KR100414518B1 - 칩 마운팅 방법 및 장치 - Google Patents
칩 마운팅 방법 및 장치 Download PDFInfo
- Publication number
- KR100414518B1 KR100414518B1 KR10-2001-0087334A KR20010087334A KR100414518B1 KR 100414518 B1 KR100414518 B1 KR 100414518B1 KR 20010087334 A KR20010087334 A KR 20010087334A KR 100414518 B1 KR100414518 B1 KR 100414518B1
- Authority
- KR
- South Korea
- Prior art keywords
- chip
- film
- receiving groove
- defective
- probe
- Prior art date
Links
- 238000000034 method Methods 0.000 title abstract description 39
- 230000002950 deficient Effects 0.000 claims abstract description 21
- 239000000523 sample Substances 0.000 claims abstract description 21
- 238000007689 inspection Methods 0.000 claims abstract description 18
- 238000011084 recovery Methods 0.000 claims abstract description 15
- 238000007789 sealing Methods 0.000 claims abstract description 9
- 230000007547 defect Effects 0.000 abstract description 11
- 238000012216 screening Methods 0.000 description 5
- 238000010586 diagram Methods 0.000 description 3
- 238000004804 winding Methods 0.000 description 2
- 238000002788 crimping Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 description 1
- 230000010363 phase shift Effects 0.000 description 1
- 238000009751 slip forming Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
- H05K13/02—Feeding of components
- H05K13/022—Feeding of components with orientation of the elements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/01—Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Containers And Plastic Fillers For Packaging (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
Abstract
Description
Claims (2)
- 필름 공급롤의 필름이 필름 회수롤 측으로 스텝운동으로 진입 및 이송되게 하고, 그 이송되는 필름이 3차원형상 측정용 프로브를 통과하는 것에 의해 필름의 칩수용홈에 탑재된 칩의 검사가 이루어지게 하며, 이 검사를 통해 검출된 불량 칩은 로봇아암에 의해 정상 칩으로 교체되는 식의 선별작업이 동시에 이루어지는 제1 공정과;상기 제1 공정을 거친 필름의 칩수용홈을 테이프로 부착시키는 것에 의해 밀봉하는 제2 공정으로 이루어진 것을 특징으로 한 칩 마운팅 방법.
- 필름 공급롤(11)의 필름(F)이 타측 필름 회수롤(12) 측으로 회수되면서 스텝운동으로 진입 및 이송되게 하는 필름이송부(1)와;상기 필름이송부(1)에 의해 이송되는 필름(F)의 상부측에 설치되어 상기 필름(F)의 칩수용홈(110)에 탑재된 칩(C)의 3차원형상을 측정하여 상기 칩(C)의 불량여부가 판별될 수 있게 하는 프로브(2)와;상기 프로브(2)에 의해 검출된 필름(F)의 해당 칩수용홈(110) 내부의 불량 칩을 정상 칩으로 교체하는 식으로 선별작업을 수행하는 로봇아암(3)과;상기 로봇아암(3)에 의해 선별된 칩(C)이 탑재된 필름(F)의 칩수용홈(110)을 테이프(41) 부착으로 밀봉시키는 테이핑부(4)로 구성된 것을 특징으로 한 칩 마운팅 장치.
