30 | 2017-06-06 | Sandisk Technologies Llc | Storage control system with data management mechanism of parity and method of operation thereof |
KR101430637B1 (ko) * | 2012-12-11 | 2014-08-18 | 서울대학교산학협력단 | 불휘발성 메모리 장치 및 그것의 데이터 관리 방법 |
US9123445B2 (en) | 2013-01-22 | 2015-09-01 | SMART Storage Systems, Inc. | Storage control system with data management mechanism and method of operation thereof |
US9329928B2 (en) | 2013-02-20 | 2016-05-03 | Sandisk Enterprise IP LLC. | Bandwidth optimization in a non-volatile memory system |
US9214965B2 (en) | 2013-02-20 | 2015-12-15 | Sandisk Enterprise Ip Llc | Method and system for improving data integrity in non-volatile storage |
US9183137B2 (en) | 2013-02-27 | 2015-11-10 | SMART Storage Systems, Inc. | Storage control system with data management mechanism and method of operation thereof |
US9470720B2 (en) | 2013-03-08 | 2016-10-18 | Sandisk Technologies Llc | Test system with localized heating and method of manufacture thereof |
US9043780B2 (en) | 2013-03-27 | 2015-05-26 | SMART Storage Systems, Inc. | Electronic system with system modification control mechanism and method of operation thereof |
US9170941B2 (en) | 2013-04-05 | 2015-10-27 | Sandisk Enterprises IP LLC | Data hardening in a storage system |
US10049037B2 (en) | 2013-04-05 | 2018-08-14 | Sandisk Enterprise Ip Llc | Data management in a storage system |
US9543025B2 (en) | 2013-04-11 | 2017-01-10 | Sandisk Technologies Llc | Storage control system with power-off time estimation mechanism and method of operation thereof |
US10546648B2 (en) | 2013-04-12 | 2020-01-28 | Sandisk Technologies Llc | Storage control system with data management mechanism and method of operation thereof |
US9313874B2 (en) | 2013-06-19 | 2016-04-12 | SMART Storage Systems, Inc. | Electronic system with heat extraction and method of manufacture thereof |
US9898056B2 (en) | 2013-06-19 | 2018-02-20 | Sandisk Technologies Llc | Electronic assembly with thermal channel and method of manufacture thereof |
US9367353B1 (en) | 2013-06-25 | 2016-06-14 | Sandisk Technologies Inc. | Storage control system with power throttling mechanism and method of operation thereof |
US9244519B1 (en) | 2013-06-25 | 2016-01-26 | Smart Storage Systems. Inc. | Storage system with data transfer rate adjustment for power throttling |
US9146850B2 (en) | 2013-08-01 | 2015-09-29 | SMART Storage Systems, Inc. | Data storage system with dynamic read threshold mechanism and method of operation thereof |
US9361222B2 (en) | 2013-08-07 | 2016-06-07 | SMART Storage Systems, Inc. | Electronic system with storage drive life estimation mechanism and method of operation thereof |
US9448946B2 (en) | 2013-08-07 | 2016-09-20 | Sandisk Technologies Llc | Data storage system with stale data mechanism and method of operation thereof |
US9431113B2 (en) | 2013-08-07 | 2016-08-30 | Sandisk Technologies Llc | Data storage system with dynamic erase block grouping mechanism and method of operation thereof |
US9152555B2 (en) | 2013-11-15 | 2015-10-06 | Sandisk Enterprise IP LLC. | Data management with modular erase in a data storage system |
KR102187643B1 (ko) * | 2013-12-04 | 2020-12-08 | 삼성전자주식회사 | 메모리 시스템 및 그것을 포함하는 유저 장치 |
KR102530905B1 (ko) | 2016-02-15 | 2023-05-11 | 에스케이하이닉스 주식회사 | 메모리 시스템 및 그의 동작 방법 |
TWI656531B (zh) * | 2018-04-11 | 2019-04-11 | 群聯電子股份有限公司 | 平均磨損方法、記憶體控制電路單元與記憶體儲存裝置 |
Citations (2)
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KR20040071574A (ko) * | 2003-02-04 | 2004-08-12 | 가부시끼가이샤 도시바 | 불휘발성 반도체 메모리 |
JP2007293486A (ja) * | 2006-04-24 | 2007-11-08 | Fujitsu Ltd | ディスク装置、ディスク制御方法及びプログラム |
Family Cites Families (4)
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JP4863749B2 (ja) * | 2006-03-29 | 2012-01-25 | 株式会社日立製作所 | フラッシュメモリを用いた記憶装置、その消去回数平準化方法、及び消去回数平準化プログラム |
US7409490B2 (en) * | 2006-04-15 | 2008-08-05 | Yi-Chun Liu | Method of flash memory management |
KR101413736B1 (ko) * | 2007-09-13 | 2014-07-02 | 삼성전자주식회사 | 향상된 신뢰성을 갖는 메모리 시스템 및 그것의웨어-레벨링 기법 |
US8285919B2 (en) * | 2008-05-27 | 2012-10-09 | Initio Corporation | SSD with improved bad block management |
-
2008
- 2008-06-26 KR KR1020080061220A patent/KR100974954B1/ko active IP Right Grant
-
2009
- 2009-06-26 US US12/492,696 patent/US20090323419A1/en not_active Abandoned
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
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KR20040071574A (ko) * | 2003-02-04 | 2004-08-12 | 가부시끼가이샤 도시바 | 불휘발성 반도체 메모리 |
JP2007293486A (ja) * | 2006-04-24 | 2007-11-08 | Fujitsu Ltd | ディスク装置、ディスク制御方法及びプログラム |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20180090414A (ko) * | 2017-02-02 | 2018-08-13 | 한밭대학교 산학협력단 | Ldpc 복호 반복 횟수 기록 및 모니터링을 통한 웨어-레벨링 신뢰도 향상 시스템 및 방법 |
KR101893064B1 (ko) | 2017-02-02 | 2018-08-30 | 한밭대학교 산학협력단 | Ldpc 복호 반복 횟수 기록 및 모니터링을 통한 웨어-레벨링 신뢰도 향상 시스템 및 방법 |
US10388387B2 (en) | 2017-08-11 | 2019-08-20 | SK Hynix Inc. | Memory system and operating method of memory system |
Also Published As
Publication number | Publication date |
---|---|
KR20100001355A (ko) | 2010-01-06 |
US20090323419A1 (en) | 2009-12-31 |
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