KR100956545B1 - 형상 왜곡을 최소화한 3차원 자동 안경테/패턴 형상 측정 방법 - Google Patents
형상 왜곡을 최소화한 3차원 자동 안경테/패턴 형상 측정 방법 Download PDFInfo
- Publication number
- KR100956545B1 KR100956545B1 KR1020080022519A KR20080022519A KR100956545B1 KR 100956545 B1 KR100956545 B1 KR 100956545B1 KR 1020080022519 A KR1020080022519 A KR 1020080022519A KR 20080022519 A KR20080022519 A KR 20080022519A KR 100956545 B1 KR100956545 B1 KR 100956545B1
- Authority
- KR
- South Korea
- Prior art keywords
- pattern
- probe
- spectacle frame
- frame
- normal vector
- Prior art date
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29D—PRODUCING PARTICULAR ARTICLES FROM PLASTICS OR FROM SUBSTANCES IN A PLASTIC STATE
- B29D12/00—Producing frames
- B29D12/02—Spectacle frames
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
- G01B11/005—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates coordinate measuring machines
- G01B11/007—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates coordinate measuring machines feeler heads therefor
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T17/00—Three dimensional [3D] modelling, e.g. data description of 3D objects
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/50—Depth or shape recovery
- G06T7/521—Depth or shape recovery from laser ranging, e.g. using interferometry; from the projection of structured light
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- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Computer Graphics (AREA)
- Geometry (AREA)
- Software Systems (AREA)
- Mechanical Engineering (AREA)
- Optics & Photonics (AREA)
- Computer Vision & Pattern Recognition (AREA)
- A Measuring Device Byusing Mechanical Method (AREA)
- Eyeglasses (AREA)
Abstract
Description
Claims (4)
- 삭제
- 삭제
- 삭제
- 탐침부가 안경테 또는 패턴에 접한 상태에서 회전하는 단계;상기 안경테 또는 패턴과 탐침부의 접점에서의 (i) 탐침부의 회전 각도, (ii) 상기 탐침부의 회전 중심축으로부터의 거리인 R축 방향 위치 변위, 및 (iii) 상기 탐침부의 상하방향 이동거리인 Z축 방향 위치 변위를 포함하는 탐침부의 위치 정보를 얻는 단계;상기 위치 정보로부터, 상기 접점에 있어서, 상기 탐침부 진행방향의 법선 벡터 기울기 및 법선 벡터 기울기 변화를 산출하는 단계; 및상기 법선 벡터 기울기의 변화에 기초하여, 상기 탐침부의 회전 속도 및/또는 작용 압력을 실시간으로 조절하는 단계를 포함하는 3차원 자동 안경테/패턴 형상 측정 방법.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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KR1020080022519A KR100956545B1 (ko) | 2008-03-11 | 2008-03-11 | 형상 왜곡을 최소화한 3차원 자동 안경테/패턴 형상 측정 방법 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020080022519A KR100956545B1 (ko) | 2008-03-11 | 2008-03-11 | 형상 왜곡을 최소화한 3차원 자동 안경테/패턴 형상 측정 방법 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20090097404A KR20090097404A (ko) | 2009-09-16 |
KR100956545B1 true KR100956545B1 (ko) | 2010-05-07 |
Family
ID=41356773
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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KR1020080022519A KR100956545B1 (ko) | 2008-03-11 | 2008-03-11 | 형상 왜곡을 최소화한 3차원 자동 안경테/패턴 형상 측정 방법 |
Country Status (1)
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KR (1) | KR100956545B1 (ko) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101713524B1 (ko) * | 2015-11-04 | 2017-03-08 | 주식회사 휴비츠 | 안경 렌즈 둘레의 가공 형상을 추출하는 방법 |
KR101877719B1 (ko) * | 2016-07-19 | 2018-07-12 | 주식회사 휴비츠 | 학습기능을 이용한 프레임 형상 검출 방법 |
KR102333829B1 (ko) | 2020-04-02 | 2021-12-06 | 주식회사 휴비츠 | 블런트 산각이 형성된 안경 렌즈 및 렌즈 가공 방법 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20030045616A (ko) * | 2001-12-03 | 2003-06-11 | 가부시키가이샤 탑콘 | 렌즈테두리형상 측정장치 |
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- 2008-03-11 KR KR1020080022519A patent/KR100956545B1/ko active IP Right Grant
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20030045616A (ko) * | 2001-12-03 | 2003-06-11 | 가부시키가이샤 탑콘 | 렌즈테두리형상 측정장치 |
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KR20090097404A (ko) | 2009-09-16 |
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