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR10-2001-0087334A KR100414518B1 (ko) | 2001-12-28 | 2001-12-28 | 칩 마운팅 방법 및 장치 |
PCT/KR2002/002420 WO2003056623A1 (en) | 2001-12-28 | 2002-12-24 | Method and apparatus for inspecting and packing chips |
AU2002359029A AU2002359029A1 (en) | 2001-12-28 | 2002-12-24 | Method and apparatus for inspecting and packing chips |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR10-2001-0087334A KR100414518B1 (ko) | 2001-12-28 | 2001-12-28 | 칩 마운팅 방법 및 장치 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20030056972A KR20030056972A (ko) | 2003-07-04 |
KR100414518B1 true KR100414518B1 (ko) | 2004-01-07 |
Family
ID=19717831
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR10-2001-0087334A KR100414518B1 (ko) | 2001-12-28 | 2001-12-28 | 칩 마운팅 방법 및 장치 |
Country Status (3)
Country | Link |
---|---|
KR (1) | KR100414518B1 (ko) |
AU (1) | AU2002359029A1 (ko) |
WO (1) | WO2003056623A1 (ko) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102015013494B3 (de) | 2015-10-16 | 2017-04-06 | Mühlbauer Gmbh & Co. Kg | Bauteilhandhabungsvorrichtung und Verfahren zum Entnehmen von Bauteilen von einem strukturierten Bauteilvorrat und zum Ablegen an einer Empfangseinrichtung |
DE102015013495B4 (de) | 2015-10-16 | 2018-04-26 | Mühlbauer Gmbh & Co. Kg | Empfangseinrichtung für Bauteile und Verfahren zum Entnehmen fehlerhafter Bauteile aus dieser |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH1045106A (ja) * | 1996-05-29 | 1998-02-17 | Seiwa Sangyo Kk | 電子部品のテーピング方法およびテーピング装置 |
JPH1072010A (ja) * | 1996-06-24 | 1998-03-17 | Seiwa Sangyo Kk | 電子部品のテーピング方法およびテーピング装置 |
JPH11171125A (ja) * | 1997-12-08 | 1999-06-29 | Sony Corp | 半導体装置用テーピング装置及びその方法 |
JP2000289709A (ja) * | 1999-04-06 | 2000-10-17 | Sony Corp | テーピング装置 |
JP2001122216A (ja) * | 1999-10-29 | 2001-05-08 | Sanyo Electric Co Ltd | テーピング装置及びテーピング方法 |
JP2001228098A (ja) * | 2000-02-14 | 2001-08-24 | Sony Corp | 検査・テーピング装置 |
JP2002160704A (ja) * | 2000-11-22 | 2002-06-04 | Sony Corp | 半導体装置用テーピング装置 |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5121053A (en) * | 1988-10-11 | 1992-06-09 | Hewlett-Packard Company | Tab frame and process of testing same |
JP3023398B2 (ja) * | 1993-10-28 | 2000-03-21 | 東芝テック株式会社 | 会計データ処理装置 |
KR100389017B1 (ko) * | 2000-11-22 | 2003-06-25 | (주) 인텍플러스 | 모아레무늬 발생기를 적용한 위상천이 영사식 모아레방법및 장치 |
KR20020078685A (ko) * | 2001-04-07 | 2002-10-19 | 이소피아 | 배면에 인쇄시트가 결합부착되어 외부투영이 이루어지는입체성형물 제작을 위한 용융사출 방법 및 금형장치 |
-
2001
- 2001-12-28 KR KR10-2001-0087334A patent/KR100414518B1/ko active IP Right Grant
-
2002
- 2002-12-24 AU AU2002359029A patent/AU2002359029A1/en not_active Abandoned
- 2002-12-24 WO PCT/KR2002/002420 patent/WO2003056623A1/en not_active Application Discontinuation
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH1045106A (ja) * | 1996-05-29 | 1998-02-17 | Seiwa Sangyo Kk | 電子部品のテーピング方法およびテーピング装置 |
JPH1072010A (ja) * | 1996-06-24 | 1998-03-17 | Seiwa Sangyo Kk | 電子部品のテーピング方法およびテーピング装置 |
JPH11171125A (ja) * | 1997-12-08 | 1999-06-29 | Sony Corp | 半導体装置用テーピング装置及びその方法 |
JP2000289709A (ja) * | 1999-04-06 | 2000-10-17 | Sony Corp | テーピング装置 |
JP2001122216A (ja) * | 1999-10-29 | 2001-05-08 | Sanyo Electric Co Ltd | テーピング装置及びテーピング方法 |
JP2001228098A (ja) * | 2000-02-14 | 2001-08-24 | Sony Corp | 検査・テーピング装置 |
JP2002160704A (ja) * | 2000-11-22 | 2002-06-04 | Sony Corp | 半導体装置用テーピング装置 |
Also Published As
Publication number | Publication date |
---|---|
KR20030056972A (ko) | 2003-07-04 |
AU2002359029A1 (en) | 2003-07-15 |
WO2003056623A1 (en) | 2003-07-10 |
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